• Title/Summary/Keyword: engineering chart

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A Synthetic Chart to Monitor The Defect Rate for High-Yield Processes

  • Kusukawa, Etsuko;Ohta, Hiroshi
    • Industrial Engineering and Management Systems
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    • v.4 no.2
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    • pp.158-164
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    • 2005
  • Kusukawa and Ohta presented the $CS_{CQ-r}$ chart to monitor the process defect $rate{\lambda}$ in high-yield processes that is derived from the count of defects. The $CS_{CQ-r}$ chart is more sensitive to $monitor{\lambda}$ than the CQ (Cumulative Quantity) chart proposed by Chan et al.. As a more superior chart in high-yield processes, we propose a Synthetic chart that is the integration of the CQ_-r chart and the $CS_{CQ-r}$chart. The quality characteristic of both charts is the number of units y required to observe r $({\geq}2)$ defects. It is assumed that this quantity is an Erlang random variable from the property that the quality characteristic of the CQ chart follows the exponential distribution. In use of the proposed Synthetic chart, the process is initially judged as either in-control or out-of-control by using the $CS_{CQ-r}$chart. If the process was not judged as in-control by the $CS_{CQ-r}$chart, the process is successively judged by using the $CQ_{-r}$chart to confirm the judgment of the $CS_{CQ-r}$chart. Through comparisons of ARL (Average Run Length), the proposed Synthetic chart is more superior to monitor the process defect rate in high-yield processes to the stand-alone $CS_{CQ-r}$ chart.

A Synthetic Exponentially Weighted Moving-average Chart for High-yield Processes

  • Kusukawa, Etsuko;Kotani, Takayuki;Ohta, Hiroshi
    • Industrial Engineering and Management Systems
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    • v.7 no.2
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    • pp.101-112
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    • 2008
  • As charts to monitor the process fraction defectives, P, in the high-yield processes, Mishima et al. (2002) discussed a synthetic chart, the Synthetic CS chart, which integrates the CS (Confirmation Sample)$_{CCC(\text{Cumulative Count of Conforming})-r}$ chart and the CCC-r chart. The Synthetic CS chart is designed to monitor quality characteristics in real-time. Recently, Kotani et al. (2005) presented the EWMA (Exponentially Weighted Moving-Average)$_{CCC-r}$ chart, which considers combining the quality characteristics monitored in the past with one monitored in real-time. In this paper, we present an alternative chart that is more superior to the $EWMA_{CCC-r}$ chart. It is an integration of the $EWMA_{CCC-r}$ chart and the CCC-r chart. In using the proposed chart, the quality characteristic is initially judged as either the in-control state or the out-of-control state, using the lower and upper control limits of the $EWMA_{CCC-r}$ chart. If the process is not judged as the in-control state by the $EWMA_{CCC-r}$ chart, the process is successively judged, using the $EWMA_{CCC-r}$ chart. We compare the ANOS (Average Number of Observations to Signal) of the proposed chart with those of the $EWMA_{CCC-r}$ chart and the Synthetic CS chart. From the numerical experiments, with the small size of inspection items, the proposed chart is the most sensitive to detect especially the small shifts in P among other charts.

Exponentially Weighted Moving Average Chart for High-Yield Processes

  • Kotani, Takayuki;Kusukawa, Etsuko;Ohta, Hiroshi
    • Industrial Engineering and Management Systems
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    • v.4 no.1
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    • pp.75-81
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    • 2005
  • Borror et al. discussed the EWMA(Exponentially Weighted Moving Average) chart to monitor the count of defects which follows the Poisson distribution, referred to the $EWMA_c$ chart, as an alternative Shewhart c chart. In the $EWMA_c$ chart, the Markov chain approach is used to calculate the ARL (Average Run Length). On the other hand, in order to monitor the process fraction defectives P in high-yield processes, Xie et al. presented the CCC(Cumulative Count of Conforming)-r chart of which quality characteristic is the cumulative count of conforming item inspected until observing $r({\geq}2)$ nonconforming items. Furthermore, Ohta and Kusukawa presented the $CS(Confirmation Sample)_{CCC-r}$ chart as an alternative of the CCC-r chart. As a more superior chart in high-yield processes, in this paper we present an $EWMA_{CCC-r}$ chart to detect more sensitively small or moderate shifts in P than the $CS_{CCC-r}$ chart. The proposed $EWMA_{CCC-r}$ chart can be constructed by applying the designing method of the $EWMA_C$ chart to the CCC-r chart. ANOS(Average Number of Observations to Signal) of the proposed chart is compared with that of the $CS_{CCC-r}$ chart through computer simulation. It is demonstrated from numerical examples that the performance of proposed chart is more superior to the $CS_{CCC-r}$ chart.

A Comparison of the performance of mean, median, and precedence control charts for nonnormal data

  • Kim, Jung-Hee;Lee, Sung-Im;Park, Heon-Jin;Lee, Jae-Cheol;Jang, Young-Chul
    • Proceedings of the Korean Statistical Society Conference
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    • 2005.05a
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    • pp.197-201
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    • 2005
  • In this article, we will compare the performance of the mean control chart, the median control chart, the transformed mean control chart, the transformed median control chart, and the precedence control chart by simulation study. For control charts with transformed data, Yeo-Johnson transformation is used. Under the in-control condition, ARL's in all control charts coincide with the designed ARL in the normal distribution, but in the other distributions, only the precedence control chart provides the in-control ARL as designed. Under the out-of-control condition, the mean control chart is preferred in the normal distribution and the median control chart is preferred in the heavy-tailed distribution and the precedence control chart outperforms in the short-tailed distribution.

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Development of a p Control Chart for Overdispersed Process with Beta-Binomial Model (베타-이항모형을 이용한 과산포 공정용 p 관리도의 개발)

  • Bae, Bong-Soo;Seo, Sun-Keun
    • Journal of Korean Society for Quality Management
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    • v.45 no.2
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    • pp.209-225
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    • 2017
  • Purpose: Since traditional p chart is unable to deal with the variation of attribute data, this paper proposes a new attribute control chart for nonconforming proportions incorporating overdispersion with a beta-binomial model. Methods: Statistical theories for control chart developed under the beta-binomial model and a new approach using this control chart are presented Results: False alarm probabilities of p chart with the beta-binomial model are evaluated and demerits of p chart under overdispersion are discussed from three examples. Hence a concrete procedure for the proposed control chart is provided and illustrated with examples Conclusion: The proposed chart is more useful than traditional p chart, individual chart to treat observed proportions nonconforming as variable data and Laney p' chart.

A Study on the Standard Flow Chart for Civil Engineering (토목공학을 위한 표준 이수체계도에 관한 연구)

  • Choi, Se-Hyu;Park, Sung-Sik
    • Journal of Engineering Education Research
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    • v.15 no.1
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    • pp.3-8
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    • 2012
  • This study present the standard flow chart for civil engineering considering Korean education environment. The flow charts of USA's 20 universities and Korea's 6 universities are investigated. The standard flow chart are proposed based on the standard curriculum of civil engineering and flow charts of USA and Korea though analyzing of prerequisite of each subject. The proposed standard flow chart is expected when used to improve korean universities curriculum.

Development of VSI Synthetic Control Chart (가변샘플링기법을 이용한 합성관리도의 개발)

  • Song, Suh-Ill;Park, Hyun-Kyu
    • Journal of Korean Society for Quality Management
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    • v.33 no.1
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    • pp.1-10
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    • 2005
  • This paper develops a new VSI $\={X}-CRL$ synthetic control chart that considers convenience of use in the field, and perception of change of process applying VSI techniques to synthetic control chart, simultaneously. We found the optimal sampling interval and various control limit factor of the suggested chart using markov chain. Comparison and analysis is carried out between synthetic VSI $\={X}-CRL$ chart and other chart in the statistical aspect; $\={X}$ control chart, VSI $\={X}$ chart, another synthetic chart. In case that the process follows normal distribution, the proposed VSI $\={X}-CRL$ synthetic control chart in detecting process mean shift showed the best performance in aspect of statistical performance, regardless of control limit L of CRL/S control chart.

The Statistical Design of CV Control Charts for the Gamma Distribution Processes (감마분포 공정을 위한 변동계수 관리도의 통계적 설계)

  • Lee, Dong-Won;Paik, Jae-Won;Kang, Chang-Wook
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.29 no.2
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    • pp.97-103
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    • 2006
  • Recently, the control chart is developed for monitoring processes with normal short production runs by the coefficient of variation(CV) characteristic for a normal distribution. This control chart does not work well in non-normal short production runs. And most of industrial processes are known to follow the non-normal distribution. Therefore, the control chart is required to be developed for monitoring the processes with non-normal short production runs by the CV characteristics for a non-normal distribution. In this paper, we suggest the control chart for monitoring the processes with a gamma short runs by the CV characteristics for a gamma distribution. This control chart is denoted by the gamma CV control chart. Futhermore evaluated the performance of the gamma CV control chart by average run length(ARL).

Design of the Robust CV Control Chart using Location Parameter (위치모수를 이용한 로버스트 CV 관리도의 설계)

  • Chun, Dong-Jin;Chung, Young-Bae
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.39 no.1
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    • pp.116-122
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    • 2016
  • Recently, the production cycle in manufacturing process has been getting shorter and different types of product have been produced in the same process line. In this case, the control chart using coefficient of variation would be applicable to the process. The theory that random variables are located in the three times distance of the deviation from mean value is applicable to the control chart that monitor the process in the manufacturing line, when the data of process are changed by the type of normal distribution. It is possible to apply to the control chart of coefficient of variation too. ${\bar{x}}$, s estimates that taken in the coefficient of variation have just used all of the data, but the upper control limit, center line and lower control limit have been settled by the effect of abnormal values, so this control chart could be in trouble of detection ability of the assignable value. The purpose of this study was to present the robust control chart than coefficient of variation control chart in the normal process. To perform this research, the location parameter, ${\bar{x_{\alpha}}}$, $s_{\alpha}$ were used. The robust control chart was named Tim-CV control chart. The result of simulation were summarized as follows; First, P values, the probability to get away from control limit, in Trim-CV control chart were larger than CV control chart in the normal process. Second, ARL values, average run length, in Trim-CV control chart were smaller than CV control chart in the normal process. Particularly, the difference of performance of two control charts was so sure when the change of the process was getting to bigger. Therefore, the Trim-CV control chart proposed in this paper would be more efficient tool than CV control chart in small quantity batch production.

Development of CV Control Chart Using EWMA Technique (EWMA 기법을 적용한 CV 관리도의 개발)

  • Hong, Eui-Pyo;Kang, Chang-Wook;Baek, Jae-Won;Kang, Hae-Woon
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.31 no.4
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    • pp.114-120
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    • 2008
  • The control chart is widely used statistical process control(SPC) tool that searches for assignable cause of variation and detects any change of process. Generally, ${\bar{X}}-R$ control chart and ${\bar{X}}-S$ are most frequently used. When the production run is short and process parameter changes frequently, it is difficult to monitor the process using traditional control charts. In such a case, the coefficient of variation (CV) is very useful for monitoring the process variability. The CV control chart is an effective tool to control the mean and variability of process simultaneously. The CV control chart, however, is not sensitive at small shift in the magnitude of CV. In this paper, we propose an CV-EWMA (exponentially weighted moving average) control chart which is effective in detecting a small shift of CV. Since the CV-EWMA control chart scheme can be viewed as a weighted average of all past and current CV values, it is very sensitive to small change of mean and variability of the process. We suggest the values of design parameters and show the results of the performance study of CV-EWMA control chart by the use of average run length (ARL). When we compared the performance of CV-EWMA control chart with that of the CV control chart, we found that the CV-EWMA control chart gives longer in-control ARL and much shorter out-of-control ARL.