• Title/Summary/Keyword: energy bandgap

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Synthesis of ZnS : Cu nano-crystals and structural and optical properties (ZnS : Cu nano 업자의 합성 및 구조적.광학적 특성)

  • 이종원;이상욱;조성룡;김선태;박인용;최용대
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.12 no.3
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    • pp.138-143
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    • 2002
  • In this study, ZnS: Cu nano-crystals are synthesized by solution synthesis technique (SST). The structural properties such as crystal structure and particle morphology, and the optical properties such as light absorption/transmittance, energy bandgap, and photoluminescence (PL) excitation/emission are investigated. In an attempt to realize the Cu-doping easiness, the synthesis temperature (~$80^{\circ}C$) is applied to the synthesis bath, and the thiourea is used as sulfur precursor, unlike other general chemical synthesis route. Both undoped ZnS and ZnS : Cu nano-crystals have the cubic crystal structure and have the spherical particle shape. The position of light absorption edge is ~305 nm, indicating the occurrence of quantum size effect. The PL emission intensity and line-width are maximum and minimum, respectively, for Cu-doping concentration 0.03M. In particular, the dependence of PL intensity and line-width on the Cu-doping concentration for ZnS : Cu nano-crystals synthesized by SST is reported for the first time in this study. Experimental results of the absorption edge and the PL excitation show that the main emission peak of ZnS : Cu nano-crystals (~510 nm) in this study is due to the radiative recombination center in the energy bandgap induced by Cu dopant.

An Investigation of Electrical Properties in Cation-anion Codoped ZnO by Atomic Layer Deposition (원자층 증착법 기반 양이온-음이온 이중 도핑 효과에 따른 ZnO 박막의 전기적 특성 비교 연구)

  • Dong-eun Kim;Geonwoo Kim;Kyung-Mun Kang;Akendra Singh Chabungbam;Hyung-Ho Park
    • Journal of the Microelectronics and Packaging Society
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    • v.30 no.3
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    • pp.94-101
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    • 2023
  • Zinc oxide(ZnO) is a semiconductor material with a bandgap of 3.37 eV and an exciton binding energy of 60 meV for various applications. Recently ZnO has been proven to enhance its electrical properties for utilization as an alternative for transparent conducting oxide (TCO) materials. In this study, cation(Al, Ga)-anion(F) single and double doped ZnO thin films were grown by atomic layer deposition (ALD) to enhance the electrical properties. The structural and optical properties of doped ZnO thin films were analyzed, and doping effects were confirmed to electrical characteristics. In single doped ZnO, it was observed that the carrier concentration was increased after doping, acting as a donor to ZnO. Among the single doping elements, F doped ZnO(FZO) showed the highest mobility and conductivity due to the passivation effect of oxygen vacancies. In the case of double doping, higher electrical characteristics were observed compared to single doping. Among the samples, Al-F doped ZnO(AFZO) exhibited the lowest resistance value. This results can be attributed to an increase in delocalized electron states and a decrease in lattice distortion resulting from the differences in ionic radius. The partial density of states(PDOS) was also analyzed and observed to be consistent with the experimental results.

Change in the Energy Band Gap and Transmittance IGZO, ZnO, AZO OMO Structure According to Ag Thickness (IGZO, ZnO, AZO OMO 구조의 Ag두께 변화에 따른 투과율과 에너지 밴드 갭의 변화)

  • Lee, Seung-Min;Kim, Hong-Bae;Lee, Sang-Yeol
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.28 no.3
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    • pp.185-190
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    • 2015
  • In this study, we fabricated the indium gallium zinc oxide (IGZO), zinc oxide (ZnO), aluminum zinc oxide (AZO). oxide and silver are deposited by magnetron sputtering and thermal evaporator, respectively transparency and energy bandgap were changed by the thickness of silver layer. To fabricate metal oxide metal (OMO) structure, IGZO sputtered on a corning 1,737 glass substrate was used as bottom oxide material and then silver was evaporated on the IGZO layer, finally IGZO was sputtered on the silver layer we get the final OMO structure. The radio-frequency power of the target was fixed at 30 W. The chamber pressure was set to $6.0{\times}10^{-3}$ Torr, and the gas ratio of Ar was fixed at 25 sccm. The silver thickness are varied from 3 to 15 nm. The OMO thin films was analyzed using XRD. XRD shows broad peak which clearly indicates amorphous phase. ZnO, AZO, OMO show the peak [002] direction at $34^{\circ}$. This indicate that ZnO, AZO OMO structure show the crystalline peak. Average transmittance of visible region was over 75%, while that of infrared region was under 20%. Energy band gap of OMO layer was increased with increasing thickness of Ag layer. As a result total transmittance was decreased.

Photodissolution, photodiffusion characteristics and holographic grating formation on Ag-doped $As_{40}Ge_{10}Se_{15}S_{35}$ chalcogenide thin film (Ag가 도핑된 칼코게나이드 $As_{40}Ge_{10}Se_{15}S_{35}$ 박막의 광분해, 광확산특성 및 홀로그래픽 격자형성)

  • Chung, Hong-Bay
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.55 no.10
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    • pp.461-466
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    • 2006
  • In the present work, we investigated the photodissolution and photodiffusion effect on the interface of Ag/chalcogenide $As_{40}Ge_{10}Se_{15}S_{35}$ thin film by measuring the absorption coefficient, the optical density, the resistance change of Ag layer. It was found that the photodissolutioniphotodiffution ratio depends on the magnitude of photon energy absorbed in the chalcogenide thin film and the depth of photodiffution was proportional to the square root of the exposed time. Also, we have investigated the holographic grating formation with P-polarization states on chalcogenide $As_{40}Ge_{10}Se_{15}S_{35}$ thin film and $As_{40}Ge_{10}Se_{15}S_{35}/Ag$ double layer structure thin film. Holographic gratings have been formed using He-Ne laser (632.8 nm) which have a smaller energy than the optical energy gap, $E_g\;_{opt}$ of the film, i. e., an exposure of sub-bandgap light $(h{\upsilon} under P-polarization. As the results, we found that the diffraction efficiency on $As_{40}Ge_{10}Se_{15}S_{35}/Ag$ double layer structure thin film was more higher than that on single $As_{40}Ge_{10}Se_{15}S_{35}$ thin film. Also, we obtained that the maximum diffraction efficiency was 0.27 %, 1,000 sec on $As_{40}Ge_{10}Se_{15}S_{35}\;(1{\mu}m)/Ag$ (10 nm) double layer structure thin film by (P: P) polarized recording beam. It will offer lots of information for the photodoping mechanism and the analyses of chalcogenide thin films.

Improvement of Photocatalytic Performance using Near-Infrared Upconversion Nanoparticles (근적외선 업컨버전 나노입자를 이용한 광촉매 성능 향상)

  • Park, Yong Il
    • Applied Chemistry for Engineering
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    • v.32 no.2
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    • pp.125-131
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    • 2021
  • Semiconductor-based photocatalysts can only be activated with ultraviolet or visible light due to their intrinsic bandgap, and they cannot use the energy in the near-infrared region, which accounts for about 50% of solar energy. Therefore, in order to improve the performance of the semiconductor photocatalyst, it is necessary to utilize more solar energy in a broad band ranging from ultraviolet to near-infrared. Combining upconversion nanoparticles with semiconductor photocatalysts for near-infrared absorption have thus been reported. Upconversion nanoparticles can sequentially absorb multiple near-infrared photons and convert them into ultraviolet or visible to activate photocatalysts. In addition, by coupling the semiconductor photocatalyst and the upconversion nanoparticles with the plasmonic metal nanoparticles, the photocatalytic activity can be further improved. This review summarizes the recent studies on improving the photocatalytic performance with near-infrared absorption by using upconversion nanoparticles.

Electrical Doping of Graphene Films by Hybridization of Nickel Nanoparticles

  • Lee, Su-Il;Song, U-Seok;Kim, Yu-Seok;Cha, Myeong-Jun;Jeong, Dae-Seong;Jeong, Min-Uk;Jeon, Cheol-Ho;Park, Jong-Yun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.08a
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    • pp.403-403
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    • 2012
  • 그래핀(graphene)은 우수한 전기적, 물리적인 특성을 지닌 물질로써 다양한 분야에서 이를 활용하려는 노력들이 활발히 진행되고 있다. 그중 그래핀을 채널로 이용하는 전계효과 트랜지스터(field effect transistor)로의 응용에 있어, 가장 핵심적인 도전과제는 전하농도(carrier concentration)의 제어 및 에너지 밴드갭(energy bandgap) 형성이라 할수 있다. 최근 다양한 물질을 이용한 도핑을 통해 이를 해결하기 위한 노력들이 진행되고 있는 추세이다. 본 연구에서는 열화학 기상 증착법(Thermal chemical vapor deposition)을 통해 합성된 단일층의 그래핀에 염화니켈 나노입자의 분산액을 스핀코팅 한후 열처리를 통해 그래핀-니켈 나노입자의 하이브리드 구조를 제작하였다. 제작된 그래핀-니켈 나노입자 하이브리드 물질의 구조적 특징을 주사 전자 현미경(Scanning electron microscope)과 원자힘 현미경(Atomic force microscopy)을 통하여 확인하였다. 또한 니켈 분산액의 농도와 도핑효과 와의 상관관계를 라만분광법(Raman spectroscopy)과 이온성 용액법(Ionic liquid)을 이용한 전계효과 특성분석을 통해 조사하였다. 나노입자의 형성 메커니즘은 X-선 광전자 분광법(X-ray photoelectron spectroscopy)을 통하여 규명하였다.

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Synthesis and Photovoltaic Performance of Long Wavelength Absorption Dyes for the Dye Sensitized Solar Cell (장 파장 대 태양광을 흡수하는 염료감응형태양전지에 대한 염료와 합성)

  • Kim, Sangah;Yoon, Jooyoung;Kim, Jaehong
    • 한국신재생에너지학회:학술대회논문집
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    • 2010.06a
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    • pp.89.2-89.2
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    • 2010
  • The dye-sensitized solar cell (DSSC) is a device for the conversion of visible light into electricity, based on the sensitization of wide bandgap semiconductors. The performance of the cell mainly depends on a dye used as sensitizer. The absorption spectrum of the dye and the anchorage of the dye to the surface of $TiO_2$ are important parameters determining the efficiency of the cell. Generally, transition metal coordination compounds(ruthenium polypyridyl complexes) are used as the effective sensitizers, due to their intense charge-transfer absorption in the whole visible range and highly efficient metal-to ligand charge transfer. However, ruthenium polypyridyl complexes contain a heavy metal, which is undesirable from point of view of the environmental aspects. Moreover, the process to synthesize the complexes is complicated and costly. Alternatively, organic dyes can be used for the same purpose with an acceptable efficiency. The advantages of organic dyes include their availability and low cost. We designed and synthesized a series of organic sensitizers containing long wavelength absorption-chromophores for the dye sensitized solar cell. The DSSC composed of Blue-chromophores for the sensitization absorbed long wavelength region which is different also applied into the dye-cocktail (mixing) system. The photovoltaic property of DSSCs organic long wavelength absorption-chromophores were measured and evaluated by comparison with that of individual chromophores.

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Design fabrication and characteristics of 3C-SiC micro heaters for high temperature, high powers (고온, 고전압용 SiC 마이크로 히터 설계, 제작 및 특성)

  • Jeong, Jae-Min;Chung, Gwiy-Sang
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.11a
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    • pp.113-113
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    • 2009
  • This paper describes the characteristics of a poly 3C-SiC micro heater which was fabricated on $AlN(0.1{\mu}m)/3C-SiC(1.0{\mu}m)$ suspended membranes by surface micro- machining technology. The 3C-SiC and AlN thin films which have wide energy bandgap and very low lattice mismatch were used sensors for high temperature and voltage environments. The 3C-SiC thin film was used as micro heaters and temperature sensor materials simultaneously. The implemented 3C-SiC RTD (resistance of temperature detector) and the power consumption of micro heaters were measured and calculated. The TCR (thermal coefficient of the resistance) of 3C-SiC RTD is about -5200 $ppm/^{\circ}C$ within a temperature range from $25^{\circ}C$ to $50^{\circ}C$ and -1040 $ppm/^{\circ}C$ at $500^{\circ}C$. The micro heater generates the heat about $500^{\circ}C$ at 10.3 mW. Moreover, durability of 3C-SiC micro heaters in high voltages is better than pt micro heaters. A thermal distribution measured and simulated by IR thermovision and COMSOL is uniform on the membrane surface.

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RF-Magnetron sputtering법을 이용한 ZnO buffer layer가 ZnO:(Al,P) 박막의 미세구조에 미치는 영향

  • Sin, Seung-Hak;Kim, Jong-Gi;Lee, Jun-Hyeong;Heo, Yeong-U;Kim, Jeong-Ju
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.266.2-266.2
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    • 2016
  • 최근 디스플레이 산업의 확대에 따라 투명 전도 산화물(Transparent Conducting Oxides:TCOs)의 수요가 급증하고 있다. 이 중 ZnO는 wide bandgap (3.37eV)와 large exciton binding energy (60meV)의 값을 가져 차세대 투명 전도 산화물, LED와 LD 등의 소자 소재로 각광받고 있다. ZnO는 electron을 내어놓는 native defect 때문에 기본적으로 n-type 물성을 띈다. 그래서 dopant를 이용해 p-type ZnO를 제작할 때 native defect를 줄이는 것이 중요한 요점이 된다. 이 때 buffer layer를 사용하여 native defect를 줄이는 방법이 사용되고 있다. 본연구에서는 RF-magnetron sputtering법을 이용하여 c-plane sapphire 기판 위에 다양한 조건의 ZnO buffer layer를 증착하고, 그 위에 ZnO:(Al,P) co-doping한 APZO를 증착하였다. ZnO buffer layer 증착조건의 변수는 증착온도와 Ar:O2의 비율을 변수로 두었다. 이러한 박막을 FE-SEM, XRD, Hall effect measurement, AFM을 통하여 미세구조와 물성을 관찰하였다. 이 때 APZO보다 낮은 증착온도에서 ZnO buffer layer가 증착되면 APZO를 증착하는 동안 chamber 내부에서 열처리하는 효과를 얻게 되고, UHV(Ultra High Vaccum)에서 열처리 될 때 ZnO buffer layer의 mophology와 결정성이 변하게 되는 모습을 관찰아혔다. 또한 본 실험을 통해 ZnO buffer layer의 증착 온도가 APZO의 증착온도보다 높을 때 제어 가능한 실험이 됨을 확인 할 수 있었다.

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Study of the Effects of the Antisite Related Defects in Silicon Dioxide of Metal-Oxide-Semiconductor Structure on the Gate Leakage Current

  • Mao, Ling-Feng;Wang, Zi-Ou;Xu, Ming-Zhen;Tan, Chang-Hua
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.8 no.2
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    • pp.164-169
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    • 2008
  • The effects of the antisite related defects on the electronic structure of silica and the gate leakage current have been investigated using first-principles calculations. Energy levels related to the antisite defects in silicon dioxide have been introduced into the bandgap, which are nearly 2.0 eV from the top of the valence band. Combining with the electronic structures calculated from first-principles simulations, tunneling currents through the silica layer with antisite defects have been calculated. The tunneling current calculations show that the hole tunneling currents assisted by the antisite defects will be dominant at low oxide field whereas the electron direct tunneling current will be dominant at high oxide field. With increased thickness of the defect layer, the threshold point where the hole tunneling current assisted by antisite defects in silica is equal to the electron direct tunneling current extends to higher oxide field.