• Title/Summary/Keyword: defect engineering

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Efficient Algorithm for Real-time Generation of Reflection Lines

  • Kim, Tae-wan;Juyup Kang;Lee, Kunwoo;Park, Sangkun
    • Journal of Mechanical Science and Technology
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    • v.15 no.2
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    • pp.160-171
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    • 2001
  • Depending upon the method of the surface generation and the quality of the designed boundary curves, the resulting surfaces may have global or local irregularities in many cases. Thus, it would be necessary for the designer to evaluate the surface quality and to modify the surface. This is very important because the defect of the surface causes the rework of the dies, increasing cost and delivery time significantly. To simulate the reflection line test in the actual production line, a faster algorithm for generating reflection lines is presented. In this paper, among various surface interrogation methods using reflection lines, Blinn-Newell type of reflection mapping is applied to generate the reflection lines on the trimmed NURBS surfaces. The derivation of reflection lines is formulated as a surface-plane intersection problem (Jung 1994) and is solved by surface-contouring techniques. Also, for eliminating the discontinuity of reflection lines due to the configuration of reflection map, a modified reflection map is proposed. An efficient traced contouring technique is utilized for the computational efficiency and proves to be well suited for the real-time quality-assessment task.

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GUIDED WAVE MODE IDENTIFICATION USING WAVELET TRANSFORM

  • Park, Ik-Keun;Kim, Hyun-Mook;Kim, Young-Kwon;J. L. Rose
    • Proceedings of the Korean Society of Machine Tool Engineers Conference
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    • 2003.04a
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    • pp.79-85
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    • 2003
  • One of unique characteristics of guided waves is a dispersive behavior that guided wave velocity changes with an excitation frequency and mode. In practical applications of guided wave techniques, it is very important to identify propagating modes in a time-domain waveform for determination of defect location and size. Mode identification can be done by measurement of group velocity in a time-domain waveform. Thus, it is preferred to generate a single or less dispersive mode But in many cases, it is difficult to distinguish a mode clearly in a time-domain waveform because of superposition of multi modes and mode conversion phenomena. Time-frequency analysis is used as efficient methods to identify modes by presenting wave energy distribution in a time-frequency. In this study, experimental guided wave mode identification is carried out in a steel plate using time-frequency analysis methods such as wavelet transform. The results are compared with theoretically calculated group velocity dispersion curves. The results are in good agreement with analytical predictions and show the effectiveness of using the wavelet transform method to identify and measure the amplitudes of individual guided wave modes.

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Influence of sharp stiffness variations in damage evaluation using POD and GSM

  • Thiene, M.;Galvanetto, U.;Surace, C.
    • Smart Structures and Systems
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    • v.14 no.4
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    • pp.569-594
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    • 2014
  • Damage detection methods based on modal analysis have been widely studied in recent years. However the calculation of mode shapes in real structures can be time consuming and often requires dedicated software programmes. In the present paper the combined application of proper orthogonal decomposition and gapped smoothing method to structural damage detection is presented. The first is used to calculate the dynamic shapes of a damaged structural element using only the time response of the system while the second is used to derive a reference baseline to which compare the data coming from the damaged structure. Experimental verification is provided for a beam case while numerical analyses are conducted on plates. The introduction of a stiffener on a plate is investigated and a method to distinguish its influence from that of a defect is presented. Results highlight that the derivatives of the proper orthogonal modes are more effective damage indices than the modes themselves and that they can be used in damage detection when only data from the damaged structure are available. Furthermore the stiffened plate case shows how the simple use of the curvature is not sufficient when analysing complex components. The combined application of the two techniques provides a possible improvement in damage detection of typical aeronautical structures.

Preparation and Characterization of Black Color Zirconia by Impregnation Method Used by Graphite (흑연 함침법에 의한 흑색 지르코니아의 제조 및 특성분석)

  • Lee, Kwang-Ho;Ahn, Jong-Pil;Park, Joo-Seok;Lee, Yong-Seok;Lee, Byung-Ha
    • Journal of the Korean Ceramic Society
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    • v.46 no.4
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    • pp.379-384
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    • 2009
  • Zirconia is widely used for structural materials in machinery due to its superior properties, such as high strength, high hardness, and high toughness. Zirconia generally has ivory or white color. Therefore many studies are performed for diversification of zirconia color, in order to be widely uitilized for decoration and machine parts which need distincfive color. In this study, graphite is used to prevent structural defect, to maintain superior properties, and to develop black color of zirconia by impregnation method. As specimen was impregnated at $1600^{\circ}C$ for 2 h, bending strength is 1221 MPa, density is $6.01\;g/cm^3$, hardness is 10.1 GPa, absorption coefficient is 0%, transmittance is Fail, chromaticity is 54. The results indicate that black zirconia has enough properties to be adopted as mechanical parts. Optimum impregnation time is 2 h for various observations.

A study on the design of boron diffusion simulator applicable for shallow $p^+-n$ junction formation (박막 $p^+-n$ 접합 형성을 위한 보론 확산 시뮬레이터의 제작에 관한 연구)

  • Kim, Jae-Young;Kim, Bo-Ra;Hong, Shin-Nam
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.04b
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    • pp.30-33
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    • 2004
  • Shallow p+-n junctions were formed by low-energy ion implantation and dual-step annealing processes The dopant implantation was performed into the crystalline substrates using $BF_2$ ions. The annealing was performed with a rapid thermal processor and a furnace. FA+RTA annealing sequence exhibited better junction characteristics than RTA+FA thermal cycle from the viewpoint of junction depth. A new simulator is designed to model boron diffusion in silicon, which is especially useful for analyzing the annealing process subsequent to ion implantation. The model which is used in this simulator takes into account nonequilibrium diffusion, reactions of point defects, and defect-dopant pairs considering their charge states, and the dopant inactivation by introducing a boron clustering reaction. Using a resonable parameter values, the simulator covers not only the equilibrium diffusion conditions but also the nonequilibrium post-implantation diffusion. Using initial conditions and boundary conditions, coupled diffusion equation is solved successfully. The simulator reproduced experimental data successfully.

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A Study on SiC Buffer Layer Prepared by Ultra High Vacuum Electron Cyclotron Resonance CVD (초고진공 전자공명 플라즈마를 이용한 SiC buffer layer 형성에 관한 연구)

  • Joen, Woo-Gon;Pyo, Jae-Hwak;Whang, Ki-Woong
    • Proceedings of the KIEE Conference
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    • 1995.11a
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    • pp.326-328
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    • 1995
  • SiC buffer layers were grown on Si(100) substrates by ultra-high-vacuum electron cryclotron resonance plasma (UHV ECR plasma) from $CH_4/H_2$ mixture at 700$^{\circ}C$. The electron densities and temperature were measured by single probe. The axial plasma potentials measured by emissive probe had the double layer structure at positive substrate bias. Piranha cleaning was carried out as ex-situ wet cleaning. Clean and smooth silicon surface were prepared by in-situ hydrogen plasma cleaning at 540$^{\circ}C$. A short exposure to hydrogen plasma transforms the Si surface from 1$\times$1 to 2$\times$1 reconstruction. It was monitored by reflection high energy electron diffraction (RHEED). The defect densities were analysed by the dilute Schimmel etching. The results showed that the substrate bias is important factor in hydrogen plasma cleaning. The low base pressure ($5\times10^{-10}$ torr) restrains the $SiO_2$ growth on silicon surface. The grown layers showed different characteristics at various substrate bias. RHEED and K-ray Photoelectron spectroscopy study showed that grown layer was SiC.

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Partial Discharge Localization Based on Detailed Models of Transformer and Wavelet Transform Techniques

  • Hassan Hosseini, Seyed Mohammad;Rezaei Baravati, Peyman
    • Journal of Electrical Engineering and Technology
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    • v.10 no.3
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    • pp.1093-1101
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    • 2015
  • Partial Discharge (PD) is a physical phenomenon, which causes defects and damages to the insulation. This phenomenon is regarded as the most important source of fault and defect in power transformers. Therefore, methods of high speed and precision are considered of special importance for the maintenance of transformers in localization of the origin of partial discharge. In this paper, the transformer winding is first modeled in a transient state by using RLC ladder network and multiconductor transmission line (MTL) models. The parameters of the two models were calculated by Ansoft Maxwell software, and the simulations were performed by Matlab software. Then, the PD pulses were applied to the models with different widths of pulses. With regard to the fact that the signals received after the application of PD had a variable frequency nature over time, and based on the wavelet transform and signal energy, a new method was presented for the localization of PD. Ultimately; the mentioned method was implemented on a 20 kV winding distribution transformer. Then, the performances of the models used in this paper, including RLC and MTL models, were compared in different frequency bands for the correct distinction of partial discharge location.

The vacancy diffusion and the formation of dislocation in graphene : Tight-binding molecular dynamics simulation

  • Lee, Gun-Do;Yoon, Eui-Joon;Hwang, Nong-Moon
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.54-55
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    • 2010
  • Vacancy defects in graphene can be created by electron or ion irradiation and those induce ripples which can change the electronic properties of graphene. Recently, the formation of defect structures such as vacancy defects and non-hexagonal rings has been reported in the high resolution transmission electron microscope (HR-TEM) of reduced graphene oxide [1]. In those HR-TEM images, it is noticed that the dislocations with pentagon-heptagon (5-7) pairs are formed and diffuses. Interestingly, it is also observed that two 5-7 pairs are separated and diffuse far away from each other. The separation of 5-7 pairs has been known to be due to their self-diffusion. However, from our tight-binding molecular dynamics simulation, it is found that the separation of 5-7 pairs is due to the diffusion of single vacancy defects and coalescence with 5-7 pairs. The diffusion and coalescence of single vacancy defects is too fast to be observed even in HR-TEM. We also implemented Van der Waals interaction in our tight-binding carbon model to describe correctly bi-layer and multi-layer graphene. The compressibility of graphite along c-axis in our tight-binding calculation is found to be in excellent agreement with experiment. We also discuss the difference between single layer and bi-layer graphene about vacancy diffusion and reconstruction.

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Nondestructive Internal Defects Evaluation for Pear Using NIR/VIS Transmittance Spectroscopy

  • Ryu, D.S.;Noh, S.H.;Hwnag, H.
    • Agricultural and Biosystems Engineering
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    • v.4 no.1
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    • pp.1-7
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    • 2003
  • Internal defects such as browning of the flesh and blackening and rot of the ovary of pear can be easily developed because of the inadequate environmental conditions during the storage and distribution of fruit. The quality assurance system for the agricultural product is to be settled in Korea. All defected agricultural products should be excluded prior to the distribution to enhance the commercial values. However, early stage on-line defect detection of agricultural product is very difficult and even more difficult in a case of the internal defects. The goal of this research is to develop a system that can detect and classify internal defects of agricultural produce on-line using VIS/NIR transmittance spectroscopy. And Shingo pear, which is one of the famous species of Korean pear, was used for the experiment. Soft independence modeling of class analogy (SIMCA) algorithm was employed to analyze the transmittance spectroscopic data qualitatively. On-line classification system was constructed and classification model was developed and validated. As a result, the correct classification rate (CCR) using the developed classification model was 96.1 %.

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Detection Algorithm for Cracks on the Surface of Tomatoes using Multispectral Vis/NIR Reflectance Imagery

  • Jeong, Danhee;Kim, Moon S.;Lee, Hoonsoo;Lee, Hoyoung;Cho, Byoung-Kwan
    • Journal of Biosystems Engineering
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    • v.38 no.3
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    • pp.199-207
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    • 2013
  • Purpose: Tomatoes, an important agricultural product in fresh-cut markets, are sometimes a source of foodborne illness, mainly Salmonella spp. Growth cracks on tomatoes can be a pathway for bacteria, so its detection prior to consumption is important for public health. In this study, multispectral Visible/Near-Infrared (NIR) reflectance imaging techniques were used to determine optimal wavebands for the classification of defect tomatoes. Methods: Hyperspectral reflectance images were collected from samples of naturally cracked tomatoes. To classify the resulting images, the selected wavelength bands were subjected to two-band permutations, and a supervised classification method was used. Results: The results showed that two optimal wavelengths, 713.8 nm and 718.6 nm, could be used to identify cracked spots on tomato surfaces with a correct classification rate of 91.1%. The result indicates that multispectral reflectance imaging with optimized wavebands from hyperspectral images is an effective technique for the classification of defective tomatoes. Conclusions: Although it can be susceptible to specular interference, the multispectral reflectance imaging is an appropriate method for commercial applications because it is faster and much less expensive than Near-Infrared or fluorescence imaging techniques.