• 제목/요약/키워드: detection circuit

검색결과 700건 처리시간 0.026초

Open and Short Circuit Switches Fault Detection of Voltage Source Inverter Using Spectrogram

  • Ahmad, N.S.;Abdullah, A.R.;Bahari, N.
    • Journal of international Conference on Electrical Machines and Systems
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    • 제3권2호
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    • pp.190-199
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    • 2014
  • In the last years, fault problem in power electronics has been more and more investigated both from theoretical and practical point of view. The fault problem can cause equipment failure, data and economical losses. And the analyze system require to ensure fault problem and also rectify failures. The current errors on these faults are applied for identified type of faults. This paper presents technique to detection and identification faults in three-phase voltage source inverter (VSI) by using time-frequency distribution (TFD). TFD capable represent time frequency representation (TFR) in temporal and spectral information. Based on TFR, signal parameters are calculated such as instantaneous average current, instantaneous root mean square current, instantaneous fundamental root mean square current and, instantaneous total current waveform distortion. From on results, the detection of VSI faults could be determined based on characteristic of parameter estimation. And also concluded that the fault detection is capable of identifying the type of inverter fault and can reduce cost maintenance.

단위 픽셀 회로의 간소화를 통해서 해상도를 향상시킨 이차원 윤곽 검출용 시각칩 (Vision chip for edge detection with resolution improvement through simplification of unit-pixel circuit)

  • 성동규;공재성;현효영;신장규
    • 센서학회지
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    • 제17권1호
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    • pp.15-22
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    • 2008
  • When designing image sensors including a CMOS vision chip for edge detection, resolution is a significant factor to evaluate the performance. It is hard to improve the resolution of a bio-inspired CMOS vision using a resistive network because the vision chip contains many circuits such as a resistive network and several signal processing circuits as well as photocircuits of general image sensors such as CMOS image sensor (CIS). Low resolution restricts the use of the application systems. In this paper, we improve the resolution through layout and circuit optimization. Furthermore, we have designed a printed circuit board using FPGA which controls the vision chip. The vision chip for edge detection has been designed and fabricated by using $0.35{\mu}m$ double-poly four-metal CMOS technology, and its output characteristics have been investigated.

브리지 회로 개념이 적용된 전기 전위법을 이용한 탄소섬유복합재료의 균열검출 (Crack Detection of Carbon Fiber Reinforced Composites by Electric Potential Method with Bridge Circuit Concept)

  • 황희윤
    • Composites Research
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    • 제22권1호
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    • pp.9-14
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    • 2009
  • 본 논문에서는 탄소섬유 복합재료의 균열의 위치 및 성장을 감지하기 위하여 브리지 회로 개념이 적용된 전기 전위법을 제안하였다. 중앙 관통 균열을 가진 복합재료 박판 시험편에 두 쌍의 전극을 생성하였으며, 브리지 회로 개념을 적용하여 한 쌍의 전극에 외부 전압을 인가하고 다른 한 쌍의 전극으로부터 출력 전압 변화를 관찰하였다. 실험과 유한요소해석을 통하여 전극의 크기와 간격, 균열의 위치와 크기 및 성장 방향의 영향을 고찰하였다. 검출 가능한 균열의 크기는 전극의 크기 보다는 전극의 간격에 의한 영향이 더 컸으며, 전극의 크기와 간격이 작을수록 균열의 검출 능력이 우수하였다. 또한, 균열 크기가 증가할 수록, 입력 전극과 가까울수록 출력 전압의 변화가 큼을 관찰할 수 있었다.

학습에 기초한 아날로그 회로의 고장진단에 관한 연구 (Fault Detection Method for Analog Circuit Board By Learning Based Algorithm)

  • 김환성;허윤수;구엔뒤안;짠녹황선
    • 한국마린엔지니어링학회:학술대회논문집
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    • 한국마린엔지니어링학회 2005년도 후기학술대회논문집
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    • pp.204-205
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    • 2005
  • The following instructions give you basic guidelines for preparing camera-ready papers for the proceeding of the KOSME. We recommend you to use the HWP word processor.

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직접검파, 광통신에 이용되는 Point-detector Array의 해석 (Direct-Detection, Analysis of the point-detector arrays used in optical communication)

  • 성평식;김영권
    • 한국통신학회논문지
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    • 제12권5호
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    • pp.428-438
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    • 1987
  • 本 論文은 大氣 空間에서 信號場과 雜音場을 處理하기 위하여 point-detector array檢波 시스템을 構成한 것이다. 또 variance 및 covariance Circuit도 구성했다. 이것들을 이용하여 測定한 直接檢波 最大出力은 理論値와 잘 一致함을 確認하였고 또한 實驗値는 joint-Gaussian理論曲線과 一致하였다.

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누전검출 및 차단기능을 가진 가로등용 HID 전자식 안정기 개발 (The development of the HID Electronic Ballast for the street lamp with the leakage Current detection and circuit breaker function)

  • 박종연;임병노;최원호
    • 한국조명전기설비학회:학술대회논문집
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    • 한국조명전기설비학회 2006년도 춘계학술대회 논문집
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    • pp.99-102
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    • 2006
  • We developed the electronic ballast for the street HID lames with the leakage current detection and circuit breaker function. By detecting the leakage current and breaking the system we are protected from the electric shock and the ballast is safe from the electric damage at the time of the continuous reignition state.

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유도무선에 의한 열차 위치검지 방식 (A Train Position Detection Method by Inductive Radio Line)

  • 정의진;김양모
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1993년도 하계학술대회 논문집 B
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    • pp.788-790
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    • 1993
  • In the train position defection for the rail car, which is not able to obtain the short circuit between the track circuit and the wheel, the methods by the inductive radio of non-contact type are applicated. It is represented the principles and the methods of the inductive radio train detection on MLU, Transrapid, HSST, M-Bahn, and People Mover for MAGLEV, on Kobe system for the rubber-tired vehicle, and on ICE for wheel-on-rail.

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게이트 레벨 천이고장을 이용한 BiCMOS 회로의 Stuck-Open 고장 검출 (Detection of Stuck-Open Faults in BiCMOS Circuits using Gate Level Transition Faults)

  • 신재흥;임인칠
    • 전자공학회논문지A
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    • 제32A권12호
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    • pp.198-208
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    • 1995
  • BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. Test to detect stuck-open faults in BiCMOS circuit is important, since these faults do sequential behavior and are represented as transition faults. In this paper, proposes a method for efficiently detecting transistor stuck-open faults in BiCMOS circuit by transforming them into slow-to=rise transition and slow-to-fall transition. In proposed method, BiCMOS circuit is transformed into equivalent gate-level circuit by dividing it into pull-up part which make output 1, and pull-down part which make output 0. Stuck-open faults in transistor are modelled as transition fault in input line of gate level circuit which is transformed from given circuit. Faults are detceted by using pull-up part gate level circuit when expected value is '01', or using pull-down part gate level circuit when expected value is '10'. By this method, transistor stuck-open faults in BiCMOS circuit are easily detected using conventional gate level test generation algorithm for transition fault.

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태양광 발전용 직류 지락 검출장치 (DC Ground Fault Detection System for Photovoltaic Generation)

  • 장수진;이정민;김왕문;구태홍;서인영
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2008년도 춘계학술대회 논문집
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    • pp.408-411
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    • 2008
  • In this paper, a new DC ground fault detection system is proposed, which is suitable for photovoltaic power generation systems. The proposed ground fault systems is superposition of divide resistance and detection circuit. The proposed system has the characteristics of a simplified structure, reduced cost and volume compared with those of the conventional ground fault system for DC source. The operation principle of the proposed systems is described and verified by simulation result.

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An Artificial Neural Networks Application for the Automatic Detection of Severity of Stator Inter Coil Fault in Three Phase Induction Motor

  • Rajamany, Gayatridevi;Srinivasan, Sekar
    • Journal of Electrical Engineering and Technology
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    • 제12권6호
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    • pp.2219-2226
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    • 2017
  • This paper deals with artificial neural network approach for automatic detection of severity level of stator winding fault in induction motor. The problem is faced through modelling and simulation of induction motor with inter coil shorting in stator winding. The sum of the absolute values of difference in the peak values of phase currents from each half cycle has been chosen as the main input to the classifier. Sample values from workspace of Simulink model, which are verified with experiment setup practically, have been imported to neural network architecture. Consideration of a single input extracted from time domain simplifies and advances the fault detection technique. The output of the feed forward back propagation neural network classifies the short circuit fault level of the stator winding.