• Journal of Korean Institute of Industrial Engineers
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• v.25 no.4
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• pp.517-526
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• 1999

This paper deals with two economic optimal designs of constant-stress accelerated life test(ALT) where failure distribution follows one of location-scale family, i. e., exponential, Weibull, and lognormal distributions which have been ones of the popular choices of failure distributions. Two optimization criteria to develop ALT plans are the statistical efficiency per unit expected cost which consists of the fixed test cost, cost being proportional to the number of test units, and variable test cost depending on test period and stress level, and the expected loss which combines Taguchi's quadratic loss function and expected test cost. Optimum plan determines the low stress level, test units allocated to each stress, and censoring times at two stress levels under Type I censoring. The proposed ALT plans are illustrated with a numerical example and sensitivity analyses are conducted to study effects of pre-estimates of design parameters.

• Journal of Korean Society for Quality Management
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• v.25 no.3
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• pp.22-38
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• 1997

In a traditional sequential acceptance sampling plan, it is assumed that the sampled items are independent each other. In this paper, stochastically dependent sequential acceptance sampling plans are dealt when there exists dependency between sampled items. Monte-Calro algorithm is used to find the acceptance and rejection probabilities of a lot. The number of defectives for the test to be accepted and rejected in probability ratio sequential test can be found by using these probabilities. The formula for measures of performance of these sampling plans is developed. Type I and II error probabilities are estimated by simulation. This research can be a, pp.ied to sequential sampling procedures in place of control charts where there is a recognized and necessary dependency during the production processes. Also, dependent multiple acceptance sampling plans can be derived by extending this sequential sampling procedure. As a numerical example, a Markov dependent process model is given, and the characteristics of the sampling plans are examined according to the change of the dependency factor.

• Journal of Korean Society for Quality Management
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• v.24 no.4
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• pp.44-58
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• 1996

This paper presents optimal accelerated life test plans with different censoring times for exponential, Weibull, and lognormal lifetime distributions, respectively. For an optimal plan, low stress level, proportion of test units allocated and censoring time at each stress are determined such that the asymptotic variance of the maximum likelihood estimator of a certain quantile at use condition is minimized. The proposed plans are compared with the corresponding optimal plans with a common censoring time over range of parameter values. Computational results indicate that those plans are statistically optimal ones in terms of accuracy of estimator when total censoring times of two plans are equal.

• Journal of Korean Institute of Industrial Engineers
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• v.28 no.4
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• pp.351-359
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• 2002

In this paper, stochastically dependent single and sequential acceptance sampling plans are dealt when the process follows a Polya process model. A Monte-Cairo algorithm is used to find the acceptance and rejection probabilities of a lot. The number of defectives for the test to be accepted and rejected in a probability ratio sequential test can be found by using these probabilities. The formula to measure performance of these sampling plans is developed. Type I and II error probabilities are estimated by simulation. Dependent multiple acceptance sampling plans can be derived by extending the sequential sampling procedure. In numerical examples, single and sequential sampling plans of a Polya dependent process are examined and the characteristics are compared according to the change of the dependency factor.

• Journal of Korean Society for Quality Management
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• v.23 no.1
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• pp.41-49
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• 1995

This paper suggests optimal accelerated constant stress life tests in Exponential distribution. The relationship between the log-mean life and the loaded stress is assumed to be linear. Optimal plans considering mean square errors of maximum likelihood estimators of the log mean life and test costs are obtained. We consider accelerated life tests with two stress levels, and as data types, failure censoring( type II) and time censoring(type I) data are used. We propose the procedure to obtain the optimal plans for each case. Some examples are also included.

• Communications for Statistical Applications and Methods
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• v.12 no.1
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• pp.11-18
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• 2005

Assume that the life times of the units under test follow the Rayleigh distribution and the test is terminated at a pre assigned time. Acceptance sampling plans are developed for this situation. The minimum sample size necessary to ensure the specified average life are obtained and the operating characteristic values of the sampling plans and producer's risk are given. An example is given to illustrate the methodology.

• Communications for Statistical Applications and Methods
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• v.2 no.2
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• pp.13-19
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• 1995

This paper considers model robust accelerated life test plans for estimating the logmean or percentile of product lige which is exponentially distributed. A linear relationship between the log mean life and the stress is assumed as usual, while the true relationship is quadratic. Optimum plans are then obtained by minimizing asymptotic mean squared error of maximum likelihood estimator of the log mean life.

• Journal of Korean Society for Quality Management
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• v.30 no.1
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• pp.74-96
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• 2002

The objectives of this study is to suggest the rectifying sampling inspection plan considering quality cost. Limiting quality level(LQL) plans(also called LTPD plans) and outgoing quality(OQ) plans are considered. The Hald's linear cost model is discussed with and without a beta prior for the distribution of the fraction of nonconforming items in a lot. It is assumed that the sampling inspection is error free. We consider the design of reliability acceptance sampling plan (RASP) for failure rate level qualification at selected confidence level. The lifetime distribution of products is assumed to be exponential. MIL-STD-690C and K C 6032 standards provide this procedures. But these procedures have some questions to apply in the field. The cost of test and confidence level(1-$\beta$ risk) are the problem between supplier and user. So, we suggest that the optimal life test sampling inspection plans using simple linear cost model considering product cost, capability of environment chamber, environmental test cost, and etc. Especially, we consider a reliability of lots that contain some nonconforming items. In this case we assumed that a nonconforming item fail after environmental life test. Finally, we develope the algorithm of the optimal sampling inspection plan based on minimum costs for rectifying inspection and RASP. And computer application programs are developed So, it is shown how the desired sampling plan can be easily found.

• Journal of Korean Institute of Industrial Engineers
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• v.34 no.1
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• pp.23-31
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• 2008

This paper presents accelerated degradation test plans considering adoption of tightened critical values. Under arandom coefficient degradation rate and log-linear acceleration models, the asymptotic variance of an estimatorfor a lifetime quantile at the use condition as the optimization criterion is derived where the degradation ratefollows a lognormal and Reciprocal Weibull distributions, respectively and then the low stress level andproportions ofunits allocated to each stress level are determined. We also show that the developed test plans canbe applied to the multiplicative model with measurement error.

• Journal of Korean Society for Quality Management
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• v.39 no.2
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• pp.313-319
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• 2011

In design verification and process validation stages, reliability demonstration tests(RDT's) are common practice in industry, A new two-stage RDT that is known to be more efficient than a corresponding single-stage one in terms of expected test duration for Weibull distribution is proposed. Zero or one failure two-stage plans to minimize expected test duration under Type I and hybrid censoring subject to satisfying consumer's risk at a specified reliability target are developed and a numerical example is provided to illustrate the proposed two-stage RDT plans and compared with other one- and two-stage plans.