• 제목/요약/키워드: X-Ray scattering

검색결과 455건 처리시간 0.028초

Exploring Fine Structures of Photoactive Yellow Protein in Solution Using Wide-Angle X-ray Scattering

  • Kim, Tae-Kyu;Zuo, Xiaobing;Tiede, David M.;Ihee, Hyot-Cherl
    • Bulletin of the Korean Chemical Society
    • /
    • 제25권11호
    • /
    • pp.1676-1680
    • /
    • 2004
  • We demonstrate that wide-angle X-ray scattering pattern from photoactive yellow protein (PYP) in solution using a high flux third generation synchrotron X-ray source reflects not only the overall structure, but also fine structures of the protein. X-ray scattering data from PYP in solution have been collected in q ranges from 0.02 ${\AA}^{-1}$ to 2.8 ${\AA}^{-1}$. These data are sensitive to the protein structure and consistent with the calculation based on known crystallographic atomic coordinates. Theoretical scattering patterns were also calculated for the intermediates during the photocycle of PYP to estimate the feasibility of time-resolved wide-angle X-ray scattering experiments on such proteins. These results demonstrate the possibility of using the wide-angle solution X-ray scattering as a quantitative monitor of photo-induced structural changes in PYP.

Real-time X-ray Scattering as a Nanostructure Probe for Organic Photovoltaic Thin Films

  • 이현휘;김효정;김장주
    • 한국진공학회:학술대회논문집
    • /
    • 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
    • /
    • pp.181-181
    • /
    • 2013
  • Recently, nanostructure and the molecular orientation of organic thin films have been largely paid attention due to its importance in organic electronics such as organic thin film transistors (OTFTs), organic light emitting diodes (OLEDs), and organic photovoltaics (OPVs). Among various methods, the diffraction and scattering techniques based on synchrotron x-rays have shown powerful results in organic thin film systems. In this work, we introduce the in-situ annealing system installed at PLS-II (Pohang Light Source II) for organic thin films by simultaneously conducting various x-ray scattering measurements of x-ray reflectivity, conventional x-ray scattering, grazing incidence wide angle x-ray scattering (GI-WAXS) and so on. Using the in-situ measurement, we could obtain real time variation of nanostructure as well as molecular orientation during thermal annealing in metal-phthalocyanine thin films. The variation of surface and interface also could be simultaneously investigated by the x-ray reflectivity measurement.

  • PDF

Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement

  • Park, Junghwan;Choi, Yong Suk;Kim, Junhyuck;Lee, Jeongmook;Kim, Tae Jun;Youn, Young-Sang;Lim, Sang Ho;Kim, Jong-Yun
    • Nuclear Engineering and Technology
    • /
    • 제53권4호
    • /
    • pp.1297-1303
    • /
    • 2021
  • Most thickness measurement techniques using X-ray radiation are unsuitable in field processes involving fast-moving organic films. Herein, we propose a Compton scattering X-ray radiation method, which probes the light elements in organic materials, and a new simple, non-destructive, and non-contact calibration-free real-time film thickness measurement technique by setting up a bench-top X-ray thickness measurement system simulating a field process dealing with thin flexible organic films. The use of X-ray fluorescence and Compton scattering X-ray radiation reflectance signals from films in close contact with a roller produced accurate thickness measurements. In a high-thickness range, the contribution of X-ray fluorescence is negligible, whereas that of Compton scattering is negligible in a low-thickness range. X-ray fluorescence and Compton scattering show good correlations with the organic film thickness (R2 = 0.997 and 0.999 for X-ray fluorescence and Compton scattering, respectively, in the thickness range 0-0.5 mm). Although the sensitivity of X-ray fluorescence is approximately 4.6 times higher than that of Compton scattering, Compton scattering signals are useful for thick films (e.g., thicker than ca. 1-5 mm under our present experiment conditions). Thus, successful calibration-free thickness monitoring is possible for fast-moving films, as demonstrated in our experiments.

The Allosteric Transition of the Chaperonin GroEL from Escherichia coli as Studied by Solution X-Ray Scattering

  • Kuwajima Kunihiro;Inobe Tomonao;Arai Munehito
    • Macromolecular Research
    • /
    • 제14권2호
    • /
    • pp.166-172
    • /
    • 2006
  • This is a short review article of our recent studies on the ATP-induced, allosteric conformational transition of the chaperonin GroEL complex by solution X-ray scattering. We used synchrotron X-ray scattering with a two-dimensional, charge-coupled, device-based X-ray detector to study (1) the specificity of the chaperonin GroEL for its ligand that induced the allosteric transition, and (2) the identification of the allosteric transition of GroEL in its complicated kinetics induced by ATP. Due to the dramatically increased sensitivity of the X-ray scattering technique based on the use of the two dimensional X-ray detector and synchrotron radiation, different allosteric conformational states of GroEL populated under different conditions were clearly distinguished from each other. It was concluded that solution X-ray scattering is an extremely powerful tool for investigating the equilibrium and kinetics of cooperative conformational transitions of oligomeric protein complex, especially when combined with other spectroscopic techniques such as fluorescence spectroscopy.

Studies on Nanostructured Amorphous Carbon by X-ray Diffraction and Small Angle X-ray Scattering

  • Dasgupta, K.;Krishna, P.S.R.;Chitra, R.;Sathiyamoorth, D.
    • Carbon letters
    • /
    • 제4권1호
    • /
    • pp.10-13
    • /
    • 2003
  • The structural studies of amorphous isotropic carbon prepared from pyrolysis of phenol formaldehyde resin have been carried out using X-ray diffraction. X-ray diffraction from as prepared sample at $1000^{\circ}C$ and a sample treated at $1900^{\circ}C$ revealed that both are amorphous even though there are small differences in short range order. It is found that both are graphite like carbon (GLC) with predominantly $sp^2$ hybridization. Small angle X-ray scattering results show that as prepared sample mainly consists of thin two dimensional platelets of graphitic carbon whereas they grow in thickness to become three dimensional materials of nano dimensions.

  • PDF

X-ray scattering study on the electric field-induced interfacial magnetic anisotropy modulation at CoFeB / MgO interfaces

  • Song, Kyung Mee;Kim, Dong-Ok;Kim, Jae-Sung;Lee, Dong Ryeol;Choi, Jun Woo
    • Current Applied Physics
    • /
    • 제18권11호
    • /
    • pp.1212-1217
    • /
    • 2018
  • The electric field-induced modifications of magnetic anisotropy in CoFeB/MgO systems are studied using X-ray resonant magnetic scattering and magneto-optical Kerr effect. Voltage dependent changes of the magnetic anisotropy of -12.7 fJ/Vm and -8.32 fJ/Vm are observed for Ta/CoFeB/MgO and Hf/CoFeB/MgO systems, respectively. This implies that the interfacial perpendicular magnetic anisotropy is reduced (enhanced) when electron density is increased (decreased). X-ray resonant magnetic scattering measurements reveal that the small in-plane magnetic component of the remanent state of CoFeB/MgO systems with weak magnetic anisotropy changes depending on the applied voltage leading to modification of the magnetic anisotropy at the CoFeB/MgO interface.

방사광 x-선 기법에 의한 다층형 Fe/Cr 자성박막의 계면확산 연구 (Interfacial Diffusion in Fe/Cr Magnetic Multilayers Studied by Synchrotron X-ray Techniques)

  • 조태식
    • 한국전기전자재료학회논문지
    • /
    • 제17권2호
    • /
    • pp.223-227
    • /
    • 2004
  • We have studied the interfacial diffusion of Fe/Cr multilayers using synchrotron x-ray techniques, such as x-ray reflectivity, extended x-ray absorption fine structures (EXAFS), and high-resolution x-ray scattering. The results of x-ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers increased with the Cr-layer thickness. The Fourier transform (FT) of EXAFS data clearly showed that the Fe atoms dominantly diffused into the stable Cr layers at the Fe/Cr interface. The results of high-resolution x-ray scattering supported the interfacial diffusion of Fe atoms. Out study revealed that the dominantly interfacial diffusion of Fe atoms into the Cr layers effects the interfacial roughness of the Fe/Cr multilayers.

결맞는 X-선 산란을 이용한 박막의 표면 거동 연구 (Coherent x-ray scattering to study dynamics in thin films)

  • 김현정
    • 한국진공학회지
    • /
    • 제14권3호
    • /
    • pp.143-146
    • /
    • 2005
  • 본 연구에서는 결맞는 x-선을 이용하여 표면의 거동 현상을 관찰할 수 있는 새로운 실험 방법인 x-선 상관 분광법(x-ray photon correlation spectroscopy)을 소개하고 이를 이용하여 측정한 고분자 박막에서의 거동 현상에 대한 결과를 보고하고자 한다. 이 방법은 파장이 짧은 x-선 영역에 동역학 광산란(dynamic light scattering) 원리를 적용하여 나노 스케일의 동역학 현상을 관찰할 수 있다. 또한 x-선 산란을 이용하므로 동역학 현상과 동시에 구조 특성을 측정할 수 있다. 본 논문에서는 글래스 전이보다 높은 온도에서, 기판에 코팅된 고분자 박막의 표면 거동현상을 온도와 파수의 함수로 측정하였다. 박막의 두께가 두꺼울 때에는 점성이 높은 액체에서와 계산된 이론에서와 같은 표면 거동 현상이 관찰되었고, 얇은 박막에서는 갇힘 현상에 의한 효과를 관찰하였다.

X-ray 후방산란 기술을 이용한 항공기용 복합재료의 다중 층간 박리 평가 (Assessment of Multiple Delamination in Laminated Composites for Aircrafts using X-ray Backscattering)

  • 김노유
    • 비파괴검사학회지
    • /
    • 제30권1호
    • /
    • pp.46-53
    • /
    • 2010
  • 항공기용 복합재료 내부 여러 층에서 발생하는 박리를 정량적으로 평가하기 위한 X-ray 후방산란 검사장치를 개발하였다. 복합재료 두께방향으로의 역산란 밀도변화로부터 층간 박리를 검사하는 슬릿 방식의 카메라와 컴퓨터로 제어되는 X-ray 선원, 그리고 센서로 구성되는 X-ray 후방산란장치를 제작하여 그 성능을 충격하중에 의해 만들어진 인공결함시편을 이용해 검증하였다. 결함평가를 위해 복합재료내 산란장의 크기를 이론적으로 계산하는 수학적 해석 모델을 볼츠만 방정식을 이용하여 제안하였으며 적응필터 알고리즘을 사용하여 산란 노이즈를 최소화 하였다. 다중 박리 결함을 X-ray 후방산란장치를 통해 효과적으로 검출하였으며, 박리 위치와 박리 상태를 모두 정확하게 검사할 수 있음을 실험을 통해 확인하였다.

The Performance Test of Anti-scattering X-ray Grid with Inclined Shielding Material by MCNP Code Simulation

  • Bae, Jun Woo;Kim, Hee Reyoung
    • Journal of Radiation Protection and Research
    • /
    • 제41권2호
    • /
    • pp.111-115
    • /
    • 2016
  • Background: The scattered photons cause reduction of the contrast of radiographic image and it results in the degradation of the quality of the image. In order to acquire better quality image, an anti-scattering x-ray gird should be equipped in radiography system. Materials and Methods: The X-ray anti-scattering grid of the inclined type based on the hybrid concept for that of parallel and focused type was tested by MCNP code. The MCNPX 2.7.0 was used for the simulation based test. The geometry for the test was based on the IEC 60627 which was an international standard for diagnostic X-ray imaging equipment-Characteristics of general purpose and mammographic anti-scatter grids. Results and Discussion: The performance of grids with four inclined shielding material types was compared with that of the parallel type. The grid with completely tapered type the best performance where there were little performance difference according to the degree of inclination. Conclusion: It was shown that the grid of inclined type had better performance than that of parallel one.