• Title/Summary/Keyword: a TFT-LCD

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Sequential Defect Region Segmentation according to Defect Possibility in TFT-LCD Image (TFT-LCD영상에서 결함 가능성에 따른 순차적 결함영역 분할)

  • Chang, Chung Hwan;Lee, SeungMin;Park, Kil-Houm
    • Journal of Korea Multimedia Society
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    • v.23 no.5
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    • pp.633-640
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    • 2020
  • Defect region segmentation of TFT-LCD images is performed by combining defect pixels detected by a defect detection method into defect region, or by using morphological operations to segment defect region. Therefore, the result of segmentation of the defect region is highly dependent on the defect detection result. In this paper, we propose a method which segments defect regions sequentially according to the possibility of being included in defect regions in TFT-LCD images. The proposed method repeats the process of detecting a seed using the median value and the median absolute deviation of the image, and segments the defect region using the seeded region growing method. We confirmed the superiority of the proposed method to segment defect regions using pseudo-images and real TFT-LCD images.

Defect detection based on periodic cell pattern elimination in TFT-LCD cell images (TFT-LCD 셀 영상에서 주기적인 셀 패턴 제거 기반 결함검출)

  • Jung, Yeong-Tak;Lee, Seung-Min;Park, Kil-Houm
    • Journal of Advanced Marine Engineering and Technology
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    • v.41 no.3
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    • pp.251-257
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    • 2017
  • In this paper, an algorithm for detecting defects in thin-film-transistor liquid-crystal display (TFT-LCD) cell images is presented. TFT-LCD cell images typically contain periodic cell patterns that make it difficult to detect defects. We propose an efficient and powerful algorithm for eliminating the cell patterns using magnitude spectrum analysis. The first step was to obtain a spectrum for a cell image using the Fourier transform while eliminating larger coefficients using an adaptive filter. Next, an image without the cell pattern was obtained by using the inverse Fourier transform. Finally, the defect pixels were detected using the STD algorithm. The validity of the proposed method was investigated using real TFT-LCD cell images. The experimental results indicate that the proposed technique is extremely effective for detecting defects in TFT-LCD cell images.

A Systematic Method for SPICE Simulation of Electrical Characteristics of Poly-Si TFT-LCD Pixel (SPICE를 사용한 다결정 실리콘 TFT-LCD 화소의 전기적 특성 시뮬레이션 방법의 체계화)

  • Son, Myung-Sik;Ryu, Jae-Il;Shim, Seong-Yung;Jang, Jin;Yoo Keon-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.38 no.12
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    • pp.25-35
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    • 2001
  • In order to analyze the electrical characteristics of complicated thin film transistor-liquid crystal display (TFT-LCD) array circuits, it is indispensible to use simulation programs such as PSPICE and AIM-SPICE. In this paper, we present a systematic method of extracting the input parameters of poly-Si TFT for SPICE simulations. This method was applied to two different types of poly-Si TFTs, fabricated by excimer laser annealing and silicide mediated crystallization methods, and yielded good fitting results to experimental data. Among the SPICE simulators, PSPICE has the graphic user interface feature making the composition of complicated circuits easier. We added successfully a poly-Si TFT device model to the PSPICE simulator, and analyzed easily the electrical characteristics of pixels considering the line RC delay. The results of this work would contribute to efficient simulations of poly-Si TFT-LCD arrays.

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A Production Planning Framework for Slim MES in TFT-LCD Lines (TFT-LCD 제조 공정의 Slim MES를 위한 생산계획 프레임워크)

  • Suh, Jung-Dae
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.12 no.5
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    • pp.2038-2047
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    • 2011
  • This paper presents a framework for production planning for a Slim MES(Manufacturing Execution System) of module operations in TFT-LCD(Thin Film Transistor-Liquid Crystal Display) production lines. There are differences in the line configurations and functions among the module operations in the TFT-LCD production systems. This paper presents the framework for the customized MES reflecting these differences. First, a production process is figured out through the analysis of the TFT-LCD module operations. Next, a mathematical modeling is presented reflecting the constraints of shop floors and an optimal schedule is presented through a case example. And a scheduling process using the dispatching rules reflecting the status of shop floors is presented and the performances are measured and compared. Finally, a design process for the Slim MES framework is presented.

A Thin Film Transistor LCD Module with Novel OverDriving Timing Controller

  • Yu, Hong-Tien;Huang, Juin-Ying;Tseng, Wen-Tse;Wen, Harchson
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.1053-1056
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    • 2004
  • Chunghwa Picture Tubes, LTD. (CPT) has developed a Novel TFT-LCD Driving Techniquel. This new technique is developed in combination with other state-of-the-art image processing solutions such as image compression / decompression, motion detection, and noise reduction. By applying the Novel Driving Technique to the high resolution TFT-LCD, it was found that the response time can be effectively reduced with a lower overall system cost by smaller frame memory requirement, lower EMI by less memory band-width. Likewise, higher display quality can also be achieved in that the unexpected noises generated by over-drive can be eliminated. The Novel TFT-LCD Driving Technique has been successfully implemented to the 30 inch WXGA (1280${\times}$768) resolution TFT LCD commercial TV module. It was found that the quality of moving picture was better improved compared with that of the conventional fast response driving method.

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A Study of Master Production Scheduling Scheme in TFT-LCD Factory considering Line Balancing (TFT-LCD 공장의 라인 밸런싱을 고려한 MPS 수립에 관한 연구)

  • Won, Dae-Il;Baek, Jong-Kwan;Kim, Sung-Shick
    • IE interfaces
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    • v.16 no.4
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    • pp.463-472
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    • 2003
  • In this study we consider the problem of MPS(master production planning) of TFT-LCD(Thin Film Transistor - Liquid Crystal Display) production factory. Due to the complexities of the TFT-LCD production processes, it is difficult to build effective MPS. This study presents an algorithm having a concept of IDPQ(Ideal Daily Production Quantity) that considers line balancing of TFT-LCD production process. In general, the MPS building procedure does not consider line balancing in non-bottleneck processes. MPS without considering line balancing may make ineffective schedule. We present algorithms for building MPS considering factory capacity and line balancing according to the sales order.

A Simulation Study on the Flicker Analysis for the Poly-Silicon TFT-LCD (다결정질 Si TFT-LCD에서의 Flicker에 대한 Simulation 연구)

  • 손명식;송민수;유건호;허지호;경희대학교물리학과;경희대학교물리학과
    • Proceedings of the IEEK Conference
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    • 2001.06b
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    • pp.225-228
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    • 2001
  • We simulated and analyzed the flicker phenomena in the poly-Si TFT-LCD using PSpice for the development of wide-area and high-quality LCD display We define the electric quantity of flicker in the TFT-LCD, which is the ratio of half frame frequency (30Hz) to DC (0 Hz) frequency. We compared two different types of TFTs, excimer laser annealed (ELA) poly-Si TFT and silicide mediated crystallization (SMC) poly-Si TFT, and found that the ELA and SMC TFTs show different flicker characteristics because of their mobility and leakage current. In addition, we showed that the gate voltage should be chosen carefully at the minimum flicker because of the larger leakage current of poly-Si Tn as compared with a-Si TFT

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2.22-inch qVGA a-Si TFT-LCD Using a 2.5 um Fine-Patterning Technology by Wet Etch Process

  • Lee, Jae-Bok;Park, Sun;Heo, Seong-Kweon;You, Chun-Ki;Min, Hoon-Kee;Kim, Chi-Woo
    • Journal of Information Display
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    • v.7 no.3
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    • pp.1-4
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    • 2006
  • 2.22-inch qVGA $(240{\times}320)$ amorphous silicon thin film transistor liquid active matrix crystal display (a-Si TFT-AMLCD) panel has been successfully demonstrated employing a 2.5 um fine-patterning technology by a wet etch process. Higher resolution 2.22-inch qVGA LCD panel with an aperture ratio of 58% can be fabricated as the 2.5 um fine pattern formation technique is integrated with high thermal photo-resist (PR) development. In addition, a novel concept of unique a-Si TFT process architecture, which is advantageous in terms of reliability, was proposed in the fabrication of 2.22-inch qVGA LCD panel. Overall results show that the 2.5 um fine-patterning is a considerably significant technology to obtain higher aperture ratio for higher resolution a-Si TFT-LCD panel realization.

LTPS TFT LCD Status, Outlook and Challenges

  • Young, Ross;Annis, Charles;Kato, Mitsuhiro;Matsuno, Sam;Young, Barry
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.39-42
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    • 2003
  • Low temperature polysilicon (LTPS) TFT LCOs are in production today at sizes ranging from 0.33" for Viewfinders to 17" for LCD TVs with 21.3" recently demonstrated. Because of their form factor, resolution, brightness and other benefits, LTPS TFT LCD unit shipments, revenues and capacity are expected to grow rapidly, particularly for mobile applications. However, despite the strong outlook, LTPS TFT LCOs are still faced with numerous challenges from a market and technology perspective. LTPS TFT LCD producers were surveyed on which of the current challenges were the most problematic among other questions.

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Comparative Pixel Characteristics of ELA and SMC poly-Si TETs for the Development of Wide-Area/High-Quality TFT-LCD (대화면/고화질 TFT-LCD 개발을 위하여 ELA 및 SMC로 제작된 다결정 실리콘 박막 트랜지스터의 화소 특성 비교)

    • Journal of the Korean Vacuum Society
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    • v.10 no.1
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    • pp.72-80
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    • 2001
  • In this paper, we present a systematic method of extracting the input parameters of poly-Si TFT(Thin-Film Transistor) for Spice simulations. This method has been applied to two different types of poly-Si TFTs such as ELA (Excimer Laser Annealing) and SMC (Silicide Mediated Crystallization) with good fitting results to experimental data. Among the Spice circuit simulators, the PSpice has the GUI(graphic user interface) feature making the composition of complicated circuits easier. We added successfully the poly-Si TFT model of AIM-Spice to the PSpice simulator, and analyzed easily to compare the electrical characteristics of pixels without or with the line RC delay. In the comparative results, the ELA poly-Si TFT is superior to the SMC poly-Si TFT in the charging time and the kickback voltage for the TFT-LCD (Thin Film Transistor-Liquid Crystal Display).

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