• Journal of the Korean Ceramic Society
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• v.34 no.2
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• pp.209-215
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• 1997

Aluminum nitride(AIN) thin films were deposited by reactive single ion beam sputtering using N2 or NH3 as reactive gas. The structural, compositional and optical properties of AIN thin films were characterized by XRD, GAXRD, TEM, SEM, XPS UV/VIS spectrophotometer, and FT-IR. All the deposited AIN thin films were amorphous by the analysis fo XRD and GAXRD. However, TEM analysis showed that AIN nano-crystallites were uniformly distributed in the films. The presence of Al-N bonds were also confirmed by FT-IR and XPS analyses. The optical bandgap of AIN films increased up to 6.2 eV and the transmittance was a-bout 100% in visible range with approaching the stoichimetric composition. Irrespective of using N2 or NH3 as reactive gas, the deposited AIN thin films had very smooth surface morphologies. Their refractive index ranged from 1.6 to 1.7.

• Analytical Science and Technology
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• v.6 no.1
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• pp.121-129
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• 1993

UV/VIS spectrophotometer interfaced with HPIC(High Performance Ion Chromatography) has been applied to the determination of lanthanide elements. The separation of lanthanide elements with HPIC helped to avoid erroneous analytical results due to interferences. Individual lanthanide elements at ppm level were separated on a HPIC CS5 column using pyromellitic acid and oxalic acid. The individual lanthanide elements were detected at 520nm following post-column reaction with PAR. Sm, Eu, Gd, Y, Tb, Dy, Ho, Er, Tm, Tb, and Lu were separated by pyromellitic acid. La, Ce, Pr and Nd were separated by oxalic acid. Appropriate pH of pyromellitic acid for separation was at pH 2.99.