• 제목/요약/키워드: coupling/decoupling networks

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커플링/디커플링 네트워크 내장 서지발생장치의 설계 및 제작 (Design and Fabrication of a Surge Generator with Coupling/Decoupling Networks)

  • 김남훈;강태호;신한신;길경석
    • 한국전기전자재료학회논문지
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    • 제33권2호
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    • pp.130-134
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    • 2020
  • Metal oxide varistors (MOVs) protect circuits and devices from transient overvoltages in electric power systems. However, a MOV continuously deteriorates owing to manufacturing defects or repetitive protective operations from transient overvoltages. A deteriorated MOV may result in a short circuit or a line-ground accident. Previous studies focused on the analysis of deterioration mechanisms and condition diagnosis techniques for MOVs owing to their recent growth of use. An accelerated deterioration experiment under the same conditions in which a MOV operates is essential. In this study, we designed and fabricated a surge generator that can apply a surge current to a MOV connected to AC mains. The coupling network operates at a low impedance against the surge current from the surge generator and transfers the surge current to the MOV under test. It also acts as a high impedance against AC mains for the AC voltage not to be applied to the surge generator. The decoupling network operates at a high impedance against the surge current and blocks the surge current from AC mains. It also acts as a low impedance against AC mains for the AC voltage to be applied to the MOV under test. The prototype surge generator can apply the 8/20 us up to 15 kA on AC voltages in the approximate range of 110~450 V, and it fully operates on a LabVIEW-based program.

뇌서지에 의한 플라이백 컨버터의 서지전류 경로 분석 (Analysis of Surge Current Path of Flyback Converter by Lightning Surge)

  • 박준우;이강희;김진호;홍성수;원재선;김종해
    • 전력전자학회논문지
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    • 제18권2호
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    • pp.178-183
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    • 2013
  • The study of lightning surge have been conducted on information and communications equipment and power system. However, the research on SMPS itself is an inactive field. This paper analyzes surge current path of flyback converter with the combination wave generator by lightning surge. Also, this paper discloses that there exists the surge current with high-frequency component besides the low-frequency component based on the standard surge current. This high-frequency surge current is the major reason to damage the semiconductor devices such as FET and IC. To confirm the validity of the proposed issue, the analysis and experimental results are presented.