• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.8
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• pp.904-909
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• 2004

We studied the dielectric properties and voltage dependence on slice XLPE sheet from 22 kV and 154 kV power cables. Interface structures are XLPE/semiconductor and XLPE/water/semiconductor capacitance and tan6 of 22 kV, 154 kV were 52/42 pF and $7.4\times{10}/^{-4}, 2.15\times{10}^{-4}$, respectively in these results, the trend was increased with the increase of temperature the tan$\delta$ of XLPE/semiconductive layer and XLPE/water/ semiconductive layer were increased as compared with that of XLPE Temperature reliability of tan$\delta$ was small.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.8
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• pp.893-897
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• 2004

In this paper, we studied the mechanical and thermal properties on slice XLPE sheet from 22 kV and 154 kV power cables. Interface structures are XLPE/semiconductor and XLPE/water/semiconductor. We evaluated mechanical property, thermal analysis, moisture analysis. Based on mechanical and thermal properties of the 22 kV XLPE sheet, elongation, mechanical strength, and melting point were evaluated to be 485.48 %, 1.74 kgf/$\textrm{mm}^2$ and $102.48^{\circ}C$, respectively. It was also evaluated from the mechanical and thermal properties of 154 kV XLPE sheet that elongation, mechanical strength, and melting point are 507.81 %, 1.8 kgf/$\textrm{mm}^2$, $106.9^{\circ}C$, respectively. A region shows a rapid increase in tension strength, and B region only shows increase in elongation under 1.0 kgf/$\textrm{mm}^2$, C region shows increase in both elongation and tension strength. Difference of melting point came from the chain of XLPE polymer and the difference of crystallization. Moisture density of semiconductor showed 800 ∼ 1200 ppm before extrude, 14000 ∼24000 ppm after extrude. These values were higher than the moisture density of XLPE (300∼560) ppm.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.05c
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• pp.84-87
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• 2001

In this paper, degradation and dielectric properties of XLPE sheets moved from 22/154kV power cables were investigated. At the results of dielectric property of 22kV/154kV XLPE sheet, We earned that $tan{\delta}$ is $7.4{\times}10^{-4}$, $2.15{\times}10^{-4}$ and dielectric constant is 2.3, 2.24. Temperature dependance of $tan{\delta}$ inclined to increasing with temperature and increase of $tan{\delta}$ of 22kV XLPE sheet is higher than it of 154kV XLPE sheet. And increasement of XLPE sheet with water is higher than it without water.

• Proceedings of the KIEE Conference
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• 2000.11c
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• pp.431-433
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• 2000

In this paper, we evaluated the dielectric properties and thermal analysis on sliced XLPE sheet from 154kV power cable and compared with 22kV XLPE sheet. As the result, dielectric constant was not applied voltage dependance but trended to increase with temperature. Test result presented that tan$\delta$ of XLPE with Interface was trend to increased.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.05b
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• pp.142-145
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• 2004

In this paper, we researched the dielectric properties and voltage dependence on slice XLPE sheet from 22[kV] and 154[kV] power cable. studied effect for impurities and water for semiconductive shied through a dielectric properties experiment to estimate performance of insulating material in power cable. Capacitance and $tan{\delta}$ of 22[kV], 154[kV] were 52/42 pF and $7.4{\times}10^{-4}$, $2.1510^{-4}$, respectively. In these results, the trend was increased with the increase of temperature. The $tan{\delta}$ of XLPE/semiconductive layer and XLPE/water/semiconductive layer were increased as compared with that of XLPE. dielectric properties reliability of $tan{\delta}$ was small.

• Proceedings of the KIEE Conference
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• 1999.07d
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• pp.1636-1638
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• 1999

In this paper, humidity and temperature were carried out on XLPE sheet and XLPE/semi sheet. We measured voltage, temperature dependency and dielectric properties of humid dielectric materials. Dielectric losses of XLPE(A,B)/semi with and without humidity were $4.2{\times}10^{-4}$ and $3.6{\times}10^{-4},\;2.8{\times}10^{-4}$ and $3.2{\times}10^{-4}$, respectively, at room temperature. On the condition that humidity and semiconductors exist, we confirmed that dielectric properties had been influenced on semiconductor and humidity.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.14 no.6
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• pp.466-469
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• 2001

In this paper, we evaluated the dielectric properties of XLPE sheet of 22kV power cable, XLPE/semiconductor and XLPE/water/semiconductor depended on electric field and temperature respectively. Dielectric properties and temperature dependency of XLPE sheet of 22kV power cable increase greatly with as temperature increase and have no effect on applied voltage. And we confirmed that tan$\delta$ values in the samples with semiconductor or water layers were higher than those in the samples without them.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.11a
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• pp.441-444
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• 2000

In this paper, dielectric properties of XLPE sheets of 22kV cable with semiconducting and water were investigated. The breakdown strength of XLPE under rod/needle electrode were measured at without oil. It is found that the dielectric properties such tan$\delta$ of XLPE sheet dependence on semiconducting and water layer and are decreased much lower increase with temperature. The breakdown strength and the electrode effect are obtained as a function of thickness, and a equation for the sheet thickness dependent breakdown strength is also discussion.

• Proceedings of the KIEE Conference
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• 2002.07c
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• pp.1463-1466
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• 2002

In this paper, the thermal analysis and dielectric/insulation properties were investigated with considering the temperature depenence Using the sheet of semi-conductor/XLPE came from 22 kV power cables, the dielectric/insulation properties and temperature dependence were measured under 1kHz. According to the results we can verify that only semi-conductor sheet changed linearly, and with the unstable results. the dielectric/insulation properties of the semi-conductor/XLPE sheet show the highest value in the range of 40 $^{\circ}C$ and 50 $^{\circ}C$ and are rely on XLPE rather than semi-conductor in terms of the temperature.

• Proceedings of the KIEE Conference
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• 2008.09a
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• pp.207-210
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• 2008

In this paper, we researched the dielectric properties and voltage dependence on slice XLPE sheet from 22[kV] and 154[kV] power cable. We studied effects for impurities and water for semiconductor shield through a dielectric properties experiment to estimate performance of insulating materials in power cable. Capacitance and $tan{\delta}$ of 22[kV], 154[kV] were 53/43[pF] and $7.4{\times}10^{-4}$, $2.1510^{-4}$. In these results, the trend was increased with the increase of temperature. The tan6 of XLPE/semiconductor layer was increased as compared with that of XLPE. Dielectric properties reliability of tan6 was small. Also, To improve mean-life and reliability of power cable in this study, we have investigated chemical properties showing by changing the content of carbon black that is semiconductive additives for underground power transmission. Specimens were made of sheet form with the three of existing resins and the nine of specimens for measurement. Chemical properties of specimens was measured by FT-ATR (Fourier Transform Attenuated Total Reflectance). The condition of specimens was a solid sheet. We could observe functional group (C=O, carbonyl group) of specimens through FT-ATR. From these experimental result, the concentration of functional group (C=O) was high according to increasing the content of carbon black. We could know EEA was excellent more than other specimens from above experimental results.