• Title/Summary/Keyword: anealing

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Hypergraph Partitioning By Using Reodered Simulated-anealing (정련법을 이용한 하이퍼그래프 분할)

  • Kim, Sang Jin;Ryoo, Myung Chun;Jung, Young Seok
    • Journal of Korea Society of Digital Industry and Information Management
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    • v.9 no.4
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    • pp.11-19
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    • 2013
  • In this paper we present a reodered simulated-anealing algorithm which is capable of applying odering based k-way partitioned clusters. This method is used for improvement of the objectives of partitioning which are k-way partitioned by using odering algorithm. It changes the positions of the clusters and the vertices in each clusters. Reodered vertices are splitted by using DP-RP method and this process has an opportunity to improve the objective functions. This algorithm has advantages to improve the quality of the solutions for various purposes. Experimental results on several graphs demonstrate that proposed algorithm provides substantial enhancement.

Change in Electrical Properties of Al2O3/GaN MIS Structures according to the Thickness of Al2O3 Thin Film and Annealing Temperature (산화알루미늄 박막의 두께 및 열처리 온도에 따른 Al2O3/GaN MIS 구조의 전기적 특성 변화)

  • Kwak, No-Won;Lee, Woo-Seok;Kim, Ka-Lam;Kim, Hyun-Jun;Kim, Kwang-Ho
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.22 no.6
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    • pp.470-475
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    • 2009
  • We deposited $Al_2O_3$ thin films on GaN by remote plasma atomic layer deposition (RPALD) technique, trimethylaluminum(TMA) and oxygen were used as precursors, at fixed process condition, the number of cycle were changed. Growth rate per cycle was $1.2\;{\AA}$/cycle. and Growth rate was in proportion to a number of cycle, the GaN MIS capacitors that $Al_2O_3$ thin film were deposited above 12 nm, have excellent electrical properties, a low electrical leakage current density(${\sim}10^{-10}\;A/cm^2$ at 1.5 MV), but below 12 nm, we can see the degradation of the leakage current density. After post deposition annealing, Dielectric constant was estimated by 1 MHz high-frequency C-V method, it was varied with the anealing temperature from 6.9 at no post anealed to 7.6 at $800^{\circ}C$, and we can see a improvement of the leakage current density and breakdown voltage by post deposition anealing below $700^{\circ}C$, but, after anealed at $800^{\circ}C$, we can see the degradation of the leakage current density and breakdown voltage.

Enhanced Giant Magnetoimpedance in Co-based Microwire by Pluse Nd:YAG laser (펄스형 레이저를 비정질 와이어 거대 자기교류저항전류 향상)

  • Lee, B.S.;Kim, C.G.;Kim, C.O.;Rheem, Y.W.;Jin, Lan;Kim, G.D.;Ahn, S.J.;Yoon, S.S.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.04a
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    • pp.76-78
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    • 2002
  • The influence of laser annealing on gaint magnetoimpedance effect of glass-covered Co-based amorphous microwires is investigated by illuminating pulse Nd:YAG laser on the etched microwires. The maxium GMI ratio reaches maximum of around 85 % at the frequency of 5 MHz for the sample iluminated by the pulse with laser energy fo 132 mJ/pulse.

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Indium Diffusion Effects on the Structural and Electrical Properties of ZnO Films Prepared by Ultrasonic Spray Pyrolysis (초음파 분무 열분해법으로 제조한 ZnO막의 전기적, 구조적 특성에 미치는 인듐 확산 효과)

  • 심대근;배성찬;마대영
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.14 no.10
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    • pp.828-834
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    • 2001
  • Zinc oxide (ZnO) films deposited on indium (In) films were post-annealed in a rapid thermal anealing (RTA) system. The ZnO/In films were RTA-treated in air or a vacuum ambient. The crystallographic properties and surface morphologies of the films were studied before and after the RTA by X-ray diffraction(XRD) and scanning electron microscopy (SEM), respectively. The resistivity variation of the films with RTA temperature and time was measured by the 4-point probe method. Auger electron spectroscopy (AES) was carried out to figure out the redistribution of indium atoms in the ZnO films. The resistivity of the ZnO/In films decreased to 2$\times$10$\^$-3/ Ωcm by diffusion of the In. The In diffusion into the ZnO films roughened the surface of ZnO films. The results of depth profile by AES showed a hump of In atoms around ZnO/In interface after the RTA at 800 $\^{C}$. The effects of temperature time and ambient during the RTA on the structural and electrical properties of the ZnO/In films were discussed.

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Relationship between Tensile Strength and Damping Capacity of Annealed Magnesium Alloys after Hot Rolling (열간 압연 후 어닐링처리한 Mg 합금의 인장강도와 감쇠능과의 관계)

  • Lee, Gyu-Hyun;Oh, Eun-Ji;Kim, Kwon-Hoo;Kim, Jae-Nam;Kang, Chang-Yong
    • Journal of the Korean Society for Heat Treatment
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    • v.27 no.6
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    • pp.295-301
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    • 2014
  • In this study, the relationship between strength and damping capacity of annealed magnesium alloys after hot rolling was investigated. The microstructure of hot rolled magnesium consisted of dendrite structure and $Mg_{17}Al_{12}$ compounds precipitated along the grain boundary. The dendrite structure was dissipated, $Mg_{17}Al_{12}$ compounds was decomposed by annealing, and then its dissolved in ${\alpha}$-Mg. With an increasing the annealing temperature and time, strength was slowly decreased and damping capacity was slowly increased by the growth of grain size and decreasing of defects induced by hot rolling. In annealing treatmented magnesium alloys after hot rolling, damping capacity was decreased rapidly with an increase of strength. There was on proportional relationship between tensile strength, and damping capacity.

직접 패터닝 기술을 이용한 $TiO_2$ 나노 패턴 형성

  • Yun, Gyeong-Min;Yang, Gi-Yeon;Lee, Heon
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2009.05a
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    • pp.58.1-58.1
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    • 2009
  • 나노 임프린트 리소그래피 기술은 기존의 노광 장비를 이용하는 기존의 리소그래피 공정에 비해 저렴한 공정으로 대면적 패터닝이 가능한 차세대 리소그래피 기술이다. 나노 임프린트 리소그래피는 기존의 나노 리소그래피 기술과는 다르게 기능성 무기물 물질을 직접 패터닝 할 수 있는 기술이다. 본 연구에서는 $TiO_2$ 나노 패턴을 를 기존의 증착, 리소그래피, 식각 등의 공정을 거치지 않고, sol-gel법과 나노 임프린트 리소그래피를 이용하여 직접 전사하는 기술에 대해 연구 하였다. 본 연구에서는 Tetrabutylorthotitanate를 precusor로 하는 ethanol 기반의 $TiO_2$ sol을 제작하여 이용하였다. PDMS mold를 임프린팅용 몰드로 사용하였으며, 이러한 PDMS mold는 노광 기술과 반응성 이온 식각을 이용하여 제작된 master mold로 부터 복제되었다. 제작된 sol을 Si wafer에 spin coating하여 넓게 도포한 후, wafer위에 PDMS mold를 밀착 시킨다. 이후, 5 bar의 압력과 $200^{\circ}C$의 온도에서 나노 임프린트 리소그래피 공정을 진행하여 $TiO_2$ gel 패턴을 형성한다. gel 상태의 $TiO_2$ 패턴을 anealing 공정을 통해 다결정질 TiO2 나노 패턴으로 제작하였다. 제작된 패턴을 scanning electron microscope(SEM)를 이용하여 확인하고, XRD 및 EDX를 이용하여 분석하였다.

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Synthesis and Electrochemical Characterization of Porous Co3O4/RuO2 Composite (다공성 Co3O4/RuO2 복합체 합성 및 전기화학적 특성)

  • Lim, Hye-Min;Ryu, Kwang-Sun
    • Korean Journal of Materials Research
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    • v.22 no.3
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    • pp.118-122
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    • 2012
  • We synthesized porous $Co_3O_4/RuO_2$ composite using the soft template method. Cetyl trimethyl ammonium bromide (CTAB) was used to make micell as a cation surfactant. The precipitation of cobalt ion and ruthenium ion for making porosity in particles was induced by $OH^-$ ion. The porous $Co_3O_4/RuO_2$ composite was completely synthesiszed after anealing until $250^{\circ}C$ at $3^{\circ}C$/min. From the XRD ananysis, we were able to determine that the porous $Co_3O_4$/RuO2 composite was comprised of nanoparticles with low crystallinity. The shape or structure of the porous $Co_3O_4/RuO_2$ composite was studied by FE-SEM and FE-TEM. The size of the porous $Co_3O_4/RuO_2$ composite was 20~40 nm. From the FE-TEM, we were able to determine that porous cavities were formed in the composite particles. The electrochemical performance of the porous $Co_3O_4/RuO_2$ composite was measured by CV and charge-discharge methods. The specific capacitances, determined through cyclic voltammetry (CV) measurement, were ~51, ~47, ~42, and ~33 F/g at 5, 10, 20, and 50 mV/sec scan rates, respectively. The specific capacitance through charge-discharge measurement was ~63 F/g in the range of 0.0~1.0 V cutoff voltage and 50 mAh/g current density.

Titanium dioxide by spray deposition for buried contact silicon solar cells fabrication (전극함몰형 실리콘 태양전지의 제작시 스프레이 방법에 의한 타이타늄 옥사이드층의 적용에 관한 연구)

  • A.U. Ebong;S.H. Lee
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.6 no.2
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    • pp.263-274
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    • 1996
  • Titanium dioxide ($TiO_{2}$) film has been widely used as anti-reflection coating for solar cells but not as masking oxide for metallisation and diffusion of impurities. In this paper we have investigated the properties of $TiO_{2}$ for possible incorporation into solar cell processing sequence. Thus the use of a spray deposition system to form the $TiO_{2}$ film and the characterisation of this film to ascertain its suitability to solar cell processing. The spray-on $TiO_{2}$ film was found to be resistant to all the chemicals used in conjunction with solar cell processing. The high temperature anealing (in oxygen ambient) of the spray-on $TiO_{2}$ film resulted in an increased refractive index, which indicated the growth of an underlying thin film of $SiO_{2}$ film for the passivation of silicon surface which would reduce the recombination activities of the fabricated device. Most importantly, the successful incorporation of the $TiO{2}$ film will lead to the reduction of the many high temperature processing steps of solar cell to only one.

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