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EPET-WL: Enhanced Prediction and Elapsed Time-based Wear Leveling Technique for NAND Flash Memory in Portable Devices

  • Kim, Sung Ho (Dept. of Computer Engineering, Yeungnam University) ;
  • Kwak, Jong Wook (Dept. of Computer Engineering, Yeungnam University)
  • Received : 2016.03.11
  • Accepted : 2016.04.26
  • Published : 2016.05.31

Abstract

Magnetic disks have been used for decades in auxiliary storage devices of computer systems. In recent years, the use of NAND flash memory, which is called SSD, is increased as auxiliary storage devices. However, NAND flash memory, unlike traditional magnetic disks, necessarily performs the erase operation before the write operation in order to overwrite data and this leads to degrade the system lifetime and performance of overall NAND flash memory system. Moreover, NAND flash memory has the lower endurance, compared to traditional magnetic disks. To overcome this problem, this paper proposes EPET (Enhanced Prediction and Elapsed Time) wear leveling technique, which is especially efficient to portable devices. EPET wear leveling uses the advantage of PET (Prediction of Elapsed Time) wear leveling and solves long-term system failure time problem. Moreover, EPET wear leveling further improves space efficiency. In our experiments, EPET wear leveling prolonged the first bad time up to 328.9% and prolonged the system lifetime up to 305.9%, compared to other techniques.

Keywords

References

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