• Title/Summary/Keyword: electron beam

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PLS-II separator the vacuum electron gun beam current emission test (PLS-II 전자총 진공이원화와 빔 전류 인출시험)

  • Son, Yoon-Kyoo
    • Proceedings of the KIEE Conference
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    • 2011.07a
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    • pp.1580-1581
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    • 2011
  • The linear accelerator of Pohang Accelerator Laboratory(PAL) will drive a top-up mode operation in PLS-II(Pohang Light Source-II). Due to this kind of the operation mode, the electron gun is expected to have shorter life time of the cathode. Further in the PLS-II, two gate valves will be installed in front of the electron gun. The distance between the pre-bunching section and the electron gun will increase by 400 mm compared to the existing system due to the insertion of these gate valves. As a result the incident electron beam. One of the goals to improve the beam pulse width is by incorporating suitable biased voltage. In this paper, we will present test results of beam pulse width as a function of different biased voltage and focusing solenoid coil.

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The simulation on dose distributions of high energy electron beams. (고에너지 전자선의 선량분포에 관한 모의계산)

  • Lee, Jeong-Ok;Kim, Seung-Kon
    • Journal of radiological science and technology
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    • v.25 no.1
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    • pp.83-88
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    • 2002
  • This work was peformed as a basic research in the application of Monte Carlo methods for planning treatments by electron beams. Depth doses, beam profiles and isodose curves in water phantoms were calculated for monoenergetic electron beams with 6, 9, and 12 MeV. The calculated depth doses and beam profiles are almost consistent with their known values. If allowances are made for distributions in electron beam energies, we are confident that the agreement between our calculations and measured values will significantly improve. In conclusion, our work shows that similar Monte Carlo calculations could be applied for geometries In human body in planning electron beam treatments.

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Electron Emission Mechanism in the Surface Conduction Electron Emitter Displays

  • Cho, Guang-Sup;Choi, Eun-Ha;Kim, Young-Guon;Kim, Dai-Il
    • 한국정보디스플레이학회:학술대회논문집
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    • 2000.01a
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    • pp.139-140
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    • 2000
  • The origin of the display current in the surface conduction electron emitter displays has been verified in the calculation of the electron trajectory. Some electrons move directly toward the display surface as an anode current which is generated due to the inertial force of electron motion along the curved electric field lines with a small curvature near the fissure area..

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Finite Element Analysis for Electron Optical System of a Thermionic SEM (열전자방사형 주사전자 현미경 전자광학계의 유한요소해석)

  • Park, Keun;Jung, Huen-U.;Kim, Dong-Hwan;Jang, Dong-Young
    • Proceedings of the KSME Conference
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    • 2007.05a
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    • pp.1288-1293
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    • 2007
  • The present study covers the design and analysis of a thermionic scanning electron microscope (SEM) column. The SEM column contains an electron optical system in which electrons are emitted and moved to form a focused beam, and this generates secondary electrons from the specimen surfaces, eventually making an image. The electron optical system mainly consists of a thermionic electron gun as the beam source, the lens system, the electron control unit, and the vacuum unit. In the design process, the dimension and capacity of the SEM components need to be optimally determined with the aid of finite element analyses. Considering the geometry of the filament, a three-dimensional (3D) finite element analysis is utilized. Through the analysis, the beam emission characteristics and relevant trajectories are predicted from which a systematic design of the electron optical system is enabled. The validity of the proposed 3D analysis is also discussed by comparing the directional beam spot radius. As a result, a prototype of a thermionic SEM is successfully developed with a relatively short time and low investment costs, which proves the adoptability of the proposed 3D analysis.

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Sterilizing Effect of Electron Beam on Ginseng Powders (Electron Beam 조사에 의한 인삼분말의 살균효과)

  • Lee, Mi-Kyung;Lee, Moo-Ha;Kwon, Joong-Ho
    • Korean Journal of Food Science and Technology
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    • v.30 no.6
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    • pp.1362-1366
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    • 1998
  • The sterilizing effect of electron beam was compared with that of gamma irradiation for commercial ginseng powders. White and red ginseng powders were contaminated by about $10^5\;CFU/g$ of total bacteria and by $10^3\;CFU$ of coliforms only in white ginseng powder. Data of microbial population for the sterilizing effect of electron beam irradiation showed that no microorganisms were detected in the samples irradiated up to 7.5 kGy for total aerobic bacteria and 2.5 kGy for molds and coliforms. Such doses were effective for controlling the microbial growth in the samples during 4 months of storage at room temperature. Decimal reduction doses $(D_{10}$ value) on the initial bacterial populations were $2.85{\sim}3.75\;kGy$ in electron beam and $2.33{\sim}2.44\;kGy$ in gamma irradiation, which were influenced by the initial microbial loads and the energy applied. Compared with gamma irradiation, electron beam showed a similar result in its sterilizing effect on ginseng powders, suggesting its potential utilization in due time.

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A Study on the Lead(Pb) Shield Thickness per Electron Beam Energy in Radiotherapy (방사선 치료용 전자선의 에너지별 납(Pb) 차폐체 두께 측정)

  • Gha-Jung, Kim
    • Journal of the Korean Society of Radiology
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    • v.16 no.6
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    • pp.719-725
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    • 2022
  • This study aimed to measure, quantitatively evaluate, and set the criteria for the minimum lead(Pb) shield thickness per level of clinically applied electron beam energy. The lead shield thickness per electron beam energy was measured using the primary field 95% reduction based on the open field at the depth of maximum dose (dmax) and depth from the surface as the reference depth of tissue dose(10 mm). The measured values were 1.906 mmPb and 1.992 mmPb at the dmax and 10 mm, respectively, regarding the lead shield thickness for 6 MeV electron beam; 2.746 mmPb and 3.743 mmPb for 9 MeV electron beam, 3.718 mmPb and 6.093 mmPb for 12 MeV electron beam, 7.300 mmPb and 15.270 mmPb for 16 MeV electron beam, and 16.825 mmPb and 25.090 mmPb for 20 MeV electron beam. Consequently, a thicker lead shield was required if the measurement was at 10 mm. The required lead shield thickness was also higher than that of the theoretical formula for electron beams of ≥ 16 MeV.

Influence of surface geometrical structures on the secondary electron emission coefficient $({\gamma})$ of MgO protective layer

  • Park, W.B.;Lim, J.Y.;Oh, J.S.;Jeong, H.S.;Jeong, J.C.;Kim, S.B.;Cho, I.R.;Cho, J.W.;Kang, S.O.;Choi, E.H.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.806-809
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    • 2003
  • Ion-induced secondary electron emission coefficient $({\gamma})$. of the patterned MgO thin film with geometrical structures has been measured by ${\gamma}$ - FIB(focused ion beam) system. The patterned MgO thin film with geometrical structures has been formed by the mask (mesh of ${\sim}$ $10{\mu}m^{2})$ under electron beam evaporation method. It is found that the higher ${\gamma}$. has been achieved by the patterned MgO thin film than the normal ones without patterning.

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