• Journal of the Semiconductor & Display Technology
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• v.17 no.4
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• pp.1-5
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• 2018

Atomic force microscopy (AFM) simulation for Si (001) surface defects was conducted by using density functional theory (DFT). Three major defects on the Si (001) surface are difficult to analyze due to external noises that are always present in the images obtained by AFM. Noise-free surface defects obtained by simulation can help identify the real surface defects on AFM images. The surface defects were first optimized by using a DFT code. The AFM tip was designed by using five carbon atoms and positioned on the surface to calculate the system's energy. Forces between tip and surface were calculated from the energy data and converted into an AFM image. The simulated AFM images are noise-free and, therefore, can help evaluate the real surface defects present on the measured AFM images.

• Journal of Surface Science and Engineering
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• v.53 no.2
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• pp.80-86
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• 2020

This paper is concerned with type of imperfections present within the anodic oxide films on AA2024 and surface hardness of the anodic film measured after ink-impregnation. The anodic oxide films were formed for 25 min at 40 mA/㎠ and 15±0.5℃ and 300 rpm of magnet stirring rate in 20% sulfuric acid solution. The ink-impregnation allows clear observations of not only the imperfections within the anodic oxide films but also an indentation mark on the oxide film surface made by a pyramidal-diamond penetrator for the hardness measurement. There were observed four different regions in the anodic oxide films on AA2024 and the surface hardness of the anodic oxide films appeared to be crucially dependent on the type of defects, showing 60~100 H_v on the oxide surface region I with large size black defect, 100~140 H_v on the oxide surface region II with large size grey defect, 140~170 H_v on the oxide surface region III with mall size black and/or grey defects and 170~190 H_v on the oxide surface region IV without defects. The pyramidal indentation marks were observed to be distorted in the regions with a large size black and grey defects, while no distortion of the indentation mark was observed in the regions with small size defects and without visible defects.

• Advances in materials Research
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• v.4 no.4
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• pp.215-226
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• 2015

Experiment on roughness and micro pit defects of SUS 430 ferrite stainless steel was investigated in laboratory. The relation between roughness and glossiness with reduction in height, roll surface roughness, emulsion parameters was analyzed. The surface morphology of micro pit defects was observed by SEM, and the effects of micro pit defects on rolling reduction, roll surface roughness, emulsion parameters, lubrication oil in deformation zone and work roll diameter were discussed. With the increasing of reduction ratio strip surface roughness Ra(s), Rp(s) and Rv(s) were decreasing along rolling and width direction, the drop value in rolling direction was faster than that in width direction. The roughness and glossiness were obtained under emulsion concentration 3% and 6%, temperature $55^{\circ}C$ and $63^{\circ}C$, roll surface roughness $Ra(r)=0.5{\mu}m$, $Ra(r)=0.7{\mu}m$ and $Ra(r)=1.0{\mu}m$. The glossiness was declined rapidly when the micro defects ratio was above 23%. With the pass number increasing, the micro pit defects were reduced, uneven peak was decreased and gently along rolling direction. The micro pit defects were increased with the roll surface roughness increase. The defects ratio was declined with larger gradient at pass number 1 to 3, but gentle slope at pass number 4 to 5. When work roll diameter was small, bite angle was increasing, lubrication oil in micro pit of deformation zone was decreased, micro defects were decreased, and glossiness value on the surface of strip was increased.

• Journal of the Korean Society for Railway
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• v.10 no.1 s.38
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• pp.1-6
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• 2007

Railway wheels in service are regularly checked by ultrasonic testing, acoustic emission and eddy current testing method and so on. However, ultrasonic testing is sometimes inadequate for sensitively detecting the cracks in railway wheel which is mainly because of the fact of crack closure. Recently, many researchers have actively fried to improve precision for defect detection of railway wheel. The development of a nondestructive measurement tool for wheel defects and its use for the maintenance of railway wheels would be useful to prevent wheel failure. The induced current focusing potential drop(ICFPD) technique is a new non-destructive tasting technique that can detect defects in railway wheels by applying on electro-magnetic field and potential drops variation. In the present paper, the ICFPD technique is applied to the detection of surface and internal defects for railway wheels. To defect the defects for railway wheels, the sensor for ICFPD is optimized and the tests are carried out with respect to 4 surface defects and 6 internal defects each other. The results show that the surface crack depth of 0.5 mm and internal crack depth of 0.7 mm in wheel tread could be detected by using this method. The ICFPB method is useful to detect the defect that initiated in the tread of railway wheels

• Transactions on Electrical and Electronic Materials
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• v.5 no.4
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• pp.143-147
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• 2004

Surface defects and bulk defects on SOI wafers are studied. Two new metrologies have been proposed to characterize surface and bulk defects in epitaxial layer transfer (ELTRAN) wafers. They included the following: i) laser scattering particle counter and coordinated atomic force microscopy (AFM) and Cu-decoration for defect isolation and ii) cross-sectional transmission electron microscope (TEM) foil preparation using focused ion beam (FIB) and TEM investigation for defect morphology observation. The size of defect is 7.29 urn by AFM analysis, the density of defect is 0.36 /cm$^2$ at as-direct surface oxide defect (DSOD), 2.52 /cm$^2$ at ox-DSOD. A hole was formed locally without either the silicon or the buried oxide layer (Square Defect) in surface defect. Most of surface defects in ELTRAN wafers originate from particle on the porous silicon.

• Journal of the Korean Society for Heat Treatment
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• v.35 no.6
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• pp.319-326
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• 2022

Direct extrusions of an aluminum 7075 alloy were carried out using 1500 ton machine with and without die cooling system. Cooling of extrusion die has been performed by the flow of liquid nitrogen and controlled by laser thermometer. Billet was 180 mm in diameter and 500 mm in length. The preheating temperatures of billet, container and die were 390℃, 400℃ and 450℃, respectively. Ram speed was kept with 1.25 mm/sec first. The change of ram speed was carried out during extrusion according to the observation of surface defects such as crack or tearing. Extrudates of 8.3 m in length, 100 mm in width and 15 mm in thickness were obtained to observe and analyze surface defects by optical microscopy and EBSD (Electron BackScattered Diffraction). In case of extrusion without die cooling cracks on the surface and tearing in the corner of extrudate occurred in the middle stage and developed in size and frequency during the late stage of extrusion. At the extrusion with die cooling the occurrence of defects could be suppressed on the most part of extrudate. EBSD micrographs showed that cracks and tearings have been resulted from the same origin. Surface defects were generated at the boundaries of grains formed by secondary recrystallization due to surface overheating during extrusion.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1996.11a
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• pp.444-449
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• 1996

The semiconductor, which is precision product, requires many inspection processes. The surface conditions of the semiconductor chip affect on the functions of the semiconductors. The defects of the chip surface are cracks or voids. As general inspection method requires many inspection procedure, the inspection system which searches immediately and precisely the defects of the semiconductor chip surface is required. We suggest the detection algorithm for inspecting the surface defects of the semiconductor surface. The proposed algorithm first regards the semiconductor surface as random texture and point spread function, and secondly presents the character of texture by linear estimation theorem. This paper assumes that the gray level of each pixel of an image is estimated from a weighted sum of gray levels of its neighbor pixels by linear estimation theorem. The weight coefficients are determined so that the mean square error is minimized. The obtained estimation window(two-dimensional estimation window) characterizes the surface texture of semiconductor and is used to discriminate the defects of semiconductor surface.

• Journal of the Korean Society for Railway
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• v.14 no.6
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• pp.535-544
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• 2011

The rail surface defects can cause the high impact load on the track and lead to the progress of the rail fatigue damage and the rail break. In case of the rail break, there is a great deal of risk for derailment, and thus the maintenance criteria for the rail surface defects are of great importance. In this study, using the dynamic train-track interaction analysis program, the impact wheel loads and rail bending stresses according to the depths of the surface defects have been calculated with the input data of the rail surface irregularities measured at 43 spots with surface defects in the ballasted track of high-speed railway. Considering the irregularity of track geometry, the allowable limits of wheel load and rail bending stress have been set, and the maintenance criteria for the rail surface defects was suggested by analyzing the relationship of the maximum values of wheel load and rail bending stress versus depth and width of rail surface defect. The analysis results suggest that the allowable depth of the surface defect is determined approximately 0.2mm from the limit of the impact wheel load.

• 제어로봇시스템학회:학술대회논문집
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• 2001.10a
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• pp.35.3-35
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• 2001

Developed is an optical auto-inspection system to detect some microscopic defects on the Inside surface of the hydraulic automobile brakes at the production line. A small cylindrical detection module with a solid laser source at its center has two rings of optical fibers to separately collect light reflected and scattered from the defects on the surface. The cylindrical brake part rotates with respect to the detection module that will move parallel to the rotational axis of the cylinder. Thus, the optical module can scan the whole inside surface area. The automatic detection of the defects is to compare the intensity distributions ...

• Transactions of the Korean Society of Mechanical Engineers B
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• v.26 no.11
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• pp.1597-1604
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• 2002

In this study, numerical investigation has been performed on the impingement, spreading and solidification of a coating material droplet impacting onto a solid substrate in the thermal spray process. The numerical model is validated through the comparison of the present numerical result with experimental data fer the flat substrate without surface defects. An analysis of deposition formation on the non-polished substrate with surface defects is also performed. The parametric study is conducted with various surface defect sizes and shapes to examine the effect of surface defects on the impact and solidification of the liquid droplet on the substrate.