• 제목/요약/키워드: W-C-N thin film

검색결과 186건 처리시간 0.023초

RF Magnetron Sputtering 법으로 증착된 AlN 박막의 특성 (Characteristics of AlN thin film using RF Magnetron Sputtering)

  • 조인호;장철영;고성용;이용현
    • 한국전기전자재료학회:학술대회논문집
    • /
    • 한국전기전자재료학회 2001년도 추계학술대회 논문집 Vol.14 No.1
    • /
    • pp.509-512
    • /
    • 2001
  • Aluminum nitride(AlN) thin films were deposited on silicon substrates using RF magnetron sputtering at various deposition conditions and investigated the characteristics. It was used XRD, AES, SEM, and HP-4145B semiconductor parameter analyzer to analysis deposited AlN thin films. The deposition conditions for the good c-axis orientation were 100 W of RF power, $200^{\circ}C$ of substrate temperature and 15 mTorr of working pressure. The leakage current density was less then $1.3{\times}10^{-7}A/cm^{2}$. And it was also investigated the etching properties of deposited AlN thin films for application.

  • PDF

Enhanced effect of magnetic anisotropy on patterned Fe-Al-O thin films

  • N.D. Ha;Kim, Hyun-Bin;Park, Bum-Chan;Kim, C.G.;Kim, C.O.
    • 한국재료학회:학술대회논문집
    • /
    • 한국재료학회 2003년도 춘계학술발표강연 및 논문개요집
    • /
    • pp.239-239
    • /
    • 2003
  • As a result of the recent miniaturization and enhancement in the performance of thin film inductors and thin film transformers, there are increased demands for the thin films with a high magnetic permeability in the high frequency range, a high saturation magnetization, a high electrical resistivity, and a low coercive force. In order to improve high frequency properties, we will investigate anisotropy field by shape and size of pattern. The Fe-Al-O thin films of 16mm diameter and 1$\mu\textrm{m}$ thickness were deposited on Si wafer, using RE magnetron reactive sputtering technique with the mixture of argon and oxygen gases. The fabricating conditions are obtained in the working partial pressure of 2m Torr, O$_2$ partial Pressure of 5%, Input power of 400w, and Al pellets on an Fe disk with purity of 99.9%. For continuous thin film is the 4Ms of 19.4kG, H$\sub$c/ of 0.6Oe, H$\sub$k/ of 6.0Oe and effective permeability of 2500 up to 100MHz. In this work, we expect to enhanced effect of magnetic anisotropy on patterned of Fe-Al-O thin films.

  • PDF

반응성 스퍼터링에 의해 제작된 InN 박막의 특성 (Characteristics of InN thin films fabricated by reactive sputtering)

  • 김영호;정성훈;문동찬;송복식;김선태
    • 한국전기전자재료학회:학술대회논문집
    • /
    • 한국전기전자재료학회 1997년도 추계학술대회 논문집
    • /
    • pp.173-176
    • /
    • 1997
  • The III-V nitride semiconductor InN thin films which have the direct bandgap in visible light wavelength region have been deposited on Si(100) substrates and AIN/Si(100) substrates by rf reactive sputtering. InN thin films have been investigated on the structural, and electrical properties according to the sputtering parameters such as total pressure, rf power, and substrate temperature. It is found that optimal conditions required for fabricating InN thin films with high crystal Quality, low carrier concentration, high Hall mobility are total pressure 5mTorr, rf power 60W, substrate temperature 6$0^{\circ}C$ . InN thin films deposited on the AIN(60min.)/Si(100) substrates arid AIN(120min.)/Si(100) substrates showed remarkably high crystal quality and electrical properties. It is known that AIN buffer layer is to decrease free energy at interface between InN film and Si substrate, and then promoting lateral growth of InN films.

  • PDF

W-TiN 복층 전극 소자에서 TiN 박막 형성 조건에 따른 특성 분석 (Characteristics of W-TiN Gate Electrode Depending on the Formation of TiN Thin Film)

  • 윤선필;노관종;양성우;노용한;김기수;장영철;이내응
    • 한국진공학회지
    • /
    • 제10권2호
    • /
    • pp.189-193
    • /
    • 2001
  • TiN을 불소의 확산 방지막으로 사용한 W-TiN 복층 게이트 소자의 물리적.전기적 특성 변화를 살펴보았다. TiN 스퍼터링 증착시 $N_2$/Ar 가스 비율이 증가할수록 TiN 박막은 N-과다막이 되어 비저항이 증가하였으나, W-TiN복층 구조에서는 $N_2$/Ar가스 비율이 증가할수록 상부 텅스텐 박막의 결정화가 증가하여 비저항이 감소하였다. 한편, 같은 $N_2$/Ar 비율의 경우, TiN 박막 열처리 온도 변화(600~$800^{\circ}C$)에 무관하게 W(110) 방향으로 우선 배향된 결정 구조를 보였다. 누설 전류 특성은 TiN증착시 $N_2$/Ar 비율 변화에 무관하게 우수하였으며, TiN을 확산 방지막으로 사용함으로서 순수 텅스텐 전극만을 적용시 나타나는 초기 저전계 누설 특성을 향상시킬 수 있음을 확인하였다.

  • PDF

마그네트론 RIE를 이용한 다결정 3C-SiC의 식각 특성 (Etching Characteristics of Polyctystalline 3C-SiC Thin Films by Magnetron Reactive Ion Etching)

  • 온창민;김귀열;정귀상
    • 한국전기전자재료학회:학술대회논문집
    • /
    • 한국전기전자재료학회 2007년도 하계학술대회 논문집 Vol.8
    • /
    • pp.331-332
    • /
    • 2007
  • Surface micromachined SiC devices have readily been fabricated from the polycrystalline (poly) 3C-SiC thin film which has an advantage of being deposited onto $SiO_2$ or $Si_3N_4$ as a sacrificial layer. Therefore, in this work, magnetron reactive ion etching process which can stably etch poly 3C-SiC thin films grown on $SiO_2$/Si substrate at a lower energy (70 W) with $CHF_3$ based gas mixtures has been studied. We have investigated the etching properties of the poly 3C-SiC thin film using PR/Al mask, according to $O_2$ flow rate, pressure, RF power, and electrode gap. The etched RMS (root mean square), etch rate, and etch profile of the poly 3C-SiC thin films were analyzed by SEM, AFM, and $\alpha$-step.

  • PDF

대향타겟식 스퍼터링법을 이용한 AIN 박막의 제작

  • 금민종;추순남;최명규;이원식;김경환
    • 한국반도체및디스플레이장비학회:학술대회논문집
    • /
    • 한국반도체및디스플레이장비학회 2005년도 추계 학술대회
    • /
    • pp.89-92
    • /
    • 2005
  • The AIN/AI thin films were prepared at various conditions, such as $N_2$ gas flow rate [$N_2(N_2+Ar)$] from 0.6 to 0.9, a substrate temperature ranging from room temperature to $300^{\circ}C$ and working pressure 1mTorr. We estimated crystallographic characteristics and c-axis preferred orientations of AIN/AI thin films as function of AI electrode surface roughness. The optimal processing conditions for AI electrode were found at substrate temperature of $300^{\circ}C$ sputtering power of 100W and a working pressure of 2mTorr. In these conditions, we obtained the c-axis preferred orientation of $AIN/AI/SiO_2/Si$ thin film about 4 degree.

  • PDF

Al 하부전극을 이용한 AlN 박막의 제작 (Preparation the AlN thin films with the Al bottom electrode)

  • 김건희;금민종;김현웅;김경환
    • 한국전기전자재료학회:학술대회논문집
    • /
    • 한국전기전자재료학회 2004년도 춘계학술대회 논문집 반도체 재료 센서 박막재료 전자세라믹스
    • /
    • pp.101-104
    • /
    • 2004
  • In this study AlN/Al thin films were prepared at various conditions, such as $N_2$ gas flow rate $[N_2/(N_2+Ar)]$ from 0.6 to 0.9, a substrate temperature ranging from room temperature to $300^{\circ}C$ and working pressure 1mTorr. We estimated crystallographic characteristics and c-axis preferred orientations of AlN/Al thin films as function of Al electrode surface roughfness. The optimal processing conditions for Al electrode were found at substrate temperature of $300^{\circ}C$, sputtering power of 100W and a working pressure of 2mTorr. In these conditions, we obtained the c-axis preferred orientation of $AlN/Al/SiO_2/Si$ thin film about 4 degree.

  • PDF

이가열원(二加熱源) 증착법(蒸着法)에 이한 산화물(酸化物) 반도체(半導體) $[(I_{n2}O_3)_x{\cdot}(S_nO_2)_{1-x}]_{(n)}/Silicon(p)$, 태양전지(太陽電池)에 관한 연구(硏究) (A study on the oxide semiconductor $[(I_{n2}O_3)_x{\cdot}(S_nO_2)_{1-x}]_{(n)}/Silicon(p)$, solar cells fabricated by two source evaporation)

  • 전춘생;김용운;임응춘
    • 태양에너지
    • /
    • 제12권2호
    • /
    • pp.62-78
    • /
    • 1992
  • 본 논문은 二(이)가열원 진공증착법을 이용하여 실리콘 웨이퍼의 온도를 190[$^{\circ}C$]로 유지한 상태에서 ITO 박막을 증착, 열처리한 후 $ITO_{(n)}/Si_{(p)}$ 태양전지를 제작하였고 그의 전기적 특성을 조사하였다. $In_2O_3$$S_nO_2$의 증착비율이 각각 91[mole %] 9[mole %]일 때 최대효율 11[%]의 태양전지를 제작 할 수 있었다. 제작된 전지는 열처리 시간과 온도에 따라 성능이 향상되지만 약 600[$^{\circ}C$] 이상의 온도, 15분 이상의 열처리 시간에서는 오히려 박막의 각종 결함의 증가로 인한 감소현상을 보였다. 제작한 전지의 광 응답 특성을 조사하였는데 열처리온도를 증가시킴에 따라 미소하나마 장파장 영역으로 그 peak값이 이동함을 알 수 있었다. X선 회절현상을 통해 열처리온도에 따른 결정성장이 증대하여 단결정 쪽으로 이동해 감을 확인할 수 있었다. 본 실험에서 제작한 $ITO_{(n)}/Si_{(p)}$ 태양전지에 대하여 특성을 조사한 바 다음과 같은 결과를 얻었다. $100[mW/cm^2]$의 태양광 에너지 조사하에서 단락전류 : ISC=31 $[mW/cm^2]$ 개방전압 : VOC=460[mV] 충실도 : FF=0.71 변환효율 : ${\eta}$=11[%].

  • PDF