• Title/Summary/Keyword: Varying Thickness

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Analysis of Fatigue Crack Growth with Thickness Ratio in Weldments (두께比를 考廬한 鎔接部의 疲勞龜裂傳播 解釋)

  • 차용훈;방한서;김덕중
    • Journal of Welding and Joining
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    • v.14 no.5
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    • pp.69-77
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    • 1996
  • This study aims to analyze the S. I. F. K value upon Mode I cracks in a finite-width plate of varying thickness, which is expressed in terms of width ratio ($\omega$), thickness ratio ($\beta$) and non-dimensional crack length (λ) by using the 2-dimensional finite element method. Then, by comparing the effectiveness of the results obtained by the two finite element methods, it is seen that the 2-dimensional finite element method can be used in order to analyse the S. I. F. K values upon a various thickness model. A model is developed in order to analyze the effects of initial residual stress upon the fatigue crack growth behavior in various thickness welded specimens. In this model, crack growth rate da/dN appears to be come small as the thickness ratio with the same ΔK is increased. Also, in the initial step, as ΔK is increased with crack growth rate is decreased and then increased because the repeated compressive residual stress retards crack growth rate.

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Electrical Properties with Varying CuPc Thickness and Channel Length of the Field-effect Transistor (CuPc 두께 변화 및 채널 길이 변화에 따른 전계 효과 트랜지스터의 전기적 특성 연구)

  • Lee, Ho-Shik
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.20 no.1
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    • pp.47-52
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    • 2007
  • Organic field-effect transistors (OFETS) are of interest for use in widely area electronic applications. We fabricated a copper phthalocyanine (CuPc) based field-effect transistor with varying channel length. The CuPc FET device was made a top-contact type and the channel length was a $100\;{\mu}m,\;50\;{\mu}m,\;40\;{\mu}m,\;and\;30\;{\mu}m$ and the channel width was a fixed at 3 mm. We observed a typical current-voltage (I-V) characteristics in CuPc FET with varying channel length (L) and we calculated the effective mobility. Also, we measured a capacitance-voltage (C-V) by applied bias voltage with varying frequency at 43, 100, 1000 Hz.

Dynamic Stability Analysis of Thick Plates with Varying Thickness and Concentrated Mass on Inhomogeneous Pasternak Foundation (비균질 Pasternak 지반에 놓인 집중질량을 갖는 변단면 후판의 동적안정해석)

  • Lee, Yong-Soo;Kim, Il-Jung
    • Transactions of the Korean Society for Noise and Vibration Engineering
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    • v.21 no.8
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    • pp.698-707
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    • 2011
  • This paper is to analyze the stability of the thick plate on inhomogeneous Pasternak foundation, with linearly varying thickness and concentrated mass by finite element method. To verify this finite element method, the results of natural frequencies and buckling stresses by the proposed method are compared with the existing solutions. The dynamic instability regions are decided by the dynamic stability analysis of the thick plate on inhomogeneous Pasternak foundation, with linearly varying thickness and concentrated mass. The non-dimensional Winkler foundation parameter is applied as 100, 1000 and non-dimensional shear foundation parameter is applied as 5. The tapered ratios are applied as 0.25 and 1.0, the ratios of concentrated mass to plate mass as 0.25 and 1.0, and the ratio of in-plane force to critical load as 0.4. As the result of numerical analysis of the thick plate on inhomogeneous Pasternak foundation for $u{\times}v=300cm{\times}300cm$ and $a{\times}b=600cm{\times}600cm$, instability areas of the thick plate which has the larger rigidity of inner area are farther from ${\beta}$-axis and narrower than those which has the larger rigidity of outer area.

Dependence of Annealing Temperature on Properties of PZT Thin Film Deposited onto SGGG Substrate

  • Im, In-Ho;Chung, Kwang-Hyun;Kim, Duk-Hyun
    • Transactions on Electrical and Electronic Materials
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    • v.15 no.5
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    • pp.253-256
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    • 2014
  • $Pb(Zr_{0.52}Ti_{0.48})O_3$ thin films of $1.5{\mu}m$ thickness were grown on $Pt/Ti/Gd_3Ga_5O_{12}$ substrate by RF magnetron sputtering at annealing temperatures ranging from $550^{\circ}C$ to $700^{\circ}C$. We evaluated the residual stress, by using a William-Hall plot, as a function of the annealing temperatures of PZT thin film with a constant thickness. As a result, the residual stresses of PZT thin film of $1.5{\mu}m$ thickness were changed by varying the annealing temperature. Also, we measured the hysteresis characteristic of PZT thin films of $1.5{\mu}m$ thickness to evaluate for application of an optoelectronic device.

Experimental investigation on the buckling of thin cylindrical shells with two-stepwise variable thickness under external pressure

  • Aghajari, Sirous;Showkati, Hossein;Abedi, Karim
    • Structural Engineering and Mechanics
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    • v.39 no.6
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    • pp.849-860
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    • 2011
  • The buckling capacity of the cylindrical shells depends on two geometric ratios of L/R and R/t. However the effect of thickness variation on the behavior of the shells is more complicated and the buckling strength of them is sensitive to the magnitude and shape of geometric imperfections. In this paper the effects of thickness variation and geometric imperfections on the buckling and postbuckling behavior of cylindrical shells are experimentally investigated. The obtained results are presented under the effect of uniform lateral pressure. It is found in this investigation that the buckling mode can be generated in the whole length of the shell, if the thickness variation is low.

Study on the Film Thickness and Pressure of the Transient Line Contact Elastohydrodynamic Lubrication (비정상 상태의 선접촉 탄성유체윤활 유막두께 및 유막압력 특성연구)

  • Cho, Jae-Cheol;Jang, Si-Youl
    • Tribology and Lubricants
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    • v.25 no.5
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    • pp.335-341
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    • 2009
  • Elastohydrodynamic lubrication (EHL) analysis shows that film thickness is very flat in the contact area and pressure distribution is somehow similar to that of Hertzian contact pressure except the outlet region with pressure spike. These typical patterns of EHL film thickness and pressure are the cases under the steady contact conditions of applied loads and speeds. However, many engineering contacts are rather under the conditions of varying loads and contact speeds, and therefore the predictions for endurance life and performance of machine elements with steady EHL analysis are not suitable in many occasions. This study shows the differences in film thickness formation and pressure distribution between steady and transient contact conditions in several contact cases.

Study of the Film Thickness Behaviors in the Elastohydrodynamic Lubrication of Circular Contact under the Dynamic Loading Condition with Multigrid Multilevel Method (변동하중 조건에서 점접촉 탄성유체윤활의 유막거동 연구)

  • Cho, Jae-Cheol;Jang, Si-Youl
    • Tribology and Lubricants
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    • v.25 no.6
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    • pp.367-373
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    • 2009
  • Many research of elastohydrodynamic lubrication (EHL) has been performed under the condition of steady state loading. However, mechanical elements undergo severe high loads that are in the fluctuating modes of frequency and amplitude. Conventional numerical method for the circular contact of EHL study has the difficulty in making the film thickness and pressure of EHL converged in high loads of steady state as well as fluctuating loading conditions. In this work, multigrid multilevel method are used for the stable convergence of film pressure and thickness under the conditions of high as well as varying loads, and very stable solutions of film behaviors with elastic deformation are obtained. Several results of dynamic loading condition are shown and compared with those of steady state condition in the aspects of circular EHL film thickness and pressure.

The Effect of Nitric Acid Catalyst on the Properties of Lead Titanate Thin Films by Sol Gel Spin Coating (졸겔 스핀 코팅에서 질산촉매가 티탄산연 박막의 물성에 미치는 영향)

  • 이전국;정형진;김종희
    • Journal of the Korean Ceramic Society
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    • v.28 no.11
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    • pp.859-864
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    • 1991
  • High quality lead titanate thin films were fabricated by spin coating on a silicon substrate. The resulting dried gel layers were uniform in thickness through 2$\times$2 $\textrm{cm}^2$ area, and polycrystalline perovskite structures developed almost crack free with a heat treatment above 50$0^{\circ}C$ in films with thickness above 360 nm. Metastable pyrochlore structures were observed in films with thickness of 160 nm when heat treated at 500 and $600^{\circ}C$, but these structure did not appear in films with thickness of 360 nm. The thickness dependence in crystal structure of films was studied. by varying the substrate condition and analyzing the interface between the film and substrate. In native oxide films on silicon stbstrates, amorphous dried gel layers were heterogeneously nucleated. Metastable cubic pyrochlore structure could be crystallized in amorphous native oxide.

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