• 제목/요약/키워드: accumulation capacitance

검색결과 33건 처리시간 0.029초

Pt/$LiNbO_3$/AIN/Si(100) 구조의 전기적 특성 (Electrical Properties of Pt/$LiNbO_3$/AIN/Si(100) structures)

  • 정순원;정상현;인용일;김광호
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 하계학술대회 논문집
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    • pp.58-61
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    • 2001
  • Metal-insulator-semiconductor (MIS) C-V properties with high dielectric AIN thin films showed no hysteresis and good interface properties. The dielectric constant of the AIN film calculated from the capacitance at the accumulation region in the capacitance-voltage(C-V) characteristics was about 8. The C-V characteristics of MFIS capacitor showed a hysteresis loop due to the ferroelectric nature of the LiNbO$_3$ thin films. Typical dielectric constant value of LiNbO$_3$ film of MFIS device was about 23. The memory window width was about 1.2V at the gate voltage of $\pm$5 V ranges. Typical gate leakage current density of the MFIS structure was the order of 10$^{-9}$ A/cm$^2$ at the range of within $\pm$500 kV/cm. The ferroelectric capacitors showed no polarization degradation up to about 10$^{11}$ switching cycles when subjected to symmetric bipolar voltage pulse(peak-to-peak 8V, 50% duty cycle) in the 500kHz.

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$N_2O$가스를 사용하여 PECVD로 성장된 Oxynitride막의 특성 (Characteristics of oxynitride films grown by PECVD using $N_2O$ gas)

  • 최현식;이철인;장의구
    • E2M - 전기 전자와 첨단 소재
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    • 제9권1호
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    • pp.9-17
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    • 1996
  • Plasma enhanced chemical vapor deposition (PECVD) allows low temperature processing and so it is widely used, but it causes instability of devices due to serious amount of impurities within the film. In this paper, electrical and chemical characteristics of the PECVD oxynitride film formed by different N$_{2}$O to N$_{2}$O+NH$_{3}$ gas ratio is studied. It has been found that hydrogen concentration of PECVD oxynitride film was decreased from 4.25*10$^{22}$ [cm$^{-2}$ ] to 1.18*10$^{21}$ [cm$^{-2}$ ] according to the increase of N$_{2}$O gas. It was also found that PECVD oxynitride films have low trap density in the oxide and interface in comparison with PECVD nitroxide films, and has higher refractive index and capacitance than oxide films. In particular, oxynitride film formed in gas ratio of N$_{2}$O/(N$_{2}$O+NH$_{3}$)= 0.88 shows increased capacitance and decreased leakage current due to small portion of hydrogen in oxide and the accumulation of nitrogen about 4[atm.%] at the interface.

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이중 샘플링 기반의 넓은 동작 범위 CMOS 이미지 센서의 동작 및 시뮬레이션을 통한 특성 분석 (Operation of a wide dynamic range CMOS image sensor based on dual sampling mechanism and its SPICE simulation)

  • 공재성;조성현;이수연;최경화;서상호;신장규
    • 센서학회지
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    • 제19권4호
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    • pp.285-290
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    • 2010
  • In this paper, a dynamic range(DR) extension technique based on a 3-transistor active pixel sensor(APS) and dual image sampling is proposed. The feature of the proposed APS is that the APS uses two or more photodiodes with different sensitivities, such as a high-sensitivity photodiode and a low-sensitivity photodiode. Compared with previously proposed wide DR(WDR) APS, the proposed approach has several advantages, such as no-external equipments or signal processing, no-additional time-requirement for additional charge accumulation, simple operation and adjustable DR extension by controlling parasitic capacitance and sensitivity of two photodiodes. Approximately 16 dB of DR extension was evaluated from the simulation for the situation of 10 times of sensitivity difference and the same size of parasitic capacitance between those two photodiodes.

Electrical Properties and Self-poling Mechanism of CNT/PVDF Piezoelectric Composite Films Prepared by Spray Coating Method

  • Lee, Sunwoo;Jung, Nak-Chun
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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    • pp.256-256
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    • 2013
  • Carbon nanotubes (CNT) / polyvinylidene fluoride (PVDF) piezoelectric composite films for nanogenerator devices were fabricated by spray coating method. When the CNT/PVDF mixture solution passes through the spray nozzle with small diameter by the compressed nitrogen gas, electric charges are generated in the liquid by a triboelectric effect. Then randomly distributed ${\beta}$ phase PVDF film could be re-oriented by the electric field resulting from the accumulated electrical charges, and might be resulted in extremely one-directionally aligned ${\beta}$ phase PVDF film without additional electric field for poling. X-ray diffraction patterns were used to investigate crystal structure of the CNT/PVDF composite films. It was confirmed that they revealed extremely large portion of the ${\beta}$ phase PVDF crystalline in the film. Therefore we could obtain the poled CNT/PVDF piezoelectric composite films by the spray coating method without additional poling process. Charge accumulation and resulting electric field generation mechanism by spray coating method were shown in Fig. 1. The capacitance of the CNT/PVDF films increased by adding CNTs into the PVDF matrix, and finally saturated. However, the I-V curves didn't show any saturation effect in the CNT concentration range of 0~4 wt%. Therefore we can control the performance of the devices fabricated from the CNT/PVDF composite film by adjusting the current level resulted from the CNT concentration with the uniform capacitance value.

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Nanocomposite Electrode Materials Prepared from Pinus roxburghii and Hematite for Application in Supercapacitors

  • SHRESTHA, Dibyashree
    • Journal of the Korean Wood Science and Technology
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    • 제50권4호
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    • pp.219-236
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    • 2022
  • Wood-based nanocomposite electrode materials were synthesized for application in supercapacitors by mixing nanostructured hematite (Fe2O3) with highly porous activated carbon (AC) produced from the wood-waste of Pinus roxburghii. The AC was characterized using various instrumental techniques and the results showed admirable electrochemical properties, such as high surface area and reasonable porosity. Firstly, AC was tested as an electrode material for supercapacitors and it showed a specific capacitance of 59.02 Fg-1 at a current density of 1 Ag-1, cycle life of 84.2% after 1,000 cycles (at a current density of 3 Ag-1), and energy density of 5.1 Wh/kg at a power density of 135 Wkg-1. However, when the AC was composited with different ratios of Fe2O3 (1:1, 2:1, and 1:2), there was an overall improvement in its electrochemical performance. Among the 3 ratios, 2:1 (AC:Fe2O3) had the best specific capacitance of 102.42 Fg-1 at 1 Ag-1, cycle life of 94.4% capacitance after 1,000 cycles (at a current density of 3 Ag-1), and energy density of 8.34 Wh/kg at a power density of 395.15 Wkg-1 in 6 M KOH electrolyte in a 3-electrode experimental setup with a high working voltage of 1.55 V. Furthermore, when Fe2O3 was doubled, 1:2 (AC:Fe2O3), the electrochemical capacitive performance of the electrode twisted and deteriorated due to either the accumulation of Fe2O3 particles within the composite or higher bulk resistance value of pure Fe2O3.

High Resistivity SOI MOS 버랙터를 위한 RF 대신호 모델 연구 (A Study on RF Large-Signal Model for High Resistivity SOI MOS Varactor)

  • 홍서영;이성현
    • 전자공학회논문지
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    • 제53권9호
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    • pp.49-53
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    • 2016
  • RF 채널 분포효과를 위한 전압 종속 외부 게이트 커패시턴스가 사용된 High resistivity(HR) silicon-on-insulator(SOI) RF accumulation-mode MOS 버랙터의 대신호 모델이 새롭게 개발되었다. 이 모델의 전압 종속 파라미터들은 정확한 S-파라미터 optimization을 사용하여 추출되었고, 이를 피팅하여 empirical 모델 방정식을 구축하였다. 이러한 새로운 대신호 RF 모델은 넓은 전압영역에서 측정된 Y11-파라미터 데이터와 20 GHz까지 잘 일치함으로써 정확도가 검증되었다.

Improving the dielectric reliability using boron doping on solution-processed aluminum oxide

  • Kim, Hyunwoo;Lee, Nayoung;Choi, Byoungdeog
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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    • pp.411.1-411.1
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    • 2016
  • In this study, we examined the effects of boron doping on the dielectric reliability of solution processed aluminum oxide ($Al_2O_3$). When boron is doped in aluminum oxide, the hysteresis reliability is improved from 0.5 to 0.4 V in comparison with the undoped aluminum oxide. And the accumulation capacitance is increased when boron was doped, which implying the reduction of the thickness of dielectric film. The improved dielectric reliability of boron-doped aluminum oxide is originated from the small ionic radius of boron ion and the stronger bonding strength between boron and oxygen ions than that of between aluminum and oxygen ions. Strong boron-oxygen ion bonding in aluminum oxide results dielectric film denser and thinner. The leakage current of aluminum oxide also reduced when boron was doped in aluminum oxide.

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Threshold Voltage Properties of OFET with CuPc Active Material

  • Lee, Ho-Shik;Kim, Seong-Geol
    • Journal of information and communication convergence engineering
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    • 제13권4호
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    • pp.257-263
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    • 2015
  • In this study, organic field-effect transistors (OFETs) using a copper phthalocyanine (CuPc) material as an active layer and SiO2 as a gate insulator were fabricated with varying active layer thicknesses and channel lengths. Further, using a thermal evaporation method in a high-vacuum system, we fabricated a CuPc FET device of the top-contact type and used Au materials for the source and drain electrodes. In order to discuss the channel formation and FET characteristics, we observed the typical current-voltage characteristics and calculated the threshold voltage of the CuPc FET device. We also found that the capacitance reached approximately 97 pF at a negative applied voltage and increased upon the accumulation of carriers at the interface of the metal and the CuPc material. We observed the typical behavior of a FET when used as an n-channel FET. Moreover, we calculated the threshold voltage to be about 15-20 V at VDS = -80 V.

스퍼터링법을 이용한 산화알루미늄/6H-SiC 구조의 제작 및 특성 (Fabrication and Properties of Aluminum oxide/6H-SiC Structures using Sputtering Method)

  • 정순원;최행철;김재현;정상현;김광호;구경완
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2006년도 하계학술대회 논문집 Vol.7
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    • pp.194-195
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    • 2006
  • Aluminum oxide films directly grown on n-type 6H-SiC(0001) substrates were fabricated by RF magnetron sputtering system. Metal-insulator-semiconductor(MIS) C-V properties with aluminum oxide thin films showed hysteresis and f1at band voltage shift. The dielectric constant of the film calculated from the capacitance at the accumulation region was about 5. Typical gate leakage current density of film at room temperature was the order of $10^{-9}\;A/cm^2$ at the range of within 2MV/cm. The breakdown did not occur at the film within the measurement range.

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고유전율 AIN 절연층을 사용한 비휘발성 강유전체 메모리용 MFIS 구조의 제작 및 특성 (Fabrications and Properties of MFIS Structures using high Dielectric AIN Insulating Layers for Nonvolatile Ferroelectric Memory)

  • 정순원;김광희;구경완
    • 대한전자공학회논문지SD
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    • 제38권11호
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    • pp.765-770
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    • 2001
  • 고온 급속 열처리시킨 LiNbO₃/AIN/Si(100) 구조를 이용하여 MFIS 소자를 제작하고, 비휘발성 메모리 동작 가능성을 확인하였다. 고유전율 AIN 박막 위에 Pt 전극을 증착시켜 제작한 MIS 구조에서 측정한 1MHz C-V 특성곡선에서는 히스테리시스가 전혀 없고 양호한 계면특성을 보였으며, 축적 영역으로부터 산출한 비유전율 값은 약 8 이었다. Pt/LiNbO₃/AIN/Si(100) 구조에서 측정한 1MHz C-V 특성의 축적영역에서 산출한 LiNbO₃ 박막의 비유전율 값은 약 23 이었으며, ±5 V의 바이어스 범위 내에서의 메모리 윈도우는 약 1.2 V이었다. 이 MFIS 구조에서의 게이트 누설전류밀도는 ±500 kV/cm의 전계 범위 내에서 10/sup -9/ A/㎠ 범위를 유지하였다. 500 kHz의 바이폴러 펄스를 인가하면서 측정한 피로특성은 10/sup 11/ cycle 까지 초기값을 거의 유지하는 우수한 특성을 보였다.

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