• Journal of radiological science and technology
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• v.5 no.1
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• pp.21-34
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• 1982

When unattenuated x-ray radiation passes through the object it is transmitted and scattered from objectes and impinging on the film. During this process certain radiation is absorbed within the object and others transmitted in reduced scattering. The scattering radiation influence upon radiation image quality, confining x-ray beam which means scattering radiation produce increased fog on x-ray film image and as a consequence decrease contrast and less detail of the film there for the elimination of fog and for absorbing scattered radiation, the grid has been used between the object and the film in order to rid of scattering rays. Using grid is good method for the qualification of the better image as well as in using air gap technique. The grid is easy to manipulate and promote good efficiency which is defined by ICRU and JIS. It is the purpose to study for eliminating scattered radiation from the tissue equivalent acryl phantom using grid, we have studied and evaluated the grid permeability about the x-ray exposure, the selection of grid ratio according to phantom thickness, on x-ray exposure are performed as follows. 1. The penetrating ratio of primary x-ray is remarkably decreased by increasing of the grid ratio, but it is almost not influenced in KVP difference and phantom thickness. 2. The scattered radiation is proportionaly increased by thickness of the phantom, having nothing to do with grid ratios. 3. The relative between the penetration rate of primary and secondary x-ray is improved by increasing grid ratio, and decreased by phantom thickness, and slightly decreased by high tube voltage. 4. The grid of 5:1 and 10:1 ratio are adequate to the phantom of 10cm and 15cm thickness, respectively.

• Journal of the Korean Society of Radiology
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• v.17 no.3
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• pp.359-365
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• 2023

In order to satisfy the requirements of dynamic X-ray imaging with high frame rate and low image lag, minimizing parasitic capacitance in photodiode and overlapped electrodes in pixels is critically required. This study presents duoPIX^TM dynamic X-ray imaging sensor composing of readout thin film transistor, reset thin film transistor and photodiode in a pixel. Furthermore, dynamic X-ray detector using duoPIX^TM imaging sensor was manufactured and evaluated its X-ray imaging performances such as frame rate, sensitivity, noise, MTF and image lag. duoPIX^TM dynamic X-ray detector has 150 × 150 mm² imaging area, 73 um pixel pitch, 2048 × 2048 matrix resolution(4.2M pixels) and maximum 50 frames per second. By means of comparison with conventional dynamic X-ray detector, duoPIX^TM dynamic X-ray detector showed overall better performances than conventional dynamic X-ray detector as shown in the previous study.

• Imaging Science in Dentistry
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• v.33 no.1
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• pp.21-26
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• 2003

Purpose: To investigate the characteristics of the newly marketed, Insight dental X-ray film. Materials and Methods: Kodak Ultraspeed (DF-58), E-speed, Agfa Dentus M2, and Kodak Insight (IP-21) films were radiographed using a Trophy intra-oral radiographic machine. 10 step exposure times were prepared and each step exposure was monitored using a FH 40G (ESM Eberline Instruments) dosimeter for each of the 4 types of intra-oral film. All films were manually processed and the radiographic densities at 6 sites of each processed film were measured, and the characteristic curves of each of the 4 types intra-oral films were created utilizing these dosimetric data and radiographic densities, based on ISO 5779. The film contrast, speed, and base plus fog density of Insight film were compared with those of the 3 other films examined in this experiment. Results : E-speed film showed greatest average gradients followed by Insight film. E-speed and Ultraspeed film showed great average gradients at low density levels. Insight film showed the fastest speed followed by E-speed, Dentus M2 and Ultraspeed film. Dentus M2 film showed greatest base plus fog density level followed by Insight film. Conclusion : Kodak Insight film showed fastest film speed with comparable film contrast on characteristic curve.

• Journal of Ceramic Processing Research
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• v.13 no.spc2
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• pp.403-406
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• 2012

Effect of thickness on ZnO properties including the compositional ratio and crystallinity has been systematically investigated using a variety of characterization tools of x-ray diffraction, field emission scanning electron microscopy, x-ray fluorescence and x-ray photoelectron spectroscopy. Interestingly, it was observed that ZnO films below 80 nm in thickness were in oxygen deficiency, while the oxygen ratio was increased in the films above the thickness, although the compositional ratio of ZnO film was not linearly varied with increasing film thickness. Also, ZnO crystallinity, which is characterized by (002) diffraction pattern, was clearly improved with increasing film thickness. The properties of ZnO film with different sputtering time and the nature of direct current reactive sputtering process were discussed in terms of compositional ratio, especially oxygen ratio in ZnO film.

• Bulletin of the Korean Chemical Society
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• v.19 no.5
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• pp.549-553
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• 1998

The structure and layer distribution of cadmium arachidate Langmuir-Blodgett film were analyzed by the small angle X-ray reflectivity measurements using synchrotron radiation. Y-to X type transition was ocurred during the 39th passage of deposition of cadmium arachidate. Based on the measurement of the consumed area of the monolayer, it was determined that about 27.5 layer was deposited. Using the synchrotron X-ray, the reflectivity profile of cadmium arachidate LB film over the wide range of grazing angle was obtained. The X-ray reflectivity profile was analyzed using the recursion formula. By fitting the location and dispersion of the subsidiary maxima between the Bragg peaks of the measured reflectivity profile with that of the calculated reflectivity profile, the average thickness and the distribution of layer thickness were evaluated. The genetic algorithm was adopted to the fitting of reflectivity profile to evaluate the optimum value of the number distribution of layer. Based on the morphology measurement with an atomic force microscopy (AFM), the domain structure and mean roughness of LB films were obtained. The mean roughness value calculated based on the number of layer distribution obtained from the measurement by AFM is consistent with that obtained from X-ray reflectivity analysis.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.06a
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• pp.329-329
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• 2007

Photoconductive poly crystalline lead oxide coated on amorphous thin film transistor (TFT) arrays is the best candidate for direct digital x-ray detector for medical imaging. Thicker films with lessening density often show lower x-ray induced charge generation and collection becomes less efficient. In this work, we present a new methodology used for the high density deposition of PbO. We investigate the structural properties of the films using X-ray diffraction and electron microscopy experiments. The film coatings of approximately $200\;{\mu}m$ thickness were deposited on $2"{\times}2"$ conductive-coated glass substrates for measurements of dark current and x-ray sensitivity. The lead oxide (PbO) films of $200\;{\mu}m$ thickness were deposited on glass substrates using a wet coating process in room temperature. The influence of post-deposition annealing on the characteristics of the lead oxide films was investigated in detail. X-ray diffraction and scanning electron microscopy, and atomic force microscopy have been employed to obtain information on the morphology and crystallization of the films. Also we measured dark current, x-ray sensitivity and linearity for investigation of the electrical characteristics of films. It was found that the annealing conditions strongly affect the electrical properties of the films. The x-ray induced output charges of films annealed in oxygen gas increases dramatically with increasing annealing temperatures up to $500^{\circ}C$ but then drops for higher temperature anneals. Consequently, the more we increase the annealing temperatures, the better density and film quality of the lead oxide. Analysis of this data suggests that incorporation and decomposition reactions of oxygen can be controlled to change the detection properties of the lead oxide film significantly. Post-deposition thermal annealing is also used for densely film. The PbO films that are grown by new methodology exhibit good morphology of high density structure and provide less than $10\;pA/mm^2$ dark currents as they show saturation in gain (at approximate fields of $4\;V/{\mu}m$). The ability to operate at low voltage gives adequate dark currents for most applications and allows voltage electronics designs.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.11a
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• pp.282-283
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• 2006

The transport phenomena of arsenic (As) doped amorphous selenium(a-Se:As) thin film for digital X-ray conversion material has been reported. The effect of As addition on the carrier mobility and recombination lifetime in a-Se:As sample has been measured using the moving photo-carrier grating (MPG) technique. An Increase in hole mobility and recombination was observed when 0.3% arsenic, was added into a-Se sample, whereas electron mobility decrease with arsenic addition due to the defect density. The fabricated a-Se:03% As device exhibited the highest X-ray sensitivity.

• Current Applied Physics
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• v.18 no.11
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• pp.1185-1189
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• 2018

Thickness-dependent magnetic domain structure of ultrathin Co wedge films (0.3 nm-1.0 nm) sandwiched by Pt layers was investigated by scanning transmission x-ray microscopy (STXM) employing X-ray magnetic circular dichroism (XMCD), utilizing elliptically polarized soft x-rays and electromagnetic fields, with a spatial resolution of 50 nm. The magnetic domain images measured at the Co $L_3$ edge showed the evolution of the magnetic domain structures from maze-like form to the bubble-like form as the perpendicular magnetic field was applied. The asymmetric domain expansion of a 500 nm-scale bubble domain was also measured when the in-plane and perpendicular external magnetic field were applied simultaneously.

• Journal of Korean Academy of Oral and Maxillofacial Radiology
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• v.21 no.2
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• pp.317-326
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• 1991

The purpose of this study was to establish the principle and the clinical application of dynamic tomogram of a human head by using the dental machine. For this study, a block of wax with details lying at three parallel planes and a human dry skull were used. This experiment was reexamined the dynamic tomogram with specialized radiographic device and view box, and the radiograms taken by the change of exposure time according to the numbers of film used in x-ray taking and taken according to the change of kVp and the types of film were analyzed density with the densitometer. From this study, the obtained results were as follows: 1. When the underexposed radiograms taken by angulation of clockwise and counter-clockwise direction of the film and skull. were superimposed and moved laterally, it was possible to focus on right and left jaws and teeth. 2. The superimposition of the two underexposed radiograms according to each condition of x-ray taking showed some differencies in density visually, and the measurement of density with the densitometer was 1.23 to 1.57 in 75kVp and 1.34 to 1.70 in 90kVp. 3. The superimposition of the two underexposed radiograms according to the kinds of x-ray film showed almost equal density visually, and the measurement of density with the densiometer was 1.34 to 1.37. 4. When seven radiograms taken by each condition of x-ray taking were superimposed on the view box, a intense rear light of view box didn't transilluminate film density regardless of the conditions of x-ray taking. Even though seven radiograms taken according to types of film were superimposed on the view box, a more intense rear light of view box was required to transilluminate total density of films. 6. Long film-object distance resulted in the enlargement and blurring of radiographic images.

• Journal of radiological science and technology
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• v.33 no.3
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• pp.289-294
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• 2010

The purpose of this study is an evaluation of the performance of a detector under radiographic irradiation condition by fabricating the polycrystalline $HgI_2$ film detector. The polycrystalline $HgI_2$ film detectors with thickness of 210 and $320\;{\mu}m$ were fabricated by screen print technology. Measurements of X-ray sensitivity and dark current were performed for two detectors. And measurements of the linearity of X-ray response and reproducibility were performed for the detector of thickness $320\;{\mu}m$. For applied electric field strengths from 0.05 to $2\;V/{\mu}m$ to the detector of thickness $320\;{\mu}m$, the X-ray sensitivities were measured from 233 to $1,408{\times}106\;electrons/mR{\cdot}mm^2$. And the dark currents were measured from 3.2 to $118\;pA/mm^2$. Compared with values reported by Zhong Su et al., the X-ray sensitivities exhibit about two times larger than the X-ray sensitivities measured by Zhong Su et al. And the dark currents exhibit about nine times larger than the dark currents measured by Zhong Su et al. The linearity of X-ray response acquired 0.988 as a coefficient of correlation (r). Reproducibility acquired 0.002 as a coefficient of variation. This study provides the performance data of fabricated polycrystalline $HgI_2$ film detector available for an active matrix flat panel imager under radiographic irradiation condition.