• Title/Summary/Keyword: XeCl Excimer laser

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Fabrication and characteristics of low temperature poly-Si thin film transistor using Polymer Substrates (저온에서 제작된 고분자 기판 위의 poly-si TFT 제조 및 특성)

  • Kang, Soo-Hee;Kim, Yong-Hoon;Han, Jin-Woo;Seo, Dae-Shik;Han, Jeong-In
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.04a
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    • pp.62-63
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    • 2006
  • In this paper, the characteristics of polycrystalline silicon thin-film transistors (poly-Si TFTs) fabricated on polymer substrates are investigated. The a-Si films was laser annealed by using a XeCl excimer laser and a four-mask-processed poly-Si TFT was fabricated with fully self-aligned top gate structure. The fabricated nMOS TFT showed field-effect mobility of $30cm2/V{\cdot}s$, on/off ratio of 105 and threshold voltage of 5 V.

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Characteristics of Amorphous Si Films Fabricated by Mesh-type PECVD and Their Crystallization Behavior Using Excimer Laser (Mesh-type PECVD 방법으로 제조된 비정질 Si박막의 특성 및 레이저 결정화)

  • Han Sang-Yong;Choi Jae-Sik;Kim Yong-Su;Park Sung-Gye;Ro Jae-Sang;Kim Hyoung-June
    • Journal of the Korean Electrochemical Society
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    • v.3 no.1
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    • pp.19-24
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    • 2000
  • It is increasingly necessary to use poly-Si n's as high resolution and integration of Tn for LCD. Excimer Laser Crystallization (ELC) of a-Si is mainly used as a low temperature process. But the ELC method for the fabrication of poly-Si has the eruption problems associated with hydrogen in the a-Si film. So we need a dehydro-genation process additionally. Hydrogen in a-Si film can degrade the quality of poly-Si film and electrical properties of device due to the hydrogen eruption and voids which occur during the excimer laser annealing. In this study, we propose mesh-type PECVD as the a-Si film deposition method for achieving the low concentration hydrogen. Mesh-type PECVD was found to reduce the hydrogen content substantially. We could obtain a as-deposited a-Si film with hydrogen contents less than $1\%$ at $300^{\circ}C$. We also investigated the behavior by XeCl excimer laser annealing of a-Si fabricated by mesh-type PECVB. As a result, we were able to confirm the broad process window in contrast to the narrow process range typically obtained in ELC. Hydrogen eruption was not observed in poly-Si films after ELC These results suggests that mesh-type PECVD is a viable method to achieve the low hydrogen content a-Si and improve the process windows for ELC.

A Study on Nitric Oxide Formation & Reduction in Industrial Burner (I) -NO Concetration-Distribution in Double Swirling Diffusion Flame by LIF- (산업용 고부하버너 연소에서의 $NO_x$ 형성 및 저감에 관한 연구(I)-레이저 유도 형광법(LIF)를 이용한 이중선회 확산화염의 NO 농도 분포 측정-)

  • 박경석;김경수
    • Journal of Energy Engineering
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    • v.10 no.4
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    • pp.379-386
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    • 2001
  • This experimental study deals with on Nitric Oxide Formation & Reduction in Industrial Bunner. In this study, Laser-induced fluorescence (LIF) techniques have been used for quantitative measurements of Nitric Oxide. The NO A-X (0, 0) Vibrational band around 226 nm was excited using a XeCl excimer-pumped dye laser. And on-line excitation used $P_{21}+Q_1(14.5)/R_{12}+Q_2(20.5)/P_1(23.5)$ transition, for minimizing the other interferential effect. The measurements were taken NO concentration distribution in double swirling diffusion flame. In this swirl burner, NO concentration in downstream fo the flame decrease as primary/secondary air ratio increases.

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Excimer Laser Annealing Effects of Double Structured Poly-Si Active Layer (이중 활성층(a-Si/a-SiNx)의 XeCl 엑시머 레이저 어닐링 효과)

  • 최홍석;박철민;전재홍;유준석;한민구
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.35D no.6
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    • pp.46-53
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    • 1998
  • A new method to form the double structured active layers of a-Si/a-SiN$_{x}$ of polycrystalline thin film transistor is proposed and poly-Si TFTs employed double structure active film are fabricated. Nitrogen ions were added to bottom amorphous silicon active film(a-SiN$_{x}$ ) and pure a-Si film deposition on a-SiN$_{x}$ was followed. The XeCl excimer laser was irradiated to crystallize double structure active film. The grain growth of upper a-Si film was also promoted in the double structured active layers of a-Si/a-SiN$_{x}$ due to the mitigation of solidification process of lower a-SiN$_{x}$ layer. Our experimental results show that the ratio of NH$_3$/SiH$_4$ is required to maintain below 0.11 for the reduction of contact resistance of n$^{+}$ poly-SiN$_{x}$ layer.r.

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Fabrication of the in-plane Aligned a-Axis Oriented $YBa_2Cu_3O_{7-x}$ Thin Films (평면배향된 a-축 수직 $YBa_2Cu_3O_{7-x}$ 고온초전도 박막의 제작)

  • 성건용;서정대
    • Journal of the Korean Ceramic Society
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    • v.33 no.3
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    • pp.313-320
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    • 1996
  • We have fabricated an in-plane aligned a-axis oriented YBa2Cu3O7-x (a-YBCO) thin film on a LaSrGaO4(100) substrate with a PrBa2Cu3O7-x(PBCO) template layer by two step plused laser deposition using 308 nm XeCl excimer laser. A YBCO layer and PBCO layer grown at low temperatures were used as template layers. We have investigated the effect of the deposition temperature of template layers on the superconducting and struc-tural properties of in-plane aligned a-YBCO thin films. An optimal deposition temperature of the PBCO template layers was 630. In-plane aligned a-YBCO thin films showed an anisotropy ratio in resistivity of 11.5 and a zero resistance temperature of 88 K.

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A Study on Measurement of NO Concentrations in Laminar Nonpremixed $H_2/N_2$ Flame by LIF (레이저 유도 형광법(LIF)을 이용한 층류 비예혼합 $H_2/N_2$화염에서의 NO 농도측정에 관한 연구)

  • Kim, Sun-Wook;Jin, Seong-Ho;Kim, Gyung-Soo;Park, Kyoung-Suk
    • 한국연소학회:학술대회논문집
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    • 2001.06a
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    • pp.133-138
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    • 2001
  • In this study, quantitative nitric oxide concentration distributions are investigated in the laminar nonpremixed $H_2/N_2$ flames by laser-induced fluorescence (LIF). The measurements are taken in flames for different $N_2$ dilution ratios varying from 20${\sim}$80%, and fuel now rate is fixed as lslpm. The NO A-X (0,0) vibrational band around 226 nm is excited using a XeCl excimer-pumped dye laser. We applied same excitation line used in $CH_4$ premixed flame. Overall, NO concentration was rapidly decreased with $N_2$ addition and we could not measure the concentration any longer for $N_2$ dilution above 80%.

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A Study on the Visualization of NO Concentration Distributions in $CH_4/O_2N_2$ Premixed Flames by PLIF (평면 레이저 유도 형광법(PLIF)을 이용한 $CH_4/O_2N_2$ 예혼합화염의 NO 농도 분포 가시화에 관한 연구)

  • Park, Kyoung-Suk;Lee, Sei-Hwan
    • Journal of ILASS-Korea
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    • v.6 no.3
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    • pp.1-7
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    • 2001
  • In this study, quantitative measurement of nitric oxide concentration distributions visualization were investigated in the laminar $CH_4/O_2N_2$ nixed flame by Planar laser-induced fluorescence(PLIF). The NO A-X (0,0) vibrational band around 226nm was excited using a XeCl excimer-pumped dye laser. Selecting an appropriate NO transition minimizes interference from Rayleigh scattering and $O_2$ fluorescence. The measurements were taken in $CH_4/O_2N_2$ premixed flame with equivalence ratios varying from $1.0{\sim}1.6$, and a fixed flow rate of 3slpm. NO was found to produce primarily between an inner premixed and an outer nonpremixed flame front, and total NO concentration is raised when equivalence ratios increase. These results suggest that prompt NO is likely to contribute to MO formation in $CH_4/O_2N_2$ premixed flame. Furthermore, this trend was well matched with previous works.

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A Study on Measurement of NO Concentrations in Burner Flames by LIF (레이저 유도 형광법(LIF)을 이용한 버너 화염의 NO 농도측정에 관한 연구)

  • Park, K.S.;Kim, S.W.
    • Journal of ILASS-Korea
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    • v.7 no.4
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    • pp.42-49
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    • 2002
  • In this study, quantitative measurement of nitric oxide concentration distributions were investigated in the laminar CH4/O2/N2 premixed flame by laser-induced fluorescence (LIF). The NO A-X (0,0) vibrational band around 226nm was excited using a XeCl excimer-pumped dye laser. Selecting an appropriate NO transition minimizes interference from Rayleigh scattering and O2 fluorescence. The measurements were taken in CH4/O2/N2 premixed flame with equivalence ratios varying from $1.0{\sim}1.6$, and a fixed flowrate of 5slpm. NO was found to produce primarily between an inner premixed and an outer nonpremixed flame front, and total NO concentration is raised when equivalence ratios increase. These results suggest that prompt NO is likely to contribute to NO formation in CH4/O2/N2 premixed flame. Furthermore, this trend was well matched with previous works.

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A Study on Measurement of NO Concentrations in Laminar Premxied $CH_4/O_2/N_2$ Flames by LIF (레이저 유도 형광법(LIF)을 이용한 층류 메탄 예혼합 화염내 NO 농도측정에 관한 연구)

  • Kim, Sun-Wook;Jin, Seong-Ho;Kim, Gyung-Soo;Park, Kyoung-Suk
    • Proceedings of the KSME Conference
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    • 2000.11b
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    • pp.156-161
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    • 2000
  • In this study, quantitative nitric oxide concentration distributions are investigated in the post-flame zone of laminar premixed $CH_4/O_2/N_2$, flames by laser-induced fluorescence (LIF). The measurements are taken in flames for different equivalence ratios varying from $0.8{\sim}1.4$, and flow rate is fixed as 5slpm. The NO A-X (0,0) vibrational band around 226 nm is excited using a XeCl excimer-pumped dye laser. Selecting an appropriate NO transition minimizes interferences from Rayleigh scattering and $O_2$ fluorescence. NO concentration is rised when equivalence ratios increase at different vertical distances form nozzle tip. In any case, the maximum NO concentration reaches the maximum in reaction zone.

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Characteristics of Poly-Si TFTs Fabricated on Flexible Substrates using Sputter Deposited a-Si Films

  • Kim, Y.H.;Moon, D.G.;Kim, W.K.;Han, J.I.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07a
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    • pp.297-300
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    • 2005
  • The characteristics of polycrystalline silicon thin-film transistors (poly-Si TFTs) fabricated using sputter deposited amorphous silicon (a-Si) precursor films are investigated. The a-Si films were deposited on flexible polymer substrates using argon-helium mixture gases to minimize the argon incorporation into the film. The precursor films were then laser annealed by using a XeCl excimer laser and a four-mask-processed poly-Si TFT was fabricated with fully self-aligned top gate structure. The fabricated pMOS TFT showed field-effect mobility of $32.4cm^2/V{\cdot}s$ and on/off ratio of $10^6$.

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