• Journal of Internet of Things and Convergence
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• v.7 no.4
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• pp.9-14
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• 2021

In computing systems that require high reliability, the method of predicting the lifetime of a storage device is one of the important factors for system management because it can maximize usability as well as data protection. The life of a solid state drive (SSD) that has recently been used as a storage device in several storage systems is linked to the life of the NAND flash memory that constitutes it. Therefore, in a storage system configured using an SSD, a method of accurately and efficiently predicting the lifespan of a NAND flash memory is required. In this paper, a method for optimizing the lifetime prediction of a flash memory-based storage device using the frequency of NAND flash memory failure is proposed. For this, we design a cost matrix to collect the frequency of defects that occur when processing data in units of Drive Writes Per Day (DWPD). In addition, a method of predicting the remaining cost to the slope where the life-long finish occurs using the Gradient Descent method is proposed. Finally, we proved the excellence of the proposed idea when any defect occurs with simulation.

• Proceedings of the KIPE Conference
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• 2016.07a
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• pp.423-424
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• 2016

Recently, the mass production of Energy storage system (ESS) is actively perform around world. Energy storage system is a technique that stores power to energy storage device to supply energy into grid and load at peak-load. Therefore, the efficient energy management is available by using ESS system. The life of Lithium-ion battery is varied corresponding to the power usage, especially selected depth of discharge (DOD). The lifetime of battery is the one of the most issue of the ESS system because of its stability and reliability. Therefore, lifetime management of battery and power converter of ESS module is required. In this paper, the battery lifetime management method estimating residual power and lifetime of lithium ion battery of ESS system is proposed. Also, total avenue prediction of ESS system is simulated considering the total lifetime of battery.

• Journal of Convergence for Information Technology
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• v.11 no.11
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• pp.44-50
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• 2021

Recently, enterprise storage systems that require large-capacity storage devices to accommodate big data have used large-capacity flash memory-based storage devices with high density compared to cost and size. This paper proposes a high-efficiency life prediction method with slope descent to maximize the life of flash memory media that directly affects the reliability and usability of large enterprise storage devices. To this end, this paper proposes the structure of a matrix for storing metadata for learning the frequency of defects and proposes a cost model using metadata. It also proposes a life expectancy prediction policy in exceptional situations when defects outside the learned range occur. Lastly, it was verified through simulation that a method proposed by this paper can maximize its life compared to a life prediction method based on the fixed number of times and the life prediction method based on the remaining ratio of spare blocks, which has been used to predict the life of flash memory.

• Journal of the Korea Society of Computer and Information
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• v.21 no.5
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• pp.1-10
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• 2016

Magnetic disks have been used for decades in auxiliary storage devices of computer systems. In recent years, the use of NAND flash memory, which is called SSD, is increased as auxiliary storage devices. However, NAND flash memory, unlike traditional magnetic disks, necessarily performs the erase operation before the write operation in order to overwrite data and this leads to degrade the system lifetime and performance of overall NAND flash memory system. Moreover, NAND flash memory has the lower endurance, compared to traditional magnetic disks. To overcome this problem, this paper proposes EPET (Enhanced Prediction and Elapsed Time) wear leveling technique, which is especially efficient to portable devices. EPET wear leveling uses the advantage of PET (Prediction of Elapsed Time) wear leveling and solves long-term system failure time problem. Moreover, EPET wear leveling further improves space efficiency. In our experiments, EPET wear leveling prolonged the first bad time up to 328.9% and prolonged the system lifetime up to 305.9%, compared to other techniques.

• Journal of the Korea Institute of Military Science and Technology
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• v.12 no.6
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• pp.719-726
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• 2009

A delay system in fuze for high explosive shell is an important safety device, but failure in the delay system usually causes failure of the shell. Root-cause analysis of failure in the delay system is required since failure in over 10-years stored delay system recently occurs. In this paper, failure in the delay system was reproduced experimentally to examine aged characteristics of the delay system, and the failed delay system shows the same characteristics as ones of failed delay systems in field. Based on the reproduced experiments, accelerated life testings and the data analysis of failure times of delay systems were performed to predict the storage lifetime.