• Title/Summary/Keyword: System semiconductor

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Overhead Hoist Transport Control System Design Using UML (UML을 적용한 OHT 제어 시스템 설계)

  • Sim, Gab-Sig;Jung, Tae-Young
    • The KIPS Transactions:PartD
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    • v.11D no.2
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    • pp.461-470
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    • 2004
  • As the semiconductor industrials change 200㎜-sized semiconductor wafer production process to 300㎜-sized one, it requires to develop the software for monitoring and simulating the robot which transfers a 300㎜-sized semiconductor wafer. Because such a software don't run at standalone but communicate MCS(Material Control System) and Its subsystem a robot, its architecture is very complex. Therefore, in order to develop such a software systematically, we must utilize an object-oriented development methodology. UML. This paper presents an UML process application developing the software for monitoring and simulating the robot which transfers a semiconductor wafer on the production process.

Design of DC OPTIMIZER for Maximum Power Generation System of Solar Panel (태양광 패널의 최대 전력 발생 시스템을 위한 DC OPTIMIZER 설계)

  • Kim, Jeong Gyu;Yang, Oh
    • Journal of the Semiconductor & Display Technology
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    • v.17 no.1
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    • pp.40-44
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    • 2018
  • In this paper, the efficiency of the solar system is lowered due to the partial shading such as the environmental factors of the solar panel. In order to solve this problem, a DC OPTIMIZER is proposed for a maximum power generation system of a photovoltaic panel. The proposed DC OPTIMIZER is composed of a buck structure that performs the maximum power point tracking (MPPT) control of each module of the solar panel, thus maximizing the efficiency. In order to verify the proposed DC Optimizer, the efficiency was measured by varying the irradiance using a solar simulator instead of the solar panel. As a result, it showed high efficiency characteristics as the maximum energy conversion efficiency was 99.3% at $800w/m^2$, $900w/m^2$, and the average efficiency was 99.06% excluding $100w/m^2$. The maximum efficiency of MPPT was 99.97% at $200w/m^2$, efficiency showed excellent performance.

Cure Properties of Isocyanurate Type Epoxy Resin Systems for FO-WLP (Fan Out-Wafer Level Package) Next Generation Semiconductor Packaging Materials (FO-WLP (Fan Out-Wafer Level Package) 차세대 반도체 Packaging용 Isocyanurate Type Epoxy Resin System의 경화특성연구)

  • Kim, Whan Gun
    • Journal of the Semiconductor & Display Technology
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    • v.18 no.1
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    • pp.65-69
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    • 2019
  • The cure properties of ethoxysilyl diglycidyl isocyanurate(Ethoxysilyl-DGIC) and ethylsilyl diglycidyl isocyanurate (Ethylsilyl-DGIC) epoxy resin systems with a phenol novolac hardener were investigated for anticipating fan out-wafer level package(FO-WLP) applications, comparing with ethoxysilyl diglycidyl ether of bisphenol-A(Ethoxysilyl-DGEBA) epoxy resin systems. The cure kinetics of these systems were analyzed by differential scanning calorimetry with an isothermal approach, and the kinetic parameters of all systems were reported in generalized kinetic equations with diffusion effects. The isocyanurate type epoxy resin systems represented the higher cure conversion rates comparing with bisphenol-A type epoxy resin systems. The Ethoxysilyl-DGIC epoxy resin system showed the highest cure conversion rates than Ethylsilyl-DGIC and Ethoxysilyl-DGEBA epoxy resin systems. It can be figured out by kinetic parameter analysis that the highest conversion rates of Ethoxysilyl-DGIC epoxy resin system are caused by higher collision frequency factor. However, the cure conversion rate increases of the Ethylsilyl-DGEBA comparing with Ethoxysilyl-DGEBA are due to the lower activation energy of Ethylsilyl-DGIC. These higher cure conversion rates in the isocyanurate type epoxy resin systems could be explained by the improvements of reaction molecule movements according to the compact structure of isocyanurate epoxy resin.

Design of Low Area Decimation Filters Using CIC Filters (CIC 필터를 이용한 저면적 데시메이션 필터 설계)

  • Kim, Sunhee;Oh, Jaeil;Hong, Dae-ki
    • Journal of the Semiconductor & Display Technology
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    • v.20 no.3
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    • pp.71-76
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    • 2021
  • Digital decimation filters are used in various digital signal processing systems using ADCs, including digital communication systems and sensor network systems. When the sampling rate of digital data is reduced, aliasing occurs. So, an anti-aliasing filter is necessary to suppress aliasing before down-sampling the data. Since the anti-aliasing filter has to have a sharp transition band between the passband and the stopband, the order of the filter is very high. However, as the order of the filter increases, the complexity and area of the filter increase, and more power is consumed. Therefore, in this paper, we propose two types of decimation filters, focusing on reducing the area of the hardware. In both cases, the complexity of the circuit is reduced by applying the required down-sampling rate in two times instead of at once. In addition, CIC decimation filters without a multiplier are used as the decimation filter of the first stage. The second stage is implemented using a CIC filter and a down sampler with an anti-aliasing filter, respectively. It is designed with Verilog-HDL and its function and implementation are validated using ModelSim and Quartus, respectively.

A Study on Image Distortion Correction for Gobo Lighting Optical System (고보 조명 광학계의 이미지 왜곡 보정에 관한 연구)

  • Gyu-Ha Kim;Ji-Hwan Lee;Chang-Hun Lee;Mee-Suk Jung
    • Korean Journal of Optics and Photonics
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    • v.34 no.2
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    • pp.61-65
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    • 2023
  • This paper studies a method of applying pre-distortion to the image mask of the gobo illumination optical system to correct an irradiated image and irradiate a clear image. In the case of the gobo illumination optical system, since it is generally irradiated with a tilt, distortion in the upper and lower directions occurs severely in the image. To solve this problem, the correction coordinates of the image were derived using a proportional equation, and the distortion was corrected by applying them to the image mask. As a result, it was confirmed that the distortion was reduced by 64.5% compared to the case of using the existing image mask.

Interface Characteristics and Electrical Properties of SiO2 and V2O5 Thin Films Deposited by the Sputtering (스퍼터링 방법으로 증착한 SiO2와 V2O5박막의 전류특성과 계면분석)

  • Li, Xiangjiang;Oh, Teresa
    • Journal of the Semiconductor & Display Technology
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    • v.17 no.4
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    • pp.66-69
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    • 2018
  • This study was researched the electrical properties of semiconductor devices such as ITO, $SiO_2$, $V_2O_5$ thin films. The films of ITO, $SiO_2$, $V_2O_5$ were deposited by the rf magnetron sputtering system with mixed gases of oxygen and argon to generate the plasma. All samples were cleaned before deposition and prepared the metal electrodes to research the current-voltage properties. The electrical characteristics of semiconductors depends on the interface's properties at the junction. There are two kinds of junctions such as ohmic and schottky contacts in the semiconductors. In this study, the ITO thin film was shown the ohmic contact properties as the linear current-voltage curves, and the electrical characteristics of $SiO_2$ and $V_2O_5$ films were shown the non-linear current-voltage curves as the schottky contacts. It was confirmed that the electronic system with schottky contacts enhanced the electronic flow owing to the increment of efficiency and increased the conductivity. The schottky contact was only defined special characteristics at the semiconductor and the interface depletion layer at the junction made the schottky contact which has the effect of leakage current cutoff. Consequently the semiconductor device with shottky contact increased the electronic current flow, in spite of depletion of carriers.

A Study on Scratch Detection of Semiconductor Package using Mask Image (마스크 이미지를 이용한 반도체 패키지 스크래치 검출 연구)

  • Lee, Tae-Hi;Park, Koo-Rack;Kim, Dong-Hyun
    • Journal of the Korea Convergence Society
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    • v.8 no.11
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    • pp.43-48
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    • 2017
  • Semiconductors are leading the development of industrial technology, leading to miniaturization and weight reduction of electronic products as a leading technology, we are dragging the electronic industry market Especially, the semiconductor manufacturing process is composed of highly accurate and complicated processes, and effective production is required Recently, a vision system combining a computer and a camera is utilized for defect detection In addition, the demand for a system for measuring the shape of a fine pattern processed by a special process is rapidly increasing. In this paper, we propose a vision algorithm using mask image to detect scratch defect of semiconductor pockage. When applied to the manufacturing process of semiconductor packages via the proposed system, it is expected that production management can be facilitated, and efficiency of production will be enhanced by failure judgment of high-speed packages.

Measurement of Condensation and Boiling Heat Transfer Coefficients of Non-flammable Mixed Refrigerant for Design of Cryogenic Cooling System for Semiconductor Etching Process (반도체 식각 공정용 초저온 냉각 시스템 설계를 위한 비가연성 혼합냉매 응축 및 비등 열전달 계수 측정)

  • Cheonkyu Lee;Jung-Gil Lee
    • Journal of the Semiconductor & Display Technology
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    • v.22 no.3
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    • pp.119-124
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    • 2023
  • In this study, experimental approach of the measurement of condensation and evaporation heat transfer coefficients is discussed for mixed refrigerants using in the ultra low-temperature cooling system for semiconductor etching process. An experimental apparatus was described performing the condensation and evaporation heat transfer measurements for mixed refrigerants. The mixed refrigerant used in this study was composed of the optimal mixture determined in previous research, with a composition of Ar:R14:R23:R218 = 0.15:0.4:0.15:0.3. The experiments were conducted over a temperature range from -82℃ to 15℃ and at pressures ranging from 18.5 bar to 5 bar. The convection heat transfer coefficients of the mixed refrigerant were measured at flow rates corresponding to actual operating conditions. The condensation heat transfer coefficient ranged from approximately 0.7 to 0.9 kW/m2K, while the evaporation heat transfer coefficient ranged from 1.0 to 1.7 kW/m2K. The detailed discussion of the experimental methods, procedures, and results were described in this paper.

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Bi-polar High-voltage Pulse Generator Using Semiconductor switches (반도체 스위치를 이용한 양방향 고압 펄스 발생기)

  • Kim J.H.;Ryu M.Y.;Jung I.W.;Shenderey S.;Kim J.S.;Rim G.H.
    • Proceedings of the KIPE Conference
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    • 2003.07a
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    • pp.291-293
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    • 2003
  • A semiconductor switch-based fast hi-polar high voltage pulse generator is proposed in this paper The proposed pulse system is made of a thyristor based-rectifier, DC link capacitor, a push-pull resonant inverter, a high voltage transformer. secondary capacitor, a high voltage IGBT & diode stacks, and a variable capacitor. The proposed system makes hi-polar high voltage sinusoidal waveform using resonance between leakage inductance of the transformer and secondary capacitor and transfers energy to output load at maximum of the secondary capacitor voltage. Compared to previous hi-polar high voltage pulse power supply using nonlinear transmission line, the proposed pulse power system using only semiconductor switches has simple structure and gives high efficiency

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Control of Object Transport Direction Using Vibration of Flexural Beam in Ultrasonic Transport System (초음파 이송장치에서 탄성 빔의 진동을 이용한 물체 이송방향 제어)

  • Jeong, Sang-Hwa;Park, Jin-Wan
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 2007.11a
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    • pp.1241-1246
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    • 2007
  • In recent years, the semiconductor industry and the optical industry are developed rapidly. The recent demands have expanded for optical components such as the optical lens, the optical semiconductor and the measuring instrument. Object transport systems are driven typically by the magnetic field and the conveyer belt. Recent industry requires more faster and efficient transport system. However, conventional transport systems are not adequate for transportation of optical elements and semiconductors. The conveyor belts can damage precision optical elements by the contact force and magnetic systems can destroy the inner structure of semiconductor by the magnetic field. In this paper, the levitation transport system using ultrasonic wave is developed for transporting precision elements without damages. The steady state flexural vibration of the beam is expressed using Euler-Bernoulli beam theory. The transport direction of an object is examined according to phase difference and frequency. The theoretical results are verified by experiments.

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