• Title/Summary/Keyword: component testing

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A Study of Static Random Access Memory Single Event Effect (SRAM SEE) Test using 100 MeV Proton Accelerator (100 MeV 양성자가속기를 활용한 SRAM SEE(Static Random Access Memory Single Event Effect) 시험 연구)

  • Wooje Han;Eunhye Choi;Kyunghee Kim;Seong-Keun Jeong
    • Journal of Space Technology and Applications
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    • v.3 no.4
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    • pp.333-341
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    • 2023
  • This study aims to develop technology for testing and verifying the space radiation environment of miniature space components using the facilities of the domestic 100 MeV proton accelerator and the Space Component Test Facility at the Space Testing Center. As advancements in space development progress, high-performance satellites increasingly rely on densely integrated circuits, particularly in core components components like memory. The application of semiconductor components in essential devices such as solar panels, optical sensors, and opto-electronics is also on the rise. To apply these technologies in space, it is imperative to undergo space environment testing, with the most critical aspect being the evaluation and testing of space components in high-energy radiation environments. Therefore, the Space Testing Center at the Korea testing laboratory has developed a radiation testing device for memory components and conducted radiation impact assessment tests using it. The investigation was carried out using 100 MeV protons at a low flux level achievable at the Gyeongju Proton Accelerator. Through these tests, single event upsets observed in memory semiconductor components were confirmed.

Main Factors that Effect on the Ion-Migration of PCB (PCB의 이온-마이그레이션에 영향을 미치는 주요요인)

  • Jang, In-Hyeok;Kim, Jeong-Ho;Oh, Gil-Gu;Lee, Young-Joo;Lim, Hong-Woo;Choi, Youn-Ok
    • Journal of Applied Reliability
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    • v.16 no.3
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    • pp.202-207
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    • 2016
  • Purpose: The purpose of this study is main factors (environmental conditions, pattern spacing, pattern material) that effect the ion-migration of PCB. Methods: Recently, the electronic components are becoming more high density of electronic device, so that electronic circuits have smaller pitches between the patten and more vulnerable to insulation failure. so the reliability of electric insulation of device has become an ever important issue as device contact pitches of pattern. Usually, ion-migration occurs in high temperature and high humidity environment as voltage is applied to the circuit. Under high temperature and high humidity, voltage applied electronic components respond to applied voltages by metals's electrochemical ionization and a conducting filament forms between the anode and cathode across a nonmetallic medium. This leads to short-circuit failure of the electronic component. Results: we studied ion-migration that occurs in accordance with the main factors (environmental conditions, pitches, pattern material). The PCB pattern material was made by two different types of material (free solder, OSP) for this research and pitches of pattern is 0.15mm, 0.3mm, 0.5mm. PCB was experimented in the environmental conditions (high temperature $120^{\circ}C$, high temperature and high humidity $85^{\circ}C$, 85%RH) and was analyzed for ion-migration through the experiment results. Conclusion: We confirmed that environmental condition, pitches of pattern, pattern material had effect on ion-migration of PCB.

Comparison of the Current Migration Testing Regulations for Plastic Containers and Packaging Materials in EU, USA and Korea or Japan (유럽연합, 미국, 한국 및 일본의 합성수지 용기.포장재에 대한 현행 이행실험 규정 비교)

  • Lee, Keun-Taik;Lee, Chang-Sung
    • KOREAN JOURNAL OF PACKAGING SCIENCE & TECHNOLOGY
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    • v.5 no.2
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    • pp.42-58
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    • 1999
  • Packaging materials and articles that are used in food contact applications can transfer constituents in the foodstuffs. This kind of risk of possible health hazards to consumers has been generally recognized for a long time with the consequence of establishing corresponding food regulations in most developed countries. However, the language of these laws, their interpretation, and their level of enforcement vary from country to country. Accordingly, the actual migrating levels from packaging materials can be varied depending on the migration testing methods as prescribed in the national legislation in each countries. Therefore, there are needs of elimination of non-tariff trade barriers raised by sanitary and phytosanitary or technical measures under the Final Act of the UR Agreement. In this connection, the EU and USA are currently in an ongoing process of legislation harmonization to overcome potential barriers to free trade. In general, regulations governing component transfer in the USA are more complicated and comprehensive than similar regulations in Europe. In future, standard migration testing procedures for microwave heat susceptor materials and for the use of fatty food simulant should be established and also harmonized among countries. The objective of this investigation is to compare the current regulations for migration testing for plastic containers and packaging materials in USA, EU and Korea or Japan. For those regulations, Korean standards are required to be kept up with the international standards. By doing this, the related Korean regulation could be amended along with the worldwide progress for harmonization.

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TID and SEL Testing on OP-Amp. of DC/DC Power Converter (DC/DC 컨버터용 OP-Amp.의 TID 및 SEL 실험)

  • Lho, Young Hwan
    • Journal of the Korean Society of Radiology
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    • v.11 no.3
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    • pp.101-108
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    • 2017
  • DC/DC switching power converters are commonly used to generate a regulated DC output voltage with high efficiency. The advanced DC/DC converter uses a PWM-IC with OP-Amp. (Operational Amplifier) to control a MOSFET (metal-oxide semiconductor field effect transistor), which is a switching component, efficiently. In this paper, it is shown that the electrical characteristics of OP-Amp. are affected by radiations of ${\gamma}$ rays using $^{60}Co$ for TID (Total Ionizing Dose) testing and 5 heavy ions for SEL (Single Event Latch-up) testing. TID testing on OP-Amp. is accomplished up to the total dose of 30 krad, and the cross section($cm^2$) versus LET($MeV/mg/cm^2$) in the OP-Amp. operation is evaluated SEL testing after implementation of the controller board.

The study of PCB tester for improving productivity (생산성향상을 위한 회로카드조립체 시험장비에 관한 연구)

  • Lee, Sang-Myung;Kim, Young-Kil
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.16 no.12
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    • pp.2808-2814
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    • 2012
  • The most of military systems that developed today are composed with many sub-systems for mission execution. The test of military systems for delivery test of mass product such that part test, PCB test, component test, integration test. Improving productivity is minimize testing item by man and minimize kind of tester, so that decrease product cost by production time for test. PCB tester be developed many kind of test method that systems were developed by many different engineers. This article studies testing check point for testing that how to minimize of kind of tester, how to automatic test for all of function that have inputs and outputs. Development of tester for improving productivity requires classify functional allocation of main system and sub system, sub system require PCB for functional allocation start on preliminary design period for reducing testing item and testing fixture.

Strategic Analysis Evolution: Scenario Planning and Simulation Based on The Methodology of System Dynamics

  • Bassi, Andrea M
    • Korean System Dynamics Review
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    • v.5 no.2
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    • pp.199-216
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    • 2004
  • The present study is aimed at developing the optimal instruments for dispelling the uncertainty factors during the formulation of strategies for corporate development. The objective is the creation of a complete model of strategic analysis, which encompasses both the environment (internal and external) and the management rational component. This model -built on the analysis of three corporate cases - is concretized by a simulation for testing the strategy by the means of software which enables the users to cope with a dynamic and complex corporate environment. The research questions regard the development of a complete strategic analysis, which covers the entire decision-making process; the concrete assessment of the business strategy on the basis of quantitative data: the identification and enhancement of the critical variables of business administration, in such a complex and dynamic reality as the corporate environment.

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SYSTEM ARCHITECTURE OF THE TELEMATICS POSITIONING TESTBED

  • Kim, Young-Min;Kim, Bong-Soo;Choi, Wan-Sik
    • Proceedings of the KSRS Conference
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    • 2005.10a
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    • pp.349-352
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    • 2005
  • The telematics positioning testbed is an infrastructure to test and verify positioning technology, the sub-component of telernatics system. The positioning testbed provides the environment of performance analysis for acquisition of static and dynamic positioning information using telematics vehicle. This testbed consists of onboard positioning system, positioning reference station and lab positioning server. The onboard positioning system equipped in telematics vehicle, consists of target positioning system, reference positioning system, and analysis tool. A equipment acquiring high precision positioning data obtained from GPS combined with IMU was set as a reference positioning system. Analysis tool compares observed positioning data with high precision positioning information from a reference positioning system, and processes positioning information. Positioning reference station is RTK system used for reducing atmosphere error, and it transmits corrected information to reference positioning system. Positioning server which is located at laboratory manages positioning database and provides monitoring data to integrated testbed operating system. It is expected that the testbed supports commercialization of telernatics technology and services, integrated testing among component technology and verification.

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A Conformance Test Procedure for the Enterprise JavaBeans (컴포넌트 소프트웨어를 위한 적합성 검증 방법)

  • Joo, Un-Gi;Kim, Joong-Bae
    • IE interfaces
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    • v.17 no.2
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    • pp.149-157
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    • 2004
  • This paper considers a conformity testing problem on EJB(Enterprise JavaBeans). The EJB architecture is a component architecture for the development and deployment of component-based distributed business applications. The objective is to find an optimal test sequence for the conformity test between the EJB specification and an implemented one. For the test sequence, we formulate the problem as a rural Chinese postman tour one and use a linear programming formulation. Based upon the formulations, we suggest a conformance test procedure and show its efficiency by applying the procedure to the CMP(Container- Managed persistency) entity bean of the EJB.

The Development of an Instrument for the Measurement of Science Process Skills of the Korean Elementary and Middle School Students (초.중학생들의 과학탐구능력 측정도구의 개발)

  • Kwon, Jae-Sool;Kim, Beom-Ki
    • Journal of The Korean Association For Science Education
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    • v.14 no.3
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    • pp.251-264
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    • 1994
  • There are a considerable number of instruments in testing science process skills in Korea as well as America and Europe. However, it has been difficult to find the instruments encompass the wide range of scientific process skills. Most instruments developed and used in Korea were focused on a school level or a few components of scientific process skills. In this study, the researchers examined the whole body of scientific process and identified 10 component skills. Three items for each component process skills were developed and revised by two pilot tests. The final instruments showed moderate difficulty, discrimination index, reliability, and validity. The instrument was also tested the usability by finding differences of students' ability on science process skills by grade levels, sexes, and city size. The results showed that the instrument was proved to be useful to discriminates the differences.

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Numerical Algorithm for Power Transformer Protection

  • Park, Chul-Won;Suh, Hee-Seok;Shin, Myong-Chul
    • KIEE International Transactions on Power Engineering
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    • v.4A no.3
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    • pp.146-151
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    • 2004
  • The most widely used primary protection for the internal fault detection of the power transformer is current ratio differential relaying (CRDR) with harmonic restraint. However, the second harmonic component could be decreased by magnetizing inrush when there have been changes to the material of the iron core or its design methodology. The higher the capacitance of the high voltage status and underground distribution, the more the differential current includes the second harmonic during the occurrence of an internal fault. Therefore, the conventional second harmonic restraint CRDR must be modified. This paper proposes a numerical algorithm for enhanced power transformer protection. This algorithm enables a clear distinction regarding internal faults as well as magnetizing inrush and steady state. It does this by analyzing the RMS fluctuation of terminal voltage, instantaneous value of the differential current, RMS changes, harmonic component analysis of differential current, and analysis of flux-differential slope characteristics. Based on the results of testing with WatATP99 simulation data, the proposed algorithm demonstrated more rapid and reliable performance.