• Title/Summary/Keyword: coherent x-ray

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X-ray Diffraction from X-ray Waveguide Arrays for Generation of Coherent X-ray

  • Park, Yong-Sung;Choi, Jae-Ho
    • Journal of the Optical Society of Korea
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    • v.14 no.4
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    • pp.333-336
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    • 2010
  • The generation of coherent x-ray beams by using a multi-slit diffraction phenomenon is presented. The mode-confinement conditions in the x-ray waveguide (XWG) needed to obtain single-mode beams are determined. The XWGs are stacked to form an XWG array. The core of the XWG array is used as a slit in an opaque screen, similar to those used for visible light. Diffraction patterns that interfered constructively in the XWG array are investigated based on multi-slit diffraction theory. The irradiance distributions are studied at on observation screen. The FWHM of diffracted x-ray spectra were between $1.67{\times}10^{-4}$ to $3.30{\times}10^{-5}$ radians which lead to a spot-size of a few tens of micrometers on the screen at distance of 1 m. The intensities decrease with increase in the period of the XWG array, i.e. a thicker cladding, due to growth of the higher-order diffraction peaks.

Real-time Temporal Characterization and Performance Optimization of a kHz Femtosecond Ti:Sapphire Laser Using a Comprehensive SPIDER

  • Luu, Tran Trung;Park, Ju-Yun;Lee, Jae-Hwan;Nam, Chang-Hee
    • Journal of the Optical Society of Korea
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    • v.14 no.2
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    • pp.146-151
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    • 2010
  • A comprehensive real-time spectral phase interferometry for direct electric field reconstruction (SPIDER) apparatus for characterizing femtosecond laser pulses is demonstrated. The SPIDER provides the temporal profiles of femtosecond laser pulses, reconstructed at the speed of 3.5 Hz, with parameters of the spectral phase such as group delay dispersion and third-order dispersion. The apparatus is applied successfully to optimize the spectral dispersion of a kHz femtosecond Ti:Sapphire laser by adjusting a grating compressor in real time.

Coherent x-ray scattering to study dynamics in thin films (결맞는 X-선 산란을 이용한 박막의 표면 거동 연구)

  • Kim, Hyun-Jung
    • Journal of the Korean Vacuum Society
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    • v.14 no.3
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    • pp.143-146
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    • 2005
  • A new method of x-ray photon correlation spectroscopy (XPCS) using coherent x-rays is developed recently for probing the dynamics of surface height fluctuations as a function of lateral length scale. This emerging technique applies the principles of dynamic light scattering in the x-ray regime. The short wavelength and slow time scales characteristic of XPCS extend the phase space accessible to scattering studies beyond some restrictions by light and neutron. In this paper, we demonstrate XPCS to study the dynamics of surface fluctuations in thin supported polymer films. We present experimental verification of the theoretical predictions for the wave vector and temperature dependence of the capillary wave relaxation times for the supported polymer films at melt for the film thicknesses thicker than 4 times of the radius of gyration of polymer. We observed a deviation from the conventional capillary wave predictions in thinner films. The analysis will be discussed in terms of surface tension, viscosity and effective interactions with the substrate.

High-power Femtosecond Ti:sapphire Laser at 1 KHz with a Long-cavity Femtosecond Oscillator

  • Sung, Jae-Hee;Hong, Kyung-Han;Nam, Chang-Hee
    • Journal of the Optical Society of Korea
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    • v.7 no.3
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    • pp.135-138
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    • 2003
  • A chirped-pulse amplification femtosecond Ti:sapphire laser operating at 1 KHz has been developed. The laser system consisted of a long-cavity femtosecond oscillator, a four-pass grating pulse stretcher, two multi-pass amplifiers and a double-pass grating pulse compressor. Thermal lensing at the amplifiers was reduced by cooling Ti:sapphire crystals using Peltier coolers. Gain narrowing and residual phase errors were compensated for by the use of an acousto-optic pulse shaper. The final laser output had an energy per pulse of 2.0 mJ and a pulse duration of 19.5 fs, reaching 0.1 TW at 1 KHz.

Characterization of carrier-envelope-offset frequency of a femtosecond laser stabilized by the direct CEP locking method

  • Luu, Tran Trung;Lee, Jae-Hwan;Kim, Eok-Bong;Park, Chang--Yong;Yu, Tae-Jun;Nam, Chang-Hee
    • Proceedings of the Optical Society of Korea Conference
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    • 2009.10a
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    • pp.241-242
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    • 2009
  • Characterics of carrier-envelope-offset frequency ($f_{ceo}$) of a femtosecond laser stabilized by the direct locking method were investigated using two f-to-2f interferometers. The stability of $f_{ceo}$ was comaparable to that achieved with a conventional PLL method.

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Measurement of the group-delay dispersion of optical elements using white-light interferometry (백색광 간섭계를 이용한 광학소자의 군지연분산 측정)

  • Tayyab Imran;Hong, Kyung-Han;Yu, Tae-Jun;Nam, Chang-Hee
    • Proceedings of the Optical Society of Korea Conference
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    • 2003.07a
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    • pp.248-249
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    • 2003
  • The characterization of laser mirrors is important for obtaining proper performance of femtosecond lasers. Characteristics of laser mirrors are usually described in terms of their reflectivity at a certain wavelength. In femtosecond laser applications, however, the dispersion property of the mirror should be considered because the temporal shape of a femtosecond light pulse changes during the reflection at the mirrors. (omitted)

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Structure of Ni and NiO Nanoparticles Observed by X-ray Coherent Diffraction Imaging

  • Kim, Chan;Kim, Yoon-Hee;Hamh, Sun-Young;Son, Jun-Gon;Khakurel, Krishna Prasad;Iqbal, Mazhar;Noh, Do-Young
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.542-543
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    • 2012
  • Coherent diffraction imaging (CDI) method using hard x-ray at 5.46 keV was applied to study assembly of Ni and Ni oxide nano structures formed on a Si3N4 membrane. Density distribution of Ni nano-particles was obtained quantitatively with about 15 nm lateral resolution by reconstructing images from the speckle diffraction pattern. In addition, reconstructed images of nickel oxide particles indicated that Ni atoms diffuse out during the oxidation process leaving pores inside the nickel oxide crust. Furthermore, we recognize that really weak phase object, less than 5 nm thickness of Ni residues, can be reconstructed due to the reference particles. We achieved quantitative information of nanometer sized materials and demonstrate the effect of reference particles by using hard x-ray coherent diffractive imaging method.

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