• Title/Summary/Keyword: defect engineering

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Hybrid Illumination System Design based on Illuminance Uniformity for Surface Inspection (표면 검사를 위한 조도 균제도 기반 하이브리드 조명계 설계)

  • Cho, Eun Deok;Kim, Gyung Bum
    • Journal of the Semiconductor & Display Technology
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    • v.18 no.3
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    • pp.60-65
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    • 2019
  • In this paper, the hybrid illumination system for effectively detecting surface defects in steel plate with lowcontrast, non-uniformity and featureless is designed based on illuminance uniformity. First of all, characteristics of steel plate defects were considered and typical inspection illumination system is implemented. Optimum illumination parameters for uniformly illuminating an inspection area in the typical illumination system are selected based on the illuminance uniformity and illuminance distribution measurement. The illuminance uniformity and illuminance distribution are measured using an illuminometer based on the arduino. Through illuminance distribution analysis of the typical illumination, an hybrid illumination is designed by fusing bi-directional illumination and coaxial illumination. The hybrid illumination showed higher uniformity ratio and illuminance distribution than the typical illuminations. The hybrid illumination system showed the ability to uniformly illuminate the entire inspection region of steel plate surface.

The motion editor and high precision integration for optimal control of robot manipulators in dynamic structural systems

  • Chen, Chen-Yuan;Wang, Ling-Huei
    • Structural Engineering and Mechanics
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    • v.41 no.5
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    • pp.633-644
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    • 2012
  • The paper presents the motion editor for the robotic movement in the study. The Motion Editor can edit all motions which we want to need. This method is easy when the beginners edit to motions of robots. And let them have interesting in robot control. This paper proposes two methods to edit movements. First, we edit the robot's movement in VB environment, and then we use the Motion Editor to make it. Finally, we compared merit and defect with two methods. Indeed, it is convenient when we use the Motion Editor.

Optimal Parameter Selection of Near-Infrared Optics Based Design of Experiment for Silicon Wafer in Solar Cell (태양전지 실리콘 웨이퍼를 위한 실험계획법 기반 근적외선 광학계의 최적조건 선정)

  • Seo, Hyoung Jun;Kim, Gyung Bum
    • Journal of the Semiconductor & Display Technology
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    • v.12 no.3
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    • pp.29-34
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    • 2013
  • Solar cell has been considered as renewable green energy. Its silicon wafer thickness is thinner due to manufacturing cost and accordingly micro cracks is often generated in the process. Micro cracks result in bad quality of solar cell, and so their accurate and reliable detection is required. In this paper, near-infrared optics system is newly designed based on the analysis of near-infrared transmittance characteristics and its important parameters are optimally selected using the design of experiment for micro crack detection in solar cell wafer. The performance of the proposed method is verified using several experiments.

A Design of Turbo Decoder for 3GPP using Log-MAP Algorithm (Log-MAP을 사용한 3GPP용 터보 복호기의 설계)

  • Kang, Heyng-Goo;Jeon, Heung-Woo
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • v.9 no.1
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    • pp.533-536
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    • 2005
  • MAP algorithm is known for optimal decoding algorithm of Turbo codes, but it has very large computational complexity and delay. Generally log-MAP algorithm is used in order to overcome the defect. In this paper we propose modified scheme of the state metric calculation block which can improve the computation speed in log-MAP decoder and simple linear offset unit without using LUT. The simulation results show that the operation speed of the proposed scheme is improved as compared with that of the past scheme.

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Effects of Electrical Stress on Polysilicon TFTs with Hydrogen Passivation (다결정 실리콘 박막 트랜지스터의 수소화에 따른 전기적 스트레스의 영향)

  • Hwang, Seong-Su;Hwang, Han-Uk;Kim, Yong-Sang
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.48 no.5
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    • pp.367-372
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    • 1999
  • We have investigated the effects of electrical stress on poly-Si TFTs with different hydrogen passivation conditions. The amounts of threshod voltage shift of hydrogen passivated poly-Si TFTs are much larger than those of as-fabricated devices both under the gate only and the gate and drain bias stressing. Also, we have quantitatively analyzed the degradation phenomena by analytical method. We have suggested that the electron trapping in the gate dielectric is the dominant degradation mechanism in only gate bias stressed poly-Si TFT while the creation of defects in the channel region and $poly-Si/SiO_2$ interface is prevalent in gate and drain bias stressed device.

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Evaluation on Degradation of Solid Insulator by PCA-LDA algorithm (PCA-LDA 알고리즘을 이용한 고체절연물의 열화도 판별)

  • Park, Seong-Hee;Kang, Seong-Hwa;Lim, Kee-Joe
    • Proceedings of the KIEE Conference
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    • 2005.07c
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    • pp.2079-2081
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    • 2005
  • Electrical treeing occurrence is caused by some defect in solid insulator. Those are accompany the PD(partial discharge) occurrence. And lifetime of the insulator is affected by PD. So, detection of electrical treeing is important thing as this view. Especially, detection of the end treeing is more important and have meaning for industrial engineering because concerned with maintenance and replacement of equipment. In this paper, evaluation of treeing process were studied and PCA(principle component analysis)-LDA(linear discriminant analysis) as classification method were used. The result is present the good recognition.

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Faults Detection of Industrial Gearbox using an Envelope Analysis (포락선 분석을 이용한 산업용 기어박스의 결함 검출)

  • Park, Y.J.;Lee, G.H.;Lee, J.J.
    • Journal of Biosystems Engineering
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    • v.34 no.2
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    • pp.82-88
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    • 2009
  • This study was conducted to detect faults in a gearbox comprised of gears, bearings and shafts. The envelope analysis was used as a method of detection, which could detect breakage and pitting of gears and bearings, and misalignment of shafts effectively. Vibration measured at the increaser was analyzed to characterize the faults. When the increaser has a defect, peaks with a constant period appear in the time history of vibration and its harmonic components also in the envelope spectrum. The envelope analysis showed that a crack in the stepped output shaft caused the increaser to generate the abnormal peaks.

The Evaluation on the Durability and Safety of Fuel Cyliders for CNG Buses (CNG 버스용 연료용기의 내구안전성 평가)

  • Park, Yong-Hwan
    • Journal of the Korean Society of Safety
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    • v.19 no.1
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    • pp.6-11
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    • 2004
  • CNG buses were introduced in 2002 to reduce air pollution to the big cities. The durability and safety evaluation were performed for the NGV-2 type cylinders taken from two buses after 30 months of running. No external damage and no internal corrosion was observed on the container surfaces. Defect exceeding the allowable limit was not found in the UT test. Permanent volume expansion was about 1.2% which is much smaller than the required design limit. Cycling test showed no failure after 11,250cycles and burst pressures were still above the maximum design pressure. Both the longitudinal and circumferential failure mode were observed, where both the fracture strengths were far above the design limit. This study showed the present CNG fuel cylinders were safe enough for further usage.

New Fault-detection Methodology of high-level event in VHDL models (VHDL 모델의 상위레벨고장 검출방법)

  • 김강철
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2004.05b
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    • pp.651-654
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    • 2004
  • In this paper, high-level events that adjust or control the conflicts between blocks or process statement, or job sequences are defined compared to low-level events. This paper proposes that high-level events consist of resources conflicts and protocol or specification-dependent conflicts, and two low-level coverage metrics can be used to defect high-level events.

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Automatic Defect Detection System for Ultra Fine Pattern Chip-on-Film (초미세 패턴 칩-온-필름을 위한 자동 결함 검출 시스템 개발)

  • Ryu, Jee-Youl;Noh, Seok-Ho
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2010.05a
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    • pp.775-778
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    • 2010
  • 본 논문에서는 초미세 패턴($24{\mu}m$ 이하의 선폭, $30{\mu}m$ 이하의 피치)을 가진 칩-온-필름(Chip-on-Film, COF)에 발생한 결함을 자동으로 검출할 수 있는 시스템을 제안한다. 개발된 시스템은 COF 패턴으로부터 대표적으로 발생하는 결함들, 즉 개방(open), 단락(hard short), mouse bite(near open) 및 near short(soft short)을 자동으로 신속히 검출할 수 있는 기술이 적용되어 있다. 특히 초미세 패턴의 경우, near open 및 near short과 같은 결함 검출이 불가능한 기존 검출시스템의 문제점을 극복한 기술이 제안되어 있다. 본 논문에서 제안하는 결함 검출 원리는 미세 선의 결함유무에 따른 저항 변화를 자동으로 검출하고, 그 미세한 변화를 좀 더 자세하게 판별하기 위해 고주파 공진기(resonator)를 적용하고 있다. 제안된 시스템은 미세 패턴을 가진 COF 제작 과정에서 발생한 결함을 신속히 검출할 수 있기 때문에 COF 불량 검사에 소요되는 많은 경비를 줄일 수 있으리라 기대한다.

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