• 한국조명전기설비학회지:조명전기설비
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• 제6권6호
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• pp.23-31
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• 1992

Charged particle in the polymers is supposed to affect the electrical conduction and to lead them th dielectrical breakdown finally. So we measured the space charge distribution made by application of high electric field and evaluated the polarity of the charged particle affected on electrical conduction and space charge formed in the insulating materials by using temperature gradient thermally stimulated current measurement method(TG-TSC measurement). As a result, in the cross-linked polyethylene, A-peak was caused from dipole polarization, C-peak was caused from ionic space charge polarization and D-peak was injected trap hole. Also we found it crossible the evaluated the polarity of injected trap carrier and electron(or hole) of carrier trap in the cross-lined polyethylene. We found that ${\gamma}$-ray irradiated low density polyethylene had a relation to the electronic trap and we also could get the value of electric field distribution in the samples of which evaluation was available.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 춘계학술대회 논문집 센서 박막재료연구회 및 광주 전남지부
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• pp.82-85
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• 2008

Polyimide is widely used as a high-temperature insulating material. Space charge distributions in polyimide (PI) films strongly depend upon electric field, temperature, water content and so on. We observed space charge distributions in PI films with various water contents. When a dc field was applied to as-received PI films or water-treated PI films, positive and negative homo space charges were observed near the respective electrodes at 333 K. In dried PI films, the homo space charges were much reduced, and positive and negative hetero space charges in the bulk were clearly observed. The space charge amounts in water-treated PI films were smaller than in as-received ones, while the current density in water-treated PI film was larger than that in as-received one by two or more orders of magnitude. These suggest not only that the charge injection from the electrode is enhanced by absorbed water but also that absorbed water makes carriers mobile. The decay of space charge was also faster in water-treated PI than in as-received or dried one. This also supports the enhancement of apparent mobilities of carriers in PI by absorbed water.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2007년도 추계학술대회 논문집
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• pp.311-312
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• 2007

Polyimide is widely used as a high-temperature insulating material. Space charge distributions in polyimide (PI) films strongly depend upon electric field, temperature, water content and so on. We observed space charge distributions in PI films with various water contents. When a dc field was applied to as-received PI films or water-treated PI films, positive and negative homo space charges were observed near the respective electrodes at 333 K. In dried PI films, the homo space charges were much reduced, and positive and negative hetero space charges in the bulk were clearly observed. The space charge amounts in water-treated PI films were smaller than in as-received ones, while the current density in water-treated PI film was larger than that in as-received one by two or more orders of magnitude. These suggest not only that the charge injection from the electrode is enhanced by absorbed water but also that absorbed water makes carriers mobile. The decay of space charge was also faster in water-treated PI than in as-received or dried one. This also supports the enhancement of apparent mobilities of carriers in PI by absorbed water.

• Transactions on Electrical and Electronic Materials
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• 제16권3호
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• pp.130-134
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• 2015

This research proposes the use of a composition modulated (ZrO₂)_x(Al₂O₃)_1-x film as a charge trapping layer for charge trap flash memory; this is possible when the Zr (Al) atomic percent is controlled to form a variable bandgap as identified by the valence band offsets and electron energy loss spectrum measurements. Compared to memory devices with uniform compositional (ZrO₂)_0.1(Al₂O₃)_0.9 or a (ZrO₂)_0.92(Al₂O₃)_0.08 trapping layer, the memory device using the composition modulated (ZrO₂)_x(Al₂O₃)_1-x as the charge trapping layer exhibits a larger memory window (6.0 V) at the gate sweeping voltage of ±8 V, improved data retention, and significantly faster program/erase speed. Improvements of the memory characteristics are attributed to the special energy band alignments resulting from non-uniform distribution of elemental composition. These results indicate that the composition modulated (ZrO₂)_x(Al₂O₃)_1-x film is a promising candidate for future nonvolatile memory device applications.

• 전력전자학회:학술대회논문집
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• 전력전자학회 2001년도 Proceedings ICPE 01 2001 International Conference on Power Electronics
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• pp.84-88
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• 2001

In an effort to develop more reliable and cost-effective satellite power system, a multiple-battery subsystem operating in parallel become a viable solution. The idea can further be extended to the parallel-able standardized battery module concept that offers many attractive features in configuring a spacecraft power system. In this paper, Multiple Battery Modules employing the charge control scheme are proposed. In addition to the conventional voltage mode controller, the charge control scheme internally regulates and controls the battery current, resulting in the identical current distribution and balanced battery charge.

• 한국정보통신학회논문지
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• 제19권12호
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• pp.2899-2904
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• 2015

3차원 순차적 집적회로에서 열에 의한 손상으로 생성되는 계면 포획 전하가 트랜지스터의 드레인 전류-게이트 전압 특성에 미치는 영향을 소개한다. 2차원 소자 시뮬레이터를 이용해서 산화막 층에 계면 포획 전자 분포를 추출한 결과를 설명한다. 이 계면 포획 전자분포를 고려한 3차원 순차적 집적회로에서 Inter Layer Dielectric (ILD)의 길이에 따른 하층 트랜지스터의 게이트 전압의 변화에 따라서 상층 트랜지스터의 문턱전압 $V_{th}$의 변화량에 대해서 소개한다. 상대적으로 더 늦은 공정인 상층 $HfO_2$층 보다 하층 $HfO_2$층과 양쪽 $SiO_2$층이 열에 의한 영향을 더 많이 받았다. 계면 포획 전하 밀도 분포를 사용하지 않았을 때 보다 사용 했을 때 $V_{th}$ 변화량이 더 적게 변하는 것을 확인 했다. 3차원 순차적 인버터에서 ILD의 길이가 50nm이하로 짧아질수록 점점 더 $V_{th}$ 변화량이 급격히 증가하였다.

• 한국정보통신학회:학술대회논문집
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• 한국정보통신학회 2012년도 춘계학술대회
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• pp.726-728
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• 2012

본 논문에서는 채널의 두께 변화에 따른 Double Gate MOSFET의 문턱전압특성을 분석 하였다. 채널의 두께는 소자의 크기를 결정할 뿐만 아니라 단채널효과에도 커다란 영향을 미치므로 IC 설계시 매우 중요한 파라미터이다. 그러므로 본 연구에서는 급수형 전하분포를 이용하여 채널두께에 따른 DGMOSFET의 문턱전압을 분석하였으며 이를 통해 채널의 두께가 증가할수록 문턱전압은 감소한다는 결과를 얻었다.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2005년도 International Meeting on Information Displayvol.I
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• pp.167-170
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• 2005

The mechanism of striation in the coplanar- and matrix-type plasma display panel (PDP) cells has been studied using the particle-in-cell Monte-Carlo Collision (PIC-MCC) model. The striation formation is related to the ionization energy of neutral atoms and the well-like deformation of space potential by space charge distribution. Negative wall charge accumulation by electrons on the MgO surface of the anode region is also one of the key factors for the formation of striation. The clearness of the striation phenomenon in PIC-MCC code in comparison with fluid code can be explained by using nonlocal electron kinetic effect.

• JSTS:Journal of Semiconductor Technology and Science
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• 제13권5호
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• pp.530-537
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• 2013

An explicit surface potential calculation method of gate-all-around MOSFET (GAAMOSFET) devices which takes into account both interface trap charge and varying doping levels is presented. The results of the method are extensively verified by numerical simulation. Results from the model are used to find qualitative and quantitative effect of interface trap charge on subthreshold slope (SS) of GAAMOSFET devices. Further, design constraints of GAAMOSFET devices with emphasis on the effect of interface trap charge on device SS performance are investigated.

• E2M - 전기 전자와 첨단 소재
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• 제7권5호
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• pp.376-382
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• 1994

In this study we developed a program(DEVSIM) to simulate the two dimensional distribution of the electrostatic potential and the electric field of the arbitrary structure consisting of GaAs/AlGaAs semiconductor and metal as well as dielectric. By the comparision of the electric field distribution of GaAs MESFETs with the various recess gates we proposed a suitable device structure to improve the breakdown characteristics of MESFET. According to the results of simulation the breakdown characteristics were improved as the thickness of the active epitaxial layer was decreased. And the planar structure, which had the highly doped layer under the drain for the ohmic contact, was the worst because the highly doped layer prevented the space charge layer below the gate from extending to the drain, which produced the narrow spaced distribution of the electrostatic potential contours resulting in the high electric field near the drain end. Instead of the planar structure with the highly doped drain the recess gate structure having the highly doped epitaxial drain layer show the better breakdown characteristics by allowing the extention of the space charge layer to the drain. Especially, the structure in which the part of the drain epitaxial layer near the gate show the more improvement of the breakdown characteristics.