• The Transactions of the Korean Institute of Electrical Engineers D
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• v.53 no.11
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• pp.768-775
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• 2004

The SSA technique in the digital circuit test is required to be repeated the input pattern stream to n bits output nodes n times in case of using a multiplexor. Because the method adopting a parallel/serial bit convertor to remove this inefficiency has disadvantage of requiring the test time n times for a pattern, the test strategy is required, which can enhance the test productivity by reducing the test time based on simplified fault detection mechanism. Accordingly, this paper proposes a test strategy which enhances the test productivity and efficiency by appling PAS (Parallel Signature Analysis) technique to those after analyzing the structure and characteristics of the digital devices including TTL and CMOS family ICs as well as ROM and RAM. The PSA technique identifies the faults by comparing the reminder from good device with reminder from the tested device. At this time, the reminder is obtained by enforcing the data stream obtained from output pins of the tested device on the LFSR(Linear Feedback Shift Resister) representing the characteristic equation. Also, the method to obtain the optimal signature analyzer is explained by furnishing the short bit input streams to the long bit input streams to the LFSR having 8, 12, 16, 20bit input/output pins and by analyzing the occurring probability of error which is impossible to detect. Finally, the effectiveness of the proposed test strategy is verified by simulating the stuck at 1 errors or stuck at 0 errors for several devices on typical 8051 digital board.

• Journal of IKEEE
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• v.5 no.1 s.8
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• pp.111-120
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• 2001

VC merging involves distinguishing cells from an identical merged VC label. Various approaches have been proposed to help this identification process. However, most of them incur additional buffering, protocol overhead and/or variable delay. They make the provision of QoS difficult to achieve. So it was proposed a merge capable scheduler to support VC-merging (VCMS). However, in situations where all VCs are to be merged or the incoming traffic load is very low, it could happen that there are not enough non-merging cells to snoop. In this situation the scheduler uses special control cells to fill the empty time slots out. Too many control cells can cause high cell loss ratio and an additional packet transfer delay. To overcome the drawbacks, we propose a Sequence Skipping(SS) method where the sequencers skip the empty queues and insert SS cells. We show SS method is suitable for VC-merging and can reduce the cell loss ratio and the mean packet transfer delay through simulations.

• Journal of IKEEE
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• v.5 no.1 s.8
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• pp.100-110
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• 2001

In this paper, we investigated several buffer management schemes for the design of shared-memory type ATM switches, which can enhance the utilization of switch resources and can support quality-of-service (QoS) functionalities. Our results show that dynamic threshold (DT) scheme demonstrate a moderate degree of robustness close to pushout(PO) scheme, which is known to be impractical in the perspective of hardware implementation, under various traffic conditions such as traffic loads, burstyness of incoming traffic, and load non-uniformity across output ports. Next, we considered buffer management strategies to support QoS functions, which utilize parameter values obtained via connection admission control (CAC) procedures to set tile threshold values. Through simulations, we showed that the buffer management schemes adopted behave well in the sense that they can protect regulated traffic from unregulated cell traffic in allocating buffer space. In particular, it was observed that dynamic partitioning is superior in terms of QoS support than virtual partitioning.