• Title/Summary/Keyword: calibration circuit

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Measurements of X-Ray and Gamma Ray Dosse Rate by the Silicon P-N Junction Diode (Silicon P-N Junction Diode에 대한 X-Ray 및 Gamma-Ray 의 Dose Ratec 측정)

  • 정만영;김덕진
    • 전기의세계
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    • v.13 no.3
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    • pp.13-20
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    • 1964
  • The measurements of X-ray and Gamma-ray Dose Rate have been successfully made by measuring the short circuit current of the Silicon P-N Junction Diode being irradiated. The short circuit current flows when a silicon P-N Junction Diode is irradiated by X-ray of Gammaray radiations due to photovoltaic effect. A brief analysis is given in order to verify the proportionality of a short circuit current to the Dose Rate. Using this method, measurements of X-ray Dose Rate were carried out in the range of 0.05-1600 r/m successfully. The calibration was made by comparing with Victoreen condenser r-meter. Some advantages in this Dose Rate meter over a condenser r-meter were found. One can measure a continous variation of X-ray Dose Rate with this rate meter at the control console of X-ray device.

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Source-Follower Type Analog Buffer Using Low Temperature Poly-Si TFTs for AMLCDs

  • Chen, Bo-Ting;Tai, Ya-Hsiang;Wei, Ying-Jyun;Tsai, Chun-Chien;Chen, Hsu-Hsin;Huang, Chun-Yao;Kuo, Yu-Ju;Cheng, Huang-Chung
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.1243-1246
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    • 2006
  • A new source follower circuit for the integrated circuit of AMLCDs is proposed. Active load is added and calibration operation is applied to compensate the circuits. Proposed circuit is capable of minimizing the variation from both timing and device variations through measured results, the uniformity and bias effect are discussed.

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A Study on the measurement and Method of Partial Discharge in High Voltage CV Cable (고압 CV 케이블에서의 부분방전 측정과 위치검출 방법에 관한 연구)

  • Song Jae-Yong;Seo Hwang-Dong;Park Dae-Won;Kil Gyung-Suk;Han Moon-Sup;Jang Dong-Wook
    • Proceedings of the KSR Conference
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    • 2005.05a
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    • pp.867-872
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    • 2005
  • This paper describes the measurement and location method of partial discharges in high voltage CV cables. Coupling capacitors were used to detect partial discharge signal. Impedance characteristic of the coupling circuit and an amplifier with a high Common Mode Rejection Ratio(CMRR) were studied to improve sensitivity of the circuit. From the calibration experiment, the sensitivity of the partial discharge detection circuit was about 100pC. Also, we confirmed that the location of partial discharges in cables can be estimated by calculation of time difference between the first pulse and the second one reflected from the other end of the cable.

The Gamma-Ray Detection Circuit design of RI Use Instrument for Hand Carry (휴대용 RI 이용 계기의 감마선 검출 회로설계)

  • Seong, Nak-Jin;Kim, Sang-Jin;Kim, Ki-Joon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.05b
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    • pp.154-158
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    • 2003
  • In this study, to measure the density of compaction, it is designed to use the 5 gamma-ray detectors. The developed instrument consists of measuring circuits for gamma-rays and thermal neutrons, a high voltage supply unit, stable circuit unit, count circuit unit and a microprocessor. To read count pulse from gamma-ray detectors are very accurate and it can be count to data calibration excluded count of ripple.

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A Wide - Range Dual-Loop DLL with Programmable Skew - Calibration Circuitry for Post Package (패키지후 프로그램을 이용 스큐 수정이 가능한 광범위한 잠금 범위를 가지고 있는 이중 연산 DLL 회로)

  • Choi, Sung-Il;Moon, Gyu;Wee, Jae-Kyung
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.40 no.6
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    • pp.408-420
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    • 2003
  • This paper describes a Delay Locked Loop (DLL) circuit having two advancements : 1) a dual loop operation for a wide lock-range and 2) programmable replica delays using antifuse circuitry and internal voltage generator for a post-package skew calibration. The dual loop operation uses information from the initial time-difference between reference clock and internal clock to select one of the differential internal loops. This increases the lock-range of the DLL to the lower frequency. In addition, incorporation with the programmable replica delay using antifuse circuitry and internal voltage generator allows for the elimination of skews between external clock and internal clock that occur from on and off-chip variations after the package process. The proposed DLL, fabricated on 0.16m process, operates over the wide range of 42MHz - 400MHz with 2.3v power supply. The measured results show 43psec peak-to-peak jitter and 4.71psec ms jitter consuming 52㎽ at 400MHz.

Development of a Signal Conditioning Circuit for Capacitive Displacement Sensors and Performance Evaluation (정전용량형 변위 센서 신호 처리 회로 개발 및 성능 평가)

  • Kim, Jong-Ahn;Kim, Jae-Wan;Eom, Tae-Bong;Kang, Chu-Shik
    • Journal of the Korean Society for Precision Engineering
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    • v.24 no.9
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    • pp.60-67
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    • 2007
  • A signal conditioning circuit for capacitive displacement sensors was developed using a high frequency modulation/demodulation method, and its performance was evaluated. Since capacitive displacement sensors can achieve high resolution and linearity, they have been widely used as precision sensors within the range of several hundred micrometers. However, they inherently have a limitation in low frequency range and some nonlinearity characteristics and so a specially designed signal conditioning circuit is needed to handle these properties. The developed signal processing circuit consists of three parts: linearization, modulation/demodulation, and nonlinearity compensation. Each part was constructed discretely using several IC chips and passive elements. An evaluation system for precision displacement sensors was developed using a laser interferometer, a precision stage, and a PID position controller. The signal processing circuit was tested using the evaluation system in the respect of resolution, repeatability, linearity, and so on. From the experimental results, we know that a highly linear voltage output can be obtained successfully, which is proportional to displacement and the nonlinearity of output is less than 0.02% of full range. However, in the future, further investigation is required to reduce noise level and phase delay due to a low-pass filter. The evaluation system also can be applied effectively to calibration and evaluation of precision sensors and stages.

DESIGN OF A RISE TIME DISCRIMINATION CIRCUIT FOR X-RAY PROPORTIONAL COUNTER (X-선 비례계수관용 상승시간 선별회로 제작)

  • 남욱원;최철성
    • Journal of Astronomy and Space Sciences
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    • v.12 no.1
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    • pp.66-77
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    • 1995
  • It is possible to distinguish X-ray events from non X-ray events in proportional conters using the method of rise time discrimination (RTD). In order to subtract non X-ray background, we have developed a simple RTD circuit which will be applied to the proportional counter planned for a sounding rocket experiment. The entire circuit consists of two parts ; the rise time measurement circuit and the time to amplitude conversion circuit which includes the self-calibration mode. From the test with X-ray detecting system, we obtained that the background can be rejected more than 80% in the energy band 2∼12 keV. However we confirmed that the RDT method is not proper to be used for the energy range above 12kV.

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A Parasitic Elements Extraction of MIM Capacitor Using Short-Open Calibration Method (단락 개방 Calibration 방법을 이용한 MIM 커패시터의 기생 소자 값 추출)

  • Kim, Yu-Seon;Nam, Hun;Lim, Yeong-Seog
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.45 no.8
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    • pp.114-120
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    • 2008
  • In this paper, we extract the parasitic elements of the metal-insulate-metal(MIM) capacitor using short-open calibration (SOC). The scattering matrixes of short, open, and MIM structures in strip lines are measured by full electro-magnetic (EM) simulator and vector network analyser. The full EM simulations are performed by finite element method (FEM) that was fitted three dimensional structure analysis. The electro-magnetic effects of MIM capacitor laminated in the multi-layered structures are proposed the II equivalent circuit with lumped elements, and the relations between the measured scattering parameters of the MIM structures and lumped elements in the circuits are shown by performing 2 port network analysis. The extracted lumped elements using the proposed SOC method are independent to frequencies.

A Multi-purpose Fingerprint Readout Circuit Embedding Physiological Signal Detection

  • Eom, Won-Jin;Kim, Sung-Woo;Park, Kyeonghwan;Bien, Franklin;Kim, Jae Joon
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.16 no.6
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    • pp.793-799
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    • 2016
  • A multi-purpose sensor interface that provides dual-mode operation of fingerprint sensing and physiological signal detection is presented. The dual-mode sensing capability is achieved by utilizing inter-pixel shielding patterns as capacitive amplifier's input electrodes. A prototype readout circuit including a fingerprint panel for feasibility verification was fabricated in a $0.18{\mu}m$ CMOS process. A single-channel readout circuit was implemented and multiplexed to scan two-dimensional fingerprint pixels, where adaptive calibration capability against pixel-capacitance variations was also implemented. Feasibility of the proposed multi-purpose interface was experimentally verified keeping low-power consumption less than 1.9 mW under a 3.3 V supply.

Embedded RF Test Circuits: RF Power Detectors, RF Power Control Circuits, Directional Couplers, and 77-GHz Six-Port Reflectometer

  • Eisenstadt, William R.;Hur, Byul
    • Journal of information and communication convergence engineering
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    • v.11 no.1
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    • pp.56-61
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    • 2013
  • Modern integrated circuits (ICs) are becoming an integrated parts of analog, digital, and radio frequency (RF) circuits. Testing these RF circuits on a chip is an important task, not only for fabrication quality control but also for tuning RF circuit elements to fit multi-standard wireless systems. In this paper, RF test circuits suitable for embedded testing are introduced: RF power detectors, power control circuits, directional couplers, and six-port reflectometers. Various types of embedded RF power detectors are reviewed. The conventional approach and our approach for the RF power control circuits are compared. Also, embedded tunable active directional couplers are presented. Then, six-port reflectometers for embedded RF testing are introduced including a 77-GHz six-port reflectometer circuit in a 130 nm process. This circuit demonstrates successful calibrated reflection coefficient simulation results for 37 well distributed samples in a Smith chart. The details including the theory, calibration, circuit design techniques, and simulations of the 77-GHz six-port reflectometer are presented in this paper.