• KSCE Journal of Civil and Environmental Engineering Research
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• v.26 no.1B
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• pp.107-111
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• 2006

The samples collected from two reactors are analyzed by X-ray diffraction and M$\ddot{o}$ssbauer spectroscopy in this study. It is concluded that the iron oxide crystal attached on anthracite media which possesses catalytic ability is identified to be Ferrihydrite, regardless of the value of pH from the analysis of the iron oxide. Iron oxide in Batch reactor is identified to be Microcrystalline goethite.

• The Korean Journal of Malacology
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• v.31 no.4
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• pp.279-283
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• 2015

This study investigated spectroscopic characteristics of shell crystals of eight marine bivalve species using X-ray diffraction (XRD) analysis; moreover, the Family level relatedness of shellfish was investigated. In XRD analysis, the shells of Ruditapes philippinarum, Meretrix lusoria, Anadara granosa, and Fulvia mutica were found to have orthorhombic aragonite $CaCO_3$ crystals, while shells of Patinopecten yessoensis and Crassostrea gigas had trigonal-rhombohedral calcite crystals. The shells of Mytilus coruscus and Atrina pectinata were determined to have a mixture of aragonite and calcite crystals. XRD information revealed the Family level-specific characteristics of shellfish; the results agreed with the current taxonomic system. In conclusion, spectroscopic characteristics of shell crystals indicated Family-level characteristics of shellfish and suggested a more intense species-level investigation; this technology may be useful in identifying shellfish species using small quantities of shells.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.103-103
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• 2011

The epitaxial Cu-doped ZnO and pure ZnO thin films were grown on Al2O3 (0001) substrates by RF sputtering method. The structures and crystallographic orientations were investigated using X-ray diffraction (XRD) and X-ray absorption spectroscopy. From the XRD pattern, it is observed that peak positions shift towards higher $2{\theta}$ value with Cu doping. The ${\omega}$-scan measurements at the (0002) diffraction peak for these samples reveal that the full-widths at half-maxima (FWHMs) are about $0.017-0.019^{\circ}$, which indicate a good c-axis orientation of the Zn1-xCuxO films. From phi-scan, all of the Zn1-xCuxO films were epitaxially grown. EXAFS measurements also demonstrated that Cu incorporated into a Zn-atom position substitutionally. All the results confirmed that copper ion were well incorporated into the ZnO lattices by substituting Zn sites without changing the wurtzite structure and no secondary phase existed in Cu-doped ZnO thin films.

• Journal of Powder Materials
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• v.21 no.3
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• pp.207-214
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• 2014

In this study, nano-scale copper powders were reduction treated in a hydrogen atmosphere at the relatively high temperature of $350^{\circ}C$ in order to eliminate surface oxide layers, which are the main obstacles for fabricating a nano/ultrafine grained bulk parts from the nano-scale powders. The changes in composition and microstructure before and after the hydrogen reduction treatment were evaluated by analyzing X-ray diffraction (XRD) line profile patterns using the convolutional multiple whole profile (CMWP) procedure. In order to confirm the result from the XRD line profile analysis, transmitted electron microscope observations were performed on the specimen of the hydrogen reduction treated powders fabricated using a focused ion beam process. A quasi-statically compacted specimen from the nano-scale powders was produced and Vickers micro-hardness was measured to verify the potential of the powders as the basis for a bulk nano/ultrafine grained material. Although the bonding between particles and the growth in size of the particles occurred, crystallites retained their nano-scale size evaluated using the XRD results. The hardness results demonstrate the usefulness of the powders for a nano/ultrafine grained material, once a good consolidation of powders is achieved.

• Journal of the Korean Society of Propulsion Engineers
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• v.8 no.1
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• pp.1-7
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• 2004

The precipitation of ultra fine ammonium perchlorate(UFAP) crystals from the N-methyl pyrrolidone(NMP) solutions of ammonium perchlorate(AP) was studied. The characteristics of the precipitated crystals were investigated by means of scanning electron micrograph(SEM), X-ray diffraction(XRD), and thermogravimetric analysis(TGA). When chloroform, methylene chloride and toluene were the precipitants, the product crystals had a mean particle size less than 2$\mu\textrm{m}$. The crystallographical property and thermal decomposition behavior of the prepared UFAP were almost the same as those of the commercial AP.

• Proceedings of the Korean Geotechical Society Conference
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• 2010.09a
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• pp.379-391
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• 2010

In order to understand the mechanism of cementation of soft soils treated with bacteria, three types of specimens(untreated, normal bacteria concentration treated, and high bacteria concentration treated) were made. Scanning Electron Microscope(SEM), EDX and X-ray diffraction(XRD) analyses were performed on the soft silt and loose sand specimens. Compared with the untreated specimen, a clearer cementation between particles was observed in the high bacteria concentration treated specimen. Based on the scanning electron microscope(SEM) EDX analyses, more calcium carbonate was observed in the specimen treated with high bacteria concentration than other specimens. On the basis of the preliminary results, it appears that microbial cementation can occur in the soft soil. Further study on the cementation of soils using bacteria is necessary to validate this result.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.14 no.3
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• pp.246-250
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• 2001

ZnO thin films for light emission device have been deposited on sapphire and silicon substrates by pulsed laser deposition technique(PLD). A Nd:YAG laser was used with the wavelength of355 nm. In order to investigate the emission properties of ZnO thin films, Pl measurements with an Ar ion laser a light source using an excitation wavelength of 351 nm and a power of 100 mW are used. All spectra were taken at room temperature by using a grating spectrometer and a photomultiplier detector. ZnO exhibited Pl bands centers around 390, 510 and 640 nm, labeled near ultra-violet(UV), green and orange bands. Structural properties of ZnO thin films are analyzed with X-ray diffraction(XRD).

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.457-457
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• 2012

We presented plasma processing using a DC Arc Plasmatron for diamond deposition on Al2O3 ceramic substrates. Plasma surface treatments were conducted to improve deposition condition before processing for diamond deposition. The Al2O3 ceramic substrates deposited, $5{\times}15mm^2$, were investigated by Scanning Electron Microscopy (SEM), Fourier Transform Infrared Spectroscopy (FTIR) and X-ray Diffraction (XRD). Properties of diamond (111), (220) and (311) peaks were shown in XRD. We identified nanocrystalline diamond films on substrates. The results showed that deposition rate was approximately $2.2{\mu}m/h$ after plasma surface treatments. Comparing the above result with a common processing, deposition rate was improved. Also, the surface condition was improved more than a common processing for diamond deposition on Al2O3 ceramic substrates.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1999.11a
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• pp.429-432
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• 1999

The growth of $\textrm{YMnO}_3$ films directly on Si(100) substrates by RF magnetron sputtering system has been performed. The structural properties of $\textrm{YMnO}_3$ films on Si(100) by rapid thermal annealing(RTA) analysed by XRD(X-ray diffraction). The c-axis oriented $\textrm{YMnO}_3$ peaks were observed deposited in $\textrm{YMnO}_3$/Si(100) structure at RF power of 100W and at a temperature range of $840^{\circ}C$~$870^{\circ}C$ in oxygen ambient.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.11a
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• pp.539-542
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• 2000

ZnO thin films for light emission device have been deposited on sapphire and silicon substrates by pulsed laser deposition technique(PLD). A Nd:YAG laser was used with the wavelength of 355 nm. In order to investigate the emission properties of ZnO thin films, PL measurements with an Ar ion laser as a light source using an excitation wavelength of 351 nm and a power of 100 mW are used. All spectra were taken at room temperature by using a grating spectrometer and a photomultiplier detector. ZnO exhibited PL bands centered around 390, 510 and 640 nm, labeled near ultra-violet (UV), green and orange bands. Structural properties of ZnO thin films are analized with X-ray diffraction (XRD).