• Proceedings of the KSME Conference
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• 2008.11a
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• pp.1963-1966
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• 2008

We fabricate and evaluate the metal-oxide-semiconductor (MOS) transistor probe with the focused-ionbeam (FIB) for surface electric properties. The probes are designed with the rectangular and V-shaped structures, and their dimensions are determined considering the contact mode operation. The conductive nano tip is grown with FIB system, and deposition condition is controlled for the sharp tip. The fabricated device is applied to the various test patterns like the metal lines and PZT poling regions, and the results show the well defined measurement patterns.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.52 no.8
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• pp.365-370
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• 2003

This research aims to develop an indicator-free DNA chip using micro-fabrication technology. At first, we fabricated a DNA microarray by lithography technology. Several probe DNAs consisting of thiol group at their 5-end were immobilized on the gold electrodes. Then indicator-free target DNA was hybridized by an electrical force and measured electrochemically in potassium ferricyanide solution. Redox peak of cyclic-voltammogram showed a difference between target DNA and mismatched DNA in an anodic peak current. Therefore, it is able to detect various genes electrochemically after immobilization of various probe DNAs and hybridization of indicator-free DNA on the electrodes simultaneously It suggested that this DNA chip could recognize the sequence specific genes.

• Journal of Electrical Engineering and Technology
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• v.6 no.1
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• pp.111-118
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• 2011

In recent years, various types of partial discharge (PD) methods such as capacitive, inductive, electromagnetic, and acoustic coupling techniques have been developed for diagnosing rotating machines. An electromagnetic (EM) probe, which is an inductively coupled type of sensor, is required for detecting corona and internal discharges during off-line tests. In this study, a new technique for enhancing the measurement sensitivities for corona and internal discharge based on an EM inductive position sensor is proposed. An EM probe that winds wires around horseshoe-shaped and cylindershaped ferrites as helices is designed and optimized for the implementation of off-line PD monitoring of the stator winding of a rotating machine. The measurement system based on this design is implemented, and it is verified from the results of the experiment performed in this study that the probe provides similar performance as existing commercial products.

• Proceedings of the KIEE Conference
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• 2009.07a
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• pp.1479_1480
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• 2009

부분방전시험은 고전압 고정자 권선의 절연상태를 검사, 평가 할 수 있는 중요한 수단이다. 전동기와 발전기에서 일어나는 절연 악화의 징후로써 부분방전이 발생되며 이러한 부분방전 결함의 정확한 위치 확인이 필요하다. 본 논문에서는 회전기 고정자권선의 결함위치를 판정하기위한 Prototype의 코로나 프로브를 설계하고자 Ferrite core를 이용한 Corona Probe를 제작하였으며 모의 결함을 가지는 6.6[kV] 회전기 고정자권선에 적용하여 부분방전펄스를 측정 하였으며 설계된 Probe의 신뢰성을 확인하고자 상용 HFCT센서와 PPM97(Corona Probe)센서를 통하여 검출감도를 비교분석하였다.

• Applied Microscopy
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• v.46 no.3
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• pp.127-133
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• 2016

Atom probe tomography is a time-of-flight mass spectrometry-based microanalysis technique based on the field evaporation of surface atoms of a tip-shaped specimen under an extremely high surface electric field. It enables three-dimensional characterization for deeper understanding of chemical nature in conductive materials at nanometer/atomic level, because of its high depth and spatial resolutions and ppm-level sensitivity. Indeed, the technique has been widely used to investigate the elemental partitioning in the complex microstructures, the segregation of solute atoms to the boundaries, interfaces, and dislocations as well as following of the evolution of precipitation staring from the early stage of cluster formation to the final stage of the equilibrium precipitates. The current review article aims at giving a comment to first atom probe users regarding the limitation of the techniques, providing a brief perspective on how we correctly interprets atom probe data for targeted applications.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.24 no.6
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• pp.647-652
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• 2015

A probe pin is a key component of LED inspection equipment. The probe pin makes contact with the LED electrodes and supplies an electric current. Because the mechanical and electrical homogeneity of the probe surface affects the service life and reliability, its characterization is essential. For this study, the hardness was measured using a micro-Vickers hardness test. Moreover, the thicknesses of the plating at different locations and the elemental compositions were examined using an FE-SEM. The uniformity of the plating was found to be acceptable because palladium was detected consistently throughout the tested domain. In addition, the hardness of the surface was determined to be higher than that of the typical palladium range, which is attributed to the use of undercoated nickel.

• Proceedings of the Korea Electromagnetic Engineering Society Conference
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• 2002.11a
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• pp.361-365
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• 2002

Three types of the coupling structures in combline resonators are presented: magnetic, electric, and mixed coupling structures. The magnetic coupling structure is provided by the window, and the electric coupling is provided by the electric probe. The mixed coupling structure which is the superposition of the magnetic and electric coupling structures, is proposed for the electric coupling in combline resonators with easy tuning capability. The responses of each coupling structure are shown. A 4-pole combline filter is designed and fabricated as an application of those coupling structures, and shows good filter responses.

• Proceedings of the Korean Nuclear Society Conference
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• 1995.10a
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• pp.450-455
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• 1995

A three-dimensional numerical tool is developed to calculate the potential distribution, electric field, and conductance for any types of conductance probes immersed in the wavy liquid film with various shapes of its free surface. The tool is validated against various analytical solutions. It is applied to find out the characteristics of the wire-wire probe, the flush-wire probe and the flush-flush probe in terms of resolution, linearity, and sensitivity. The wire-wire probe shows high resolution and excellent linearity for various film thickness, but comparably low sensitivity for low film thickness fixed. The flush-wire probe shows good linearity and high sensitivity for varying film thickness, but resolution degrading with an increase in film thickness. In order to check the applicability of the three types of probes in the real situation, the Korteweg-de Vries(KdV) two-dimensional solitary wave is simulated. The wire-wire probe is strongly affected by the installation direction of the two wires; when the wires are installed perpendicularly to the flow direction, the wire-wire probe shows large distortion of the solitary wave. In order to measure the transverse profile of waves, the wire-wire probes and the flush-wire probes are required to be separately installed 2mm and 2mm, respectively.

• Proceedings of the KIEE Conference
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• 2005.07b
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• pp.975-977
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• 2005

The generator on-line diagnosis system has been developed. This system monitor the insulation condition of stator winding by on-line measurements of partial discharge and the shorted-turn condition of rotor winding by on-line measurements of slot leakage flux. Sensor, such as SSC(Stator Slot Coupler) and flux probe are used for generator on-line diagnosis.

• Korean Journal of Optics and Photonics
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• v.8 no.2
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• pp.161-164
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• 1997

A new hybrid, heterodyne, fiber-optic electric field sensor scheme is presented. In this scheme, a dual polarization, dual frequency, stabilized He-Ne laser is used for the light source of the interferometer, Probe beam is delivered to the sensor head using polarization maintaining fiber. In the sensor head, $LiTaO_3$ electro-optic crystal is used for sensing element. Phase retardation is induced on the dual frquency, dual polarization probe beam due to applied electric field across the crystal. Induced phase retardation is demodulated by in-phase and quadrature demodulation technique. In this way, we can obtain optimum sensitivity for electric field measurement regardless a quasi-static phase difference between two polarization components.