• 제목/요약/키워드: dielectric test

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Influence of Defects on Electrical Characteristics of Distributing Cable Termination (배전급 케이블 종단부의 결점이 전기적 특성에 미치는 영향)

  • Kim, Sang-Hyun;Choi, Jae-Hyeong;Choi, Jin-Wook;Kim, Young-Seok;Kim, Sun-Gu;Baek, Seung-Myeong
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.23 no.2
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    • pp.190-195
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    • 2009
  • This paper introduces experimental investigates of an electrical accident of the distributing cable termination with simulated a shoddy construction. We prepared two termination kites, one is built-in type, the other is heat contraction type. Also, we manufactured cable termination that have simulated defect by badness construction and investigated their insulation characteristics such as ac (35[kV], 1[min]) and impulse (95[kV], $1.2{\times}50[{\mu}s]$) withstand test. The influence of defects such as thickness decrease, the gap between stress-con of housing and semiconductor and heating time on insulating properties of the termination have been studied. The thickness decrease of an insulator decreases ac breakdown strength suddenly and the breakdown traces of the insulator that is damaged by knife displayed elliptic shape. The gap of between stress-con and semiconductor deteriorates dielectric strength of insulator seriously. In heat contraction type, the ac breakdown voltage became low when the heating time is short.

Design of Microstrip Defected Ground Structure-based Sensor with Enhanced-Sensitivity for Permittivity Measurement (유전율 측정을 위한 고감도 마이크로스트립 결함 접지 구조 기반 센서 설계)

  • Yeo, Junho;Lee, Jong-Ig
    • Journal of Advanced Navigation Technology
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    • v.23 no.1
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    • pp.69-76
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    • 2019
  • In this paper, a design method for an enhanced-sensitivity microwave sensor based on microstrip defected ground structure was studied for the permittivity measurement of planar dielectric substrates. The proposed sensor was designed by modifying the ridge structure of an H-shaped aperture into the shape of a capacitor symbol. The sensitivity of the proposed sensor was compared with that of a conventional sensor based on a double-ring complementary split ring resonator(DR-CSRR). Two sensors were designed and fabricated on a 0.76-mm-thick RF-35 substrate so that the transmission coefficient would resonate at 1.5 GHz in the absence of the substrate under test. Five types of taconic substrates with a relative permittivity ranging from 2.17 to 10.2 were selected asthe substrate under test. Experiment results show that the sensitivity of the proposed sensor, which is measured by the shift in the resonant frequency of the transmission coefficient, is 1.31 to 1.62 times higher than that of the conventional DR-CSRR-based sensor.

A study on Resin Filling Analysis and Experiment by VAP and VaRTM Processes (VaRTM과 VAP 공정의 수지 충진실험 및 해석에 관한 연구)

  • Dong-Hwan Yoon;Kyeong-Ho Seo;Yu-Jung Kwon;Jin-Ho Choi
    • Composites Research
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    • v.36 no.5
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    • pp.310-314
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    • 2023
  • VaRTM(Vacuum assisted resin transfer molding) and VAP(Vacuum assisted process) processes are a type of RTM(Resin transfer molding) process, and are typical out-of-autoclave (OOA) processes that can manufacture large structures at low cost. In this paper, a resin filling test was conducted to compare the VaRTM and VAP processes, and the filling process and dimensional stability were compared. In addition, an analysis method to simulate the filling process was developed, and a dielectric sensor was used to detect the flow front of the resin, which was compared with the analysis results. From the resin filling test, the total filling time of the composite plate was measured to be 48 minutes for the VAP process and 145 minutes for the VaRTM process, and the filling time by the VAP process was reduced by about 67%. In addition, it was confirmed that the VAP process was superior to the VaRTM process in the thickness control ability and uniformity of the composite plate.

Accelerated Thermal Aging Test for Predicting Lifespan of Urethane-Based Elastomer Potting Compound

  • Min-Jun Gim;Jae-Hyeon Lee;Seok-Hu Bae;Jung-Hwan Yoon;Ju-Ho Yun
    • Elastomers and Composites
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    • v.59 no.2
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    • pp.73-81
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    • 2024
  • In the field of electronic components, the potting material, which is a part of the electronic circuit package, plays a significant role in protecting circuits from the external environment and reducing signal interference among electronic devices during operation. This significantly affects the reliability of the components. Therefore, the accurate prediction and assessment of the lifespan of a material are of paramount importance in the electronics industry. We conducted an accelerated thermal aging evaluation using the Arrhenius technique on elastic potting material developed in-house, focusing on its insulation, waterproofing, and contraction properties. Through a comprehensive analysis of these properties and their interrelations, we confirmed the primary factors influencing molding material failure, as increased hardness is related to aggregation, adhesion, and post-hardening or thermal-aging-induced contraction. Furthermore, when plotting failure times against temperature, we observed that the hardness, adhesive strength, and water absorption rate were the predominant factors up to 120 ℃. Beyond this temperature, the tensile properties were the primary contributing factors. In contrast, the dielectric constant and loss tangent, which are vital for reducing signal interference in electric devices, exhibited positive changes(decreases) with aging and could be excluded as failure factors. Our findings establish valuable correlations between physical properties and techniques for the accurate prediction of failure time, with broad implications for future product lifespans. This study is particularly advantageous for advancing elastic potting materials to satisfy the stringent requirements of reliable environments.

A Study of Failure Mechanism through abnormal AlXOY Layer after pressure Cooker Test for DRAM device (DRAM 소자의 PCT 신뢰성 측정 후 비정상 AlXOY 층 형성에 의해 발생된 불량 연구)

  • Choi, Deuk-Sung;Jeong, Seung-Hyun;Choi, Chae-Hyoung
    • Journal of the Microelectronics and Packaging Society
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    • v.25 no.3
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    • pp.31-36
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    • 2018
  • This research scrutinizes the reason of failure after pressure cooker test (PCT) for DRAM device. We use the physical inspecting tools, such as microscope, SEM and TEM, and finally find the discolor phenomenon, corrosion of Al and delamination of inter-metal dielectric (IMD) in the failed devices after PCT. Furthermore, we discover the abnormal $Al_XO_Y$ layer on Al through the careful additional measurements. To find the reason, we evaluate the effect of package ball size and pinhole in passivation layer. Unfortunately, those aren't related to the problems. We also estimate halide effect of Al. The halogens such like Cl are contained within EMC material. Those result in the slight improving of PCT characteristics but do not perfectly solve the problems. We make a hypothesis of Galvanic corrosion. We can find the residue of Ti at the edge of pad open area. We can see the improving the PCT characteristics by the time split of repair etch. The possible mechanism of the PCT failure can be deduced as such following sequence of reactions. The remained Ti reacts on the pad Al by Galvanic corrosion. The ionized Al is easily react with the $H_2O$ supplied under PCT environment, and finally transfers to the abnormal $Al_XO_Y$ layer.

Influence of Glass Fiber Orientation on the Bi-directional GFRP Characteristics (직교이방향 GFRP 재료 특성에 미치는 유리 섬유방향의 영향)

  • Suh, Jung-Joo;Moon, Duk-Hong
    • Journal of the Korean Society of Fisheries and Ocean Technology
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    • v.21 no.1
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    • pp.75-81
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    • 1985
  • The tensile and dielctric strength of the epoxied resin with bi-directional woven glass fibers with a laminate of two layers(G-10) are studied, and the test parameter is the angle between fiber orientation and the tensile axis. The obtained results may be summaried as follows: 1) when the angle between fiber orientation and tensile axis was varied from 0$^{\circ}$ to 45$^{\circ}$ the yield and fracture stresses have a tendency to decrease with increase in the angle. Especially, the decrease rates in the yield and fracture stresses are changed remarkably in the range of 0$^{\circ}$ to 15$^{\circ}$. 2) The fracture strain has showed the maximum value when the angle between fiber orientation and tensile axis is 45$^{\circ}$, and showed the rapid rate of change from 15$^{\circ}$ to 45$^{\circ}$. 3) For the sample with same angle between fiber orientation and tensile axis the maximum dielectric strength under compressive stress is decreased with increase in tensile stress, when the compressive stress is increased as a parameter of tensile stress. 4) When the angle between fiber orientation and tensile axis is 45$^{\circ}$, the dielectric strength showed the worst value, as the mechanical strength did.

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Geophysical Imaging of Alluvial Water Table and the underlying Layers of Weathered and Soft Rocks (충적층 지하수면 및 그 하부의 풍화암/연암의 경계면 파악을 위한 복합 지구물리탐사)

  • Ju, Hyeon-Tae;Lee, Chul-Hee;Kim, Ji-Soo
    • The Journal of Engineering Geology
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    • v.25 no.3
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    • pp.349-356
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    • 2015
  • Although geophysical methods are useful and generally provide valuable information about the subsurface, it is important to recognize their limitations. A common limitation is the lack of sufficient contrast in physical properties between different layers. Thus, multiple methods are commonly used to best constrain the physical properties of different layers and interpret each section individually. Ground penetrating radar (GPR) and shallow seismic reflection (SSR) methods, used for shallow and very shallow subsurface imaging, respond to dielectric and velocity contrasts between layers, respectively. In this study, we merged GPR and SSR data from a test site within the Cheongui granitic mass, where the water table is ~3 m deep all year. We interpreted the data in combination with field observations and existing data from drill cores and well logs. GPR and SSR reflections from the tops of the sand layer, water table, and weathered and soft rocks are successfully mapped in a single section, and they correlate well with electrical resistivity data and SPS (suspension PS) well-logging profiles. In addition, subsurface interfaces in the integrated section correlate well with S-wave velocity structures from multi-channel analysis shear wave (MASW) data, a method that was recently developed to enhance lateral resolution on the basis of CMP (common midpoint) cross-correlation (CMPCC) analysis.

Fabrication of Stress-balanced $Si_{3}N_{4}/SiO_{2}/Si_{3}N_{4}$ Dielectric Membrane (스트레스균형이 이루어진 $Si_{3}N_{4}/SiO_{2}/Si_{3}N_{4}$ 유전체 멤브레인의 제작)

  • Kim, Myung-Gyoo;Park, Dong-Soo;Kim, Chang-Won;Kim, Jin-Sup;Lee, Jung-Hee;Lee, Jong-Hyun;Sohn, Byung-Ki
    • Journal of Sensor Science and Technology
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    • v.4 no.3
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    • pp.51-59
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    • 1995
  • Stress-balanced flat 150 nm-$Si_{3}N_{4}$/300 nm-$SiO_{2}$/150 nm-$Si_{3}N_{4}$ dielectric membrane on silicon substrate has been fabricated. Analyses of stress-deflection and stress-temperature, and visual inspection for the strain diagnostic test patterns were performed in order to characterize stress properties of the membrane. The $SiO_{2}$ layers sandwiched between two $Si_{3}N_{4}$ layers were deposited by three different techniques(PECVD, LPCVD, and APCVD) for the purpose of investigating the dependence of stress on the deposition methods. Some extent of tensile stress in the membrane was always observed regardless of the deposition methods, however it could be balanced against silicon substrate by post-wet oxidation in $1,150^{\circ}C$. Stress-temperature characteristics of the membranes showed that APCVD-LTO was better as mid-$SiO_{2}$ layer than PECVD - or LPCVD - $SiO_{2}$ when there was no oxidation process.

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Physical Properties of $LiPF_6/PC+EC+DEC$ Electrolyte by the Variation of PC Fraction and Initial Electrochemical Properties of Carbon Anode in the Electrolyte (PC 비율에 따른 $LiPF_6/PC+EC+DEC$ 전해액의 물리적 특성 및 탄소분극과의 초기 전기화학적 특성)

  • Doh Chil-Hoon;Moon Seong-In;Yun Mun-Soo
    • Journal of the Korean Electrochemical Society
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    • v.3 no.4
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    • pp.224-231
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    • 2000
  • The exfoliation of graphite (layer) was progressed due to the irreversible insertion of PC molecules between graphene layers, when propylene carbonate (PC) solvent was used as the organic solvents. The problem could be mitigated by the replacement of PC by ethylene carbonate (EC). But, the freezing point of EC-based electrolyte increased due to the high freezing point of $EC(36.2^{\circ}C)$. Therefore, EC+PC mixed electrolyte is expected as a good organic electrolyte for lithium ion battery. The EC-based organic electrolyte containing PC within pertinent quantity can be expected to have high molar conductivity and reduced exfoliation of graphite layer. The dielectric constant and molar conductivity of $LiPF_6/PC+EC+DEC$ electrolyte was investigated with a variation in the PC content. The electrochemical properties of carbon electrode in the electrolyte were also investigated. Molar conductivity and dielectric constant increased linearly by increasing the PC volume fraction in the electrolyte. The results of charge-discharge test for carbon/electrolyte/Li cell indicated that the initial irreversible specific capacity(IIC) of MCMB-6-28s and MPCF3000 decreased by the addition of $0.83 vol\%$ of PC, but increased with PC content over than $0.83 vol\%$. In the case of MPCF3000 and PCG100 having less than $10 vol\%$ PC, IIC was lower than 50 mAh/g. The discharge specific capacities varied with carbon material, but did not vary with PC content in the electrolyte.

A Study on the Properties Analysis of an Iron Fittings Type CSST Damaged by the PCITS (PCITS에 의해 소손된 강이음쇠형 CSST의 특성 해석에 관한 연구)

  • Lee, Jang-Woo;Choi, Chung-Seog
    • Fire Science and Engineering
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    • v.30 no.4
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    • pp.121-127
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    • 2016
  • This study analyzed the structural and electrical characteristics of an iron fittings type Corrugated Stainless Steel Tubing (CSST) damaged by the Primary Current Injection Test System (PCITS). CSST consists of cladding, tube, nuts, clamp ring, flare cap, socket, and ball valve. For an evaluation of the dielectric withstand voltage, the area between the live part and non-live part of the CCST shall withstand a voltage of 220 V AC for one minute. For an evaluation of the insulation performance by 500 V DC, it is required that the insulation exceed more than $1M{\Omega}$ before the temperature rise test, $0.3M{\Omega}$ after the test. Although the average resistance of the product was $11.5m{\Omega}$, that of the product damaged at a current of 130 A by the PCITS was $11.50m{\Omega}$. Furthermore, parts of the cladding were melted and black smoke appeared when a current of 130 A applied for 10 s. After 60 s, most parts were heated and turned red. At 120 s, the parts that turned red had widened. Although it did not form a normal distribution because the P value was 0.019 with a confidential interval of 95%, it revealed outstanding characteristics with an AD (Anderson-Darling) value of 0.896 and a standard deviation of 0.5573.