• Title/Summary/Keyword: Surface Defects

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Development of Real-Time COF Film Complex Inspection System using Color Image (컬러영상을 이용한 실시간 COF 필름 복합 검사시스템 개발)

  • Kim, Yong-Kwan;Lee, In Hwan
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.20 no.10
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    • pp.112-118
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    • 2021
  • In this study, an inspection method using a color image is proposed to conduct a real-time inspection of covalent organic framework (COF) films to detect defects, if any. The COF film consists of an upper pattern SR and a lower PI. The proposed system detects the defects of more than 20 ㎛ on the SR surface owing to the characteristics of the pattern, whereas on the PI surface, it detects defects of more than 4 ㎛ by utilizing a micro-optical system. In the existing system, it is difficult for the operator to conduct a full inspection through a high-performance microscope. The proposed inspection algorithm performs the inspection by separating each color component using the color contrast of the pattern on the SR side, and on the PI surface it inspects the bonding state of the mounted chip. As a result, it is possible to confirm the exact location of the defects through the SR and PI surface inspections in the implemented inspection.

Inspection of Coin Surface Defects using Multiple Eigen Spaces (다수의 고유 공간을 이용한 주화 표면 품질 진단)

  • Kim, Jae-Min;Ryoo, Ho-Jin
    • The Journal of the Korea Contents Association
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    • v.11 no.3
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    • pp.18-25
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    • 2011
  • In a manufacturing process of metal coins, surface defects of coins are manually detected. This paper describes an new method for detecting surface defects of metal coins on a moving conveyor belt using image processing. This method consists of multiple procedures: segmentation of a coin from the background, alignment of the coin to the model, projection of the aligned coin to the best eigen image space, and detection of defects by comparison of the projection error with an adaptive threshold. In these procedures, the alignement and the projection are newly developed in this paper for the detection of coin surface defects. For alignment, we use the histogram of the segmented coin, which converts two-dimensional image alignment to one-dimensional alignment. The projection reduces the intensity variation of the coin image caused by illumination and coin rotation change. For projection, we build multiple eigen image spaces and choose the best eigen space using estimated coin direction. Since each eigen space consists of a small number of eigen image vectors, we can implement the projection in real- time.

Detection of Defects in a Thin Steel Plate Using Ultrasonic Guided Wave (유도초음파를 이용한 박판에서의 결함의 검출에 관한 연구)

  • Jeong, Hee-Don;Shin, Hyeon-Jae;Rose, Joseph L.
    • Journal of the Korean Society for Nondestructive Testing
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    • v.18 no.6
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    • pp.445-454
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    • 1998
  • In order to establish a technical concept for the detection of defects in weldments in thin steel plate, an experimental and theoretical investigation was carried out for artificial defects in a steel plate having a thickness of 2.4mm by using the guided wave technique. In particular the goal was to find the most effective testing parameters paying attention to the relationship between the excitation frequency by a tone burst system and various incident angles. It was found that the test conditions that worked best was for a frequency of 840kHz and an incident angle of 30 or 85 degrees, most of the defects were detected with these conditions. Also, it was clear that a guided wave mode generated under an incident angle of 30 degrees was a symmetric mode, So, and that of 85 degrees corresponded to an antisymmetric mode, Ao. By using the two modes, most of all of the defects could be detected. Furthermore, it was shown that the antisymmetric mode was more sensitive to defects near the surface than the symmetric mode. Theoretical predictions confirmed this sensitivity improvement with Ao for surface defects because of wave structure variation and energy concentration near the surface.

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Numerical Simulation of Fatigue Growth of Multiple Surface Crack under Fatigue Load (피로 하중하에서의 복수표면크랙진전에 관한 수치시뮬레이션)

  • 한문식
    • Transactions of the Korean Society of Automotive Engineers
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    • v.10 no.6
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    • pp.133-141
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    • 2002
  • This paper describes a versatile finite element technique which has been used to investigate wide range of structural defects of practical importance. The procedure automatically remeshes the three-dimensional finite element model during the stages of crack growth. Problems include the surface cracks in leak-before-break situations, the shape development of multiple surface defects.

Enhancement of Hardness and Moderation of Surface Defects of 14K, 18K Yellow Gold Alloy by Heat Treatment (열처리에 의한 14K, 18K yellow gold alloy의 경도 향상 및 표면 결함 완화)

  • Ahn, Ji-Hyun;Seo, Jin-Kyo;Ahn, Yoeng-Gil;Park, Jong-Wang
    • Journal of Surface Science and Engineering
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    • v.43 no.2
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    • pp.86-90
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    • 2010
  • In this study, we conducted heat treatment on 14K, 18K yellow gold alloy at various temperature conditions for improving their hardness and moderating their surface defects. Also after the heat treatment we used EPMA (Electron Probe Micro Analyzer), XRF (x-ray Fluorescence spectroscopy) for qualitative analysis and OM (optical microscope), SEM (scanning electron microscope) to investigate the changes of surface grain boundary. We used Vickers hardness tester to verify the changes of hardness. After the heat treatment, 14K, 18K gold alloys showed improved hardness and moderated surface defects at specific temperatures and duration.

VOID DEFECTS IN COBALT-DISILICIDE FOR LOGIC DEVICES

  • Song, Ohsung;Ahn, Youngsook
    • Journal of Surface Science and Engineering
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    • v.32 no.3
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    • pp.389-392
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    • 1999
  • We employed cobalt-disilicide for high-speed logic devices. We prepared stable and low resistant $CoSi_2$ through typical fabrication process including wet cleaning and rapid thermal process (RTP). We sputtered 15nm thick cobalt on the wafer and performed RTP annealing 2 times to obtain 60nm thick $CoSi_2$. We observed spherical shape voids with diameter of 40nm in the surface and inside $CoSi_2$ layers. The voids resulted in taking over abnormal junction leakage current and contact resistance values. We report that the voids in $CoSi_2$ layers are resulted from surface pits during the ion implantation previous to deposit cobalt layer. Silicide reaction rate around pits was enhanced due to Gibbs-Thompson effects and the volume expansion of the silicidation of the flat active regime trapped dimples. We confirmed that keeping the buffer oxide layer during ion implantation and annealing the silicon surface after ion implantation were required to prevent void defects in CoSi$_2$ layers.

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Part tolerancing through multicale defect analysis

  • Petitcuenot, Mathieu;Anselmetti, Bernard
    • International Journal of Aeronautical and Space Sciences
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    • v.17 no.1
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    • pp.109-119
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    • 2016
  • When manufactured parts undergo large deformations during the manufacturing process, the global specifications of a part based on the concept of tolerance zone defined in the ISO 1101 standard [1] enable one to control the part's global defects. However, the extent of this tolerance zone is too large when the objective is to minimize local defects, such as hollows and bumps. Therefore, it is necessary to address local defects and global defects separately. This paper refers to the ISO 10579 standard [2] for flexible parts, which enables us to define a stressed state in order to measure the part by straightening it to simulate its position in the mechanism. The originality of this approach is that the straightening operation is performed numerically by calculating the displacement of a cloud of points. The results lead to a quantification of the global defects through various simple models and enable us to extract local defects. The outcome is an acceptable tolerance solution. The procedure is first developed for the simple example of a steel bar with a rectangular cross section, then applied to an industrial case involving a complex 3D surface of a turbine blade. The specification is described through ISO standards both in the free state and in the straightened state.

Effect of Skinpassing Conditions on the Surface Characteristics of Hot-dip Galvanized Steel Sheets (용융아연도금강판의 표면특성에 미치는 조질압연 조업조건의 영향)

  • 전선호
    • Journal of Surface Science and Engineering
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    • v.34 no.4
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    • pp.327-336
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    • 2001
  • The skinpassing conditions such as roll type, roll force and roll roughness of the work roll were evaluated to give the surface properties of the galvanized steel sheets that were required for automotive and to get rid of the surface defects that caused with the bad control of galvanized coating process parameters. The surface defects of the galvanized steel sheets such as the ripple mark and the scratch were completely removed as the roll force of SPM work roll was increased and the amount of the transfer of roll surface texture to the strip was also gained a lot. The image clarity of electro discharge textured (EDT) coated steel sheets before and after painting was higher than that of the bright (BRT) and shot blasted (SBT) coated steel sheets because of higher PPI value, lower waviness and uniform surface pattern. Since micro-craters transferred on the surface of the galvanized steel sheets played a role of nucleation sites of chromate reaction, Increase of micro-craters was bring to better corrosion resistance with the increase of the roll force and the use of EDT roll at the skin pass mill.

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Light Scattering Characteristics of Defects on Silicon Wafer Surface (실리콘 웨이퍼 미세 표면결함의 광산란 특성 평가)

  • Ha T.H.;Song J.Y.;Miyoshi Takashi;Takaya Yasuhiro
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.06a
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    • pp.1083-1086
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    • 2005
  • Light scattering measurement system that can evaluate light scattering characteristic from defects on silicon wafer surface has been developed. The system uses $Ar^+$ laser as an illumination source, and a highly sensitive photomultiplier tube (PMT) for detecting scattered light from defects. Unlike with conventional measurement system, our system has ability to measure scattered light pattern from wide range of scattering angles with changeable incidence condition. It is shown that our developed system is effective to discriminate the types and sizes of defects from basic experimental results using a microscatch and a PSL sphere.

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