• Title/Summary/Keyword: depletion mode

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Influence of Self-Regulatory Resource and Self-Regulatory Modes on Fashion Product Purchase Intention (소비자의 자아조절자원과 자기조절모드가 패션제품의 구매의도에 미치는 영향)

  • Baek, So Ra;Hwang, Sun Jin
    • Human Ecology Research
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    • v.53 no.5
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    • pp.543-556
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    • 2015
  • This study examined the influence of self-regulatory resource depletion and self-regulatory modes on fashion product purchase intention. Initial research design dealt with differences of the resource depletion effect according to self-regulatory modes. The study used a 2 (self-regulatory resource depletion: depletion/non-depletion) ${\times}$ 2 (regulatory mode: assessment mode/locomotion mode) between-subjects factorial design. Second, the research design empirically analyzed the influence of self-regulatory resource depletion and self-regulatory mode on the fashion product purchase intention by each product group divided by type and involvement of fashion product. The subjects for the initial research were 255 university students in Seoul, Gyeonggi, and Daejeon. The subjects for the second research were 873 university students in Seoul and Daejeon. Collected data were analyzed with SPSS statistical package with reliability analysis, t -test, analysis of variance (ANOVA), and analysis of covariance (ANCOVA). The results were as follows. First, assessment-oriented consumers showed low purchase intentions about fashion products when self-regulatory resources were exhausted than when self-regulatory resource were not exhausted. Locomotion-oriented consumers, indicated no differences in purchase intention about fashion products regardless of self-regulatory resource depletion. Second, influences on purchase intention by self-regulatory resource depletion and self-regulatory mode were different according to the fashion product group. The results of this study implied that strategies should be differentiated when establishing a fashion industry marketing strategy according to the self-regulatory resource depletion and self-regulatory mode of consumers.

Full-Range Analytic Drain Current Model for Depletion-Mode Long-Channel Surrounding-Gate Nanowire Field-Effect Transistor

  • Yu, Yun Seop
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.13 no.4
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    • pp.361-366
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    • 2013
  • A full-range analytic drain current model for depletion-mode long-channel surrounding-gate nanowire field-effect transistor (SGNWFET) is proposed. The model is derived from the solution of the 1-D cylindrical Poisson equation which includes dopant and mobile charges, by using the Pao-Sah gradual channel approximation and the full-depletion approximation. The proposed model captures the phenomenon of the bulk conduction mechanism in all regions of device operation (subthreshold, linear, and saturation regions). It has been shown that the continuous model is in complete agreement with the numerical simulations.

Compact Model of a pH Sensor with Depletion-Mode Silicon-Nanowire Field-Effect Transistor

  • Yu, Yun Seop
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.14 no.4
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    • pp.451-456
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    • 2014
  • A compact model of a depletion-mode silicon-nanowire (Si-NW) pH sensor is proposed. This drain current model is obtained from the Pao-Sah integral and the continuous charge-based model, which is derived by applying the parabolic potential approximation to the Poisson's equation in the cylindrical coordinate system. The threshold-voltage shift in the drain-current model is obtained by solving the nonlinear Poisson-Boltzmann equation for the electrolyte. The simulation results obtained from the proposed drain-current model for the Si-NW field-effect transistor (SiNWFET) agree well with those of the three-dimensional (3D) device simulation, and those from the Si-NW pH sensor model also agree with the experimental data.

A Semi-analytical Model for Depletion-mode N-type Nanowire Field-effect Transistor (NWFET) with Top-gate Structure

  • Yu, Yun-Seop
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.10 no.2
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    • pp.152-159
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    • 2010
  • We propose a semi-analytical current conduction model for depletion-mode n-type nanowire field-effect transistors (NWFETs) with top-gate structure. The NWFET model is based on an equivalent circuit consisting of two back-to-back Schottky diodes for the metal-semiconductor (MS) contacts and the intrinsic top-gate NWFET. The intrinsic top-gate NWFET model is derived from the current conduction mechanisms due to bulk charges through the center neutral region as well as of accumulation charges through the surface accumulation region, based on the electrostatic method, and thus it includes all current conduction mechanisms of the NWFET operating at various top-gate bias conditions. Our previously developed Schottky diode model is used for the MS contacts. The newly developed model is integrated into ADS, in which the intrinsic part of the NWFET is developed by utilizing the Symbolically Defined Device (SDD) for an equation-based nonlinear model. The results simulated from the newly developed NWFET model reproduce considerably well the reported experimental results.

Current Conduction Model of Depletion-Mode N-type Nanowire Field-Effect Transistors (NWFETS) (공핍 모드 N형 나노선 전계효과 트랜지스터의 전류 전도 모델)

  • Yu, Yun-Seop;Kim, Han-Jung
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.45 no.4
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    • pp.49-56
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    • 2008
  • This paper introduces a compact analytical current conduction model of long-channel depletion-mode n-type nanowire field-effect transistors (NWFETs). The NWFET used in this work was fabricated with the bottom-up process and it has a bottom-gate structure. The model includes all current conduction mechanisms of the NWFET operating at various bias conditions. The results simulated from the newly developed NWFET model reproduce a reported experimental results within a 10% error.

Fabrication of a depletion mode p-channel GaAs MOSFET using $Al_2O_3$ gate insulator ($Al_2O_3$ 게이트 절연막을 이용한 공핍형 p-채널 GaAs MOSFET의 제조)

  • Jun, Bon-Keun;Lee, Tae-Hyun;Lee, Jung-Hee;Lee, Yong-Hyun
    • Journal of Sensor Science and Technology
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    • v.8 no.5
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    • pp.421-426
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    • 1999
  • In this paper, we present p-channel GaAs MOSFET having $Al_2O_3$ as gate insulator fabricated on a semi-insulating GaAs substrate, which can be operated in the depletion mode. $1\;{\mu}m$ thick undoped GaAs buffer layer, $4000\;{\AA}$ thick p-type GaAs epi-layer, undoped $500{\AA}$ thick AlAs layer, and $50\;{\AA}$ thick GaAs cap layer were subsequently grown by molecular beam epitaxy(MBE) on (100) oriented semi-insulating GaAs substrate and this wafer was oxidized. AlAs layer was fully oxidized as a $Al_2O_3$ thin film. The I-V, $g_m$, breakdown charateristics of the fabricated GaAs MOSFET showed that wet thermal oxidation of AlAs/GaAs epilayer/S I GaAs was successful in realizing depletion mode p-channel GaAs MOSFET.

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Analysis and Optimization of a Depletion-Mode NEMFET Using a Double-Gate MOSFET (Double-Gate MOSFET을 이용한 공핍형 NEMFET의 특성 분석 및 최적화)

  • Kim, Ji-Hyun;Jeong, Na-Rae;Kim, Yu-Jin;Shin, Hyung-Soon
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.12
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    • pp.10-17
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    • 2009
  • Nano-Electro-Mechanical MOSFET (NEMFET) using Double-Gate MOSFET (DGMOS) structure can efficiently control the short channel effect. Espatially, subthreshold current of depletion-mode Double-Gate NEMFET (Dep-DGNEMFET) decreases in the off-state due to the thin equivalent-oxide thickness. Analytical $t_gap$ vs. $V_g$ equation for Dep-DGNEMFET is derived and characteristics for different device structures are analyzed. Dep-DGNEMFET structure is optimized to satisfy ITRS criteria.

3-Dimensional Numerical Analysis of Deep Depletion Buried Channel MOSFETs and CCDs

  • Kim Man-Ho
    • Journal of Electrical Engineering and Technology
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    • v.1 no.3
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    • pp.396-405
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    • 2006
  • The visual analysis of buried channel (Be) devices such as buried channel MOSFETs and CCDs (Charge Coupled Devices) is investigated to give better understanding and insight for their electrical behaviours using a 3-dimensional (3-D) numerical simulation. This paper clearly demonstrates the capability of the numerical simulation of 'EVEREST' for characterising the analysis of a depletion mode MOSFET and BC CCD, which is a simulation software package of the semiconductor device. The inverse threshold and punch-through voltages obtained from the simulations showed an excellent agreement with those from the measurement involving errors of within approximately 1.8% and 6%, respectively, leading to the channel implanted doping profile of only approximately $4{\sim}5%$ error. For simulation of a buried channel CCD an advanced adaptive discretising technique was used to provide more accurate analysis for the potential barrier height between two channels and depletion depth of a deep depletion CCD, thereby reducing the CPU running time and computer storage requirements. The simulated result for the depletion depth also showed good agreement with the measurement. Thus, the results obtained from this simulation can be employed as the input data of a circuit simulator.

Optical Parametric Amplification in Cerenkov-pump Configuration in a Planar Waveguide (평판 도파로에서의 체렌코프 펌프 형태에 의한 광 매개증폭)

  • Suh, Zung-Shik
    • Korean Journal of Optics and Photonics
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    • v.25 no.1
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    • pp.44-49
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    • 2014
  • We have analyzed the amplification of a signal wave in the optical parametric interactions of the pump, signal, and idler waves in planar waveguides, with the pump wave being Cerenkov radiation. Based on the coupled-mode theory, we have derived the first-order coupled-mode differential equations for no pump depletion. The equations can easily be solved numerically. The approximate analytical and numerical solutions of the equations show that the signal wave can be amplified parametrically.

Effect of trimethyl-indium source depletion on InGaAsP epilayer grown by MOCVD (Trimethyl-indium 소스 고갈에 따른 InGaAsP 에피층의 특성 변화)

  • 김현수;오대곤;편광의;최인훈
    • Journal of the Korean Vacuum Society
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    • v.9 no.4
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    • pp.400-405
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    • 2000
  • We investigated the effect of TMIn (trimethly-indium) source depletion on InGaAs, InGaAsP and 1.55 $\mu\textrm{m}$ InGaAs/InGaAsP SMQW by using EPISON ultrasonic monitor for measuring the concentration of metalorganic/carrier gas mixtures. And the problems for the growth reproducibility in MOCVD was solved by using an EPISON ultrasonic monitor with closed-loop mode under the condition of TMIn source depletion. The saturation pressure of TMIn was dramatically decreased over consumption of 80%. In the case of bulk epilayer, Up-shifting of 300 arcsec to Ga-rich direction and FWHM broadening by a factor of two in DCXRD spectrum were observed due to the TMIn source depletion. In the case of SMQW, Up-shifting of 300 arcsec to Ga-rich direction in DCXRD spectrum and blue-shift of 40 nm in PL spectrum were observed due to the TMIn source depletion. However, good reproducibility ($\Delta\theta$<$\pm$100 arcsec) was achieved even the condition of 95% of TMIn consumption, when we used the EPISON with closed-loop mode.

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