• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.2
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• pp.872-875
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• 2003

Carbon nitride($CN_x$) thin films were deposited on quartz substrates using reactive RF magnetron sputtering system at uarious deposition conditions and investigated dielectric characteristics. Samples for capacitance measurements were of the MIM(Metal-Insulator-Metal) type devices. Aluminum film electrodes were prepared by a vacuum thermal evaporation method before and after the deposition of carbon nitride films. Capacitances were measured by a FLUKE PM6306 RCL Meter at room temperature. Current-voltage(I-V) characteristics and resistivity were measured by a CATS CA-EDA semiconductor test and analyzer. The carbon nitride films showed ${\alpha}-C_3N_4$ and ${\beta}-C_3N_4$ etc. peaks through Raman and FTIR. Observed surface of film and side structure using SEM(Scanning Electron Microscope), and measured thickness of film by ${\alpha}-step$. We can find that the dielectric constant was the lowest value in 50% nitrogen ratio and the resistivity was the highest value in 70% nitrogen ratio.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2010년도 하계학술대회 논문집
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• pp.92-92
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• 2010

In this paper, the test is performed on MgO, which is used as a filler in epoxy additives, respectively (0, 1.0, 3.0, 5.0, 7.0, 10 [wt%]) for HVDC(high voltage direct current) submarine cable insulating material to improve electrical properties of epoxy resin in high temperature. The breakdown strength due to increasing amount of filler increased to 5.0 [wt%] by the effects of the Coulomb blockade. However, it is confirmed that strength of dielectric breakdown decreased because the filler functioned as impurities and affected the breakdown when filler additive exceeded by 5.0 [wt%] or more. We have found that the highest dielectric breakdown strength of specimen added 5.0 wt% at $25^{\circ}C$, and is more increased approximately 13.7 [%] than virgin specimen.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2010년도 하계학술대회 논문집
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• pp.20-20
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• 2010

The effect of excimer laser annealing on the structural and dielectric behaviors of $PbZr_{0.52}Ti_{0.48}O_3$ (PZT) thin films has been investigated. The amorphous PZT thin films were prepared on Pt/Ti/$SiO_2$/Si substrates by a sol-gel method. The PZT precursor was prepared from lead acetate, zirconium acetylacetonate, and titanium isopropoxide. The starting materials were dissolved in n-propanol and 1,3-propanediol. After, the amorphous PZT thin films were laser-annealed (using KrF excimer laser) as a function of the laser energy density and the number of laser pulse. Structural properties of PZT thin films are characterized by using X-ray diffraction (XRD) and scanning electron microscopy (SEM). The dielectric characterization was done on a RT66A test system and a Agilent 4294A impedance analyzer. The PZT thin films show that excimer laser irradiation drastically improved the crystallization and dielectric properties of the PZT thin films, depending on the energy density and the pulse number.

• 한국세라믹학회지
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• 제44권5호
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• pp.173-178
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• 2007

The microstructure and microwave dielectric properties of dolomite type borates, $CaZr(BO_3)_2$ ceramics prepared by conventional mixed oxide method were explored. The sintering temperature of $CaZr(BO_3)_2$ ceramics could be reduced from $1150^{\circ}C\;to\;925^{\circ}C$ with little amount of sintering additives. Microwave dielectric properties of 3 wt% $Bi_2O_3-CuO$ added $CaZr(BO_3)_2$ ceramics sintered at $925^{\circ}C$ were $K{\approx}10.4,\;Q{\times}f{\approx}80,000GHz\;and\;TCF{\approx}+2ppm/^{\circ}C$. Thus obtained LTCC tape was co-fired with Ag paste for compatibility test and revealed no sign of Ag reaction with the ceramics. Therefore, $CaZr(BO_3)_2$ ceramics is considered as a possible candidate material for low temperature co-fired multilayer devices.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 추계학술대회 논문집 Vol.16
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• pp.546-549
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• 2003

This paper was shown removal characteristic of escherichia coli for discharge tube with globular $SiO_2$. At the result of the removal characteristic experiments of escherichia coli using the discharge tube with globular $SiO_2$, because the electric field is also increased when input voltage is increased, the removal characteristic of escherichia coli was appeared relation connection to input voltage. If a passing number of test water in discharge tube is increased, the removal ratio of escherichia coli is increased because passing number of electric field section is increased. When diameter of globular $SiO_2$ is increased, the removal time of escherichia coli is to be decreased because dielectric polalization of globular dielectric($SiO_2$), Also, the removal ratio of escherichia coli of the discharge tube with globular dielectric($SiO_2$) is appeared higher than the removal ratio of the discharge tube without globular dielectric($SiO_2$).

• 마이크로전자및패키징학회지
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• 제27권1호
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• pp.37-43
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• 2020

Fan-out wafer level packaging (FOWLP) 재배선 적용을 위한 Ti 박막과 WPR 절연층 사이의 계면 신뢰성을 평가하기 위해, O₂ 플라즈마 전처리 및 후속 열처리 시간에 따라 90° 필 테스트를 진행하였다. O₂ 플라즈마 전처리 시간이 증가 할수록 계면 접착력이 감소하다가 유지되는 거동을 보였으며, 이는 과도한 O₂ 플라즈마 전처리가 WPR 절연층 내의 C-O-C 또는 C=O 결합을 끊어 WPR 표면이 손상을 받아 계면 접착력이 저하된 것으로 판단된다. 또한 O₂ 플라즈마 전처리를 30초 진행한 시편을 150℃ 후속 열처리 진행한 결과, 계면 접착력이 0시간에서 24시간까지는 감소하였으나, 100시간까지 유지되는 거동을 보였다. 이는 고온에 취약한 WPR 절연층이 과도한 열처리로 인해 손상되어 계면 접착력이 급격히 감소하다가 유지되는 것으로 판단된다. 따라서, 절연층 소재에 대한 최적의 플라즈마 전처리 조건을 확보하는 것이 FOWLP 재배선의 계면신뢰성 향상을 위한 핵심요소임을 알 수 있다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 하계학술대회 논문집
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• pp.115-118
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• 2000

In case of developing new motor, many examinations was tested to decide a motor efficiency and reliability. To give reliability judgment, traction motor winding insulation was tested by electrical method after appling electrical, heat, mechanical, environmental stress. In this study, stator form-wound winding of traction motor in urban transit E.M.U was tested by accelerative thermal degradation test. Stator form-wound winding was tested on the accelerative degradation composed of heat, vibration, moisture, overvoltage and researched insulation resistance, dielectric loss, partial discharge for insulation degradation properties, evaluated withstand voltage. Degradation temperature was $230[^\circ{C}]$, $250[^\circ{C}]$, $270[^\circ{C}]$, for stator form-wound winding respectively. On the test results of accelerative thermal degradation, insulation properties were relied all temperature until 10 times and expected life was evaluated by the rule of reducing $10[^\circ{C}]$ life into halves. Expected life was 31.8 years. It is guaranteed insulation reliability because of exceeding 25 years life times as considering.

• 지질공학
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• 제14권2호
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• pp.179-187
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• 2004

Frequency Domain Reflectometry(FDR) system과 길이 7cm의 측정센서를 사용하여 에탄을 믹싱리퀴드(EML)를 주입함으로씨 포화된 흙의 유전율상수 변화를 파악하기 위한 실내실험을 실시하였다. 측정센서에 대한 유전율 측정 범위의 확인 및 물과 동일한 비중을 갖는 EML이 포화된 흙의 공극을 통하여 이동 경로를 파악하기 위함이다. EML 확산실험에서는 포화 흙 칼럼 상단부의 배출구가 EML 주입구로부터 이격될수록 포화 흙의 공극을 통한 EML의 확산범위가 확대됨을 확인하였다. 그리고 EML 유동실험의 결과에서는 포화된 흙 칼럼에 대한 주입과 동시에 일정한 간격으로 설치된 모든 측정센서에서 유전율의 변화를 파악하였다. 따라서 EML 주입에 따른 포화 흑의 공극 내에 존재하는 물의 치환이 충분히 가능하며 공극을 통한 이동성도 함께 확인하였다.

• 한국항공우주학회지
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• 제41권10호
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• pp.820-826
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• 2013

본 논문에서는 스마트 스킨 기술을 활용한 소형경량 및 광대역 특성을 갖는 항공기용 안테나 내장 스킨 구조(CLAS: Conformal Load bearing Antenna Structure)를 설계하였다. 제안된 CLAS 안테나는 전기적 성능을 만족하기 위해 전도성 매쉬, 외부표피, 복사소자, 내부심재 및 하우징 등으로 구성하였다. 특히, 복사소자의 경우 복합자성유전체와 PCB에 에칭된 방사체로 구성되어 있으며 방사체는 복합자성유전체에 삽입되어 슬롯형 폴디드 대수주기 구조(Folded Log-Periodic)를 갖는다. 제안된 CLAS 안테나는 복합자성유전체에 의해 공진주파수가 낮아지고 임피던스 매칭특성이 향상되었으며 측정 결과, 안테나의 소형경량 및 광대역 특성을 확인하였다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2004년도 하계학술대회 논문집 B
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• pp.842-844
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• 2004

The Back Up Breaker and Making Switch are very important equipments for the short circuit test facility, and contacts are the most important parts of the above switches. There are very many kind of contacts according to switches characteristic and should be done the verification test before use, especially development contacts. This study describes the class of switches, arc chute, material of whole contacts and essential test for verification. The essential test for verification are dielectric test, mechanical operation test, short-time withstand current test, load current breaking test, and short-circuit making current test etc.