Electron Tunneling Characteristics of PtSi-nSi Junctions according to Temperature Variations (온도변화에 따른 백금 실리사이드-엔 실리콘 접합의 전자 터널링 특성)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 1998.06a
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- pp.87-91
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- 1998