• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.06a
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• pp.229-230
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• 2008

본 논문에서는 비정질-결정질간 가역적 상변화 기록 매질로 이용되고 있는 $(Ag_{5.5}In_{6.5}Sb_{59}Te_{29})$ 합금 박막의 Ag 조성 증가에 따른 원자구조와 상변화 특성간의 상관관계를 연구하였다. 실험에 사용된 AgInSbTe 조성은 5N의 금속 파우더를 용융-냉각법으로 벌크를 제작하였고 열증착 방법으로 Si (100) 및 유리(corning glass, 7059) 기판위에 200 nm 두께로 박막을 증착하였다. 비정질 박막의 결정화속도를 평가하기 위해서 658 nm의 LD가 장착된 나노-펄스 스캐너를 이용하여 power; 1~17mW, pulse duration; 10~460 ns의 범위에서 각 조성의 상변화에 따른 반사도 차이를 측정, 비교 분석하였다. 또한 각각의 박막을 $100^{\circ}C$ 에서 $300^{\circ}C$까지 $50^{\circ}C$ 간격으로 $N_2$ 분위기에서 1시간동안 열처리 한 후 XRD와 UV-Vis-NIR spectrophotometer를 사용하여 각 상의 구조분석 및 광학적 특성을 분석하였으며, 4-point probe로 면저항을 측정하였다.

• Korean Journal of Materials Research
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• v.1 no.4
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• pp.191-197
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• 1991

The surface roughnesses of titanium silicide films and the diffusion behaviours of dopants in single crystal and polycrystalline silicon substrates durng titanium silicide formation by rapid thermal annealing(RTA) of sputter deposited Ti-filicide film from the composite $TiSi_{2.6}$ target were investigated by the secondary ion mass spectrometry(SIMS), a four-point probe, X-ray diffraction, and surface roughness measurements. The as-deposited films were amorphous but film prepared on single silicon substrate crystallized to the orthorhombic $TiSi_2$(C54 structure) upon rapid thermal annealing(RTA) at $800^{\circ}C$ for 20sec. There was no significant out-diffusion of dopants from both single crystal and polycrystalline silicon substrate into titanum silicide layers during annealing. Most of the implanted dopants piled up near the titanium silicide/silicon interface. The surface roughnesses of titanium silicide films were in the range between 16 and 22nm.

• Journal of Genetic Medicine
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• v.15 no.1
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• pp.13-16
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• 2018

X-linked juvenile retinoschisis (XLRS) is characterized by the progressive loss of visual acuity and vitreous hemorrhage. XLRS is caused by a mutation of retinoschisin 1 (RS1) gene at Xp22.13. In the current report, a 2-year-old Korean patient with XLRS was described. The germline deletion of exon 1 was identified in the RS1 gene. Considering X-linked inheritance pattern, validation of a carrier state of a patient's mother is important for the genetic counseling of other family members and for the future reproductive plan. To confirm the carrier state of his mother, the multiplex ligation-dependent probe amplification analysis was done using peripheral leukocytes and found the heterozygous deletion of exon 1 in his mother.

• Proceedings of the Materials Research Society of Korea Conference
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• 2009.05a
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• pp.56.1-56.1
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• 2009

The intermediate operating temperature of solid oxide fuel cells (IT-SOFCs) have achieved considerable importance in the area of power fabrication. This is because to improve materials compatibility, their long-term stability and cost saving potential. However, to conserve rational cell performance at reduced-temperature regime, cathode performance should be obtained without negotiating the internal resistance and the electrode kinetics of the cell. Recently, double perovskite structure cathodes have been studied with great attention as a potential material for IT-SOFCs. In this study, double-perovskite structured cathodes of $GdBaCoCuO_{5+\delta}$, $GdBaCo_{2/3}Cu_{2/3}Fe_{2/3}O_{5+\delta}$ compositions and $(1-x)GdBaCo_2O_{5+\delta}+xCe_{0.9}Gd_{0.1}O_{1.95}$ (x = 10, 20, 30 and 40 wt.%) composites were evaluated as the cathode for intermediate temperature solid oxide fuel cells(IT-SOFCs). Electrical conductivity of the cathodes were measured by DC 4-probe method, and the thermal expansion coefficient of each sample was measured up to $900^{\circ}C$ by a dilatometer study. Area specific resistances(ASR) of the $GdBaCo_{2/3}Cu_{2/3}Fe_{2/3}O_{5+\delta}$ cathode and 70 wt.% $GdBaCo_2O5+\delta$ + 30wt.% Ce0.9Gd0.1O1.95 composite cathode on CGO electrolyte substrate were analyzed using AC 3-probe impedance study. The obtained results demonstrate that double perovskite-based compositions are promising cathode materials for IT-SOFCs.

• Proceedings of the KIEE Conference
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• 2011.07a
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• pp.1656-1657
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• 2011

본 논문에서는 RF 프로브를 이용하여 평면 구조물의 RCS(Radar Cross Section)를 감쇄시키기 위한 방법을 제안하였다. 우선적으로, EM 시뮬레이터를 이용하여 제안한 방법에 대한 가능성을 증명한 후 실험을 수행하였다. x-band 에서 $10{\lambda}$의 알루미늄판 위에 FR4 기판을 이용하여 patch 형태로 제작된 RF 프로브를 설치하였으며, 그 후 알루미늄 판으로 입사되는 외부 전자파를 상쇄시키기 위하여 RF 프로브로부터 전자파를 방사하였다. 로테이터를 사용하여 알루미늄판을 phi 방향으로 회전하여 임의의 각도로 입사하는 평면파에 대해서도 반사파의 크기를 측정하였다. RF 프로브로부터 방사된 전자파의 세기와 위상은 신호 발생기와 위상 천이기를 이용하여 조절되었다. 결과적으로 무반향실에서의 실험을 통해, 알루미늄판에 의해 반사되는 전자파를 측정하여 외부 전자파의 상쇄 정도를 확인하였다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.07a
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• pp.470-473
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• 2002

In order to get proper original suspension for the electrophoresis process of making YBaCuO films, YBaCuO superconductor powder was prepared with the Sol-gel method. The composition of the powder was analyzed by X-ray diffraction, which was identified as YBa$_2$Cu$_3$O$\sub$7-x/(Yl23) phase. The form of YBaCuO single particle was showed to be spherical by scanning electronic microscope and its size was among 0.2-1 $\mu\textrm{m}$. The critical transition temperature (T$\sub$c/) and the critical current density (J$\sub$c/) were measured with the four-probe, method. The T$\sub$c/ was about 91 K, and the J$\sub$c/ was 5-30 A/$\textrm{cm}^2$.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.19 no.1
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• pp.58-63
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• 2006

In this Paper, ZnO films mixed with iron oxide were prepared by an ultrasonic spray pyrolysis method. The chemical composition and structural properties as a function of the Fe atomic ratio in the deposition solution were studied. Zinc acetate and ferrous chloride were used as precursors of Zn and Fe, respectively. Fe atomic ratio to Zn varied from 0.15 to 10.0. Substrate temperature was fixed at $250^{\circ}C$. The crystallographic properties and surface morphologies of the films were studied by X-ray diffraction (XRD) and scanning electron microscopy (SEM), respectively. Electron probe X-ray microanalysis (EPMA) and X-ray photoelectron spectroscopy (XPS) were carried out to analyse the chemical composition and state of Zn and Fe atoms.

• Proceedings of the Materials Research Society of Korea Conference
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• 2012.05a
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• pp.91.2-91.2
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• 2012

The TiB2-reinforced iron matrix nanocomposite (Fe-TiB2) was in-situ fabricated from titanium hydride (TiH2) and iron boride (FeB) powders by a simple and cost-effective process that combines the mechanical activation (MA) and a subsequent heat treatment (HT). Effect of milling factors and synthesized temperatures on the formation of the nanocomposite were presented and discussed. A differential thermal analyser (DSC-TG) was employed for examination of thermal behavior of MAed powders. Phases of the nanocomposite were confirmed by X-ray diffraction analysis (XRD). The morphologies and microstructure of nanocomposite were investigated by field emission-scanning electron microscopy (FE-SEM) and energy-dispersive X-ray spectroscopy (EDS). Phase composition and distribution were analyzed by electron probe X-ray microanalysis (EPMA). Results showed that TiB2 particles formed in nanoscale were uniformly distributed in alloyed Fe matrix.

• Proceedings of the KIEE Conference
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• 1993.07b
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• pp.1137-1139
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• 1993

The superconducting thin films of $YBa_2Cu_3O_{7-x}$ were deposited on (100) sapphire substrates at low temperature by rf magnetron sputtering and annealed at $895^{\circ}C$ for 60 sec. using rapid-thermal-annealing(RTA) technique. The films were characterized by SEM, four-point probe resistivity measurement, XRD, and AES. The RTA processed HTS films had a preferential structure with c-axis normal to the substrate surface.

• Journal of Sensor Science and Technology
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• v.30 no.5
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• pp.342-348
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• 2021

For the characterization or failure analysis of electronic devices such as PCB (printed circuit boards), the most common method is the measurement of voltage waveforms with an oscilloscope. However, because there are many types of problems that cannot be detected by voltage waveform analysis, several other methods such as X-ray transmission, infrared imaging, or eddy current measurement have been applied for these analyses. However, these methods have also been limited to general analyses because they are partially useful in detecting physical defects, such as disconnections or short circuits. Fundamentally current waveform measurements during the operation of electronic devices need to be performed, however, commercially available current sensors have not yet been developed, particularly for applications in highly integrated PCB products with sub-millimeter fine pitch. In this study, we developed a highly sensitive PHR (planar hall resistance) magnetic sensor for application in highly integrated PCBs. The developed magnetic sensor exhibited sufficient features of an ultra-small size of less than 340 ㎛, magnetic field resolution of 10 nT, and current resolution of 1 mA, which can be applicable for PCB analyses. In this work, we introduce the development process of the magnetic sensing probe and its characteristic results in detail, and aim to extend this pin-type current probe to applications such as current distribution imaging of PCBs.