• Title/Summary/Keyword: Surface Measurement

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Measurement of Fuzz Fibers on Fabric Surface Using Image Analysis Methods

  • Ucar Nuray;Boyraz Plnar
    • Fibers and Polymers
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    • v.6 no.1
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    • pp.79-81
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    • 2005
  • Fuzz on the fabrics, which is the fibers protruded from the fabric surface, is very important in view of appearance quality, since it causes unpleasant appearance on the fabrics and also leads to pilling which makes fabric appearance and soft­ness worse. However, fuzz on fabric surface is measured mostly by subjective methods (human vision) rather than objective methods. Thus, in this study, objective method using image analysis techniques has been developed for the measurement of fuzz on fabric surface. Fuzz on the fabric has also been ranked and rated by experts in order to see the reliability of the results obtained from the fuzz measurement. It was observed that correlation coefficient (r) between rating value and objective mea­surement value was 0.9 and this correlation coefficient value confirmed the reliability of this method.

Production and measurement of a super-polished low-scattering mirror substrate (초연마 저산란 반사경 기판 제작과 평가)

  • 조민식
    • Journal of the Korea Institute of Military Science and Technology
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    • v.2 no.2
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    • pp.157-165
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    • 1999
  • Production and measurement of a super-polished few-ppm-scattering mirror substrate are investigated. In order to improve the surface roughness directly determining scattering, the super-polishing process using Bowl-Feed technique is tried. The surface quality of the super-polished substrate is estimated by the phase-measuring interferometer. For the reliable roughness measurement using the interferometer, data averaging method is applied so that the optimal data averaging condition, 30 phase-data averaging and 20 intensity-data averaging, minimizing the measurement error is experimently searched. Based on the optimal data averaging condition, surface roughness of home-made mirror substrate is measured to be less than $0.5{\AA}$ rms corresponding to 2-ppm total-integrated-scattering.

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Analysis of Surface Current Measurement Based on X-band Radar Image (X-밴드 레이더 이미지 기반 표층해류 계측 분석)

  • Na-Yun Kang;Yu-Kyung Lee;Young-Jun Yang
    • Proceedings of the Korean Institute of Navigation and Port Research Conference
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    • 2022.11a
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    • pp.323-324
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    • 2022
  • This paper explains the comparison results of surface current measurement using X-band Radar image through analysis. Measurements were carried out from February 2022 using the X-band Radar for marin ships installed at Sokcho Beach. Based on the Korea Hydrographic and Oceanographic Agency ocean observation buoys, the accuracy of surface current(current speed) measurement was verified through comparison and analysis of measurement data.

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Adjustment Algorithm of Incident Light Power for Improving Performance of Laser Surface Roughness Measurement (레이저 표면 거칠기 측정 성능 향상을 위한 입사 광강도 조정 알고리즘)

  • 서영호;김화영;안중환
    • Journal of the Korean Society for Precision Engineering
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    • v.21 no.4
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    • pp.79-87
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    • 2004
  • The light pattern reflected from a machined surface contains some information like roughness and profile on the projected surface as expected in the Beckmann-Spizzichino model. In applying the theory into a real reliable measuring device, many parameters such as incident light power, wave length, spot size should be kept a constant optical value. However, the reflected light power is likely to change with the environmental noise, the variations of the light source, the reflectivity of the surface, etc. even though the incident light power is constant. In this study, a method for adjusting the incident light power to keep the reflected light power projected on a CMOS image sensor constant was proposed and a simple adjustment algorithm based on PI digital control was examined. Experiments verified that the proposed method made the surface roughness measurement better and more reliable even under variations of the height of light source.

Measurement and Analysis of the Section Profile for Feature Line Surface on an Automotive Outer Panel (자동차 외판 특징선 곡면의 단면 형상 측정과 분석)

  • Choe, W.C.;Chung, Y.C.
    • Transactions of Materials Processing
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    • v.24 no.2
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    • pp.107-114
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    • 2015
  • The current study presents a geometric measurement and analysis of the section profile for a feature line surface on an automotive outer panel. A feature line surface is the geometry which is a visually noticeable creased line on a smooth panel. In the current study the section profile of a feature line surface is analyzed geometrically. The section profile on the real press panel was measured using a coordinate measuring machine. The section profiles from the CAD model and the real panel are aligned using the same coordinate system defined by two holes near the feature line. In the aligned section profiles the chord length and height of the curved part were measured and analyzed. The results show that the feature line surface on the real panel is doubled in width size.

A Rational Quantity of Measurement for Finding Flatness of a Surface Table (정반 평면도 평가를 위한 측정점의 합리적인 개수의 결정)

  • Hyun, Chang-Hun;Shin, Sang-Cheol;Park, Hung-Sik
    • Journal of Industrial Technology
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    • v.18
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    • pp.181-186
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    • 1998
  • The flatness is the most important nature for the surface table. For finding such a flatness, the surface is surveyed along a number of straight lines parallel to the edges of table, which form a grid. Next, the variations in height of the grid points are measured relative to a datum point. If the number of such points is increased. It is not necessarily to use many grid points for finding the original flatness of a measured surface table. So, it is necessary to find the rational quantity of such grid points. It is found that about 220 points per $1m^2$ of surface table for measurement is the rational quantity with less than about 15% error of the original flatness.

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Generating Cartesian Tool Paths for Machining Sculptured Surfaces from 3D Measurement Data (3차원 측정자료부터 자유곡면의 가공을 위한 공구경로생성)

  • Ko, Byung-Chul;Kim, Kwang-Soo
    • Journal of Korean Institute of Industrial Engineers
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    • v.19 no.3
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    • pp.123-137
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    • 1993
  • In this paper, an integrated approach is proposed to generate gouging-free Cartesian tool paths for machining sculptured surfaces from 3D measurement data. The integrated CAD/CAM system consists of two modules : offset surface module an Carteian tool path module. The offset surface module generates an offset surface of an object from its 3D measurement data, using an offsetting method and a surface fitting method. The offsetting is based on the idea that the envelope of an inversed tool generates an offset surface without self-intersection as the center of the inversed tool moves along on the surface of an object. The surface-fitting is the process of constructing a compact representation to model the surface of an object based on a fairly large number of data points. The resulting offset surtace is a composite Bezier surface without self-intersection. When an appropriate tool-approach direction is selected, the tool path module generates the Cartesian tool paths while the deviation of the tool paths from the surface stays within the user-specified tolerance. The tool path module is a two-step process. The first step adaptively subdivides the offset surface into subpatches until the thickness of each subpatch is small enough to satisfy the user-defined tolerance. The second step generates the Cartesian tool paths by calculating the intersection of the slicing planes and the adaptively subdivided subpatches. This tool path generation approach generates the gouging-free Cartesian CL tool paths, and optimizes the cutter movements by minimizing the number of interpolated points.

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Thickness and Surface Measurement of Transparent Thin-Film Layers using White Light Scanning Interferometry Combined with Reflectometry

  • Jo, Taeyong;Kim, KwangRak;Kim, SeongRyong;Pahk, HeuiJae
    • Journal of the Optical Society of Korea
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    • v.18 no.3
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    • pp.236-243
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    • 2014
  • Surface profiling and film thickness measurement play an important role for inspection. White light interferometry is widely used for engineering surfaces profiling, but its applications are limited primarily to opaque surfaces with relatively simple optical reflection behavior. The conventional bucket algorithm had given inaccurate surface profiles because of the phase error that occurs when a thin-film exists on the top of the surface. Recently, reflectometry and white light scanning interferometry were combined to measure the film thickness and surface profile. These techniques, however, have found that many local minima exist, so it is necessary to make proper initial guesses to reach the global minimum quickly. In this paper we propose combing reflectometry and white light scanning interferometry to measure the thin-film thickness and surface profile. The key idea is to divide the measurement into two states; reflectometry mode and interferometry mode to obtain the thickness and profile separately. Interferogram modeling, which considers transparent thin-film, was proposed to determine parameters such as height and thickness. With the proposed method, the ambiguity in determining the thickness and the surface has been eliminated. Standard thickness specimens were measured using the proposed method. Multi-layered film measurement results were compared with AFM measurement results. The comparison showed that surface profile and thin-film thickness can be measured successfully through the proposed method.

Precise Analysis of the Surface Oxidation Layer on Cu Powders Using FE-TEM Techniques (전계방출 투과전자현미경 분석기술을 이용한 Cu 입자 표면산화층의 정밀평가)

  • Lee, Tae Hun;Yoo, Jung Ho;Hyun, Moon Seop;Yang, Jun-Mo;Seong, Mi-Ryn;Kwon, Jinhyeong;Lee, Caroline Sunyong;Kim, Jeong-Sun;Baik, Kyeong Ho
    • Korean Journal of Metals and Materials
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    • v.48 no.1
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    • pp.57-61
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    • 2010
  • Nanosized surface structures of Cu powders were investigated at the atomic scale by field-emission transmission electron microscope techniques. The nanoscale surface oxide layer on the Cu powder was analyzed to be the $CU_2O$ phase by electron diffraction pattern and electron energy-loss spectroscopy. In addition, it was found from high-resolution transmission electron microscopy study that there are formed no surface oxide layers on the surface of alkanethiol coated Cu powders.