• Title/Summary/Keyword: Surface leakage

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Non-destructive Testing and Numerical Analysis for Ferromagnetic Plates using Magnetic Flux Leakage Method (강자성체 평판의 자속 누설 탐상 비파괴 실험 및 수치해석)

  • Kim, Sean;Lee, Hyang-Beom
    • Proceedings of the KIEE Conference
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    • 2001.04a
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    • pp.126-128
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    • 2001
  • In this paper, Magnetic Flux Leakage(MFL) method is used to detect surface defect in ferromagnetic plate. Surface defects are created on the SM 45C ferromagnetic plate and magnetizing equipment is composed to perform MFL nondestructive testing. The length and width of defect is twice the thickness of ferromagnetic plate, and defects with different depths are made artificially for the experiment. Also, NdFeB magnet in magnetizing equipment is used to make magnetic flux. This paper shows that it is possibile to detect 10% defect and to analyze numerically for any defect using MFL method.

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The influence of filler for silicone rubber tracking (실리콘 고무의 트래킹에 미치는 충전재의 영향)

  • 허창수;장기순;조한구
    • Electrical & Electronic Materials
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    • v.9 no.4
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    • pp.344-350
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    • 1996
  • Tracking is one of the biggist problems to be overcome in polymeric materials for outdoor insulators. But It can be decreased with the addition of filler such as alumina trihydrate (ATH). In this paper, the tracking of surface and evaluation of insulating ability at silicone rubber is investigated, using the salt fog test. At initial state, the peak leakage current and numbers by dry band arcing is increasing with increasing the filler level, but at aged state decreasing at high concentration filler samples. This is because the roughness of the surface may contribute to the increase in peak leakage cur-rent and numbers. As increasing the filler level, the insulating ability of materials is higher and weight loss is decreased. The mechanism of insulating failure is occurred by the erosion than the tracking and the erosion caused weight loss of 2 g.

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A study on radio interference voltage(RIV) reduction of 22-9 KV-y distribution line (22.9 KV-y 배전선로 통신 유도장해전압(RIV)감소 대책에 관한 연구)

  • Chon, Y.K.;Sun, J.H.;Cho, K.H.
    • Proceedings of the KIEE Conference
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    • 1998.07e
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    • pp.1670-1674
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    • 1998
  • Now and then there are many electrical accidents between cable and line post insulator which is degraded by long time using, causing leakage current on the surface of insulator. In this paper it is denied that the 22.9 KV-y distribution lines are protected by binding cover which is needed from fog or rainy moisture, surges occurring by swiching or lightening pulse. It is analyzed to investgate the unballanced transfer characteristics and reflection coefficient by using bidding cover and non-cover. It was tested the radio interference voltage in the test room. In the factory it was tested the amount of leakage current causing on the surface of insulator in the state of no load and 70(%) load.

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Characterization of Surface Damage and Contamination of Si Using Cylindrial Magnetron Reactive Ion Etching

  • Young, Yeom-Geun
    • Korean Journal of Materials Research
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    • v.3 no.5
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    • pp.482-496
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    • 1993
  • Radiation damage and contamination of silicons etched in the $CF_4+H_2$ and $CHF_3$ magnetron discharges have been characterized using Schottky diode characteristics, TEM, AES, and SIMS as a function of applied magnetic field strength. It turned out that, as the magnetic field strength increased, the radiation damage measured by cross sectional TEM and by leakage current of Schottky diodes decreased colse to that of wet dtched samples especially for $CF_4$ plasma etched samples, For $CF_4+H_2$and $CHF_3$ etched samples, hydrogen from the plasmas introduced extended defects to the silicon and this caused increased leakage current to the samples etched at low magnetic field strength conditions by hydrogen passivation. The thickness of polymer with the increasing magnetic field strength and showed the minimum polymer residue thickness near the 100Gauss where the silicon etch rate was maximum. Also, other contaminants such as target material were found to be minimum on the etched silicon surface near the highest etch rate condition.

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A study on the electric field strength of the insulation cover using 22.9 kV-y distribution line (22.9 KV-y 배전선로용 전선보호관 전계강도 비교실험 연구)

  • Chon, Y.K.;Seo, K.S.;Cha, K.S.
    • Proceedings of the KIEE Conference
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    • 2000.07c
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    • pp.1871-1873
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    • 2000
  • There are many electrical accidents between bare wire and line post insulator which is degraded by long time using, causing leakage current on the surface of insulator. In this paper it is presented that the 22.9 Kv-y distribution lines are protected by binding cover which is needed from fog or rainy moisture, surges occurring by switching or lightening pulse. It is analyzed to investigate the unbalanced transfer characteristics and reflection coefficient by using binding cover and non-cover. It was tested the radio interference voltage in the test room and electric field strength by calculation between binding cover and non-cover. In the factory the leakage current causing on the surface of insulator was tested in the state of light load and heavy load.

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Structural and Electrical Properties of ZrO2 Films Coated onto PET for High-Energy-Density Capacitors

  • Park, Sangshik
    • Applied Science and Convergence Technology
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    • v.23 no.2
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    • pp.90-96
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    • 2014
  • Flexible $ZrO_2$ films as dielectric materials for high-energy-density capacitors were deposited on polyethylene terephthalate (PET) substrates by RF magnetron sputtering. The growth behavior, microstructure and electrical properties of the flexible $ZrO_2$ films were dependent on the sputtering pressure and gas ratio. Although $ZrO_2$ films were deposited at room temperature, all films showed a tetragonal crystalline structure regardless of the sputtering variables. The surface of the film became a surface with large white particles upon an increase in the $O_2/Ar$ gas ratio. The RMS roughness and crystallite size of the $ZrO_2$ films increased with an increase in the sputtering pressure. The electrical properties of the $ZrO_2$ films were affected by the microstructure and roughness. The $ZrO_2$ films exhibited a dielectric constant of 21~38 at 1 kHz and a leakage current density of $10^{-6}{\sim}10^{-5}A/cm^2$ at 300 kV/cm.

The Change of Electrical Properties on Silicone Rubber Contained ATH under Cyclic Aging(I) (ATH를 첨가한 실리콘고무의 반복열화에 따른 전기적 특성변화(I))

  • Oh, Tae-Seung;Lee, Chung;Kim, Ki-Yup;Park, Soo-Gil;Ryu, Boo-Hyung
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.11a
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    • pp.258-261
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    • 2001
  • In this paper, aging characteristics of silicone rubber used for outdoor insulation have been investigated with regards to salt fog condition and heat aging effect. We look over the change of properties of silicone rubber in salt fog chamber with average leakage current monitoring for observing the transformation of surface degradation properties of silicone rubber with different ATH(alumina trihydrate, Al$_2$O$_3$$.$3H$_2$O) filler contents. Surface resistivity, SEM(Scanning Electro Microscope) were measured.

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Film Compensation of Twisted Nematic LC mode using Hybrid Film (하이브리드 필름을 이용한 비틀린 네마틱 액정 모드의 필름보상 연구)

  • Kim, Seong-Su;Hwang, Seong-Han;Kang, Hoon;Lee, Myong-Hoon;Lee, Seung-Hee
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.06a
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    • pp.390-391
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    • 2007
  • We have studied improvement of light leakage of twisted nematic liquid crystal display (TN-LCD) in dark state using the hybrid aligned compensation film made of rod-like LC. When the voltage is applied properly to the TN-LCD, the director tilts up but LC director on the substrate don't tilts up due to surface anchoring energy of the LC cell. Accordingly, LC director from surface to middle LC of TN -LCD become hybrid state such as hybrid aligned film. Consequently, in this paper we achieve wide viewing angle performances of TN mode using developed hybrid aligned film which especially decreases light leakage at vertical direction in dark state.

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A Study on Dry and Wet Wipe Test for Radioisotope Leakage Checking (방사성동위원소 누설 점검을 위한 건식 및 습식 문지름 시험법 연구)

  • Park, SangMin;Yoo, SeungHee;Choi, KyuSeok;Lee, HwaHyung;Hong, Sayong
    • Journal of the Korean Society of Radiology
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    • v.12 no.3
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    • pp.305-312
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    • 2018
  • A dry and wet wipe test for radioisotope leakage checking was conducted by fixing the radioisotope $^{14}C$ to the glass surface and used for observing the transfer factor and surface shape of the test paper through wipe test. The dry wipe test showed that transfer factor in the tissue paper was twice as high as in the paper filter, and the wet wipe test showed that transfer factor in the paper filter paper was three times higher than the tissue paper. Although paper filters are general choice for leakage checking, it has been shown that tissue paper can be an alternative in the dry wipe test.

Fractal Analysis of the Carbonization Pattern Formed on the Surface of a Phenolic Resin (페놀수지 표면에 형성된 탄화패턴에 대한 프랙탈 해석)

  • Kim, Jun-Won;Park, Sang-Taek;Roh, Young-Su
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.24 no.1
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    • pp.124-129
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    • 2010
  • When a phenolic resin is carbonized by the leakage current flowing along its surface, the carbonization pattern is one of the most important factors to determine its carbonization characteristics. However, the typical carbonization pattern of a phenolic resin is too complicated to be analyzed by conventional Euclidean geometry. In most cases, such a complicated shape shows a fractal structure. It is possible, therefore, to examine the characteristics of the carbonization pattern regarding a given phenolic resin. In order to quantitatively investigate the carbonization pattern of the phenolic resin carbonized by a leakage current, in this paper, the fractal dimension of the carbonization pattern has been calculated as a function of the magnitude of a leakage current and the distance between two electrodes. For reliability of calculation, the correlation function as well as the box counting method has been used to calculate the fractal dimension. According to the result of calculation, the fractal dimension increases as the current increases at the constant electrode gap distance. However, there is no significant relation between the fractal dimension and the electrode gap distance at a constant current.