• Title/Summary/Keyword: Trap level

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Determination of Memory Trap Distribution in Charge Trap Type SONOSFET NVSM Cells Using Single Junction Charge Pumping Method (Single Junction Charge Pumping 방법을 이용한 전하 트랩 형 SONOSFET NVSM 셀의 기억 트랩 분포 결정)

  • 양전우;흥순혁;박희정;김선주;서광열
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.11a
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    • pp.453-456
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    • 1999
  • The Si-SiO$_2$interface trap and nitride bulk trap distribution of SONOSFET(polysilicon-oxide-nitride-oxide-semiconductor)NVSM(nonvolatile semiconductor memory) cell were investigated by single charge pumping method. The used device was fabricated by 0.35 7m standard logic fabrication including the ONO cell process. This ONO dielectric thickness is tunnel oxide 24 $\AA$, nitride 74 $\AA$, blocking oxide 25 $\AA$, respectively. Keeping the pulse base level in accumulation and pulsing the surface into inversion with increasing amplitudes, the charge pumping current flow from the single junction. Using the obtained I$_{cp}$-V$_{h}$ curve, the local V$_{t}$ distribution, doping concentration, lateral interface trap distribution and lateral memory trap distribution were extracted. The maximum N$_{it}$($\chi$) of 1.62$\times$10$^{19}$ /cm$^2$were determined.mined.d.

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The effect of deep level defects in SiC on the electrical characteristics of Schottky barrier diode structures (깊은 준위 결함에 의한 SiC SBD 전기적 특성에 대한 영향 분석)

  • Lee, Geon-Hee;Byun, Dong-Wook;Shin, Myeong-Cheol;Koo, Sang-Mo
    • Journal of IKEEE
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    • v.26 no.1
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    • pp.50-55
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    • 2022
  • SiC is a power semiconductor with a wide bandgap, high insulation failure strength, and thermal conductivity, but many deep-level defects. Defects that appear in SiC can be divided into two categories, defects that appear in physical properties and interface traps that appear at interfaces. In this paper, Z1/2 trap concentration 0 ~ 9×1014 cm-3 reported at room temperature (300 K) is applied to SiC substrates and epi layer to investigate turn-on characteristics. As the trap concentration increased, the current density, Shockley-read-Hall (SRH), and Auger recombination decreased, and Ron increased by about 550% from 0.004 to 0.022 mohm.

Entering behavior and fishing efficiency of common octopus, Octopus minor to cylindric trap (통발에 대한 낙지의 입망 행동과 어획성능)

  • Park, Seong-Wook;Kim, Hyun-Young;Cho, Sam-Kwang
    • Journal of the Korean Society of Fisheries and Ocean Technology
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    • v.42 no.1
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    • pp.11-18
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    • 2006
  • The behavior patterns of common octopus, Octopus minor to a cylindric trap were examined in the water tank using a video camera in order to know entering mechanism to the trap and to improve it. Fishing efficiency by 2 kinds of traps(A: 3 entrances, B: 2 entrances) was investigated in the coastal area of Deugryang Bay from May to July, 2005. Common octopus tends to approach by swimming more than walking towards trap. When they approached to the trap, they showed much more behaviors that sate at the around than upper part of it. Approaching behaviors of common octopus was more vigorous at nighttime than daytime on the trap, they showed the most vigorous action between 2 am and 4 am of the day. The rate of staying 30 seconds over around the trap was 41.5% in the nighttime. CPUE(g/trap) of common octopus caught by A type trap was 21.4% higher than the B type trap but there was no difference on the significance level of 5% by the ANOVA. Catch rate of common octopus and by-catch species caught by the A type trap were 97.2%, three and 98.7%, two for B type trap, respectively.

Review of Population Policy in Korea (우리나라 인구정책방향의 재음미)

  • 이규식;김택일
    • Korea journal of population studies
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    • v.11 no.1
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    • pp.32-49
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    • 1988
  • The social conditions in Koreas until 1950s were similar to the model phenomena of low level eqilibrium trap which was named by Prof. Nelson, with the continuation of high population growth rate and low economic growth rate. To escape from the trap, Korean government adopted two different policies, one is economic development plans and the other is family planning programs. Theses policies were successful in both increasing the national products and decreasing the population growth rate. In 1985 per capita GNP increased to over two thousand dollars, fertility rate reduced to replacement level(2.1) and unemployment rate was stabilized at 4 percent level. From various prospects, we were successfully escaped from the Malthusian trap and many economists, who studied developed countries, belive that population growth has positive effects on technological progress, economies of scale, specialization, individual attitude on work, and economic growth. Therefore we need to reexamine the anti-natalistic population policy of Korea in this situation.

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Grain Boundary Trap Levels in ZnO-based Varistor (ZnO계 바리스터의 입계포획준위)

  • Kim, Myung-Chul;Park, Soon-Ja
    • Korean Journal of Materials Research
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    • v.2 no.1
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    • pp.12-18
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    • 1992
  • The trap levels of ZnO-based varistor are obtained by Isothermal Capacitance Transient Spectroscopy method. Here ICTS measuring system consists of YHP 4192A Impedance Analyzer and a personal computer for the data acquisition. Between $-40^{\circ}C$ and $60^{\circ}C$, the grain boundary trap levels of 0.48 and 0.94eV were detected for $ZnO-Bi_2O_3-MnO$ system. The hole omission spectra are observed in the case of the addition of CoO into the $ZnO-Bi_2O_3$ system, while the electron emission spectra are detected in the case of the addition of MnO. The nonlinear resistance coefficient $\alpha$ increases with the decrease of the dormer concentration. Finally, the trap level density of $ZnO-Bi_2O_3-MnO$ system is found to decrease with the amount of CoO, while $\alpha$ is found to increase with the amount of CoO.

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A Study on the Thermally Stimulated Current in CdS Single Crystal (CdS단결정의 열랄격전류에 관한 연구)

  • 유용택
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.7 no.2
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    • pp.59-65
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    • 1982
  • In this paper, the CdS single crystal, which was grown as piper-polish method, was Ion-bombarded with Sb and In, and the thermally stimulated current of the spot that was Ionbombarded was measured. In the sample which was individually bombarded by Sb and In, the over-lapping peak was found, this over lapping peak was separated, by the method of thermal cleaning, showing the trap levels of 0.25(eV) and 0.31(eV) at the temperature of 147(K) and 181(K). While the spot is being cooled down and excited with photolight at the same time, the trap level 0.25(eV) disappeared and the new trap level of 0.85(eV) appeared. It can be said that the better photo-conductive crystals, the T.S.C is better measured.

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LC Trap Filter Design of Single Phase NPC Multi-Level PWM Inverters for Harmonic Reduction (고조파 저감을 위한 단상 NPC 멀티레벨 PWM 인버터의 LC트랩 필터 설계)

  • Kim, Yoon-Ho;Lee, Jae-Hak;Kim, Soo-Hong
    • The Transactions of the Korean Institute of Power Electronics
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    • v.11 no.4
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    • pp.313-320
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    • 2006
  • In this paper, a design approach of LC trap filter for output side harmonic reduction of single phase NPC multilevel inverter is proposed, and THD of the output voltage and harmonic FFT of the output current are analyzed. The proposed filter consists of a conventional LCR filter cascaded with an LC trap filter and it is tuned to inverter switching frequency. A NPC multilevel inverter inverter is used an inverter system for high power application and DSP(TMS320C31) is used for the controller. The effectiveness of the proposed system confirmed through simulation and experimental results.

A Study on Behavior of Deep Levels for AlGaAs Epi-layers using DLTS (DLTS를 이용한 AlGaAs 에피층의 깊은준위 거동에 관한 연구)

  • Choi, Young-Chul;Park, Young-Ju;Kim, Tae-Geun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07a
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    • pp.150-153
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    • 2004
  • 본 논문에서는 780 nm 고출력 레이저 다이오드의 신뢰성을 향상시키기 위하여 DLTS(deep level transient spectroscopy)을 이용하여 MOCVD(metalorganic chemical vapor deposition) 성장 조건 변화에 따른 $Al_{0.48}Ga_{0.52}As$$Al_{0.1}Ga_{0.9}As$ 물질에서의 깊은준위(deep level)의 거동을 조사하였다. DLTS 측정결과, MOCVD로 성장된 막에서만 나타나는 결함(defect)으로 추정되는 trap A(0.3 eV), DX center로 알려진 trap B, 갈륨(Ga) vacancy와 산소(O2) 원자의 복합체(complex)에 의한 결함인 trap D(0.6 eV) 및 EL2 라고 불리우는 trap E(0.9 eV)의 네 가지 깊은준위들이 관측되었고, 성장 조건의 변화에 따라 깊은 준위들의 농도가 감소하는 것을 관측함으로써 최적 성장 조건을 찾을 수 있었다.

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