• 제목/요약/키워드: chip size package

검색결과 84건 처리시간 0.03초

백색 LED용 Y3Al5O12:Ce3+ 형광체 크기 효과 및 광 시뮬레이션 (The Size Effect and Its Optical Simulation of Y3Al5O12:Ce3+ Phosphors for White LED)

  • 이성훈;강태욱;김종수
    • 반도체디스플레이기술학회지
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    • 제18권1호
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    • pp.10-14
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    • 2019
  • In this study, we synthesized two $Y_3Al_5O_{12}:Ce^{3+}$ phosphors ($7{\mu}m$-sized and $2{\mu}m$-sized YAG) with different sizes by controlling particles sizes of starting materials of the phosphors for white LED. In the smaller one ($2{\mu}m$-sized YAG), its photoluminescence intensity in the reflective mode was 63 % that of the bigger one ($7{\mu}m$-sized YAG); the quantum efficiencies were 93 % and 70 % for the smaller and the bigger ones. Two kinds of white LED packages with the same color coordinates were fabricated with a blue package (chip size $53{\times}30$) and two phosphors. The luminous flux of the white LED package with the smaller YAG phosphor was 92 % of that with the bigger one, indicating that the quantum efficiency of phosphor dispersed inside LED package was higher than that of the pure powder. It was consistently confirmed by the optical simulation (LightTools 6.3). It is notable according to the optical simulation that the white LED with the smaller phosphor showed 24 % higher luminous efficiency. If the smaller one had the same quantum efficiency as the bigger one (~93 %). Therefore, it can be suggested that the higher luminous efficiency of white LED can be possible by reducing the particle size of the phosphor along with maintaining its similar quantum efficiency.

An Wideband GaN Low Noise Amplifier in a 3×3 mm2 Quad Flat Non-leaded Package

  • Park, Hyun-Woo;Ham, Sun-Jun;Lai, Ngoc-Duy-Hien;Kim, Nam-Yoon;Kim, Chang-Woo;Yoon, Sang-Woong
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제15권2호
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    • pp.301-306
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    • 2015
  • An ultra-compact and wideband low noise amplifier (LNA) in a quad flat non-leaded (QFN) package is presented. The LNA monolithic microwave integrated circuit (MMIC) is implemented in a $0.25{\mu}m$ GaN IC technology on a Silicon Carbide (SiC) substrate provided by Triquint. A source degeneration inductor and a gate inductor are used to obtain the noise and input matching simultaneously. The resistive feedback and inductor peaking techniques are employed to achieve a wideband characteristic. The LNA chip is mounted in the $3{\times}3-mm^2$ QFN package and measured. The supply voltages for the first and second stages are 14 V and 7 V, respectively, and the total current is 70 mA. The highest gain is 13.5 dB around the mid-band, and -3 dB frequencies are observed at 0.7 and 12 GHz. Input and output return losses ($S_{11}$ and $S_{22}$) of less than -10 dB measure from 1 to 12 GHz; there is an absolute bandwidth of 11 GHz and a fractional bandwidth of 169%. Across the bandwidth, the noise figures (NFs) are between 3 and 5 dB, while the output-referred third-order intercept points (OIP3s) are between 26 and 28 dBm. The overall chip size with all bonding pads is $1.1{\times}0.9mm^2$. To the best of our knowledge, this LNA shows the best figure-of-merit (FoM) compared with other published GaN LNAs with the same gate length.

몰드 두께에 의한 팬 아웃 웨이퍼 레벨 패키지의 Warpage 분석 (Analysis of Warpage of Fan-out Wafer Level Package According to Molding Process Thickness)

  • 문승준;김재경;전의식
    • 반도체디스플레이기술학회지
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    • 제22권4호
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    • pp.124-130
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    • 2023
  • Recently, fan out wafer level packaging, which enables high integration, miniaturization, and low cost, is being rapidly applied in the semiconductor industry. In particular, FOWLP is attracting attention in the mobile and Internet of Things fields, and is recognized as a core technology that will lead to technological advancements such as 5G, self-driving cars, and artificial intelligence in the future. However, as chip density and package size within the package increase, FOWLP warpage is emerging as a major problem. These problems have a direct impact on the reliability and electrical performance of semiconductor products, and in particular, cause defects such as vacuum leakage in the manufacturing process or lack of focus in the photolithography process, so technical demands for solving them are increasing. In this paper, warpage simulation according to the thickness of FOWLP material was performed using finite element analysis. The thickness range was based on the history of similar packages, and as a factor causing warpage, the curing temperature of the materials undergoing the curing process was applied and the difference in deformation due to the difference in thermal expansion coefficient between materials was used. At this time, the stacking order was reflected to reproduce warpage behavior similar to reality. After performing finite element analysis, the influence of each variable on causing warpage was defined, and based on this, it was confirmed that warpage was controlled as intended through design modifications.

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TSV 인터포저 기술을 이용한 3D 패키지의 방열 해석 (Thermal Analysis of 3D package using TSV Interposer)

  • 서일웅;이미경;김주현;좌성훈
    • 마이크로전자및패키징학회지
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    • 제21권2호
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    • pp.43-51
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    • 2014
  • 3차원 적층 패키지(3D integrated package) 에서 초소형 패키지 내에 적층되어 있는 칩들의 발열로 인한 열 신뢰성 문제는 3차원 적층 패키지의 핵심 이슈가 되고 있다. 본 연구에서는 TSV(through-silicon-via) 기술을 이용한 3차원 적층 패키지의 열 특성을 분석하기 위하여 수치해석을 이용한 방열 해석을 수행하였다. 특히 모바일 기기에 적용하기 위한 3D TSV 패키지의 열 특성에 대해서 연구하였다. 본 연구에서 사용된 3차원 패키지는 최대 8 개의 메모리 칩과 한 개의 로직 칩으로 적층되어 있으며, 구리 TSV 비아가 내장된 인터포저(interposer)를 사용하여 기판과 연결되어 있다. 실리콘 및 유리 소재의 인터포저의 열 특성을 각각 비교 분석하였다. 또한 본 연구에서는 TSV 인터포저를 사용한 3D 패키지에 대해서 메모리 칩과 로직 칩을 사용하여 적층한 경우에 대해서 방열 특성을 수치 해석적으로 연구하였다. 적층된 칩의 개수, 인터포저의 크기 및 TSV의 크기가 방열에 미치는 영향에 대해서도 분석하였다. 이러한 결과를 바탕으로 메모리 칩과 로직 칩의 위치 및 배열 형태에 따른 방열의 효과를 분석하였으며, 열을 최소화하기 위한 메모리 칩과 로직 칩의 최적의 적층 방법을 제시하였다. 궁극적으로 3D TSV 패키지 기술을 모바일 기기에 적용하였을 때의 열 특성 및 이슈를 분석하였다. 본 연구 결과는 방열을 고려한 3D TSV 패키지의 최적 설계에 활용될 것으로 판단되며, 이를 통하여 패키지의 방열 설계 가이드라인을 제시하고자 하였다.

An Experiment on Thermosyphon Boiling in Uniformly Heated Vertical Tube and Asymmetrically Heated Vertical Channel

  • Kwak, Ho-Young;Jeon, Jin-Seok;Na, Jung-Hee;Park, Hong-Chul
    • Journal of Mechanical Science and Technology
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    • 제15권1호
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    • pp.98-107
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    • 2001
  • Continuing efforts to achieve increased circuit performance in electronic package have resulted in higher power density at chip and module level. As a result, the thermal management of electronic package has been important in maintaining or improving the reliability of the component. An experimental investigation of thermosyphonic boiling in vertical tube and channel made by two parallel rectangular plates was carried out in this study for possible application of the direct immersion cooling. Fluorinert FC-72 as a working fluid was used in this experiment. Asymmetric heated channel of open periphery with gap size of 1, 2, 4 and 26mm and uniformly heated vertical tubes with diameter of 9, 15 and 20mm were boiled at saturated condition. The boiling curves from tested surfaces exhibited the boiling hysteresis. It was also found that the gap size is not a significant parameter for the thermosyphonic boiling heat transfer with this Fluorinert. Rather pool boiling characteristics appeared for larger gap size and tube diameter. The heat transfer coefficients measured were also compared with the calculation results by Chens correlation.

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초음파 분량법에 의한 레진 내부 결합의 크기 측정에 관한 연구 (Sizing of lnner Flaw in Resin by using Ultrasonic spectroscopy)

  • Han, E.K.;Kim, Y.J.;Park, I.G.
    • 한국정밀공학회지
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    • 제10권3호
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    • pp.182-190
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    • 1993
  • In manufacturing process of semiconductor package, the thermal stress owing to high temperature in moulding and the bubbles generated in chip bonding process become main causes to produce void. On this study we evaluated quantitatively void size by use of ultrasonic spectroscopy method which analyze the reflective pulses with broad band frequency in frequency domain, and after destructive testing we verified effectiv- eness of sizing void by use of ultasonic spectroscopy.

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CSP의 Multi-sorting을 위한 pick and place 시스템의 개발 (The development of Pick and place system for multi-sorting of CSP)

  • 김찬용;곽철훈;이은상
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 1997년도 추계학술대회 논문집
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    • pp.171-174
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    • 1997
  • The great development of semiconductor industry demands the high efficiency and performance of related device, but the pick and place system of semiconductor packaging device can load a few units until nowdays. Although the system can load a lot of units, it can work multiple sort operation. The defect like that causes a low efficiency. Therefore, this paper represents the development of pick and place system which can work multiple sort operation.

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유한요소 해석을 이용한 팬아웃 웨이퍼 레벨 패키지 과정에서의 휨 현상 분석 (Warpage Analysis during Fan-Out Wafer Level Packaging Process using Finite Element Analysis)

  • 김금택;권대일
    • 마이크로전자및패키징학회지
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    • 제25권1호
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    • pp.41-45
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    • 2018
  • 기술의 발전과 전자기기의 소형화와 함께 반도체의 크기는 점점 작아지고 있다. 이와 동시에 반도체 성능의 고도화가 진행되면서 입출력 단자의 밀도는 높아져 패키징의 어려움이 발생하였다. 이러한 문제를 해결하기 위한 방법으로 산업계에서는 팬아웃 웨이퍼 레벨 패키지(FO-WLP)에 주목하고 있다. 또한 FO-WLP는 다른 패키지 방식과 비교해 얇은 두께, 강한 열 저항 등의 장점을 가지고 있다. 하지만 현재 FO-WLP는 생산하는데 몇 가지 어려움이 있는데, 그 중 한가지가 웨이퍼의 휨(Warpage) 현상의 제어이다. 이러한 휨 변형은 서로 다른 재료의 열팽창계수, 탄성계수 등에 의해 발생하고, 이는 칩과 인터커넥트 간의 정렬 불량 등을 야기해 대량생산에 있어 제품의 신뢰성 문제를 발생시킨다. 이러한 휨 현상을 방지하기 위해서는 패키지 재료의 물성과 칩 사이즈 등의 설계 변수의 영향에 대해 이해하는 것이 매우 중요하다. 이번 논문에서는 패키지의 PMC 과정에서 칩의 두께와 EMC의 두께가 휨 현상에 미치는 영향을 유한요소해석을 통해 알아보았다. 그 결과 특정 칩과 EMC가 특정 비율로 구성되어 있을 때 가장 큰 휨 현상이 발생하는 것을 확인하였다.

IC 칩 냉각용 초소형 히트 파이프의 제작 및 성능 평가 (Fabrication and Characteristics Test of Micro Heat Pipe Array for IC Chip Cooling)

  • 박진성;최장현;조형철;조한상;양상식;유재석
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제50권7호
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    • pp.351-363
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    • 2001
  • This paper presents an experimental investigation on the heat trensfer characteristic of micro pipe (MHP) array with 38 triangular microgrooves. A heat pipe is an effective heat exchanger operating without external power. The heat pipe transfers heat by means of the latent heat of vaporization and two-phase fluid flow driven by the capillary force. The overall size of the MHP array can be put undermeath a microelectonic die and integrated into the electrronic package of a microelectronin device to dissipate the heat from the die. The MHP array is fabricated by micromachining with a silicon wafer and a glass substrate. The MHP was filled with water and sealed. The experimental results show the temperature decrease of 12.1$^{\circ}C$ at the evaporator section for the input power of 5.9 W and the improvement of 28% in the heat transfer rate.

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플립칩 연결부 구성요소들이 전송특성에 미치는 영향 (Effects of Flip-chip interconnect elements on the transmission characteristics)

  • 이재훈;황보훈;나완수;주진호;정승부
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2005년도 제36회 하계학술대회 논문집 C
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    • pp.2357-2359
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    • 2005
  • In this paper, we analyzed the effect of flip chip interconnect which is a part of FC-BGA package on the transmission characteristics of interconnect. We designed simple interconnect model and analyzed the change of the transmission characteristics as the size of each component change. And we provided design guide of interconnect which shows more enhanced results.

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