• Title/Summary/Keyword: Wollaston Prism

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Analysis of Phase Error Due to the Azimuth Angle of the Wave Plates in the Shearography Using Wollaston Prism (Wollaston prism을 이용한 스펙클패턴 전단간섭법에 있어서 파장판의 방위각에 의한 위상오차 해석)

  • Kim, Soo-Gil;Kim, Ki-Soo;Ko, Myung-Sook
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.19 no.8
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    • pp.1-7
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    • 2005
  • We introduced the method to obtain four speckle patterns with relative phase shift of ${\pi}/2$ by the polarizing elements, and calculate the phase at each point of the speckle pattern in shearography using Wollaston prism and polarizing elements. Ant we analyzed the phase error caused by the azimuth angles of wave plates used in the proposed method by Jones matrix.

Polarization Phase-shifting Technique in Shearographic System with a Wollaston Prism

  • Kim, Soo-Gil
    • Journal of the Optical Society of Korea
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    • v.8 no.3
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    • pp.122-126
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    • 2004
  • The method to obtain four speckle patterns with relative phase shift of ${\pi}/2$ by passive devices such as two waveplates and a linear polarizer, awl to calculate the phase at each point of the speckle pattern in shearography with a Wollaston prism is presented, and the feasibility of the proposed method is theoretically demonstrated by Jones vector.

Single-shot Transport-of-intensity Equation Using a Wollaston Prism for Biological Samples

  • Joseph Vermont Bunyi Bandoy;Cuong Manh Nguyen;An Nazmus Sakib;Suhyeon Kim;Hyuk-Sang Kwon
    • Current Optics and Photonics
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    • v.8 no.5
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    • pp.502-507
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    • 2024
  • The Wollaston prism (WP) has shown promise in enabling single-shot transport-of-intensity equation (ssTIE) measurements, facilitating efficient phase retrieval in microscopy. The 1-degree prism which produces the minor beam-separation angle is used to prevent distortions. An optical-glass plate is employed in the duplicated beam path to introduce defocusing. This configuration is also advantageous when aligning the beams laterally caused by the refraction of the optical-glass plate, thus allowing another method for single-shot measurements. We applied the proposed method to image the red blood cells (RBCs), demonstrating that the proposed method could be useful in various biological and medical applications.

The Theoretical Analysis about the Phase-Shifting Technique of Shearography Using Waveeplates (파장판을 이용한 Shearography의 위상천이기술에 대한 이론적 고찰)

  • Kim, Soo-Gil
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.18 no.6
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    • pp.8-13
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    • 2004
  • We presented the method to obtain four speckle interferograms with relative phase shift of $\pi$/2 by passive devices such as waveplate and polarizer, calculate the phase at each point of the speckle interferogram in shearography using Wollaston prism, and theoretically demonstrated the feasibility of the unposed method by Jones matrix.

Phase Error Analysis in Shearography Using Wave Plates (파장판를 이용한 스펙클패턴 전단간섭법에 있어서의 위상오차 해석)

  • Kim, Soo-Gil
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.19 no.1
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    • pp.34-39
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    • 2005
  • We presented the method to obtain four speckle patterns with relative phase shift of ${\pi}/2$ by passive devices such as wave plate and polarizer, and calculate the phase at each point of the speckle pattern in shearography using Wollaston prism. And, we analyzed the phase error caused by wave plates used in the proposed method by Jones matrix.

Phase Error Analysis in Polarization Phase-shifting Technique using a Wollaston Prsim and Wave Plates

  • Kim Soo-Gil
    • Journal of the Optical Society of Korea
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    • v.9 no.4
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    • pp.145-150
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    • 2005
  • The method to obtain four speckle patterns with relative phase shift of $\pi$/2 by passive devices such as two waveplates and a linear polarizer, and to calculate the phase at each point of the speckle pattern in shearography with a Wollaston prism is described. In this paper, we analyze its potential error sources caused by wave plates.

Theoretical analysis and Phase Error Analysis of the Shearographic System for the Deformation Evaluation of Semiconductor Equipment (반도체 장비의 변형 진단을 위한 shearographic system의 이론적 고찰 및 위상오차해석)

  • Kim, Soo-Gil;Hong, Sun-Ki
    • Journal of the Semiconductor & Display Technology
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    • v.4 no.1 s.10
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    • pp.17-21
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    • 2005
  • We presented a new method to obtain four speckle interferograms with relative phase shift of $\pi$/2 by passive devices such as waveplate and polarizer, calculate the phase at each point of the speckle interferogram in shearography using Wollaston prism, which can be applied to the deformation evaluation of semiconductor devices, and theoretically demonstrated the feasibility of the proposed method by Jones matrix.

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Real-time Measurement of Full Field Retardation Near Quarter Wavelength

  • Liu, Longhai;Zeng, Aijun;Yuan, Qiao;Zhu, Linglin;Fang, Ruifang;Huang, Huijie
    • Journal of the Optical Society of Korea
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    • v.16 no.4
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    • pp.457-461
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    • 2012
  • A real-time method to measure full field retardation near quarter wavelength is proposed. The circularly polarized beam passes through a sample with a large aperture. The measuring beam then goes through a quarter-wave plate and is then split by a Wollaston prism. An image with two sub-images is then detected by a high-speed image sensor. The full field retardation near quarter wavelength can be obtained in real time by processing the image. The measured retardation is independent of the fast axis angle of the sample and the fluctuation of the initial intensity. In experiments, a wedge waveplate is measured with different fast axis angle and initial intensity, and the full field retardations are acquired. The maximum and standard deviation of the full field retardation is $1.5^{\circ}$ and $0.4^{\circ}$. The validity of the method is verified.

Compensation of the Straightness Measurement Error in the Laser Interferometer (레이저 간섭계의 진직도 측정오차 보상)

  • Khim Gyungho;Keem Tae-Ho;Lee Husang;Kim Seung-Woo
    • Journal of the Korean Society for Precision Engineering
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    • v.22 no.9 s.174
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    • pp.69-76
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    • 2005
  • The laser interferometer system such as HP5529A is one of the most powerful equipment fur measurement of the straightness error in precision stages. The straightness measurement system, HP5529A is composed of a Wollaston prism and a reflector. In this system, the straightness error is defined as relative lateral motion change between the prism and the reflector and computed from optical path difference of two polarized laser beams between these optics. However, rotating motion of the prism or the reflector used as a moving optic causes unwanted straightness error. In this paper, a compensation method is proposed for removing the unwanted straightness error generated by rotating the moving optic and an experiment is carried out for theoretical verification. The result shows that the unwanted straightness error becomes very large when the reflector is used as the moving optic and the distance between the reflector and the prism is far. Therefore, the prism must be generally used as the moving optic instead of the reflector so as to reduce the measurement error. Nevertheless, the measurement error must be compensated because it's not a negligible error if a rotating angle of the prism is large. In case the reflector must be used as the moving optic, which is unavoidable when the squareness error is measured between two axes, this compensation method can be applied and produces a better result.