• Journal of the Korean Operations Research and Management Science Society
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• v.39 no.1
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• pp.1-12
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• 2014

This article proposes a variable sampling interval (VSI) $\bar{X}$ control chart using weighted standard deviation (WSD) method for skewed populations. The WSD method decomposes the standard deviation of a quality characteristic into upper and lower deviations and adjusts control limits and warning limits of a control chart in accordance with the direction and degree of skewness. A control chart constant is derived for estimating the standard deviation of skewed distributions with the mean of sample standard deviations. The proposed chart is compared with the conventional VSI $\bar{X}$ control chart under some skewed distributions. Simulation study shows that the proposed WSD VSI chart can control the in-control average time to signal (ATS) as an adequate level better than the conventional VSI chart, and the proposed chart can detect a decrease in the process mean of a quality characteristic following a positively skewed distribution more quickly than the standard VSI chart.

• Journal of Korean Society for Quality Management
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• v.35 no.2
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• pp.37-44
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• 2007

Today, the statistical process control (SPC) in manufacture environment is an important role at the process by the productivity improvement of the manufacturing systems. The control chart in this statistical method is widely used as an important statistical tool to find the assignable cause that provoke the change of the process parameters such as the mean of interest or standard deviation. But the traditional SPC don't grasp the change of process according to the points fallen the near control limits because of monitoring the variance of process such as the fixed sampling interval and the sample size and handle the cost of the aspect of these sample point. The control chart can be divided into the statistical and economic design. Generally, the economic design considers the cost that maintains the quality level of process. But it is necessary to consider the cost of the process improvement by the learning effects. This study does the economic design in the VSI $\bar X$ control chart and added the concept of loss function of Taguchi in the cost model. Also, we preyed that the VSI $\bar X$ control chart is better than the FSI $\bar X$ in terms of the economic aspects and proposed the standard of the process improvement using the VSI $\bar X$ control chart.

• Journal of Korean Society for Quality Management
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• v.32 no.4
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• pp.252-264
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• 2004

Variable sampling Interval (VSI) control charts vary the sampling interval according to value of the control statistic while the sample size is fixed. It is known that control charts with 2-state VSI scheme, which uses only two sampling intervals, give good statistical properties. Variable sample size (VSS) control charts vary the sample size according to value of the control statistic while the sampling interval is fixed. In the VSS scheme no optimal results are known for the number of sample sizes. It is also known that the variable sampling rate (VSR) $\bar{X}$ control chart with 2-state VSS and 2-state VSI scheme leads to large improvements In performance over the fixed sampling rate (FSR) $\bar{X}$ chart, but the optimal number of states for sample size Is not known. In this paper, the VSR Χ charts with multi-state VSS and 2-state VSI scheme are designed and compared to 2-state VSS and 2-state VSI scheme. The multi-state VSS scheme is considered to, achieve an additional improvement by switching from the 2-state VSS scheme. On the other hand, the multi-state VSI scheme is not considered because the 2-state scheme is known to be optimal. The 3-state VSS scheme improves substantially the sensitivity of the $\bar{X}$ chart especially for small and moderate mean shifts.

• Journal of Korean Society for Quality Management
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• v.28 no.3
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• pp.18-30
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• 2000

Recent studies have shown that the $\bar{X}$ chart with variable sampling intervals(VSI) and the $\bar{X}$ chart with variable sample size(VSS) are much quicker than Shewhart $\bar{X}$ chart in detecting shiks in the process. Shewhart $\bar{X}$ chart has been beneficial to detect large shifts but it is hard to apply Shewhart $\bar{X}$ chart in detecting moderate shifts in the process mean. In this article the $\bar{X}$ chart using variable sample size(VSS) and variable sampling Intervals(VSI) has been proposed to supplement the weak point mentioned above. So the purpose of this paper is to consider finding the design parameters which minimize expected loss costs for unit process time and measure the performance of VSSI(variable sample size and sampling interval) $\bar{X}$ chart. It is important that assignable causes be detected to maintain the process controlled. This paper has been studied under the assumption that one cycle is from starting of the process to eliminating the assignable causes in the process. The other purpose of this article is to represent the expected loss costs in one cycle with three process parameters(sample size, sampling interval and control limits) function and find the three parameters.

• Journal of Korean Society for Quality Management
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• v.32 no.4
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• pp.156-168
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• 2004

This research investigates the statistical efficiency of variable sampling size & sampling interval(VSSI) $\bar{X}$ charts under two assignable causes. Algorithms for calculating the average run length(ARL) and average time to signal(ATS) of the VSSI $\bar{X}$ chart are proposed by employing Markov chain method. States of the process are defined according to the process characteristics after the occurrence of an assignable cause. Transition probabilities are carefully derived from the state definition. Statistical properties of the proposed chart are also investigated. A simple procedure for designing the proposed chart is presented based on the properties. Extensive sensitivity analyses show that the VSSI $\bar{X}$ chart is superior to the VSS or VSI $\bar{X}$ chart as well as to the Shewhart $\bar{X}$ chart in statistical sense, even tinder two assignable causes.

• Journal of Korean Institute of Industrial Engineers
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• v.39 no.5
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• pp.422-428
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• 2013

In many cases, an $\bar{X}$ control chart which is based on the performance variable is used in industrial fields. However, if the performance variable is too costly or impossible to measure and a less expensive surrogate variable is available, the process may be more efficiently controlled using surrogate variables. In this paper, we propose a model for the economic design of a VSI (Variable Sampling Interval) $\bar{X}$ control chart using a surrogate variable that is linearly correlated with the performance variable. The total average profit model is constructed, which involves the profit per cycle time, the cost of sampling and testing, the cost of detecting and eliminating an assignable cause, and the cost associated with production during out-of-control state. The VSI $\bar{X}$ control charts using surrogate variables are expected to be superior to the Shewhart FSI (Fixed Sampling Interval) $\bar{X}$ control charts using surrogate variables with respect to the expected profit per unit cycle time from economic viewpoint.