• Title/Summary/Keyword: electron microscopic analysis

Search Result 222, Processing Time 0.031 seconds

Accuracy Improvement of Lattice Parameters Measured from Electron Diffraction Data (전자회절을 이용한 격자상수의 측정 정확도 향상)

  • Lee, Sang-Gil;Song, Kyung;Kim, Jin-Gyu
    • Applied Microscopy
    • /
    • v.41 no.1
    • /
    • pp.75-79
    • /
    • 2011
  • For quantitative analysis of nano-crystal structure, we reported the accuracy improvement method of lattice parameters measured from electron diffraction. For calculation of Au lattice parameters used as a standard crystal structure, it was considered two different acquisition methods (detector and enegy-filter) and three different calculation methods (conventional, least-square and regression fit). As a result, the measurement reliability could be enhanced by using CCD camera which gives higher performance, while energy-filtering did not affect the improvement the camera constant accuracy. Also, the accuracy of lattice parameters could be improved up to $10^{-4}$ order by regression fitting with correction formula. Finally, it is expected that the combination of regression fitting and intensity extraction from energy-filtered precession electron diffraction gives a solution of quantitative structure analysis for unknown nano-crystals.

Circular Fast Fourier Transform Application: A Useful Script for Fast Fourier Transform Data Analysis of High-resolution Transmission Electron Microscopy Image

  • Kim, Jin-Gyu;Yoo, Seung Jo;Kim, Chang-Yeon;Jou, Hyeong-Tae
    • Applied Microscopy
    • /
    • v.44 no.4
    • /
    • pp.138-143
    • /
    • 2014
  • Transmission electron microscope (TEM) is an excellent tool for studying the structure and properties of nanostructured materials. As the development of $C_s$-corrected TEM, the direct analysis of atomic structures of nanostructured materials can be performed in the high-resolution transmission electron microscopy (HRTEM). Especially, fast Fourier transform (FFT) technique in image processing is very useful way to determine the crystal structure of HRTEM images in reciprocal space. To apply FFT technique in HRTEM analysis in more reasonable and friendly manner, we made a new circular region of interest (C-ROI) FFT script and tested it for several HRTEM analysis. Consequentially, it was proved that the new FFT application shows more quantitative and clearer results than conventional FFT script by removing the streaky artifacts in FFT pattern images. Finally, it is expected that the new FFT script gives great advantages for quantitative interpretation of HRTEM images of many nanostructured materials.

Objective Aperture Effects for the Quantitative Analysis in Electron Tomography (전자토모그래피의 정량적 분석에서 대물렌즈 조리개의 영향)

  • Kim, Jin-Gyu;Lee, Sang-Hee;Kweon, Hee-Seok;Jeong, Jong-Man;Jeong, Won-Gu;Lee, Su-Jeong;Jou, Hyeong-Tae;Kim, Youn-Joong
    • Applied Microscopy
    • /
    • v.38 no.4
    • /
    • pp.285-291
    • /
    • 2008
  • We have evaluated the effects of experimental factors on transmitted electron beam intensities for quantitative analysis in electron tomography. For the correct application of Beer's law in electron tomography, the transmitted beam intensity should reflect the net effect of mass properties on beam path. So, the any other effects of the objective aperture and the specimen holder on beam path should be removed. The cut-off effects of objective aperture were examined using Quanti-foil holey carbon film and a transmission electron microscope operated at 120 kV. The transmitted beam intensities with $30{\mu}m$ objective aperture dropped about 16.7% compared to electron beam intensities without the objective aperture. Also, the additional losses of about 14.2% at high tilt angles were occurred by cut-off effects of the objective apertures. For the precise quantitative analysis in electron tomography, the effect of the objective aperture on transmitted electron beam intensities should be considered. It is desirable that 2-D tilt series images are obtained without the objective aperture for correct application of Bee's law.

A Glance of Electron Tomography through 4th International Congress on Electron Tomography (International Congress on Electron Tomography에 대한 간략한 이해와 현황)

  • Rhyu, Im-Joo;Park, Seung-Nam
    • Applied Microscopy
    • /
    • v.38 no.3
    • /
    • pp.275-278
    • /
    • 2008
  • Electron tomography (ET) is an electron microscopic technique for obtaining a 3-D image from any electron microscopy specimen and its application in biomedical science has been increased thanks to development of electron microscopy and related technologies during the last decade. There are few researches on ET in Korea during this period. Although the importance of ET has been recognized recently by many researchers, initial approach to electron tomographic research is not easy for beginners. The 4th International Congress on Electron Tomography (4 ICET) was held on Nov $5{\sim}8$, 2006, at San Diego. The program dealt instrumentation, reconstruction algorithm, visualization/quantitative analysis and electron tomographic presentation of biological specimen and nano particles. 1 have summarized oral presentations and analyzed the posters presented on the meeting. Cryo-electron microscopic system was popular system for ET and followed conventional transmission electron microscopic system. Cultured cell line and tissue were most popular specimens analyzed and microorganisms including bacteria and virus also constituted important specimens. This analysis provides a current state of art in ET research and a guide line for practical application of ET and further research strategies.

Three-Dimensional Automated Crystal Orientation and Phase Mapping Analysis of Epitaxially Grown Thin Film Interfaces by Using Transmission Electron Microscopy

  • Kim, Chang-Yeon;Lee, Ji-Hyun;Yoo, Seung Jo;Lee, Seok-Hoon;Kim, Jin-Gyu
    • Applied Microscopy
    • /
    • v.45 no.3
    • /
    • pp.183-188
    • /
    • 2015
  • Due to the miniaturization of semiconductor devices, their crystal structure on the nanoscale must be analyzed. However, scanning electron microscope-electron backscatter diffraction (EBSD) has a limitation of resolution in nanoscale and high-resolution electron microscopy (HREM) can be used to analyze restrictive local structural information. In this study, three-dimensional (3D) automated crystal orientation and phase mapping using transmission electron microscopy (TEM) (3D TEM-EBSD) was used to identify the crystal structure relationship between an epitaxially grown CdS interfacial layer and a $Cu(In_xGa_{x-1})Se_2$ (CIGS) solar cell layer. The 3D TEM-EBSD technique clearly defined the crystal orientation and phase of the epitaxially grown layers, making it useful for establishing the growth mechanism of functional nano-materials.

Reliability Test of the TEM Rotation Holder for 3-D Structure Analysis (3차원적 구조분석을 위한 TEM Rotation Holder의 신뢰도 점검)

  • Kim, Jin-Gyu;Jeong, Jong-Man;Kim, Young-Min;Kim, Youn-Joong
    • Applied Microscopy
    • /
    • v.36 no.3
    • /
    • pp.209-216
    • /
    • 2006
  • Accuracy and precision of the goniometer and the specimen holder should be measured and corrected to improve reliability of 3-D structure analysis using transmission electron microscopy (TEM). In this study, we described the operation principle and performance of the Gatan rotation holder. Through analysis of the images taken inside the microscope, rotation angles were measured within the accuracy of ${\pm}0.42^{\circ}$. For comparison the rotation angles were measured outside the microscope using a home-made measurement tool, which resulted in the accuracy of ${\pm}0.6^{\circ}$. Additionally, we found abnormal specimen drifts during rotation probably due to the unstable engagement between the specimen cup and the rotation belt.

Rietveld Analysis of Nano-crystalline MnFe2O4 with Electron Powder Diffraction

  • Kim, Jin-Gyu;Seo, Jung-Wook;Cheon, Jin-Woo;Kim, Youn-Joong
    • Bulletin of the Korean Chemical Society
    • /
    • v.30 no.1
    • /
    • pp.183-187
    • /
    • 2009
  • The structure of nano-crystalline $MnFe_2O_4$ was determined and refined with electron powder diffraction data employing the Rietveld refinement technique. A nano-crystalline sample (with average crystal size of about 10.9 nm) was characterized by selected area electron diffraction in an energy-filtering transmission electron microscope operated at 120 kV. All reflection intensities were extracted from a digitized image plate using the program ELD and then used in the course of structure refinements employing the program FULLPROF for the Rietveld analysis. The final structure was refined in space group Fd-3m (# 227) with lattice parameters a=8.3413(7) $\AA$. The reliability factors of the refinement are $R_F$=7.98% and $R_B$=3.55%. Comparison of crystallographic data between electron powder diffraction data and reference data resulted in better agreement with ICSD-56121 rather than with ICSD-28517 which assumes an initial structure model.

Development of Multi-sample Loading Device for TEM Characterization of Hydroxyapatite Nanopowder

  • Lee, Jong-Moon;Kim, Jung-Kyun;Jeong, Jong-Man;Kim, Jin-Gyu;Lee, Eunji;Kim, Youn-Joong
    • Bulletin of the Korean Chemical Society
    • /
    • v.34 no.3
    • /
    • pp.788-792
    • /
    • 2013
  • A shortcoming of using transmission electron microscopy (TEM) for structural analysis via electron diffraction is the relatively large error of the measurements as compared to X-ray diffraction. To reduce these errors, various internal standard methods from earlier studies have been widely used. We developed a new device to facilitate the application of internal standard methods in preparation of TEM grids used for nanopowder analysis. Through the application of a partial mask on the TEM grid, both the internal standards and the research materials can be loaded on the same grid. Through this process, we conducted a TEM analysis that compared synthetic hydroxyapatite (HAp) nanopowder to bone apatite from a bovine femur. We determined that the accuracy of the d-spacing measurements of the HAp and bone powders could be improved to better than 1% after statistical treatments of the experimental data. By applying a quarter mask, we loaded four different nanoparticles on a single TEM grid, with one section designated for the internal standard.

Determination of Absorbed Dose for Gafchromic EBT3 Film Using Texture Analysis of Scanning Electron Microscopy Images: A Feasibility Study

  • So-Yeon Park
    • Progress in Medical Physics
    • /
    • v.33 no.4
    • /
    • pp.158-163
    • /
    • 2022
  • Purpose: We subjected scanning electron microscopic (SEM) images of the active layer of EBT3 film to texture analysis to determine the dose-response curve. Methods: Uncoated Gafchromic EBT3 films were prepared for direct surface SEM scanning. Absorbed doses of 0-20 Gy were delivered to the film's surface using a 6 MV TrueBeam STx photon beam. The film's surface was scanned using a SEM under 100× and 3,000× magnification. Four textural features (Homogeneity, Correlation, Contrast, and Energy) were calculated based on the gray level co-occurrence matrix (GLCM) using the SEM images corresponding to each dose. We used R-square to evaluate the linear relationship between delivered doses and textural features of the film's surface. Results: Correlation resulted in higher linearity and dose-response curve sensitivity than Homogeneity, Contrast, or Energy. The R-square value was 0.964 for correlation using 3,000× magnified SEM images with 9-pixel offsets. Dose verification was used to determine the difference between the prescribed and measured doses for 0, 5, 10, 15, and 20 Gy as 0.09, 1.96, -2.29, 0.17, and 0.08 Gy, respectively. Conclusions: Texture analysis can be used to accurately convert microscopic structural changes to the EBT3 film's surface into absorbed doses. Our proposed method is feasible and may improve the accuracy of film dosimetry used to protect patients from excess radiation exposure.

Heterocyclic Nonlinear Optical Chromophores Composed of Phenothiazine or Carbazole Donor and 2-Cyanomethylene-3-cyano-4,5,5-trimethyl-2,5-dihydrofuran Acceptor

  • Cho, Min-Ju;Kim, Ja-Youn;Kim, Jae-Hong;Lee, Seung-Hwan;Dalton, Larry R.;Choi, Dong-Hoon
    • Bulletin of the Korean Chemical Society
    • /
    • v.26 no.1
    • /
    • pp.77-84
    • /
    • 2005
  • We prepared the new nonlinear optical chromophores that show fairly high microscopic nonlinearity through intramolecular charge transfer. Phenothiazine and carbazole units played an important role to contribute high electron donability and connect the resonance pathway via conjugative effect in the cyclized ring beside the aromatic ring. Theoretical calculation, electrochemical analysis, and absorption spectroscopic study gave us useful information about the energy states and microscopic nonlinearities of two serial chromophores. We compared the microscopic nonlinearities of four chromophores with the conjugation length and electron donability in the push-pull type NLO chromophores. The effect of gradient donability and lengthening the conjugation were investigated on the electronic state and microscopic nonlinearity.