• 한국진공학회:학술대회논문집
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• 한국진공학회 2005년도 제29회 학술발표회 초록집
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• pp.110-110
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• 2005

• 한국재료학회:학술대회논문집
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• 한국재료학회 1998년도 IUMRS-ICEM ABSTRACT BOOK
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• pp.86.3-86
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• 1998

• 한국자기학회:학술대회 개요집
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• 한국자기학회 2016년도 자성 및 자성재료 국제학술대회
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• pp.70-70
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• 2016

• 한국진공학회지
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• 제14권4호
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• pp.238-244
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• 2005

rf 마그네트론 스퍼터링 방법을 사용하여 유리기판 위에 $In_2O_3$ : ZnO=90 : 10 $wt.\%$의 조성비를 갖는 indium-zinc-oxide(IZO) 박막을 산소분압 $O_2$/(Ar +$O_2$) : $0\~10 \%$의 Ar가스 분위기에서 제작하였다. IZO 박막의 면저항은 증착 시 유입되는 산소량이 증가함에 따라 현저하게 증가하는데, 순수한 Ar 가스 분위기에서 증착될 때 $3.7\times10^{-4}\Omega\cdot$ cm 정도의 가장 낮은 비저항과 가시광 영역에서 평균 $85\%$ 이상의 투과율을 보이는 박막이 얻어진다. $600^{\circ}C$의 다양한 환경에서 옅처리될 경우, 순수한 Ar 분위기에서 성막된 IZO 박막의 전기적 저항 변화는 박막 내에 포함된 In 또는 InO와 같은 금속 성분들의 결정화와 산화에 의해 설명되어 진다. 또한 IZO 박막을 공기 중에서 열처리하는 동안 $600^{\circ}C$ 이상에서 현저하게 일어나는 산소 흡착과 구조 변화에 의한 전기적 특성들이 조사된다.

• 한국표면공학회지
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• 제48권6호
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• pp.322-328
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• 2015

We investigated the diffusion behaviors, electrical properties, microstructures, and composition of In-Ga-Zn-O (IGZO) oxide thin films deposited by radio frequency reactive magnetron sputtering with increasing annealing temperatures. The samples were deposited at room temperature and then annealed at 300, 400, 500, 600 and $700^{\circ}C$ in air ambient for 2 h. According to the results of time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy, no diffusion of In, Ga, and Zn components were observed at 300, 400, 500, $600^{\circ}C$, but there was a diffusion at $700^{\circ}C$. However, for the sample annealed at $700^{\circ}C$, considerable diffusion occurred. Especially, the concentration of In and Ga components were similar at the IGZO thin film but were decreased near the interface between the IGZO and glass substrate, while the concentration of Zn was decreased at the IGZO thin film and some Zn were partially diffused into the glass substrate. The high-resolution transmission electron microscopy results showed that a phase change at the interface between IGZO film and glass substrate began to occur at $500^{\circ}C$ and an unidentified crystalline phase was observed at the interface between IGZO film and glass substrate due to a rapid change in composition of In, Ga and Zn at $700^{\circ}C$. The best values of electron mobility of $15.5cm^2/V{\cdot}s$ and resistivity of $0.21{\Omega}cm$ were obtained from the sample annealed at $600^{\circ}C$.

• 한국재료학회지
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• 제16권6호
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• pp.346-350
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• 2006

Al-doped ZnO (AZO) thin films were grown on type of glass#1737 substrates by DC magnetron sputtering. The structural, electrical and optical properties of the films were investigated as a function of various plasma discharge power. The obtained films were polycrystalline with a hexagonal wurtzite structure and preferentially oriented in the (002) crystallographic direction. The lowest resistivity was $6.0{\times}10^{-4}{\Omega}cm$ with the carrier concentration of $2.69{\times}10^{20}cm^{-3}$ and Hall mobility of 20.43 $cm^2/Vs$. The average transmittance in the visible range was above 90%.

• 한국재료학회지
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• 제20권12호
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• pp.676-680
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• 2010

Most TCOs such as ITO, AZO(Al-doped ZnO), FTO(F-doped $SnO_2$) etc., which have been widely used in LCD, touch panel, solar cell, and organic LEDs etc. as transparent electrode material reveal n-type conductivity. But in order to realize transparent circuit, transparent p-n junction, and introduction of transparent p-type materials are prerequisite. Additional prerequisite condition is optical transparency in visible spectral region. Oxide based materials usually have a wide optical bandgap more than ~3.0 eV. In this study, single-phase transparent semiconductor of $SrCu_2O_2$, which shows p-type conductivity, have been synthesized by 2-step solid state reaction at $950^{\circ}C$ under $N_2$ atmosphere, and single-phase $SrCu_2O_2$ thin films of p-type TCOs have been deposited by RF magnetron sputtering on alkali-free glass substrate from single-phase target at $500^{\circ}C$, 1% $H_2$/(Ar + $H_2$) atmosphere. 3% $H_2$/(Ar + $H_2$) resulted in formation of second phases. Hall measurements confirmed the p-type nature of the fabricated $SrCu_2O_2$ thin films. The electrical conductivity, mobility of carrier and carrier density $5.27{\times}10^{-2}S/cm$, $2.2cm^2$/Vs, $1.53{\times}10^{17}/cm^3$ a room temperature, respectively. Transmittance and optical band-gap of the $SrCu_2O_2$ thin films revealed 62% at 550 nm and 3.28 eV. The electrical and optical properties of the obtained $SrCu_2O_2$ thin films deposited by RF magnetron sputtering were compared with those deposited by PLD and e-beam.

• Transactions on Electrical and Electronic Materials
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• 제16권2호
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• pp.62-64
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• 2015

We have investigated zinc tin oxide (ZTO) thin films under various silicon ratios. ZTO TFTs were fabricated by solution processing with the bottom gate structure. Furthermore, annealing process was performed at different temperatures in various annealing conditions, such as air, vacuum and wet ambient. Completed fabrication of ZTO TFT, and the performance of TFT has been compared depending on the annealing conditions by measuring the transfer curve. In addition, structure in ZTO thin films has been investigated by X-ray diffraction spectroscopy (XRD) and Scanning electron microscope (SEM). It is confirmed that the electrical performance of ZTO TFTs are improved by adopting optimized annealing conditions. Optimized annealing condition has been found for obtaining high mobility.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2005년도 제36회 하계학술대회 논문집 C
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• pp.1859-1861
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• 2005

The ZnO:Al thin films were prepared on glass by Facing Target Sputtering (FTS) system. We investigated electrical, optical, and structural properties of AZO thin film with sputtering current $0.1[A]{\sim}0.6[A]$. We obtained the lowest resistivity $2.3{\times}10^{-4}[{\Omega}-cm]$ at sputtering current 0.6[A] from the 4-point probe and the strong (002) peak at sputtering current 0.3[A] from the X-ray Diffractometer (XRD ). The optical transmittance of AZO thin films show a very high transmittance of $80{\sim}95%$ in the visible range and exhibit the absorption edge of about 350nm.

• 한국정보통신학회논문지
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• 제18권2호
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• pp.394-400
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• 2014

본 연구에서는 고주파 마그네트론 스퍼터링 법으로 상온에서 RF 파워를 30 에서 60W 로 변화시켜가며 유리기판 위에 ITZO 박막을 제작하여 전기적, 광학적, 구조적 특성을 조사하였다. RF 파워 50W 에서 증착한 ITZO 박막이 $10.52{\times}10^{-3}{\Omega}^{-1}$의 제일 큰 재료평가지수를 나타내었으며, 이때 $3.08{\times}10^{-4}{\Omega}-cm$의 비저항과 $11.41{\Omega}/sq.$의 면저항으로 가장 우수한 전기적 특성을 보였다. 광학적 특성을 측정한 결과, 가시광 영역 (400~800 nm) 에서의 평균 투과도는 모든 ITZO 박막에서 80 % 이상으로 나타났다. XRD 측정을 통해 RF 파워에 상관없이 모든 ITZO 박막이 비정질 구조를 가지고 있음을 확인할 수 있었다. FESEM 과 AFM 으로 ITZO 박막의 표면 형상을 관찰한 결과, 모든 ITZO 박막이 핀홀이나 크랙 같은 결함이 없는 매우 부드러운 표면을 가지며, RF 파워 50W 에서 증착한 박막이 0.254 nm의 가장 작은 표면 거칠기를 나타내었다. 본 연구를 통해 비정질 ITZO 박막이 유기발광다이오드와 같은 차세대 디스플레이 소자에서 ITO 박막을 대체할 매우 유망한 재료라는 것을 알 수 있었다.