References
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- Handbook of Electrical and Electronic Insulating Materials W. Tiller Shugg
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- 古河電工時報 v.84 154 kV CV ケ-ブル用 Prefab接續函の 開發 藤井 他
- IEEE Trans. Elec. Insul v.24 no.5 Surface Flashover of Insulators H. Craig Miller https://doi.org/10.1109/14.42158
- ICPADM 92 Breakdown Strength Affected by the Interface Roughness at the Semiconducting Layer in XLPE Power Cables T. Okamoto
- J. of KIEEME v.12 no.5 Charcterization of failed underground distribution Cables C. S. Jung;W. S. Lee;J. H. Han
- J. of KIEEME v.11 no.9 Comparison of Charcteristics of XLPE for distribution power cables K. S. Suh;J. E. Kim;J. Lee;Y. H. Kim;J. S. Jung
- 3rd ICPADM Technical Aspects of Interfacial Phenomena in Solid Insulating Systems H. C. Kaerner;M. Ieda
- Eleventh International Symposium on High-Voltage Engineering, IEE, Conference Publication 467 v.4 no.22-27 The breakdown Strength of two-layer dielectrics S. M. Lebedev;O. S. Gefle;Yu, P. Pokholkov;V. I. Chichikin
- Annual Report of the 1999 Conference on Electrical Isulation and Dielectric Phenomena. IEEE Publication 99CH36319-2 Two kinds of decay time constants for interfacial space charge in polyethylene-laminated dielectrics T. Tanaka;M. Uchiumi
- J. of KIEEME v.12 no.3 Dependency on Temperature, Electric Field, Pressure and Dielectric Properties of XLPE/EPCM D. H. Park;D. S. Kim;S. O. Han
- Conference Record of the 1994 IEEE International Symposium on Electrical Insulation Thermal Ageing in Polymer Cables : Effect of Interfaces on Dielectric Properties T. Brincourt;B. Pinel;R. M. Morra;J. M. Braun
- IEEE Trans. Elec. Ins. v.24 Dielectrical breakdown strength affected by the lamellar configuration in XLPE insulation at a semiconduction interface T. Okamoto https://doi.org/10.1109/14.34194