• Journal of Korean Institute of Industrial Engineers
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• v.39 no.2
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• pp.82-89
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• 2013

Novelty detection (ND) is an effective technique that can be used to determine whether a future observation is normal or not. In the present study we propose a novelty detection algorithm that can handle a situation where the distributions of target (normal) observations are inhomogeneous. A simulation study and a real case with the TFT-LCD process demonstrated the effectiveness and usefulness of the proposed algorithm.

• Proceedings of the Korean Society of Broadcast Engineers Conference
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• 2011.07a
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• pp.14-15
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• 2011

본 논문은 TFT-LCD 디스플레이를 위한 저전력 화질 개선 기법을 제안한다. 제안하는 기법에서는 TFT-LCD 디스플레이의 어두워진 백라이트를 보상하기 위한 기법을 히스토그램 균등화에 기반하여 유도하며, 밝기 보상으로 인하여 손실되는 정보량이 최소가 되게 하는 변환 함수를 구한다. 컴퓨터 모의실험을 통해 제안하는 알고리듬이 전력 소비를 줄이는 동시에 영상의 화질을 개선하는 것을 확인한다.

• Journal of Korea Multimedia Society
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• v.19 no.3
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• pp.626-632
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• 2016

In this paper, we propose the defect emphasis in TFT-LCD panel image. The defect emphasis image consist of S(Shape) map and B(Brightness) map. S map based on DoG(difference of gaussian) is made with the mura defect shape characteristic. And B map use defect intensity property that defect intensity is higher than background. The experiments were conducted to evaluate the performance of the proposed defect emphasis method. The results of experiments show the validity of the defect emphasis using the proposed method.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08b
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• pp.1176-1178
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• 2007

A novel integrated a-Si:H gate driver with high reliability has been designed and simulated. Since the a-Si:H TFT is easily degraded by gate bias stress, we should optimize the circuit considering the threshold voltage shift. The conventional circuit shows voltage drop at the input stage by threshold voltage of the TFT, however, the proposed circuit dose not shows voltage drop and keeps constant regardless of threshold voltage shift of the TFT.

• Proceedings of the KIEE Conference
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• 2006.07d
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• pp.2051-2052
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• 2006

본 연구는 HHP,PDA,PMP,CNS 등등에 사용되는 중소형 A-Si:H TFT LCD 에서의 Automatic Gamma Correction 적용으로 화질 최적화 구현에 좀 더 쉽고 빠르게 접근하게 되었다. Analog Gamma String 대신 1chip Drive IC에 집적된 Gamma resister Ladder를 A-Si:H TFT-LCD Panel 특성에 보다 정확하게 적용시키기 위해 새로운 알고리즘을 개발 했으며 이를 적용시킨 회로를 Test Board로 실제 구현해서 최종결과를 도출하였다. Kick-Rack 전압을 고려한 Asymmetry-Gamma Correction 구현까지 Automatic으로 1chip Drive IC의 Register를 산출 할 수 있도록 알고리즘을 구성했다.

• Proceedings of the Korean Information Science Society Conference
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• 2008.06d
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• pp.264-267
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• 2008

본 논문에서는 TFT-LCD 생산 라인에서의 시스템 통합에 필요한 데이터 프레임 포맷 표준화 방안을 연구하였다. 이를 위해 TFT-LCD 생산 라인을 구축 하는데 있어서 Glass 반송 작업에 필요한 데이터 프레임 구조 및 32개의 Word로 구성된 데이터 필드를 정의하였다. 시스템 통합에 필요한 표준화된 Glass 데이터 프레임 포맷을 사용함에 따라, 각 장비 제조사의 시스템 설계 기간 단축, 비용 절감, 셋업 기간 단축 등의 효과를 기대할 수 있다고 본다.

• Current Optics and Photonics
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• v.2 no.1
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• pp.69-78
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• 2018

This paper presents a precise edge detection algorithm for the critical dimension (CD) measurement of a Thin-Film Transistor Liquid-Crystal Display (TFT-LCD) pattern. The sigmoid surface function is proposed to model the blurred step edge. This model can simultaneously find the position and geometry of the edge precisely. The nonlinear least squares fitting method (Levenberg-Marquardt method) is used to model the image intensity distribution into the proposed sigmoid blurred edge model. The suggested algorithm is verified by comparing the CD measurement repeatability from high-magnified blurry and noisy TFT-LCD images with those from the previous Laplacian of Gaussian (LoG) based sub-pixel edge detection algorithm and error function fitting method. The proposed fitting-based edge detection algorithm produces more precise results than the previous method. The suggested algorithm can be applied to in-line precision CD measurement for high-resolution display devices.

• 한국정보디스플레이학회:학술대회논문집
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• 2001.08a
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• pp.9-12
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• 2001

With the explosive growth of Note-PC and Desktop monitor market, TFT LCD market confronted a entire supply shortage during 1999. Forecasting a more booming stage for the next several years, many TFT-LCD panel manufacturers continue to expand the capacity of their existing plants and also make an additional investment in building new plants. The new investment is concentrated on the $4^{th}$ generation TFT LCD line in order to improve investment efficiency. The set up of the Samsung's Gen 3.5 line progressed with satisfactorily performance using $600{\times}720mm$ glass size. We have continuously reviewed several issues regarding the glass size for our next Gen. 4 line, which leads to adopt $730{\times}920mm$. Due to the continuous enlargement of a substrate size and following difficulty in transferring cassettes, the next line is expected to be the last line that employs "cassette transfer". The layout of the next line will shift from conventional "concentration-type" to "separation-type" configuration for the purpose of reducing transfer distance as well as transfer time. The details will be discussed in this paper.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2003.06a
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• pp.1215-1219
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• 2003

Light Guide Panel(LGP) is a key part of backlight unit(BLU) which transforms line-light of lamp to surface-light. Dot pattern is formed on the injected LGP surface by screen printing. This dot pattern is composed of several ten thousands micro dots of diameter 150-180$\mu\textrm{m}$ or so. The dot patterning by screen printing causes low productivity and low performance of TFT-LCD. This research develops the micromachining technology for LGP mould which could form micro dot pattern by injection molding, removing the existing screen printing process.

• Journal of Korean Society for Quality Management
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• v.34 no.1
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• pp.13-19
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• 2006

Data mining is a useful tool for analyzing data from different perspectives and for summarizing them into useful information. Recently, the data mining methods are applied to solving quality problems of the manufacturing processes. This paper discusses the problems of construction of a quality mining system, which is based on the various data mining methods. The quality mining system includes recipe optimization, significant difference test, finding critical processes, forecasting the yield. The contents and system of this paper are focused on the TFT-LCD manufacturing process. We also provide some illustrative field examples of the quality mining system.