• Title/Summary/Keyword: System-On-a-Chip (SOC)

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An Efficient Test Access Mechanism for System On a Chip Testing (시스템 온 칩 테스트를 위한 효과적인 테스트 접근 구조)

  • Song, Dong-Seop;Bae, Sang-Min;Gang, Seong-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.39 no.5
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    • pp.54-64
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    • 2002
  • Recently System On a Chip(SoC) design based on IP cores has become the trend of If design To prevent the testing problem from becoming the bottleneck of the core-based design, defining of an efficient test architecture and a successful test methodology are mandatory. This paper describes a test architecture and a test control access mechanism for SoC based on IEEE 1149.1 boundary,scan. The proposed SoC test architecture is fully compatible with IEEE P1500 Standard for Embedded Core Test(SECT), and applicable for both TAPed cores and Wrapped cores within a SOC with the same test access mechanism. Controlled by TCK, TMS, TDI, and TDO, the proposed test architecture provides a hierarchical test feature.

SoC Platform기반 Design Methodology

  • Jang, Jun-Yeong;Han, Jin-Ho;Bae, Yeong-Hwan;Jo, Han-Jin
    • IT SoC Magazine
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    • s.2
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    • pp.34-38
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    • 2004
  • 실리콘 처리 기술의 고속화 요구와 유무선 환경에서 동영상 통신이 가능한 비디오 폰, 영상 회의 시스템, 이동 통신용 단말기 등의 전자 제품 사용자의 급증은 시스템을 하나의 칩에 집적화하는 SoC(System-On-a-Chip) 설계 기술을 요구하고 있다. 칩의 복잡도와 SoC 제품의 생산성 차이가 계속적으로 증가함에 따라 현재의 IC 설계 방법으로는 SoC 제품의 성능과 요구의 변화를 만족시킬 수 없다. 칩의 면적을 최소화하고 성능을 최대화하며 게이트 수준의 최적화를 통한 기존의 셀 기반 설계 방법으로는 설계의 생산성 문제를 해결할 수 없다. 이러한 문제를 해결 위한 새로운 설계 방법인 IP 재사용을 기반으로 한 플랫폼 기반 설계가 제시되었다. 플랫폼 기반 설계는 SoC 제품을 빠르게 개발하기 위한 응용 기반 통합 플랫폼과 재사용이 가능한 IP(Intellectual Property) 이용한 플랫폼 기반 설계(Platform-Based Design) 방법이다. 새로운 설계 방법은 90% 이상의 IP 재사용을 통해서 설계 시간을 단축하며, 시스템 수준에서의 최적화를 통해서 제품의 시장 경쟁력(Time-to-Market)의 문제를 해결하기 위한 방법이다.

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Technology Development of Entry-Level MiC Smart Photovoltaic System based on SOC (SoC 기반 보급형 MiC 스마트 태양광발전시스템 기술개발)

  • Yoon, Yongho
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.20 no.3
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    • pp.129-134
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    • 2020
  • Moisture infiltration inside the solar cell module, filling of EVA sheet, melting of the frame seal, and deterioration of power generation performance in the module one year after installation are occurring. Whitening phenomenon, electrode corrosion phenomenon, and dielectric breakdown phenomenon are appearing in solar cell module installed in Korea before 5-7 years, leading to deterioration of power generation performance, and big problems for long-term reliability and long life technology are emerging. Therefore, in order to solve these problems, the development of a micro inverter (MiCrco Inverter Converter, MiC) including the function of securing the durability of the solar cell module and monitoring the aging progress and the solar cell based on the monitoring data from the MiC smart monitoring programs have been proposed to determine the aging of modules. In addition, in order to become a highly efficient solar smart monitoring system through systematic operation management through IT convergence with MiC that has enhanced monitoring function of solar cell module, SoC(System On Chip) in micro inverter is the environment for solar cell module. There is a demand for functions that can detect information in a complex manner and perform communication and control when necessary. Based on these requirements, this paper aims to develop SoC-based low-cost MiC smart photovoltaic system technology.

Education Equipment for FPGA Design of Sensor-based IOT System (센서 기반의 IOT 시스템의 FPGA 설계 교육용 장비)

  • Cho, Byung-woo;Kim, Nam-young;Yu, Yun-seop
    • Journal of Practical Engineering Education
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    • v.8 no.2
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    • pp.111-120
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    • 2016
  • Education equipment for field programmable gate array (FPGA) design of sensor-based IOT (Internet Of Thing) system is introduced. Because sensors have different interfaces, several types of interface controller on FPGA need. Using this equipment, several types of interface controller, which can control ADC (analog-to-digital converter) for analog sensor outputs and $I^2C$ (Inter-Integrated Circuit), SPI (Serial Peripheral Interface Bus), and GPIO (General-Purpose Input/Output) for digital sensor outputs, can be designed on FPGA. Image processing hardware using image sensors and display controller for real and image-processed images or videos can be design on FPGA chip. This equipment can design a SOC (System On Chip) consisting of a hard process core on Linux OS and a FPGA block for IOT system which can communicate with wire and wireless networks. Using the education equipment, an example of hardware design using image sensor and accelerometer is described, and an example of syllabus for "Digital system design using FPGA" course is introduced. Using the education equipment, students can develop the ability to design some hardware, and to train the ability for the creative capstone design through conceptual, partial-level, and detail designs.

Embedded ARM based SoC Implementation for 5.8GHz DSRC Communication Modem (임베디드 ARM 기반의 5.8GHz DSRC 통신모뎀에 대한 SOC 구현)

  • Kwak, Jae-Min;Shin, Dae-Kyo;Lim, Ki-Taek;Choi, Jong-Chan
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.43 no.11 s.353
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    • pp.185-191
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    • 2006
  • DSRC((Dedicated Short Range Communication) is dedicated short range communication for wireless communications between RSE(Road Side Equipment) and OBE(On-Board Unit) within vehicle moving high speed. In this paper, we implemented 5.8GHz DSRC modem according to Korea TTA(Telecommunication Technology Association) standard and investigated implementation results and design process for SoC(System on a Chip) embedding ARM CPU which control overall signal and process arithmetic work. The SoC is implemented by 0.11um design technology and 480pins EPBGA package. In the implemented SoC ($Jaguar^{TM}$), 5.8GHz DSRC PHY(Physical Layer) modem and MAC are designed and included. For CPU core ARM926EJ-S is embedded, and LCD controller, smart card controller, ethernet MAC, and memory controller are designed as main function.

Physical-Aware Approaches for Speeding Up Scan Shift Operations in SoCs

  • Lee, Taehee;Chang, Ik Joon;Lee, Chilgee;Yang, Joon-Sung
    • ETRI Journal
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    • v.38 no.3
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    • pp.479-486
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    • 2016
  • System-on-chip (SoC) designs have a number of flip-flops; the more flip-flops an SoC has, the longer the associated scan test application time will be. A scan shift operation accounts for a significant portion of a scan test application time. This paper presents physical-aware approaches for speeding up scan shift operations in SoCs. To improve the speed of a scan shift operation, we propose a layout-aware flip-flop insertion and scan shift operation-aware physical implementation procedure. The proposed combined method of insertion and procedure effectively improves the speed of a scan shift operation. Static timing analyses of state-of-the-art SoC designs show that the proposed approaches help increase the speeds of scan shift operations by up to 4.1 times that reached under a conventional method. The faster scan shift operation speeds help to shorten scan test application times, thus reducing test costs.

Cold Cathode using Avalanche Phenomenon at the Inversion Layer (반전층에서의 애벌런치 현상을 이용한 냉음극)

  • Lee, Jung-Yong
    • Journal of the Korean Vacuum Society
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    • v.16 no.6
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    • pp.414-423
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    • 2007
  • Field Emission Display(FED) has significant advantages over existing display technologies, particularly in the area of small and high quality display. In order to test the feasibility of fabricating the System-on-Chip(SOC) with FED, we conducted the experiment to use the p-n junction as an electron beam source for the flat panel display. A novel structure was constructed to form p-n junctions by generating inversion layer with the electric field from the cantilever style gate. When we applied more than 220V at the cantilever style gate which has a height of $1{\mu}m$, avalanche breakdown onset was successfully achieved. The characteristics was compared with the electron emission from the ultra shallow junction in the avalanche region. The experiment result and the future direction were discussed.

Double Precision Integer Divider Using Multiplier (곱셈기를 사용한 배정도 정수 나눗셈기)

  • Song, Hong-Bok;Cho, Gyeong-Yeon
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.14 no.3
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    • pp.637-647
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    • 2010
  • This paper suggested an algorithm that uses a multiplier, 'w bit $\times$ w bit = 2w bit', to process $\frac{N}{D}$ integer division of 2w bit integer N and w bit integer D. An algorithm suggested of the research, when the divisor D is '$D=0.d{\times}2^L$, 0.5 < 0.d < 1.0', approximate value of $\frac{1}{D}$, '$1.g{\times}2^{-L}$', which satisfies '$0.d{\times}1.g=1+e$, e < $2^{-w}$', is defined as over reciprocal number and the dividend N is segmented in small word more than 'w-3' bit, and partial quotient is calculated by multiplying over reciprocal number in each segmented word, and quotient of double precision integer division is evaluated with sum of partial quotient. The algorithm suggested in this paper doesn't require additional correction, because it can calculate correct reciprocal number. In addition, this algorithm uses only multiplier, so additional hardware for division is not required to implement microprocessor. Also, it shows faster speed than the conventional SRT algorithm. In conclusion, results from this study could be used widely for implementation SOC(System on Chip) and etc. which has been restricted to microprocessor and size of the hardware.

An Efficient Technique to Improve Compression for Low-Power Scan Test Data (저전력 테스트 데이터 압축 개선을 위한 효과적인 기법)

  • Song, Jae-Hoon;Kim, Doo-Young;Kim, Ki-Tae;Park, Sung-Ju
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.10 s.352
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    • pp.104-110
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    • 2006
  • The huge test data volume, test time and power consumption are major problems in system-on-a-chip testing. To tackle those problems, we propose a new test data compression technique. Initially, don't-cares in a pre-computed test cube set are assigned to reduce the test power consumption, and then, the fully specified low-power test data is transformed to improve compression efficiency by neighboring bit-wise exclusive-or (NB-XOR) scheme. Finally, the transformed test set is compressed to reduce both the test equipment storage requirements and test application time.

Development of Convergent IOT Managing Mindmap System (마인드맵 기반의 사물인터넷 융합 관리 시스템의 개발)

  • Ho, Won;Lee, Dae-Hyun;Bae, Ho-Chul
    • Journal of the Korea Convergence Society
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    • v.10 no.1
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    • pp.45-51
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    • 2019
  • The use of the Internet of things plays a major role in the Fourth Industrial Revolution, and a series of tasks of accumulating, converging, analyzing and reusing various data and services becomes very important. Because the pace and scope if the paradigm shift in Fourth Industrial Revolution is so rapid and unpredictable, the development and utilization of a system to fulfill this role for IOT are urgently required. In this paper, we introduce the Web-based IOT management system, which connects the IOT with OKMindmap, which is a domestic open source software and service, and the Node-RED service. This system combines the advantages of OKMindmap with the advantages of Node-RED, which is capable of visual component based programming, so that it can easily and flexibly connect the IOT based on Web browsers, and various data and services can be integrated and linked. We developed a camera module, a temperature and humidity sensor module, and the motor control module in Raspberry PI basically, and tested the operation successfully. We plan to extend the IOT component gradually by using Arduino and System On Chip.