• Proceedings of the IEEK Conference
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• 2006.06a
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• pp.465-466
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• 2006

In this paper, novel analog duty cycle corrector (DCC) with a digital duty error detector is proposed. The digital duty error detector measures the duty error of the clock and converts it into a digital code. This digital code is then used to accurately correct the duty ratio by adaptively steering the charge-pump current. The proposed duty cycle corrector was implemented using an 80nm DRAM process with 1.8V supply voltage. The simulation result shows that the proposed duty cycle corrector improves the settling time up to $70{\sim}80%$ at 500MHz clock frequency for the same duty correction accuracy as the conventional analog DCC.

• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.2
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• pp.152-156
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• 2013

This paper presents a fast-lock dual-loop successive approximation register-controlled duty-cycle corrector (SARDCC) circuit using a mixed (binary+sequential) search algorithm. A wider duty-cycle correction range, higher operating frequency, and higher duty-cycle correction accuracy have been achieved by utilizing the dual-loop architecture and the binary search SAR that achieves the fast duty-cycle correcting property. By transforming the binary search SAR into a sequential search counter after the first DCC lock-in, the proposed dual-loop SARDCC keeps the closed-loop characteristic and tracks variations in process, voltage, and temperature (PVT). The measured duty cycle error is less than ${\pm}0.86%$ for a wide input duty-cycle range of 15-85 % over a wide frequency range of 0.5-2.0 GHz. The proposed dual-loop SARDCC is fabricated in a 0.18-${\mu}m$, 1.8-V CMOS process and occupies an active area of $0.075mm^2$.

• Journal of Korea Society of Industrial Information Systems
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• v.18 no.5
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• pp.51-58
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• 2013

A clock duty-cycle corrector (DCC) which is an essential device of clocking circuits for high-speed system-on-chip (SoC) design is introduced in this paper. The architectures and operation of conventional analog feedback DCCs and digital feedback DCCs are compared and analyzed. A new mixed-mode feedback DCC that combines the advantages of analog DCCs and digital DCCs to achieve a wider duty-cycle correction range, higher operating frequency, and higher duty-cycle correction accuracy is presented. Especially, the architectures and design of a mixed-mode duty-cycle amplifier (DCA) which is a core unit circuit of a mixed-mode DCC is presented in detail. Two mixed-mode DCCs based on a single-stage DCA and a two-stage DCA were designed in a 0.18-${\mu}m$ CMOS process, and it is proven that the two-stage DCA-based DCC has a wider duty-cycler correction range and smaller duty-cycle correction error.

• Journal of the Institute of Electronics and Information Engineers
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• v.49 no.10
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• pp.142-147
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• 2012

This paper presents a mixed-mode CMOS duty-cycle corrector (DCC) circuit that has a dynamic frequency scaling (DFS) counter and coarse and fine tuning adjustments. A higher duty-cycle correction accuracy and smaller jitter have been achieved by utilizing the DFS counter that reduces the bit-switching glitch effect of a digital to analog converter (DAC). The proposed circuit has been designed using a 0.18-${\mu}m$ CMOS process. The measured duty cycle error is less than ${\pm}1.1%$ for a wide input duty-cycle range of 25-75% over a wide freqeuncy range of 0.5-1.5 GHz.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.48 no.4
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• pp.39-50
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• 2011

In this paper, we presents a CDR circuit for $2^{nd}$-generation AiPi+, one of the Intra-panel Interface. The speed of the proposed clock and data recovery is increased to 1.25 Gbps compared with that of AiPi+. The DLL-based CDR architecture is used to generate the multi-phase clocks. We propose the simple scheme for frequency detector (FD) to mitigate the harmonic-locking and reduce the complexity. In addition, the duty cycle corrector that limits the maximum pulse width is used to avoid the problem of missing clock edges due to the mismatch between rising and falling time of VCDL's delay cells. The proposed CDR is implemented in 0.18 um technology with the supply voltage of 1.8 V. The active die area is $660\;{\mu}m\;{\times}\;250\;{\mu}m$, and supply voltage is 1.8 V. Peak-to-Peak jitter is less than 15 ps and the power consumption of the CDR except input buffer, equalizer, and de-serializer is 5.94 mW.