DOI QR코드

DOI QR Code

Dielectric Properties of XLPE/Semiconductor Sheet in Power Cables

전력케이블용 XLPE/반도전층의 유전 특성

  • Published : 2004.08.01

Abstract

We studied the dielectric properties and voltage dependence on slice XLPE sheet from 22 kV and 154 kV power cables. Interface structures are XLPE/semiconductor and XLPE/water/semiconductor capacitance and tan6 of 22 kV, 154 kV were 52/42 pF and $7.4\times{10}/^{-4}, 2.15\times{10}^{-4}$, respectively in these results, the trend was increased with the increase of temperature the tan$\delta$ of XLPE/semiconductive layer and XLPE/water/ semiconductive layer were increased as compared with that of XLPE Temperature reliability of tan$\delta$ was small.

Keywords

References

  1. Reliability and Transmission Capacty in XLPE Cable T. Mohatai;Fujikura Giho
  2. CIGRE v.2 Reliability and Develop towards High Voltage of Synthetic Insulated Cables Devaux, A.;Oudib, J.;M. Rerolle;Y. Jocteur,;R. Noirclerc;A. Osty
  3. Handbook of Electrical and Electronic Insulating Materials W. Tiller Shugg
  4. Proc. JICABLE Direct Measurement of Space Charge in Synthetic Cables by the Pressure Wave Method S. Mahdvis
  5. 古河電工時報 v.84 154 kV CV ケ-ブル用 Prefab接續函の 開發 藤井 他
  6. IEEE Trans. Elec. Insul v.24 no.5 Surface Flashover of Insulators H. Craig Miller https://doi.org/10.1109/14.42158
  7. ICPADM 92 Breakdown Strength Affected by the Interface Roughness at the Semiconducting Layer in XLPE Power Cables T. Okamoto
  8. J. of KIEEME v.12 no.5 Charcterization of failed underground distribution Cables C. S. Jung;W. S. Lee;J. H. Han
  9. J. of KIEEME v.11 no.9 Comparison of Charcteristics of XLPE for distribution power cables K. S. Suh;J. E. Kim;J. Lee;Y. H. Kim;J. S. Jung
  10. 3rd ICPADM Technical Aspects of Interfacial Phenomena in Solid Insulating Systems H. C. Kaerner;M. Ieda
  11. Eleventh International Symposium on High-Voltage Engineering, IEE, Conference Publication 467 v.4 no.22-27 The breakdown Strength of two-layer dielectrics S. M. Lebedev;O. S. Gefle;Yu, P. Pokholkov;V. I. Chichikin
  12. Annual Report of the 1999 Conference on Electrical Isulation and Dielectric Phenomena. IEEE Publication 99CH36319-2 Two kinds of decay time constants for interfacial space charge in polyethylene-laminated dielectrics T. Tanaka;M. Uchiumi
  13. J. of KIEEME v.12 no.3 Dependency on Temperature, Electric Field, Pressure and Dielectric Properties of XLPE/EPCM D. H. Park;D. S. Kim;S. O. Han
  14. Conference Record of the 1994 IEEE International Symposium on Electrical Insulation Thermal Ageing in Polymer Cables : Effect of Interfaces on Dielectric Properties T. Brincourt;B. Pinel;R. M. Morra;J. M. Braun
  15. IEEE Trans. Elec. Ins. v.24 Dielectrical breakdown strength affected by the lamellar configuration in XLPE insulation at a semiconduction interface T. Okamoto https://doi.org/10.1109/14.34194