• Title/Summary/Keyword: TiC-Mo

Search Result 214, Processing Time 0.027 seconds

Formation of Nickel Silicide from Atomic Layer Deposited Ni film with Ti Capping layer

  • Yun, Sang-Won;Lee, U-Yeong;Yang, Chung-Mo;Na, Gyeong-Il;Jo, Hyeon-Ik;Ha, Jong-Bong;Seo, Hwa-Il;Lee, Jeong-Hui
    • Proceedings of the Korean Society Of Semiconductor Equipment Technology
    • /
    • 2007.06a
    • /
    • pp.193-198
    • /
    • 2007
  • The NiSi is very promising candidate for the metallization in 60nm CMOS process such as FUSI(fully silicided) gate and source/drain contact because it exhibits non-size dependent resistance, low silicon consumption and mid-gap workfunction. Ni film was first deposited by using ALD (atomic layer deposition) technique with Bis-Ni precursor and $H_2$ reactant gas at $220^{\circ}C$ with deposition rate of $1.25{\AA}/cycle$. The as-deposited Ni film exhibited a sheet resistance of $5{\Omega}/{\square}$. RTP (repaid thermal process) was then performed by varying temperature from $400^{\circ}C$ to $900^{\circ}C$ in $N_2$ ambient for the formation of NiSi. The process window temperature for the formation of low-resistance NiSi was estimated from $600^{\circ}C$ to $800^{\circ}C$ and from $700^{\circ}C$ to $800^{\circ}C$ with and without Ti capping layer. The respective sheet resistance of the films was changed to $2.5{\Omega}/{\square}$ and $3{\Omega}/{\square}$ after silicidation. This is because Ti capping layer increases reaction between Ni and Si and suppresses the oxidation and impurity incorporation into Ni film during silicidation process. The NiSi films were treated by additional thermal stress in a resistively heated furnace for test of thermal stability, showing that the film heat-treated at $800^{\circ}C$ was more stable than that at $700^{\circ}C$ due to better crystallinity.

  • PDF

Sedimentary Environments and Heavy Metallic Pollution at Shihwa Lake (시화호의 퇴적환경과 중금속오염)

  • Hyun, Sang-Min;Chun, Jong-Hwa;Yi, Hi-Il
    • The Sea:JOURNAL OF THE KOREAN SOCIETY OF OCEANOGRAPHY
    • /
    • v.4 no.3
    • /
    • pp.198-207
    • /
    • 1999
  • Five core sediments acquired from the Lake Shihwa are analyzed for variations of sedimentary environment and heavy metal pollution after the Shihwa seawall construction. The depositional environment of the study area is divided into anoxic, oxic and mixed suboxic conditions based on the C/N ratio and C/S ratios of organic matters. Controlling factors for redox condition are the water depth and the difference in industrial effluents supply. Correlations among geochemical elements (Mn, U, Mo) show a distinctive difference and thus can be used as an indicator of redox condition. The content of Al, Ti are dependent on the sediment characteristics, and the contents of heavy metals (Cr, Ni, Cu, Zn, and Pb) indicate heavy metal pollution. The concentrations of heavy metals are higher near Shiswa-Banwol industrial complexies than the central part of Lake Shihwa. Especially, the accumulation of the heavy metal at the surface sediments near Shihwa-Banwol industrial complex are two to eight times higher than in the center of Lake Shihwa.

  • PDF

Crystallographic Characterization of the (Bi, La)4Ti3O12 Film by High-Resolution Electron Microscopy (고분해능 전자현미경법을 이용한 (Bi, La)4Ti3O12 박막의 결정학적 특성 평가)

  • Lee, Doek-Won;Yang, Jun-Mo;Park, Tae-Su;Kim, Nam-Kyung;Yeom, Seung-Jin;Park, Ju-Chul;Lee, Soun-Young;Park, Sung-Wook
    • Korean Journal of Materials Research
    • /
    • v.13 no.7
    • /
    • pp.478-483
    • /
    • 2003
  • The crystallographic characteristics of the $(Bi, La)_4$$Ti_3$$O_{12}$ thin film, which is considered as an applicable dielectrics in the ferroelectric RAM device due to a low crystallization temperature and a good fatigue property, were investigated at the atomic scale by high resolution transmission electron microscopy and the high resolution Z-contrast technique. The analysis showed that a (00c) preferred orientation and a crystallization of the film were enhanced with the diffraction intensity increase of the (006) and (008) plane as the annealing temperature increased. It indicated a change of the atomic arrangement in the (00c) plane. Stacking faults on the (00c) plane were also observed. Through the comparison of the high-resolution Z-contrast image and the $Bi_4$$Ti_3$$O_{12}$ atomic model, it was evaluated that the intensity of the Bi atom was different according to the atomic plane, and it was attributed to a substitution of La atom for Bi at the specific atom position.

Effects of Different Precursors on the Surface Mn Species Over $MnO_x/TiO_2$ for Low-temperature SCR of NOx with $NH_3$

  • Kim, Jang-Hoon;Yoon, Sang-Hyun;Lee, Hee-Soo
    • Proceedings of the Materials Research Society of Korea Conference
    • /
    • 2011.10a
    • /
    • pp.29.1-29.1
    • /
    • 2011
  • The selective catalytic reduction (SCR) of $MnO_x$ with $NH_3$ is an effective method for the removal of $MnO_x$ from stationary system. The typical catalyst for this method is $V_2O_5-WO_3(MoO_3)/TiO_2$, caused by the high activity and stability. However, This catalyst is active within $300{\sim}400^{\circ}C$ and occurs the pore plugging from the deposition of ammonium sulfate salts on the catalysts surface. It needs to locate the SCR unit after the desulfurizer and electrostatic precipitator without reheating of the flue gas as well as deposition of dust on the catalyst. The manganese oxides supported on titania catalysts have attracted interest because of its high SCR activity at low temperature. The catalytic activity of $MnO_x/TiO_2$ SCR catalyst with different manganese precursors have investigated for low-temperature SCR in terms of structural, morphological, and physico-chemical analyses. The $MnO_x/TiO_2$ were prepared from three different precursors such as manganese nitrate, manganese acetate (II), and manganese acetate (III) by the sol-gel method and then it calcinated at $500^{\circ}C$ for 2 hr. The structural analysis was carried out to identify the phase transition and the change intensity of catalytic activity by various manganese precursors was analyzed by FT-IR and Raman spectroscopy. These different precursors also led to various surface Mn concentrations indicated by SEM. The Mn acetate (III) tends to be more suppressive the crystalline phase (rutile), and it has not only smaller particle size, but also better distributed than the others. It was confirmed that the catalytic activity of MA (III)-$MnO_x/TiO_2$ was the highest among them.

  • PDF

Atomic Layer Deposition of Silicon Oxide Thin Film on $TiO_2$ nanopowders (원자층증착법에 의한 $TiO_2$ 나노파우더 표면의 실리콘 산화물 박막 증착)

  • Kim, Hee-Gyu;Kim, Hyung-Jong;Kang, In-Gu;Kim, Doe-Hyoung;Choi, Byung-Ho;Jung, Sang-Jin;Kim, Min-Wan
    • 한국신재생에너지학회:학술대회논문집
    • /
    • 2009.11a
    • /
    • pp.381-381
    • /
    • 2009
  • 염료감응형 태양전지의 효율 향상을 위한 다양한 방법들 중 $TiO_2$ 나노 파우더의 표면 개질 및 페이스트의 분산성 향상을 위한 연구가 활발하게 진행되고 있다. 기존 나노 파우더의 표면 개질법으로는 액상 공정인 졸겔법이 있으나 표면 처리 공정에서의 응집현상은 아직 해결해야 할 과제 중 하나이다. 이에 본 연구에서는 진공증착방법인 ALD법을 이용하여 염료감응형 태양전지용 $TiO_2$ 나노 파우더의 $SiO_2$ 산화물 표면처리를 통한 분산특성을 파악하였다. 기존 ALD법의 경우 reactor의 온도가 $300{\sim}500^{\circ}C$ 정도의 고온에서 공정이 이루어졌지만 본 실험에서는 2차 아민계촉매(pyridine)을 사용하여 reactor의 온도를 $30^{\circ}C$정도의 저온공정에서 $SiO_2$ 산화물을 코팅을 하였다. MO source로는 액체상태의 TEOS$(Si(OC_2H_5)_4)$를, 반응가스로는 $H_2O$를 사용하였고, 불활성 기체인 Ar 가스는 purge 가스로 각각 사용 하였다. ALD 공정에 의해 표면처리 된 $TiO_2$ 나노 파우더의 분산특성은 각 공정 cycle에 따라 FESEM을 통하여 입자의 형상 및 분산성을 확인하였으며 입도 분석기를 통하여 부피의 변화 및 분산 특성을 확인하였다. 공정 cycle 이 증가함에 따라 입자간의 응집현상이 개선되는 것을 확인 할 수 있었으며, 100cycles에서 응집현상이 가장 많이 감소하는 것을 확인할 수 있었다. 또한 표면 처리된 $SiO_2$ 산화막은 XRD를 통한 결정 분석 및 EDX를 통한 정성 분석을 통하여 확인하였다.

  • PDF

Si and Mg Coatings on the Hydroxyapatite Film Formed Ti-29Nb-xHf Alloys by Plasma Electrolyte Oxidation

  • Park, Seon-Yeong;Choe, Han-Cheol
    • Proceedings of the Korean Institute of Surface Engineering Conference
    • /
    • 2017.05a
    • /
    • pp.152-152
    • /
    • 2017
  • Titanium and its alloys have been widely used for biomedical applications. However, the use of the Ti-6Al-4V alloy in biomaterial is then a subject of controversy because aluminum ions and vanadium oxide have potential detrimental influence on the human body due to vanadium and aluminum. Hence, recent works showed that the synthesis of new Ti-based alloys for implant application involves more biocompatible metallic alloying element,such as, Nb, Hf, Zr and Mo. In particular, Nb and Hf are one of the most effective Ti ${\beta}$-stabilizer and reducing the elastic modulus. Plasma electrolyte oxidation (PEO) is known as excellent method in the biocompatibility of biomaterial due to quickly coating time and controlled coating condition. The anodized oxide layer and diameter modulation of Ti alloys can be obtained function of improvement of cell adhesion. Silicon (Si) and magnesium (Mg) has a beneficial effect on bone. Si in particular has been found to be essential for normal bone and cartilage growth and development. In vitro studies have shown that Mg plays very important roles in essential for normal growth and metabolism of skeletal tissue in vertebrates and can be detected as minor constituents in teeth and bone. Therefore, in this study, Si and Mg coatings on the hydroxyapatite film formed Ti-29Nb-xHf alloys by plasma electrolyte oxidation has been investigated using several experimental techniques. Ti-29Nb-xHf (x= 0, 3, 7 and 15wt%, mass fraction) alloys were prepared Ti-29Nb-xHf alloys of containing Hf up from 0 wt% to 15 wt% were melted by using a vacuum furnace. Ti-29Nb-xHf alloys were homogenized for 2 hr at $1050^{\circ}C$. The electrolyte was Si and Mg ions containing calcium acetate monohydrate + calcium glycerophosphate at room temperature. The microstructure, phase and composition of Si and Mg coated oxide surface of Ti-29Nb-xHf alloys were examined by FE-SEM, EDS, and XRD.

  • PDF

Fabrication of YB $a_2$C $u_3$ $O_{7-x}$ film on a (100) SrTi $O_3$ single crystal substrate by single liquid source MOCVD method ((100) SrTi $O_3$ 단결정 기판위에 단일 액상 원료 MOCVD 법에 의한 YB $a_2$C $u_3$ $O_{7-x}$ 박막 제조)

  • Jun Byung-Hyuk;Choi Jun-Kyu;Kim Ho-Jin;Kim Chan-Joong
    • Progress in Superconductivity and Cryogenics
    • /
    • v.6 no.3
    • /
    • pp.16-20
    • /
    • 2004
  • YB $a_2$C $u_3$$O_{7-x}$ (YBCO) films were deposited on (100) SrTi $O_3$ single crystal substrates by a metal organic chemical vapor deposition (MOCVD) system of hot-wall type using single liquid source. Under the condition of the mole ratio of Y(tmhd)$_3$:Ba(tmhd)$_2$:Cu(tmhd)$_2$= 1:2.1:2.9. the deposition pressure of 10 Torr. the MO source line speed of 15 cm/min. the Ar/ $O_2$ flow rate of 800/800 sccm. YBCO films were prepared at the deposition temperatures of 780∼89$0^{\circ}C$. In case of the YBCO films with 2.2 ${\mu}{\textrm}{m}$ thickness deposited for 6 minutes at 86$0^{\circ}C$. XRD pattern showed complete c-axis growth and SEM morphology showed dense and crack-free surface. The atomic ratios of Ba/Y and Cu/Ba in the film were 1.92 and 1.56. respectively. The deposition rate of the film was as high as 0.37 ${\mu}{\textrm}{m}$/min. The critical temperature ( $T_{c.zero}$) of the film was 87K. The critical current of the film was 104 A/cm-width. and the critical current density was 0.47 MA/$\textrm{cm}^2$. For the thinner film of 1.3 ${\mu}{\textrm}{m}$ thickness. the critical current density of 0.62 MA/$\textrm{cm}^2$ was obtained.d.

Effect of post annealing on the structural and electrical properties of $Ba_{0.5}Sr_{0.5}TiO_3$ films deposited on 4H-SiC (4H-SiC에 증착된 BST 박막의 열처리 효과에 따른 구조적, 전기적 특성)

  • Lee, Jae-Sang;Jo, Yeong-Deuk;Bahng, Wook;Kim, Sang-Cheol;Kim, Nam-Kyun;Koo, Sang-Mo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2008.11a
    • /
    • pp.196-196
    • /
    • 2008
  • We have investigated that the effect of post annealing on the structural and electrical properties of $Ba_{0.5}Sr_{0.5}TiO_3$ thin films. The BST thin films were deposited on n-type 4H-silicon carbide(SiC) using pulsed laser deposition (PLD). The deposition was carried out in oxygen ambient 100mTorr for 5 minutes, which results in about 300nm-thick BST films. For the BST/4H-SiC, 200nm thick silver was deposited on the BST films bye-beam evaporation. The X-ray diffraction patterns of the BST films revealed that the crystalline structure of BST thin films has been improved after post-annealing at $850^{\circ}C$ for 1 hour. The root mean square (RMS) surface roughness of the BST film measured by using a AFM was increased after post-annealing from 5.69nm to 11.49nm. The electrical properties of BST thin film were investigated by measuring the capacitance-voltage characteristics of a silver/BST/4H-SiC structure. After the post-annealing, dielectric constant of the film was increased from 159.67 to 355.33, which can be ascribed to the enhancement of the crystallinity of BST thin films.

  • PDF

Effect of Zr/Ti Concentration in the PLZT(10/y/z) Thin Films From the Aspect of NVFRAM Application (비휘발성 메모리소자로의 응용의 관점에서 PLZT(10/y/z) 박막에서의 Zr/Ti 농도변화 효과)

  • Kim, Seong-Jin;Gang, Seong-Jun;Yun, Yeong-Seop
    • Journal of the Institute of Electronics Engineers of Korea SD
    • /
    • v.38 no.5
    • /
    • pp.313-322
    • /
    • 2001
  • The effects of Zr/Ti concentration ratio in PLZT (10/y/z) thin films prepared by sol-gel method are investigated for the NVFRAM application. Rosette and pyrochlore phase are observed in PLZT (10/40/60) thin film and the (100) orientation, the grain size, and the surface roughness of PLZT thin films increase due to the increase of Ti amount in Zr/Ti concentration ratio. As Ti amount of Zr/Ti concentration ratio increases, the dielectric constants at 10KHz decrease from 600 to 400, while the loss tangents increase from 0.028 to 0.053 and the leakage current densities at 170 kY/cm decrease from 1.64$\times$10$^{-6}$ to 1.26$\times$10$^{-7}$ A/$\textrm{cm}^2$. In the results of hysteresis loops measured at $\pm$ 170 ㎸/cm, the remanent polarization and the coercive field increase from 6.62 to 12.86 $\mu$C/$\textrm{cm}^2$ and from 32.15 to 56.45 ㎸/cm, respectively, according to the change from 40/60 to 0/100 in Zr/Ti concentration ratio. Fatigue and retention properties also improve much as the Zr/Ti concentration ratio change from 40/60 to 0/100. After applying 10$^{9}$ square pulses with $\pm$5V, the remanent polarization of the PLZT (10/40/60) thin film decreases 50% from the initial state while that of the PLZT (10/0/100) thin film decreases 30%. In the results of retention measurements of 10$^{5}$ s, the remanent polarization of the PLZT (10/0/100) thin film decreases only 11% from the initial state, while that of the PLZT (10/40/60) thin film decreases 40%.

  • PDF

Preparation of TiO2-SiO2 Powder by Modified Sol-Gel Method and their Photocatalytic Activities (수식 졸-겔법에 의한 TiO2-SiO2분체합성 및 광촉매활성)

  • Kim, Byung-Kwan;Mizuno, Noritaka;Yasui, Itaru
    • Applied Chemistry for Engineering
    • /
    • v.7 no.6
    • /
    • pp.1034-1042
    • /
    • 1996
  • Various $TiO_2-SiO_2$ composite powders were prepared by the modified sol-gel method using 1-dodecanol as DCCA (Dryng Control Chemical Additive ). Their characterizations were carried out and their photocatalytic catalysis was examined on the evolution reaction of hydrogen. The weight losses at $500^{\circ}C$ of only $TiO_2$ and $SiO_2$ powders were 33. 0wt% and 42.5wt%, respectively, and those of the $TiO_2/SiO_2$ powders ($TiO_2/SiO_2=25/75$, 50/50 and 75/25) were about $70.0{\pm}3.0wt%$. The released substances from the powders were almost organic matters. The as-prepared powders except only $TiO_2$ powder were amorphous. Transformation of anatase to rutil was hindered by $SiO_2$ component and the crystallinity of anatase was decreased with increasing $SiO_2$ contents. The as-prepared powders were bulky states. By heating at $600^{\circ}C$ for 1 hr $TiO_2-SiO_2$ powders ($TiO_2=100%$, $TiO_2/SiO_2=75/25,\;50/50$) showed agglomerates consisted of particles in submicron, but those of $TiO_2/SiO_2=25/75$ and $SiO_2=100%$ were still bulky states. Specific surface area of the powders heat-treated at $600^{\circ}C$ for 1hr was increased with $SiO_2$ concents and their pore sizes were also depended on $SiO_2$ contents. The photocatalytic activity of $TiO_2/SiO_2=75/25$ heat-treated at $600^{\circ}C$ for 1hr was 0.240mo1/h.g-cat as $H_2$ evolution rate. This value was about 2.0 times that of P-25(Degussa P-25) as a standard photocatalyst.

  • PDF