• Title/Summary/Keyword: Time to breakdown

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Prediction of Life-Time on the Macroscopic Interface between Solid Materials with Analysis of V-t Characteristics (V-t 특성 분석에 의한 고체 거시계면의 수명 평가)

  • 오재한;이경섭;배덕권;김충혁;이준웅
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.13 no.7
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    • pp.607-611
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    • 2000
  • The characteristics on the interface between Epoxy and EPDM which are materials of the underground insulation systems of power delivery have studied. The breakdown strength of specimens are observed by applying high AC voltage at the room temperature. The breakdown times under the constant voltage below the breakdown voltage were gained. As constant voltage is applied the breakdown time is proportion to the breakdown strength. The life exponent n is gained by inverse power law and the long breakdown life time can be evaluated. AC breakdown strength and life time is improved by oiling to the interface. When the low viscosity oil is spread interface has the highest life time.

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V-t Characteristics in $SF_6-N_2$ Mixtures for Transient Impulse Voltages ($SF_6-N_2$ 혼합가스에서 과도임펄스전압에 대한 V-t특성)

  • Lee, Bok-Hui;Lee, Gyeong-Ok
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.50 no.9
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    • pp.456-465
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    • 2001
  • In this paper, breakdown voltages in $SF_6-N_2$ mixtures were experimentally investigated to understand characteristics of dielectric strength and physical phenomena in nonuniform field disturbed by a needle shape protrusion. The test voltages are the lightning impulse$(\pm1.2/44 \mus)$ and the damped oscillatory impulse$(\pm400 ns / 0.83 MHz)$ voltages which can be occurred by the operation of disconnecting switches in gas-insulated switchgears(GIS). The effects of the polarity and wave shape of the test voltages, and the gas pressure on the V-t characteristics were in detail examined. The V-t characteristic curves were measured in different two ways : (1) one is the method by taking the maximum voltage recorded at or prior to breakdown against the time to breakdown, that is, the Procedures recommended in IEC 60060-1, (2) the other is the method by taking the voltage at the instant of chopping against the time to breakdown. As a result, the V-t characteristics of $SF_6-N_2$ mixtures in nonuniform electric field were significantly affected by the polarity and wave shape of the applied voltages. The positive breakdown voltages resulted in lower breakdown voltages in the time ranges considered, and the V-t curves for the negative oscillatory impulse voltage were extended over the longer time range. For the lightning impulse voltages, the V-t curves obtained by IEC Pub. 60060-1 were nearly same with the V-t curves obtained by the voltage at the instant of chopping against the time to breakdown. It is clear that the actual breakdown voltages were much lower than the maximum voltages appearing at or prior to breakdown because of the displacement current produced as a result of the dV/dt during the oscillatory transient voltage app1ication. The scattering of the negative actual breakdown voltages was much larger than that of the positive.

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An Estimation of Breakdown Time of the Epoxy Composites according to Filler and Silane Treatment (충진제와 실란처리에 따른 에폭시 복합체의 파괴시간 예측)

  • Shin, Cheol-Gi
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.20 no.9
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    • pp.793-797
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    • 2007
  • In this paper, the long time breakdown characteristic of the epoxy composite, which is widely used in the insulation system for high voltage application, was estimated with Weibull distribution. In the procedure of the estimation, the short time breakdown characteristics for the epoxy composite specimens, which were made with the variation of hardener and/or filler, were tested firstly. Then the long time voltage-to-time test was implemented. Finally, the long time breakdown voltage of each specimen was estimated with the parameters obtained from the statistical treatment with Weibull distribution. Base on the results, it has been found that the optimal weight ratio of epoxy resin/hardener/filler that has the excellent long time breakdown characteristic was 100/100/65. It was due to the silane treatment which relieves the electric field at the interface between filler and epoxy.

The Estimation of the Dielectric Strength Decrease of the Solid-solid Interfaces by using the Applied Voltage to Breakdown Time Characteristics

  • Shin, Cheol-Gi;Bae, Duck-Kweon
    • Transactions on Electrical and Electronic Materials
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    • v.8 no.6
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    • pp.278-282
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    • 2007
  • In the complex insulation system that is used in extra high voltage(EHV) devices, according to the trend for electric power equipment of high capacity and reduction of its size, macro interfaces between two different bulk materials which affect the stability of insulation system exist inevitably. In this paper, the dielectric strength decrease of the macro interfaces between epoxy and ethylene propylene diene terpolymer(EPDM) was estimated by using the applied voltage to breakdown time characteristics. Firstly, the AC short time dielectric strength of specimens was measured at room temperature. Then, the breakdown time was measured under the applied constant voltage which is 70% of short time breakdown voltage. With these processes, the life exponent n was determined by inverse power law, and the long time breakdown voltage can be evaluated. The best condition of the interface was LOS(low viscosity(350 cSt) silicone oil spread specimen). When 30 years last on the specimens, the breakdown voltage was estimated 44% of the short time breakdown voltage.

Statistical Analysis of Electrical Tree Inception Voltage, Breakdown Voltage and Tree Breakdown Time Data of Unsaturated Polyester Resin

  • Ahmad, Mohd Hafizi;Bashir, Nouruddeen;Ahmad, Hussein;Piah, Mohamed Afendi Mohamed;Abdul-Malek, Zulkurnain;Yusof, Fadhilah
    • Journal of Electrical Engineering and Technology
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    • v.8 no.4
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    • pp.840-849
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    • 2013
  • This paper presents a statistical approach to analyze electrical tree inception voltage, electrical tree breakdown voltage and tree breakdown time of unsaturated polyester resin subjected to AC voltage. The aim of this work was to show that Weibull and lognormal distribution may not be the most suitable distributions for analysis of electrical treeing data. In this paper, an investigation of statistical distributions of electrical tree inception voltage, electrical tree breakdown voltage and breakdown time data was performed on 108 leaf-like specimen samples. Revelations from the test results showed that Johnson SB distribution is the best fit for electrical tree inception voltage and tree breakdown time data while electrical tree breakdown voltage data is best suited with Wakeby distribution. The fitting step was performed by means of Anderson-Darling (AD) Goodness-of-fit test (GOF). Based on the fitting results of tree inception voltage, tree breakdown time and tree breakdown voltage data, Johnson SB and Wakeby exhibit the lowest error value respectively compared to Weibull and lognormal.

Study on the Prediction of the Life-time in the Macroscopic Solid-Solid Interfaces (고체-고체 거시계면의 수명예측에 관한 연구)

  • 박정규;배덕권;정동회;오재한;김충혁;이준웅
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.07a
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    • pp.775-778
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    • 2000
  • In this paper, the life-time of macro interface between Epoxy/EPDM which consists in underground power cable joints is predicted. The electrode system of specimen is designed by FEM(finite elements method). The breakdown strength of specimens are observed by applying high AC voltage at the room temperature. The breakdown times under the constant voltage below the breakdown voltage were gained. As constant voltage is applied, the breakdown time is proportion to the breakdown strength. The life exponent n is gained by inverse power law, and the long breakdown life time can be evaluated.

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A study on the v-t characteristics of interfaces between Toughened Epoxy and Rubber with Inverse Power Law (역승법칙을 이용한 터픈드 Epoxy/Rubber 계면의 V-t 특성에 관한 연구)

  • 박정규;이동규;오현석;신철기;박건호;박우현;이기식;이준웅
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.11a
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    • pp.437-440
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    • 2000
  • In this study, the interfacial dielectric breakdown phenomenon of interface between Epoxy and Rubber was discussed, which affects the stability of insulation system of power delivery devices. The breakdown strength of specimens are observed by applying high AC voltage at the room temperature. The breakdown times under the constant voltage below the breakdown voltage were gained. As constant voltage is applied, the breakdown time is proportion to the breakdown strength. The life exponent n is gained by inverse power law and the long time breakdown life time can be evaluated.

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Effect on Metal Guard Ring in Breakdown Characteristics of SiC Schottky Barrier Diode (금속 가드 링이 SiC 쇼트키 다이오드의 항복전압에 미치는 영향)

  • Kim, Seong-Jin
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.10
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    • pp.877-882
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    • 2005
  • In order to fabricate a high breakdown SiC-SBD (Schottky barrier diode), we investigate an effect on metal guard ring (MGR) in breakdown characteristics of the SiC-SBD. The breakdown characteristics of MGR-type SiC-SBD is significantly dependent on both the guard ring metal and the alloying time of guard ring metal. The breakdown characteristics of MGR-type SiC-SBDs are essentially improved as the alloying time of guard ring metal is increased. The SiC-SBD without MGR shows less than 200 V breakdown voltage, while the SiC-SBD with Al MGR shows approximately 700 V breakdown voltage. The improvement in breakdown characteristics is attributed to the field edge termination effect by the MGR, which is similar to an implanted guard ring-type SiC-SBD. There are two breakdown origins in the MGR-type SiC-SBD. One is due to a crystal defects, such as micropipes and stacking faults, in the Epi-layers and the SiC substrate, and occurs at a lower electric field. The other is due to the destruction of guard ring metal, which occurs at a higher electric field. The demolition of guard ring metal is due to the electric field concentration at an edge of Schottky contact metal.

Effect of Amino Silane Coupling Agent on the AC Electrical Breakdown Phenomena of Epoxy/Layered Silicate Nanocomposite in Needle-plate Electrodes

  • Park, Jae-Jun
    • Transactions on Electrical and Electronic Materials
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    • v.13 no.3
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    • pp.149-152
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    • 2012
  • The effects of amino silane coupling agent on the AC electrical treeing and breakdown behaviors in an epoxy/layered silicate (1 wt%) were examined in needle-plate electrode geometry. A layered silicate was exfoliated in an epoxy base resin by using our AC electric field apparatus. To measure the tree initiation and propagation and the breakdown rate, an alternating current (AC) of 10 kV (60 Hz) was applied to the specimen in needle-plate electrode arrangement with a $30^{\circ}C$ insulating oil bath. In the epoxy/amino silane system, the tree initiation time was 11.5 times higher and the breakdown time was 17.9 times higher than those of the neat epoxy resin. The tree initiation time in the epoxy/layered silicate (1 wt%) system with the amino silane was 2.0 times higher, and the breakdown time was 1.5 times higher than those of the epoxy/layered silicate (1 wt%) system.

TDDB Analysis and Electrical Characteristics of Thin Insulator Films (얇은 절연막의 TDDB 분석과 전기적 특성)

  • Park, Chanwon;Kim, Bokheon
    • Journal of Industrial Technology
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    • v.8
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    • pp.23-30
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    • 1988
  • In this paper, the characteristics of electrical breakdown and TDDR (Time Dependant Dielectric Breakdown) were studied to evaluate stability and reliability of thin insulator films such as oxide and nitride. As the oxide film thickness decreased, the electrical breakdown field was increased proportioning to its reverse square root, ${d^{-\frac{1}{2}}}$. As for the temperature dependance of breakdown field, its field was inclined to decrease as temperature increased. It also showed that oxide charge (Qss) was changed by stress field and stress time. Consequently, TDDB characteristics and breakdown mechanism proved the improvement of reliability and stability and provided the accurate analysis to predict a device life time.

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