• Title/Summary/Keyword: dielectric test

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Dielectric Characteristics of Turn-ro-Turn Insulation for SFCL (초전도 한류기의 턴간 절연특성)

  • Baek, Seung-Myeong;Joung, Jong-Man;Lee, Chang-Hwa;Kim, Sang-Hyun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.05a
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    • pp.65-68
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    • 2003
  • Interconnected power system operation has given rise to the problem of increased fault levels and leads to over stressing of all the components. Use have been made of recently developed high Tc superconductor in devising a superconducting fault current limiter (SFCL) that promises optimum performance in terms of capital cost, size, auto sensing, operational losses, response time and reliability. Recently, research about the application of the SFCL is actively progressing in Korea. To be applied for SFCL practically, the electrical insulation design of SFCL must be developed. Therefore, this paper presents the result of an investigation of the dielectric characteristics of turn-to-turn insulation for SFCL in liquid nitrogen. The dielectric characteristics of turn-to-turn insulation models of SFCL were investigated. We obtained following results. The breakdown voltages increased as the spacer thickness and length increased. And the breakdown voltages of turn-to-turn model without spacer were higher than the breakdown voltages of turn-to-turn model with spacer under impulse as well as AC voltages. The information gathered in this test series should be helpful in the design of liquid nitrogen filled SFCL.

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Effect of Measuring Method on the Evaluation of Piezoelectric and Dielectric Properties of PMN-PT Single Crystal (PMN-PT 단결정의 압전 및 유전 특성 평가에 미치는 측정 방법의 영향)

  • Kim, Yong Soo;Park, Jae Hwan;Lee, Jeongho;Lee, Sang Goo
    • Journal of the Microelectronics and Packaging Society
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    • v.26 no.4
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    • pp.69-74
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    • 2019
  • The influence of measuring fixtures on the measurement of dielectric and piezoelectric properties of PMN-PT single crystal specimens was investigated. As the pressure of the jig pin which applied the AC electrical signal to the sample decreased, the lower resonance resistance was measured and the higher mechanical quality factor was calculated. The mechanical quality factor was 418 when the spring tension of the jig pin was 20grf, and the value of the quality factor was reduced by half when the spring tension was 200grf. The 4-probe fixture method is unsuitable for measuring piezoelectric properties, but it was suitable for the measurement of dielectric loss. In order to accurately evaluate the piezoelectric properties of PMN-PT, it is necessary to lower the spring tension of the jig pin as much as possible.

Specular Reflectance Measurements of Dielectric Plates in Millimeter Frequency Range

  • Kang, Jin-Seob;Kim, Jeong-Hwan;Kang, Kwang Yong;Yoon, Dae Hwan;Park, Sung Won
    • Journal of electromagnetic engineering and science
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    • v.18 no.2
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    • pp.78-87
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    • 2018
  • This paper describes specular reflectance measurements of dielectric plates in three waveguide frequency bands: D-band (110-170 GHz), G-band (140-220 GHz), and J-band (220-325 GHz). The transmit (Tx) part of the proposed specular reflectance measurement system is stationary, while the receive (Rx) part and the material under test (MUT) holder are concentric-rotating with a 2:1 speed ratio for specular reflectance measurements. In specular reflectance measurements, the first step measures the specular reflection coefficients of an MUT and a metal plate on the MUT holder located at the center of the Tx and Rx parts, and the second step calculates the specular reflectance defined by the specular reflection power (i.e., intensity) of the MUT normalized to that of the metal plate. Multiple reflection effects between the Tx and Rx antennas and the MUT on the measured specular reflectance are minimized by averaging out the multiple specular reflectances measured with changing the separation distance between the two antennas by ${\lambda}/8$ intervals. Measurement results of the perpendicular-polarized specular reflectance of commonly used dielectric plates are verified by comparing those with the analytic results and show that the results measured over the overlapped frequency range of the D-/G-bands and at the boundary frequency of the G-/J-bands agree well with the results for the other band, respectively.

Comparison of Evaluation Methods of the Small Current Breaking Performance for $SF_{6}$ Gas Circuit Breakers

  • Song, Ki-Dong;Lee, Byeong-Yoon;Park, Kyong-Yop;Park, Jung-Hoo
    • KIEE International Transaction on Electrical Machinery and Energy Conversion Systems
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    • v.11B no.4
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    • pp.129-136
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    • 2001
  • In order to evaluate the dielectric recovery strength for GCBs, two equations have been usually utilized. One is the empirical formula obtained from a series of tests and the other is the theoretical formula obtained from the streamer theory. In this paper, both methods were applied to predict the small capacitive current interruption capability of model circuit breakers and were investigated in terms of the reliability by comparing the simulation results with test ones.

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Dielectric Properties of EPDM/ATH/Clay Compounds (EPDM/ATH/Clay 파운드의 절연특성)

  • Lee, Chul-Ho;Lee, Heon-Ju;Jeon, Young-Jun;Kim, Sang-Wook
    • Proceedings of the KIEE Conference
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    • 1999.07d
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    • pp.1648-1650
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    • 1999
  • In the present study. we investigated the role of fillers, alumina trihydrate (ATH) and calcined clay, on the mechanical and electrical properties of EPDM compounds. Mechanical properties and tracking resistance improved with increasing ATH fillers. whereas volume resistivity, tan$\delta$ and dielectric constant decreased when ATH was replaced by clay filler. Futhermore, it was more prominent in $90^{\circ}C$ hot water test. This was explained with polarity of ATH, and the smaller particle size of ATH filler than clay filler.

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Effect of Some Design Factors in the Front Panel on the Characteristics of a Plasma Display

  • Kim, Beong-Ju;Moon, Chelo-Hee
    • Journal of Information Display
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    • v.9 no.3
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    • pp.28-32
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    • 2008
  • Low sustained voltage $(V_s)$ and high luminous efficiency (lumen/Watts) are required for the enhanced performance of an AC PDP. Both are not realized in the same condition, however, because luminous efficiency decreases when the sustained voltage is lowered in most cases. In this study, the three design factors in the front panel of a PDP, i.e., the thickness and position of the bus electrode and the thickness of the dielectric layer, were chosen to investigate how they affect the sustained voltage and the luminous efficiency, and to find a way to optimize them. Two values were given to each of the three design factors, and experiments were done via full factorial design, i.e., with a total of eight conditions, using a 3-in.diagonal test panel. The changes in the sustained voltage and the luminous characteristics were explained in connection with the discharge characteristics of the PDP cells.

Characterization of Ultra Low-k SiOC(H) Film Deposited by Plasma-Enhanced Chemical Vapor Deposition (PECVD)

  • Kim, Sang-Yong
    • Transactions on Electrical and Electronic Materials
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    • v.13 no.2
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    • pp.69-72
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    • 2012
  • In this study, deposition of low-dielectric constant SiOC(H) films by conventional plasma-enhanced chemical vapor deposition (PECVD) were investigated through various characterization techniques. The results show that, with an increase in the plasma power density, the relative dielectric constant (k) of the deposited films decreases whereas the refractive index increases. This is mainly due to the incorporation of organic molecules with $CH_3$ group into the Si-O-Si cage structure. It is as confirmed by FT-IR measurements in which the absorption peak at 1,129 $cm^{-1}$ corresponding to Si-O-Si cage structure increases with power plasma density. Electrical characterization reveals that even after fast thermal annealing process, the leakage current density of the deposited films is in the order of $10^{-11}$ A/cm at 1.5 MV/cm. The reliability of the SiOC(H) film is also further characterized by using BTS test.

Analysis of Small Current Interruption Performance for EHV Gas Circuit Breaker (초고압 가스차단기의 소전류 차단성능 해석)

  • Kim, H.K.;Park, K.Y.;Song, K.D.
    • Proceedings of the KIEE Conference
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    • 2006.10d
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    • pp.22-24
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    • 2006
  • This paper presents the prediction method of small current interruption Performance for EHV gas circuit breakers. The FVFLIC method is used for the gas flow analysis and the FEM for the electric field analysis. Then, the dielectric withstanding voltage is evaluated by the empirical formulation or Streamer theory. By comparing the calculated dielectric strength with the test result. it is found that both methods show good prediction capability for the small current interruption performance. Especially, when both methods predict the same interrupting performance, the prediction is in accordance with the experimental result.

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Study on the Electric Property of multilayered $BaTiO_3$ thin film using t Reliability test (절연 신뢰성 평가를 이용한 다층구조 $BaTiO_3$ 박막의 전기적 특성 평가)

  • Oh, Jeong-Hoon;Kim, Young-Sik;Lee, Yun-Hi;Park, Chang-Yun;Oh, Myung-Hwan
    • Proceedings of the KIEE Conference
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    • 1997.07d
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    • pp.1232-1235
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    • 1997
  • 서로 다른 두께를 가진 다층구조 $BaTiO_3$ 박막의 절연신뢰성을 time-zero dielectric breakdown (TZDB) 기법과 time-dependent dielectric breakdown (TDDB) 기법을 사용하여 평가하였으며 통계적 방법을 이용하여 그 결과를 분석하였다. 다층구조 $BaTiO_3$ 박막은 rf-magnetron sputtering 방법으로 ITO가 코팅된 유리기판 위에 형성되었다 TZDB 측정 결과, 박막의 두께가 증가 할수록 최고 빈도수를 보이는 항복전기장의 세기는 낮아지는 것으로 확인되었으며, 두께에 따라 다른 항전기장의 분포를 보였다. TDDB 결과로부터 박막의 두께 증가에 파라 안정적인 시간거동 특성이 확인되었으며 이것은 항전기장의 분포 특성과 관계가 있는 것으로 보인다.

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A Study of Aging Characteristic of EPDM by High-temperature Treatment (고온 열처리에 의한 EPDM의 열화 특성에 대한 연구)

  • Choi, N.H.;Han, S.I.;Han, S.O.;Yoon, J.Y.;Park, K.S.;Kim, J.S.
    • Proceedings of the KIEE Conference
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    • 1997.07d
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    • pp.1465-1468
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    • 1997
  • In this study we investigated the aging characteristic such as leakage current, dielectric loss, contact angle, of EPDM for outdoor use by thermal treatment. And also observed the color change of surface, changing of chemical ingredient of the marterials by optical microscope. SEMI, FTIR and EDX at the section and surface. The test result show that leakage current is increased with thermal aging time. contact angle and dielectric loss is slightly decreased. Moreover, micro-void or crack in bulk is severely increased with aging time. However, the result affect to the tan $\delta$ at bulk of EPDM. It seems that carrier sources are removed by degassing with heat treatment.

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